Archivio Istituzionale della RicercaBOSIO, ALBERTO
DEAR-CNN: Data-Efficient Assessment of Resiliency in Convolutional Neural Networks
2025 Bellarmino, Nicolo'; Bosio, Alberto; Cantoro, Riccardo; Ruospo, Annachiara; Sanchez, Ernesto
Investigating on Gradient Regularization for Testing Neural Networks
2025 Bellarmino, Nicolo; Bosio, Alberto; Cantoro, Riccardo; Ruospo, Annachiara; Sanchez, Ernesto; Squillero, Giovanni
Reliability of Deep Neural Networks: Impact and Open Issues
2025 Ruospo, A.; Pappalardo, S.; Turco, V.; Bosio, A.; Sanchez, E.
Resiliency approaches in Convolutional, Photonic, and Spiking Neural Networks
2024 Bosio, Alberto; Gomes, Mauricio; Pavanello, Fabio; Porsia, Antonio; Ruospo, Annachiara; Sanchez, Ernesto; Vatajelu, Elena Ioana
Special Session: Reliability Assessment Recipes for DNN Accelerators
2024 Ahmadilivani, Mohammad Hasan; Bosio, Alberto; Deveautour, Bastien; Santos, Fernando Fernandes Dos; Guerrero-Balaguera, Juan-David; Jenihhin, Maksim; Kritikakou, Angeliki; Limas Sierra, Robert; Pappalardo, Salvatore; Raik, Jaan; Rodriguez Condia, Josie E.; Sonza Reorda, Matteo; Taheri, Mahdi; Traiola, Marcello
Special Session: Approximation and Fault Resiliency of DNN Accelerators
2023 Ahmadilivani, Mh; Barbareschi, M; Barone, S; Bosio, A; Daneshtalab, M; Della Torca, S; Gavarini, G; Jenihhin, M; Raik, J; Ruospo, A; Sanchez, E; Taheri, M
Design, Verification, Test, and In-Field Implications of Approximate Digital Integrated Circuits
2022 Bosio, Alberto; Di Carlo, Stefano; Girard, Patrick; Ruospo, Annachiara; Sanchez, Ernesto; Savino, Alessandro; Sekanina, Lukas; Traiola, Marcello; Vasicek, Zdenek; Virazel, Arnaud
A Pipelined Multi-Level Fault Injector for Deep Neural Networks
2020 Ruospo, Annachiara; Balaara, Angelo; Bosio, Alberto; Ernesto, Sanchez
Cross-layer soft-error resilience analysis of computing systems
2020 Bosio, A.; Canal, R.; Di Carlo, S.; Gizopoulos, D.; Savino, A.
Design, Verification, Test and In-Field Implications of Approximate Computing Systems
2020 Bosio, A.; Di Carlo, S.; Girard, P.; Sanchez, E.; Savino, A.; Sekanina, L.; Traiola, M.; Vasicek, Z.; Virazel, A.
Evaluating Convolutional Neural Networks Reliability depending on their Data Representation
2020 Ruospo, Annachiara; Bosio, Alberto; Ianne, Alessandro; Ernesto, Sanchez
On the Analysis of Real-time Operating System Reliability in Embedded Systems
2020 Mamone, Dario; Bosio, Alberto; Savino, Alessandro; Hamdioui, Said; Rebaudengo, Maurizio
An Effective Fault-Injection Framework for Memory Reliability Enhancement Perspectives
2017 Harcha, Ghita; Girard, Patrick; Virazel, Arnaud; Bosio, Alberto; Bernardi, Paolo
Improving stress quality for SoC using faster-than-at-speed execution of functional programs
2017 Bernardi, Paolo; Bosio, Alberto; Di Natale, Giorgio; Guerriero, Andrea; Sanchez, Ernesto; Venini, Federico
Microprocessor Testing: Functional Meets Structural Test
2017 Touati, A.; Girard, P.; Virazel, A.; Bosio, Alberto; Bernardi, Paolo; SONZA REORDA, Matteo
An effective approach for functional test programs compaction
2016 Touati, A.; Bosio, Alberto; Girard, P.; Virazel, A.; Bernardi, Paolo; SONZA REORDA, Matteo
Are IEEE 1500 compliant cores really compliant to the standard?
2009 Benso, Alfredo; Bosio, Alberto; DI CARLO, Stefano; Prinetto, Paolo Ernesto
March Test Generation Revealed
2008 Benso, Alfredo; Bosio, Alberto; DI CARLO, Stefano; DI NATALE, Giorgio; Prinetto, Paolo Ernesto
A Functional Verification based Fault Injection Environment
2007 Benso, Alfredo; Bosio, Alberto; DI CARLO, Stefano; Mariani, R.
Automating the IEEE std. 1500 compliance verification for embedded cores
2007 Benso, Alfredo; DI CARLO, Stefano; Prinetto, Paolo Ernesto; Bosio, Alberto
| Citazione | Data di pubblicazione | Autori | File |
|---|---|---|---|
| DEAR-CNN: Data-Efficient Assessment of Resiliency in Convolutional Neural Networks / Bellarmino, Nicolo'; Bosio, Alberto; Cantoro, Riccardo; Ruospo, Annachiara; Sanchez, Ernesto. - ELETTRONICO. - (2025). (Intervento presentato al convegno 28th IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS) tenutosi a Lyon, France nel May 5-7, 2025). | 1-gen-2025 | Nicolo' BellarminoAlberto BosioRiccardo CantoroAnnachiara RuospoErnesto Sanchez | 2025_DDECS_DNN_TEST_COMPACTION_CONFERENCE (1).pdf |
| Investigating on Gradient Regularization for Testing Neural Networks / Bellarmino, Nicolo; Bosio, Alberto; Cantoro, Riccardo; Ruospo, Annachiara; Sanchez, Ernesto; Squillero, Giovanni. - ELETTRONICO. - 15509:(2025), pp. 67-81. (Intervento presentato al convegno 10th International Conference on machine Learning, Optimization and Data science (LOD 2024) tenutosi a Castiglione della Pescaia (ITA) nel September 22 – 25, 2024) [10.1007/978-3-031-82484-5_6]. | 1-gen-2025 | Bellarmino, NicoloBosio, AlbertoCantoro, RiccardoRuospo, AnnachiaraSanchez, ErnestoSquillero, Giovanni | 2024_LOD_GRADIENT_PENALIZATION.pdf; 978-3-031-82484-5_6.pdf |
| Reliability of Deep Neural Networks: Impact and Open Issues / Ruospo, A.; Pappalardo, S.; Turco, V.; Bosio, A.; Sanchez, E.. - In: IEEE DESIGN & TEST. - ISSN 2168-2356. - ELETTRONICO. - 42:3(2025), pp. 14-25. [10.1109/MDAT.2025.3544125] | 1-gen-2025 | Ruospo A.Turco V.Bosio A.Sanchez E. + | DesignAndTest___TPTR_Special_Issue.pdf; Reliability_of_Deep_Neural_Networks_Impact_and_Open_Issues.pdf |
| Resiliency approaches in Convolutional, Photonic, and Spiking Neural Networks / Bosio, Alberto; Gomes, Mauricio; Pavanello, Fabio; Porsia, Antonio; Ruospo, Annachiara; Sanchez, Ernesto; Vatajelu, Elena Ioana. - ELETTRONICO. - (2024), pp. 1-10. (Intervento presentato al convegno 2024 IEEE 25th Latin American Test Symposium (LATS) tenutosi a Maceió (BRA) nel 09-12 April 2024) [10.1109/LATS62223.2024.10534615]. | 1-gen-2024 | Bosio, AlbertoPavanello, FabioPorsia, AntonioRuospo, AnnachiaraSanchez, ErnestoVatajelu, Elena Ioana + | LATS24_SpecialSession.pdf; Resiliency_Approaches_in_Convolutional_Photonic_and_Spiking_Neural_Networks.pdf |
| Special Session: Reliability Assessment Recipes for DNN Accelerators / Ahmadilivani, Mohammad Hasan; Bosio, Alberto; Deveautour, Bastien; Santos, Fernando Fernandes Dos; Guerrero-Balaguera, Juan-David; Jenihhin, Maksim; Kritikakou, Angeliki; Limas Sierra, Robert; Pappalardo, Salvatore; Raik, Jaan; Rodriguez Condia, Josie E.; Sonza Reorda, Matteo; Taheri, Mahdi; Traiola, Marcello. - ELETTRONICO. - (2024). (Intervento presentato al convegno 2024 IEEE 42nd VLSI Test Symposium (VTS) tenutosi a Tempe (USA) nel 22-24 April 2024) [10.1109/vts60656.2024.10538707]. | 1-gen-2024 | Bosio, AlbertoGuerrero-Balaguera, Juan-DavidLimas Sierra, RobertRodriguez Condia, Josie E.Sonza Reorda, Matteo + | Special_Session_Reliability_Assessment_Recipes_for_DNN_Accelerators.pdf |
| Special Session: Approximation and Fault Resiliency of DNN Accelerators / Ahmadilivani, Mh; Barbareschi, M; Barone, S; Bosio, A; Daneshtalab, M; Della Torca, S; Gavarini, G; Jenihhin, M; Raik, J; Ruospo, A; Sanchez, E; Taheri, M. - (2023), pp. 1-10. (Intervento presentato al convegno 2023 IEEE 41st VLSI Test Symposium (VTS) tenutosi a San Diego (USA) nel 24-26 April 2023) [10.1109/VTS56346.2023.10140043]. | 1-gen-2023 | Barone, SBosio, AGavarini, GRuospo, ASanchez, E + | Special_Session_Approximation_and_Fault_Resiliency_of_DNN_Accelerators.pdf |
| Design, Verification, Test, and In-Field Implications of Approximate Digital Integrated Circuits / Bosio, Alberto; Di Carlo, Stefano; Girard, Patrick; Ruospo, Annachiara; Sanchez, Ernesto; Savino, Alessandro; Sekanina, Lukas; Traiola, Marcello; Vasicek, Zdenek; Virazel, Arnaud - In: Approximate Computing Techniques From Component- to Application-Level / Bosio A., Ménard D., Sentieys O.. - STAMPA. - [s.l] : Springer Nature, 2022. - ISBN 978-3-030-94704-0. - pp. 349-385 [10.1007/978-3-030-94705-7_12] | 1-gen-2022 | Bosio, AlbertoDi Carlo, StefanoRuospo, AnnachiaraSanchez, ErnestoSavino, Alessandro + | chapter12.pdf; printed-chapter.pdf |
| A Pipelined Multi-Level Fault Injector for Deep Neural Networks / Ruospo, Annachiara; Balaara, Angelo; Bosio, Alberto; Ernesto, Sanchez. - ELETTRONICO. - (2020). (Intervento presentato al convegno IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) tenutosi a ESA-ESRIN, Frascati (Rome) Italy nel October 19 – October 21, 2020) [10.1109/DFT50435.2020.9250866]. | 1-gen-2020 | Annachiara RuospoAngelo BalaaraAlberto BosioErnesto Sanchez | DFT_2020_CR_FINAL.pdf |
| Cross-layer soft-error resilience analysis of computing systems / Bosio, A.; Canal, R.; Di Carlo, S.; Gizopoulos, D.; Savino, A.. - STAMPA. - (2020), pp. 79-79. (Intervento presentato al convegno 50th Annual IEEE/IFIP International Conference on Dependable Systems and Networks: Supplemental Volume, DSN-S 2020 tenutosi a Valencia, Spain, Spain nel 29 June-2 July 2020) [10.1109/DSN-S50200.2020.00042]. | 1-gen-2020 | Bosio A.Di Carlo S.Savino A. + | 09159134.pdf; one_page_tutorial.pdf |
| Design, Verification, Test and In-Field Implications of Approximate Computing Systems / Bosio, A.; Di Carlo, S.; Girard, P.; Sanchez, E.; Savino, A.; Sekanina, L.; Traiola, M.; Vasicek, Z.; Virazel, A.. - STAMPA. - (2020), pp. 1-10. (Intervento presentato al convegno 2020 IEEE European Test Symposium (ETS) tenutosi a Tallinn, Estonia, Estonia nel 25-29 May 2020) [10.1109/ETS48528.2020.9131557]. | 1-gen-2020 | Bosio, A.Di Carlo, S.Sanchez, E.Savino, A. + | 09131557.pdf; paper.pdf |
| Evaluating Convolutional Neural Networks Reliability depending on their Data Representation / Ruospo, Annachiara; Bosio, Alberto; Ianne, Alessandro; Ernesto, Sanchez. - ELETTRONICO. - (2020), pp. 672-679. (Intervento presentato al convegno Euromicro Conference on Digital System Design (DSD) 2020 tenutosi a Kranj, Slovenia (virtual event) nel August 26 – 28, 2020) [10.1109/DSD51259.2020.00109]. | 1-gen-2020 | Annachiara RuospoAlberto BosioAlessandro IanneErnesto Sanchez | 09217880_POSTPRINT.pdf; DSD_ACK_CR.pdf |
| On the Analysis of Real-time Operating System Reliability in Embedded Systems / Mamone, Dario; Bosio, Alberto; Savino, Alessandro; Hamdioui, Said; Rebaudengo, Maurizio. - STAMPA. - (2020), pp. 1-6. (Intervento presentato al convegno 33rd IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems tenutosi a Frascati, Italy, Italy nel 19-21 Oct. 2020) [10.1109/DFT50435.2020.9250861]. | 1-gen-2020 | Bosio, AlbertoSavino, AlessandroRebaudengo, Maurizio + | 09250861.pdf; camera_ready.pdf |
| An Effective Fault-Injection Framework for Memory Reliability Enhancement Perspectives / Harcha, Ghita; Girard, Patrick; Virazel, Arnaud; Bosio, Alberto; Bernardi, Paolo. - (2017). (Intervento presentato al convegno Design &Technology of Integrated Systems in Nanoscale Era). | 1-gen-2017 | BOSIO, ALBERTOBERNARDI, PAOLO + | - |
| Improving stress quality for SoC using faster-than-at-speed execution of functional programs / Bernardi, Paolo; Bosio, Alberto; Di Natale, Giorgio; Guerriero, Andrea; Sanchez, Ernesto; Venini, Federico - In: IFIP Advances in Information and Communication Technology / Bernardi, Paolo. - STAMPA. - [s.l] : Springer New York LLC, 2017. - ISBN 9783319671031. - pp. 130-151 [10.1007/978-3-319-67104-8_7] | 1-gen-2017 | Bernardi, PaoloBosio, AlbertoDi Natale, GiorgioSanchez, ErnestoVenini, Federico + | - |
| Microprocessor Testing: Functional Meets Structural Test / Touati, A.; Girard, P.; Virazel, A.; Bosio, Alberto; Bernardi, Paolo; SONZA REORDA, Matteo. - In: JOURNAL OF CIRCUITS, SYSTEMS, AND COMPUTERS. - ISSN 0218-1266. - 26:8(2017), pp. 1-18. [10.1142/S0218126617400072] | 1-gen-2017 | BOSIO, ALBERTOBERNARDI, PAOLOSONZA REORDA, MATTEO + | - |
| An effective approach for functional test programs compaction / Touati, A.; Bosio, Alberto; Girard, P.; Virazel, A.; Bernardi, Paolo; SONZA REORDA, Matteo. - STAMPA. - (2016), pp. 1-6. (Intervento presentato al convegno 19th IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems, DDECS 2016 tenutosi a svk nel 2016) [10.1109/DDECS.2016.7482466]. | 1-gen-2016 | BOSIO, ALBERTOBERNARDI, PAOLOSONZA REORDA, Matteo + | - |
| Are IEEE 1500 compliant cores really compliant to the standard? / Benso, Alfredo; Bosio, Alberto; DI CARLO, Stefano; Prinetto, Paolo Ernesto. - In: IEEE DESIGN & TEST OF COMPUTERS. - ISSN 0740-7475. - STAMPA. - 26:3(2009), pp. 16-24. [10.1109/MDT.2009.46] | 1-gen-2009 | BENSO, AlfredoBOSIO, ALBERTODI CARLO, STEFANOPRINETTO, Paolo Ernesto | 2009-MTD-IEEE1500.pdf |
| March Test Generation Revealed / Benso, Alfredo; Bosio, Alberto; DI CARLO, Stefano; DI NATALE, Giorgio; Prinetto, Paolo Ernesto. - In: IEEE TRANSACTIONS ON COMPUTERS. - ISSN 0018-9340. - STAMPA. - 57:12(2008), pp. 1704-1713. [10.1109/TC.2008.105] | 1-gen-2008 | BENSO, AlfredoBOSIO, ALBERTODI CARLO, STEFANODI NATALE, GiorgioPRINETTO, Paolo Ernesto | 2008-TC-MarchTest.pdf |
| A Functional Verification based Fault Injection Environment / Benso, Alfredo; Bosio, Alberto; DI CARLO, Stefano; Mariani, R.. - STAMPA. - (2007), pp. 114-122. (Intervento presentato al convegno IEEE 22nd International Symposium on Defect and Fault Tolerance in VLSI Systems (DFTS) tenutosi a Roma, IT nel 26-28 Sept. 2007) [10.1109/DFT.2007.31]. | 1-gen-2007 | BENSO, AlfredoBOSIO, ALBERTODI CARLO, STEFANO + | 2007-DFT-FaultSim.pdf |
| Automating the IEEE std. 1500 compliance verification for embedded cores / Benso, Alfredo; DI CARLO, Stefano; Prinetto, Paolo Ernesto; Bosio, Alberto. - STAMPA. - (2007), pp. 171-178. (Intervento presentato al convegno IEEE International High Level Design Validation and Test Workshop (HLDVT) tenutosi a Irvine (CA), USA nel 7-9 Nov. 2007) [10.1109/HLDVT.2007.4392810]. | 1-gen-2007 | BENSO, AlfredoDI CARLO, STEFANOPRINETTO, Paolo ErnestoBOSIO, ALBERTO | 2007-HLDVT-IEEE1500.pdf |