BOSIO, ALBERTO

BOSIO, ALBERTO  

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Citazione Data di pubblicazione Autori File
Special Session: Approximation and Fault Resiliency of DNN Accelerators / Ahmadilivani, Mh; Barbareschi, M; Barone, S; Bosio, A; Daneshtalab, M; Della Torca, S; Gavarini, G; Jenihhin, M; Raik, J; Ruospo, A; Sanchez, E; Taheri, M. - (2023), pp. 1-10. (Intervento presentato al convegno 2023 IEEE 41st VLSI Test Symposium (VTS) tenutosi a San Diego (USA) nel 24-26 April 2023) [10.1109/VTS56346.2023.10140043]. 1-gen-2023 Barone, SBosio, AGavarini, GRuospo, ASanchez, E + Special_Session_Approximation_and_Fault_Resiliency_of_DNN_Accelerators.pdf
Design, Verification, Test, and In-Field Implications of Approximate Digital Integrated Circuits / Bosio, Alberto; Di Carlo, Stefano; Girard, Patrick; Ruospo, Annachiara; Sanchez, Ernesto; Savino, Alessandro; Sekanina, Lukas; Traiola, Marcello; Vasicek, Zdenek; Virazel, Arnaud - In: Approximate Computing Techniques From Component- to Application-Level / Bosio A., Ménard D., Sentieys O.. - STAMPA. - [s.l] : Springer Nature, 2022. - ISBN 978-3-030-94704-0. - pp. 349-385 [10.1007/978-3-030-94705-7_12] 1-gen-2022 Bosio, AlbertoDi Carlo, StefanoRuospo, AnnachiaraSanchez, ErnestoSavino, Alessandro + chapter12.pdfprinted-chapter.pdf
A Pipelined Multi-Level Fault Injector for Deep Neural Networks / Ruospo, Annachiara; Balaara, Angelo; Bosio, Alberto; Ernesto, Sanchez. - ELETTRONICO. - (2020). (Intervento presentato al convegno IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) tenutosi a ESA-ESRIN, Frascati (Rome) Italy nel October 19 – October 21, 2020) [10.1109/DFT50435.2020.9250866]. 1-gen-2020 Annachiara RuospoAngelo BalaaraAlberto BosioErnesto Sanchez DFT_2020_CR_FINAL.pdf
Cross-layer soft-error resilience analysis of computing systems / Bosio, A.; Canal, R.; Di Carlo, S.; Gizopoulos, D.; Savino, A.. - STAMPA. - (2020), pp. 79-79. (Intervento presentato al convegno 50th Annual IEEE/IFIP International Conference on Dependable Systems and Networks: Supplemental Volume, DSN-S 2020 tenutosi a Valencia, Spain, Spain nel 29 June-2 July 2020) [10.1109/DSN-S50200.2020.00042]. 1-gen-2020 Bosio A.Di Carlo S.Savino A. + 09159134.pdfone_page_tutorial.pdf
Design, Verification, Test and In-Field Implications of Approximate Computing Systems / Bosio, A.; Di Carlo, S.; Girard, P.; Sanchez, E.; Savino, A.; Sekanina, L.; Traiola, M.; Vasicek, Z.; Virazel, A.. - STAMPA. - (2020), pp. 1-10. (Intervento presentato al convegno 2020 IEEE European Test Symposium (ETS) tenutosi a Tallinn, Estonia, Estonia nel 25-29 May 2020) [10.1109/ETS48528.2020.9131557]. 1-gen-2020 Bosio, A.Di Carlo, S.Sanchez, E.Savino, A. + 09131557.pdfpaper.pdf
Evaluating Convolutional Neural Networks Reliability depending on their Data Representation / Ruospo, Annachiara; Bosio, Alberto; Ianne, Alessandro; Ernesto, Sanchez. - ELETTRONICO. - (2020), pp. 672-679. (Intervento presentato al convegno Euromicro Conference on Digital System Design (DSD) 2020 tenutosi a Kranj, Slovenia (virtual event) nel August 26 – 28, 2020) [10.1109/DSD51259.2020.00109]. 1-gen-2020 Annachiara RuospoAlberto BosioAlessandro IanneErnesto Sanchez 09217880_POSTPRINT.pdfDSD_ACK_CR.pdf
On the Analysis of Real-time Operating System Reliability in Embedded Systems / Mamone, Dario; Bosio, Alberto; Savino, Alessandro; Hamdioui, Said; Rebaudengo, Maurizio. - STAMPA. - (2020), pp. 1-6. (Intervento presentato al convegno 33rd IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems tenutosi a Frascati, Italy, Italy nel 19-21 Oct. 2020) [10.1109/DFT50435.2020.9250861]. 1-gen-2020 Bosio, AlbertoSavino, AlessandroRebaudengo, Maurizio + 09250861.pdfcamera_ready.pdf
An Effective Fault-Injection Framework for Memory Reliability Enhancement Perspectives / Harcha, Ghita; Girard, Patrick; Virazel, Arnaud; Bosio, Alberto; Bernardi, Paolo. - (2017). (Intervento presentato al convegno Design &Technology of Integrated Systems in Nanoscale Era). 1-gen-2017 BOSIO, ALBERTOBERNARDI, PAOLO + -
Improving stress quality for SoC using faster-than-at-speed execution of functional programs / Bernardi, Paolo; Bosio, Alberto; Di Natale, Giorgio; Guerriero, Andrea; Sanchez, Ernesto; Venini, Federico - In: IFIP Advances in Information and Communication Technology / Bernardi, Paolo. - STAMPA. - [s.l] : Springer New York LLC, 2017. - ISBN 9783319671031. - pp. 130-151 [10.1007/978-3-319-67104-8_7] 1-gen-2017 Bernardi, PaoloBosio, AlbertoDi Natale, GiorgioSanchez, ErnestoVenini, Federico + -
Microprocessor Testing: Functional Meets Structural Test / Touati, A.; Girard, P.; Virazel, A.; Bosio, Alberto; Bernardi, Paolo; SONZA REORDA, Matteo. - In: JOURNAL OF CIRCUITS, SYSTEMS, AND COMPUTERS. - ISSN 0218-1266. - 26:8(2017), pp. 1-18. [10.1142/S0218126617400072] 1-gen-2017 BOSIO, ALBERTOBERNARDI, PAOLOSONZA REORDA, MATTEO + -
An effective approach for functional test programs compaction / Touati, A.; Bosio, Alberto; Girard, P.; Virazel, A.; Bernardi, Paolo; SONZA REORDA, Matteo. - STAMPA. - (2016), pp. 1-6. (Intervento presentato al convegno 19th IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems, DDECS 2016 tenutosi a svk nel 2016) [10.1109/DDECS.2016.7482466]. 1-gen-2016 BOSIO, ALBERTOBERNARDI, PAOLOSONZA REORDA, Matteo + -
Are IEEE 1500 compliant cores really compliant to the standard? / Benso, Alfredo; Bosio, Alberto; DI CARLO, Stefano; Prinetto, Paolo Ernesto. - In: IEEE DESIGN & TEST OF COMPUTERS. - ISSN 0740-7475. - STAMPA. - 26:3(2009), pp. 16-24. [10.1109/MDT.2009.46] 1-gen-2009 BENSO, AlfredoBOSIO, ALBERTODI CARLO, STEFANOPRINETTO, Paolo Ernesto 2009-MTD-IEEE1500.pdf
March Test Generation Revealed / Benso, Alfredo; Bosio, Alberto; DI CARLO, Stefano; DI NATALE, Giorgio; Prinetto, Paolo Ernesto. - In: IEEE TRANSACTIONS ON COMPUTERS. - ISSN 0018-9340. - STAMPA. - 57:12(2008), pp. 1704-1713. [10.1109/TC.2008.105] 1-gen-2008 BENSO, AlfredoBOSIO, ALBERTODI CARLO, STEFANODI NATALE, GiorgioPRINETTO, Paolo Ernesto 2008-TC-MarchTest.pdf
A Functional Verification based Fault Injection Environment / Benso, Alfredo; Bosio, Alberto; DI CARLO, Stefano; Mariani, R.. - STAMPA. - (2007), pp. 114-122. (Intervento presentato al convegno IEEE 22nd International Symposium on Defect and Fault Tolerance in VLSI Systems (DFTS) tenutosi a Roma, IT nel 26-28 Sept. 2007) [10.1109/DFT.2007.31]. 1-gen-2007 BENSO, AlfredoBOSIO, ALBERTODI CARLO, STEFANO + 2007-DFT-FaultSim.pdf
Automating the IEEE std. 1500 compliance verification for embedded cores / Benso, Alfredo; DI CARLO, Stefano; Prinetto, Paolo Ernesto; Bosio, Alberto. - STAMPA. - (2007), pp. 171-178. (Intervento presentato al convegno IEEE International High Level Design Validation and Test Workshop (HLDVT) tenutosi a Irvine (CA), USA nel 7-9 Nov. 2007) [10.1109/HLDVT.2007.4392810]. 1-gen-2007 BENSO, AlfredoDI CARLO, STEFANOPRINETTO, Paolo ErnestoBOSIO, ALBERTO 2007-HLDVT-IEEE1500.pdf
March AB, a State-of-the-Art March Test for Realistic Static Linked Faults and Dynamic Faults in SRAMs / Bosio, Alberto; DI CARLO, Stefano; DI NATALE, Giorgio; Prinetto, Paolo Ernesto. - In: IET COMPUTERS & DIGITAL TECHNIQUES. - ISSN 1751-8601. - STAMPA. - 1:3(2007), pp. 237-245. [10.1049/iet-cdt:20060137] 1-gen-2007 BOSIO, ALBERTODI CARLO, STEFANODI NATALE, GiorgioPRINETTO, Paolo Ernesto 2007-IET-CDT-MarchAB-AuthorVersion.pdf
A 22n March Test for Realistic Static Linked Faults in SRAMs / Benso, Alfredo; Bosio, Alberto; DI CARLO, Stefano; DI NATALE, Giorgio; Prinetto, Paolo Ernesto. - STAMPA. - (2006), pp. 49-54. (Intervento presentato al convegno IEEE 11th European Test Symposium (ETS) tenutosi a SouthAmpton, UK nel 21-24 May 2006) [10.1109/ETS.2006.2]. 1-gen-2006 BENSO, AlfredoBOSIO, ALBERTODI CARLO, STEFANODI NATALE, GiorgioPRINETTO, Paolo Ernesto 2006-ETS-March.pdf
A Black-Box-Oriented Test Methodology / Benso, Alfredo; Bosio, Alberto; Prinetto, Paolo Ernesto; Savino, Alessandro. - STAMPA. - (2006), pp. 11-15. (Intervento presentato al convegno IEEE East-West Design & Test Workshop (EWDTW06) tenutosi a Sochi (Russia) nel Sept. 15-19, 2006). 1-gen-2006 BENSO, AlfredoBOSIO, ALBERTOPRINETTO, Paolo ErnestoSAVINO, ALESSANDRO -
A tool for teaching memory testing based on BIST / Fischerova, M.; Pikula, T.; Simlastik, M.; Bosio, Alberto; DI CARLO, Stefano; DI NATALE, Giorgio. - STAMPA. - (2006), pp. 187-190. (Intervento presentato al convegno IEEE International Biennal Baltic Electronics Conference (BEC) tenutosi a Tallin, EE nel 2-4 Oct. 2006) [10.1109/BEC.2006.311094]. 1-gen-2006 BOSIO, ALBERTODI CARLO, STEFANODI NATALE, Giorgio + 2006-BEC-MemoryApplets-AuthorVersion.pdf
A Unique March Test Algorithm for the Wide Spread of Realistic Memory Faults in SRAMs / Benso, Alfredo; Bosio, Alberto; DI CARLO, Stefano; DI NATALE, Giorgio; Prinetto, Paolo Ernesto. - STAMPA. - (2006), pp. 155-156. (Intervento presentato al convegno IEEE 9th Workshop on Design and Diagnostics of Electronic Circuits and Systems (DDECS) tenutosi a Prague, CZ nel 18-21 Apr. 2006) [10.1109/DDECS.2006.1649602]. 1-gen-2006 BENSO, AlfredoBOSIO, ALBERTODI CARLO, STEFANODI NATALE, GiorgioPRINETTO, Paolo Ernesto 2006-DDECS-MarchTest.pdf