Archivio Istituzionale della RicercaBOSIO, ALBERTO
Dynamic Workload Selection for Ranked Fault Injection via Sequential Bernoulli Discovery Modeling
In corso di stampa Bellarmino, Nicolo'; Bosio, Alberto; Cantoro, Riccardo
Implicit Activation Sparsity for Fault-Tolerant CNNs: A Training-Dynamics Perspective
In corso di stampa Bellarmino, Nicolo'; Bosio, Alberto; Ruospo, Annachiara; Ernesto, Sanchez; Cantoro, Riccardo
M-EL2N: Data-Efficient Fault Injection Through Sample Difficulty Analysis
2026 Bellarmino, Nicolò; Bosio, Alberto; Al-Kaf, Ahmed; Benabdenbi, Mounir; Leveugle, Régis; Cantoro, Riccardo
OpRA: Optimizing Resiliency Assessment for Deep Neural Networks
2026 Bellarmino, Nicolò; Barone, Salvatore; Pappalardo, Salvatore; Bosio, Alberto; Cantoro, Riccardo
Trustworthy AI in the Cloud
2026 Bosio, Alberto; Sanchez, Ernesto; Sinha, Arani; Pappalardo, Salvatore; Ruospo, Annachiara; Turco, Vittorio
DEAR-CNN: Data-Efficient Assessment of Resiliency in Convolutional Neural Networks
2025 Bellarmino, Nicolo'; Bosio, Alberto; Cantoro, Riccardo; Ruospo, Annachiara; Sanchez, Ernesto
Investigating on Gradient Regularization for Testing Neural Networks
2025 Bellarmino, Nicolo; Bosio, Alberto; Cantoro, Riccardo; Ruospo, Annachiara; Sanchez, Ernesto; Squillero, Giovanni
Reliability of Deep Neural Networks: Impact and Open Issues
2025 Ruospo, A.; Pappalardo, S.; Turco, V.; Bosio, A.; Sanchez, E.
Special Session: Reliability Assessment Recipes for DNN Accelerators
2024 Ahmadilivani, Mohammad Hasan; Bosio, Alberto; Deveautour, Bastien; Santos, Fernando Fernandes Dos; Guerrero-Balaguera, Juan-David; Jenihhin, Maksim; Kritikakou, Angeliki; Limas Sierra, Robert; Pappalardo, Salvatore; Raik, Jaan; Rodriguez Condia, Josie E.; Sonza Reorda, Matteo; Taheri, Mahdi; Traiola, Marcello
Special Session: Approximation and Fault Resiliency of DNN Accelerators
2023 Ahmadilivani, Mh; Barbareschi, M; Barone, S; Bosio, A; Daneshtalab, M; Della Torca, S; Gavarini, G; Jenihhin, M; Raik, J; Ruospo, A; Sanchez, E; Taheri, M
Design, Verification, Test, and In-Field Implications of Approximate Digital Integrated Circuits
2022 Bosio, Alberto; Di Carlo, Stefano; Girard, Patrick; Ruospo, Annachiara; Sanchez, Ernesto; Savino, Alessandro; Sekanina, Lukas; Traiola, Marcello; Vasicek, Zdenek; Virazel, Arnaud
Cross-layer soft-error resilience analysis of computing systems
2020 Bosio, A.; Canal, R.; Di Carlo, S.; Gizopoulos, D.; Savino, A.
Design, Verification, Test and In-Field Implications of Approximate Computing Systems
2020 Bosio, A.; Di Carlo, S.; Girard, P.; Sanchez, E.; Savino, A.; Sekanina, L.; Traiola, M.; Vasicek, Z.; Virazel, A.
On the Analysis of Real-time Operating System Reliability in Embedded Systems
2020 Mamone, Dario; Bosio, Alberto; Savino, Alessandro; Hamdioui, Said; Rebaudengo, Maurizio
An Effective Fault-Injection Framework for Memory Reliability Enhancement Perspectives
2017 Harcha, Ghita; Girard, Patrick; Virazel, Arnaud; Bosio, Alberto; Bernardi, Paolo
Improving stress quality for SoC using faster-than-at-speed execution of functional programs
2017 Bernardi, Paolo; Bosio, Alberto; Di Natale, Giorgio; Guerriero, Andrea; Sanchez, Ernesto; Venini, Federico
Microprocessor Testing: Functional Meets Structural Test
2017 Touati, A.; Girard, P.; Virazel, A.; Bosio, Alberto; Bernardi, Paolo; SONZA REORDA, Matteo
An effective approach for functional test programs compaction
2016 Touati, A.; Bosio, Alberto; Girard, P.; Virazel, A.; Bernardi, Paolo; SONZA REORDA, Matteo
Are IEEE 1500 compliant cores really compliant to the standard?
2009 Benso, Alfredo; Bosio, Alberto; DI CARLO, Stefano; Prinetto, Paolo Ernesto
March Test Generation Revealed
2008 Benso, Alfredo; Bosio, Alberto; DI CARLO, Stefano; DI NATALE, Giorgio; Prinetto, Paolo Ernesto
| Citazione | Data di pubblicazione | Autori | File |
|---|---|---|---|
| Dynamic Workload Selection for Ranked Fault Injection via Sequential Bernoulli Discovery Modeling / Bellarmino, N., Bosio, A., Cantoro, R.. - (In corso di stampa). (IEEE 35th Asian Test Symposium (ATS 2026) Kaohsiung, Taiwan 1st - 3rd December, 2026). | In corso di stampa | Nicolo, BellarminoAlberto, BosioRiccardo, Cantoro | 2026_ATS_ON_LINE_FI_CONFERNCE.pdf |
| Implicit Activation Sparsity for Fault-Tolerant CNNs: A Training-Dynamics Perspective / Bellarmino, N., Bosio, A., Ruospo, A., Ernesto, S., Cantoro, R.. - IEEE International Conference on Omni-Layer Intelligent Systems (COINS):(In corso di stampa). (IEEE International Conference on Omni-Layer Intelligent Systems (COINS) Bologna, Italy 7-9 September 2026). | In corso di stampa | Nicolo, BellarminoAlberto, BosioAnnachiara, RuospoErnesto, SanchezRiccardo, Cantoro | 2026_COINS_LOL_TRAINING_DYNAMICS_CNN (7).pdf |
| M-EL2N: Data-Efficient Fault Injection Through Sample Difficulty Analysis / Bellarmino, N., Bosio, A., Al-Kaf, A., Benabdenbi, M., Leveugle, R., Cantoro, R.. - (2026), pp. 1-6. (27th Latin American Test Symposium, LATS 2026 Florianópolis (BRA) 17-20 March 2026) [10.1109/lats70329.2026.11480331]. | 1-gen-2026 | Bellarmino, NicolòBosio, AlbertoCantoro, Riccardo + | M-EL2N_Data-Efficient_Fault_Injection_Through_Sample_Difficulty_Analysis.pdf; 2025_LATS_MIRRORED_EL2N (3).pdf |
| OpRA: Optimizing Resiliency Assessment for Deep Neural Networks / Bellarmino, N., Barone, S., Pappalardo, S., Bosio, A., Cantoro, R.. - In: IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS. - ISSN 0278-0070. - 45:4(2026), pp. 1921-1934. [10.1109/TCAD.2025.3610062] | 1-gen-2026 | Nicolò BellarminoAlberto BosioRiccardo Cantoro + | Data_Efficient_Resiliency_Assessment_of_Convolutional_Neural_Networks__IEEE_TCAD_ (3).pdf; OpRA_Optimizing_Resiliency_Assessment_for_Deep_Neural_Networks.pdf |
| Trustworthy AI in the Cloud / Bosio, A., Sanchez, E., Sinha, A., Pappalardo, S., Ruospo, A., Turco, V. - In: Machine Learning Systems: The Role of Hardware Design for Dependable Computing[s.l] : Springer Nature, 2026. - ISBN 9783032179470. - pp. 287-322 [10.1007/978-3-032-17948-7_10] | 1-gen-2026 | Bosio, AlbertoSanchez, ErnestoPappalardo, SalvatoreRuospo, AnnachiaraTurco, Vittorio + | Trust and Security in Machine Learning Systems.pdf |
| DEAR-CNN: Data-Efficient Assessment of Resiliency in Convolutional Neural Networks / Bellarmino, N., Bosio, A., Cantoro, R., Ruospo, A., Sanchez, E.. - ELETTRONICO. - (2025), pp. 13-18. (28th IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS) Lyon (FRA) May 5-7, 2025) [10.1109/DDECS63720.2025.11006797]. | 1-gen-2025 | Nicolo' BellarminoAlberto BosioRiccardo CantoroAnnachiara RuospoErnesto Sanchez | 2025_DDECS_DNN_TEST_COMPACTION_CONFERENCE (1).pdf; DEAR-CNN_Data-Efficient_Assessment_of_Resiliency_in_Convolutional_Neural_Networks.pdf |
| Investigating on Gradient Regularization for Testing Neural Networks / Bellarmino, N., Bosio, A., Cantoro, R., Ruospo, A., Sanchez, E., Squillero, G.. - ELETTRONICO. - 15509:(2025), pp. 67-81. (10th International Conference on machine Learning, Optimization and Data science (LOD 2024) Castiglione della Pescaia (ITA) September 22 – 25, 2024) [10.1007/978-3-031-82484-5_6]. | 1-gen-2025 | Bellarmino, NicoloBosio, AlbertoCantoro, RiccardoRuospo, AnnachiaraSanchez, ErnestoSquillero, Giovanni | 2024_LOD_GRADIENT_PENALIZATION.pdf; 978-3-031-82484-5_6.pdf |
| Reliability of Deep Neural Networks: Impact and Open Issues / Ruospo, A., Pappalardo, S., Turco, V., Bosio, A., Sanchez, E.. - In: IEEE DESIGN & TEST. - ISSN 2168-2356. - ELETTRONICO. - 42:3(2025), pp. 14-25. [10.1109/MDAT.2025.3544125] | 1-gen-2025 | Ruospo A.Turco V.Bosio A.Sanchez E. + | DesignAndTest___TPTR_Special_Issue.pdf; Reliability_of_Deep_Neural_Networks_Impact_and_Open_Issues.pdf |
| Special Session: Reliability Assessment Recipes for DNN Accelerators / Ahmadilivani, M.H., Bosio, A., Deveautour, B., Santos, F.F.D., Guerrero-Balaguera, J., Jenihhin, M., Kritikakou, A., Limas Sierra, R., Pappalardo, S., Raik, J., Rodriguez Condia, J.E., Sonza Reorda, M., Taheri, M., Traiola, M.. - ELETTRONICO. - (2024). (2024 IEEE 42nd VLSI Test Symposium (VTS) Tempe (USA) 22-24 April 2024) [10.1109/vts60656.2024.10538707]. | 1-gen-2024 | Bosio, AlbertoGuerrero-Balaguera, Juan-DavidLimas Sierra, RobertRodriguez Condia, Josie E.Sonza Reorda, Matteo + | Special_Session_Reliability_Assessment_Recipes_for_DNN_Accelerators.pdf |
| Special Session: Approximation and Fault Resiliency of DNN Accelerators / Ahmadilivani, M.h., Barbareschi, M., Barone, S., Bosio, A., Daneshtalab, M., Della Torca, S., Gavarini, G., Jenihhin, M., Raik, J., Ruospo, A., Sanchez, E., Taheri, M.. - (2023), pp. 1-10. (2023 IEEE 41st VLSI Test Symposium (VTS) San Diego (USA) 24-26 April 2023) [10.1109/VTS56346.2023.10140043]. | 1-gen-2023 | Barone, SBosio, AGavarini, GRuospo, ASanchez, E + | Special_Session_Approximation_and_Fault_Resiliency_of_DNN_Accelerators.pdf |
| Design, Verification, Test, and In-Field Implications of Approximate Digital Integrated Circuits / Bosio, A., Di Carlo, S., Girard, P., Ruospo, A., Sanchez, E., Savino, A., Sekanina, L., Traiola, M., Vasicek, Z., Virazel, A. - In: Approximate Computing Techniques From Component- to Application-Level / Bosio A., Ménard D., Sentieys O.. - STAMPA. - [s.l] : Springer Nature, 2022. - ISBN 978-3-030-94704-0. - pp. 349-385 [10.1007/978-3-030-94705-7_12] | 1-gen-2022 | Bosio, AlbertoDi Carlo, StefanoRuospo, AnnachiaraSanchez, ErnestoSavino, Alessandro + | chapter12.pdf; printed-chapter.pdf |
| Cross-layer soft-error resilience analysis of computing systems / Bosio, A., Canal, R., Di Carlo, S., Gizopoulos, D., Savino, A.. - STAMPA. - (2020), pp. 79-79. (50th Annual IEEE/IFIP International Conference on Dependable Systems and Networks: Supplemental Volume, DSN-S 2020 Valencia, Spain, Spain 29 June-2 July 2020) [10.1109/DSN-S50200.2020.00042]. | 1-gen-2020 | Bosio A.Di Carlo S.Savino A. + | 09159134.pdf; one_page_tutorial.pdf |
| Design, Verification, Test and In-Field Implications of Approximate Computing Systems / Bosio, A., Di Carlo, S., Girard, P., Sanchez, E., Savino, A., Sekanina, L., Traiola, M., Vasicek, Z., Virazel, A.. - STAMPA. - (2020), pp. 1-10. (2020 IEEE European Test Symposium (ETS) Tallinn, Estonia, Estonia 25-29 May 2020) [10.1109/ETS48528.2020.9131557]. | 1-gen-2020 | Bosio, A.Di Carlo, S.Sanchez, E.Savino, A. + | 09131557.pdf; paper.pdf |
| On the Analysis of Real-time Operating System Reliability in Embedded Systems / Mamone, D., Bosio, A., Savino, A., Hamdioui, S., Rebaudengo, M.. - STAMPA. - (2020), pp. 1-6. (33rd IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems Frascati, Italy, Italy 19-21 Oct. 2020) [10.1109/DFT50435.2020.9250861]. | 1-gen-2020 | Bosio, AlbertoSavino, AlessandroRebaudengo, Maurizio + | 09250861.pdf; camera_ready.pdf |
| An Effective Fault-Injection Framework for Memory Reliability Enhancement Perspectives / Harcha, G., Girard, P., Virazel, A., Bosio, A., Bernardi, P.. - (2017). (Design &Technology of Integrated Systems in Nanoscale Era ). | 1-gen-2017 | BOSIO, ALBERTOBERNARDI, PAOLO + | - |
| Improving stress quality for SoC using faster-than-at-speed execution of functional programs / Bernardi, P., Bosio, A., Di Natale, G., Guerriero, A., Sanchez, E., Venini, F. - In: IFIP Advances in Information and Communication Technology / Bernardi, Paolo. - STAMPA. - [s.l] : Springer New York LLC, 2017. - ISBN 9783319671031. - pp. 130-151 [10.1007/978-3-319-67104-8_7] | 1-gen-2017 | Bernardi, PaoloBosio, AlbertoDi Natale, GiorgioSanchez, ErnestoVenini, Federico + | - |
| Microprocessor Testing: Functional Meets Structural Test / Touati, A., Girard, P., Virazel, A., Bosio, A., Bernardi, P., SONZA REORDA, M.. - In: JOURNAL OF CIRCUITS, SYSTEMS, AND COMPUTERS. - ISSN 0218-1266. - 26:8(2017), pp. 1-18. [10.1142/S0218126617400072] | 1-gen-2017 | BOSIO, ALBERTOBERNARDI, PAOLOSONZA REORDA, MATTEO + | - |
| An effective approach for functional test programs compaction / Touati, A., Bosio, A., Girard, P., Virazel, A., Bernardi, P., SONZA REORDA, M.. - STAMPA. - (2016), pp. 1-6. (19th IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems, DDECS 2016 svk 2016) [10.1109/DDECS.2016.7482466]. | 1-gen-2016 | BOSIO, ALBERTOBERNARDI, PAOLOSONZA REORDA, Matteo + | - |
| Are IEEE 1500 compliant cores really compliant to the standard? / Benso, A., Bosio, A., DI CARLO, S., Prinetto, P.E.. - In: IEEE DESIGN & TEST OF COMPUTERS. - ISSN 0740-7475. - STAMPA. - 26:3(2009), pp. 16-24. [10.1109/MDT.2009.46] | 1-gen-2009 | BENSO, AlfredoBOSIO, ALBERTODI CARLO, STEFANOPRINETTO, Paolo Ernesto | 2009-MTD-IEEE1500.pdf |
| March Test Generation Revealed / Benso, A., Bosio, A., DI CARLO, S., DI NATALE, G., Prinetto, P.E.. - In: IEEE TRANSACTIONS ON COMPUTERS. - ISSN 0018-9340. - STAMPA. - 57:12(2008), pp. 1704-1713. [10.1109/TC.2008.105] | 1-gen-2008 | BENSO, AlfredoBOSIO, ALBERTODI CARLO, STEFANODI NATALE, GiorgioPRINETTO, Paolo Ernesto | 2008-TC-MarchTest.pdf |