In a world with computation at the epicenter of every activity, computing systems must be highly resilient to errors even if miniaturization makes the underlying hardware unreliable. Techniques able to guarantee high reliability are associated to high costs. Early resilience analysis has the potential to support informed design decisions to maximize system-level reliability while minimizing the associated costs. This tutorial focuses on early cross-layer (hardware and software) resilience analysis considering the full computing continuum (from IoT/CPS to HPC applications) with emphasis on soft errors.
Cross-layer soft-error resilience analysis of computing systems / Bosio, A.; Canal, R.; Di Carlo, S.; Gizopoulos, D.; Savino, A.. - STAMPA. - (2020), pp. 79-79. ((Intervento presentato al convegno 50th Annual IEEE/IFIP International Conference on Dependable Systems and Networks: Supplemental Volume, DSN-S 2020 tenutosi a Valencia, Spain, Spain nel 29 June-2 July 2020.
Titolo: | Cross-layer soft-error resilience analysis of computing systems |
Autori: | |
Data di pubblicazione: | 2020 |
Abstract: | In a world with computation at the epicenter of every activity, computing systems must be highly ...resilient to errors even if miniaturization makes the underlying hardware unreliable. Techniques able to guarantee high reliability are associated to high costs. Early resilience analysis has the potential to support informed design decisions to maximize system-level reliability while minimizing the associated costs. This tutorial focuses on early cross-layer (hardware and software) resilience analysis considering the full computing continuum (from IoT/CPS to HPC applications) with emphasis on soft errors. |
ISBN: | 978-1-7281-7260-6 |
Appare nelle tipologie: | 4.1 Contributo in Atti di convegno |
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09159134.pdf | 2a Post-print versione editoriale / Version of Record | Non Pubblico - Accesso privato/ristretto | Administrator Richiedi una copia | |
one_page_tutorial.pdf | 2. Post-print / Author's Accepted Manuscript | PUBBLICO - Tutti i diritti riservati | Visibile a tuttiVisualizza/Apri |
http://hdl.handle.net/11583/2853435