Archivio Istituzionale della RicercaVATAJELU, ELENA IOANA
Mostra
records
Risultati 1 - 12 di 12 (tempo di esecuzione: 0.019 secondi).
New Metrics for Spin Transfer Torque (STT) MRAM Cell Robustness Estimation
In corso di stampa Vatajelu, ELENA IOANA; R., Rodriguez Montañés; Indaco, Marco; M., Renovell; Prinetto, Paolo Ernesto; J., Figueras
On the impact of supply voltage variation on the statistical reliability of a Spin-transfer-torque MRAM (STT-MRAM)
In corso di stampa Vatajelu, ELENA IOANA; R., Rodriguez Montañés; Indaco, Marco; M., Renovell; Prinetto, Paolo Ernesto; J., Figueras
Security Primitives (PUF and TRNG) with STT-MRAM
2016 Vatajelu, ELENA IOANA; Di Natale, G.; Prinetto, Paolo Ernesto
STT-MRAM-based PUF architecture exploiting magnetic tunnel junction fabrication-induced variability
2016 Vatajelu, ELENA IOANA; Di Natale, Giorgio; Barbareschi, Mario; Torres, Lionel; Indaco, Marco; Prinetto, Paolo Ernesto
Towards a Highly Reliable SRAM-based PUFs
2016 Vatajelu, ELENA IOANA; Di Natale, Giorgio; Prinetto, Paolo Ernesto
Nonvolatile Memories: Present and Future Challenges
2015 Vatajelu, ELENA IOANA; H., Aziza; C., Zambelli
Power-aware voltage tuning for STT-MRAM reliability
2015 Vatajelu, ELENA IOANA; Rodriguez Montanes, R.; DI CARLO, Stefano; Indaco, Marco; Renovell, M.; Prinetto, Paolo Ernesto; Figueras, J.
Read/Write Robustness Estimation Metrics for Spin Transfer Torque (STT) MRAM Cell
2015 Vatajelu, ELENA IOANA; Rodriguez Montañés, Rosa; Indaco, Marco; Renovell, Michel; Prinetto, Paolo Ernesto; Figueras, Joan
STT MRAM-Based PUFs
2015 Vatajelu, ELENA IOANA; G., Di Natale; Indaco, Marco; Prinetto, Paolo Ernesto
STT-MRAM cell reliability evaluation under process, voltage and temperature (PVT) variations
2015 Vatajelu, ELENA IOANA; Rodriguez Montanes, Rosa; Indaco, Marco; Prinetto, Paolo Ernesto; Figueras, Joan
STT-MRAM-based strong PUF architecture
2015 Vatajelu, ELENA IOANA; Di Natale, Giorgio; Torres, Lionel; Prinetto, Paolo Ernesto
On the impact of process variability and aging on the reliability of emerging memories (Embedded tutorial)2014 19th IEEE European Test Symposium (ETS)
2014 Indaco, Marco; Prinetto, Paolo Ernesto; Vatajelu, ELENA IOANA
| Citazione | Data di pubblicazione | Autori | File |
|---|---|---|---|
| New Metrics for Spin Transfer Torque (STT) MRAM Cell Robustness Estimation / Vatajelu, E.I., R., R.M., Indaco, M., M., R., Prinetto, P.E., J., F.. - ELETTRONICO. - (In corso di stampa). (Design, Automation & Test in Europe Conference 2015 ). | In corso di stampa | VATAJELU, ELENA IOANAINDACO, MARCOPRINETTO, Paolo Ernesto + | - |
| On the impact of supply voltage variation on the statistical reliability of a Spin-transfer-torque MRAM (STT-MRAM) / Vatajelu, E.I., R., R.M., Indaco, M., M., R., Prinetto, P.E., J., F.. - ELETTRONICO. - (In corso di stampa). (Design of Circuits and Integrated Systems Madrid ). | In corso di stampa | VATAJELU, ELENA IOANAINDACO, MARCOPRINETTO, Paolo Ernesto + | - |
| Security Primitives (PUF and TRNG) with STT-MRAM / Vatajelu, E.I., Di Natale, G., Prinetto, P.E.. - In: 2016 IEEE 34th VLSI Test Symposium (VTS). - ELETTRONICO. - 2016 IEEE 34th VLSI Test Symposium (VTS):(2016), pp. 1-4. (2016 IEEE 34th VLSI Test Symposium (VTS) ) [10.1109/VTS.2016.7477292]. | 1-gen-2016 | VATAJELU, ELENA IOANAPRINETTO, Paolo Ernesto + | - |
| STT-MRAM-based PUF architecture exploiting magnetic tunnel junction fabrication-induced variability / Vatajelu, E.I., Di Natale, G., Barbareschi, M., Torres, L., Indaco, M., Prinetto, P.E.. - In: ACM JOURNAL ON EMERGING TECHNOLOGIES IN COMPUTING SYSTEMS. - ISSN 1550-4832. - 13:1(2016), pp. 1-21. [10.1145/2790302] | 1-gen-2016 | VATAJELU, ELENA IOANAINDACO, MARCOPRINETTO, Paolo Ernesto + | 2790302.pdf |
| Towards a Highly Reliable SRAM-based PUFs / Vatajelu, E.I., Di Natale, G., Prinetto, P.E.. - ELETTRONICO. - (2016), pp. 273-276. (2016 Design, Automation & Test in Europe Conference & Exhibition (DATE) ) [10.3850/9783981537079_0753]. | 1-gen-2016 | VATAJELU, ELENA IOANAPRINETTO, Paolo Ernesto + | - |
| Nonvolatile Memories: Present and Future Challenges / Vatajelu, E.I., H., A., C., Z.. - ELETTRONICO. - (2015). (International Test Symposium 2014 ). | 1-gen-2015 | VATAJELU, ELENA IOANA + | - |
| Power-aware voltage tuning for STT-MRAM reliability / Vatajelu, E.I., Rodriguez Montanes, R., DI CARLO, S., Indaco, M., Renovell, M., Prinetto, P.E., Figueras, J.. - ELETTRONICO. - (2015), pp. 1-6. (20th IEEE European Test Symposium (ETS) Cluj-Napoca, RO 25-29 May 2015) [10.1109/ETS.2015.7138748]. | 1-gen-2015 | VATAJELU, ELENA IOANADI CARLO, STEFANOINDACO, MARCOPRINETTO, Paolo Ernesto + | ETS.2015.MRAM.pdf |
| Read/Write Robustness Estimation Metrics for Spin Transfer Torque (STT) MRAM Cell / Vatajelu, E.I., Rodriguez Montañés, R., Indaco, M., Renovell, M., Prinetto, P.E., Figueras, J.. - ELETTRONICO. - (2015), pp. 447-452. (2015 Design, Automation & Test in Europe Conference & Exhibition (DATE) ) [10.7873/DATE.2015.0822]. | 1-gen-2015 | VATAJELU, ELENA IOANAINDACO, MARCOPRINETTO, Paolo Ernesto + | - |
| STT MRAM-Based PUFs / Vatajelu, E.I., G., D.N., Indaco, M., Prinetto, P.E.. - ELETTRONICO. - (2015), pp. 872-875. (Design, Automation and Test in Europe ) [10.7873/DATE.2015.0505]. | 1-gen-2015 | VATAJELU, ELENA IOANAINDACO, MARCOPRINETTO, Paolo Ernesto + | 07092507.pdf |
| STT-MRAM cell reliability evaluation under process, voltage and temperature (PVT) variations / Vatajelu, E.I., Rodriguez Montanes, R., Indaco, M., Prinetto, P.E., Figueras, J.. - ELETTRONICO. - (2015), pp. 1-6. (2015 10th IEEE International Conference on Design and Technology of Integrated Systems in Nanoscale Era, DTIS 2015 ita 2015) [10.1109/DTIS.2015.7127377]. | 1-gen-2015 | VATAJELU, ELENA IOANAINDACO, MARCOPRINETTO, Paolo Ernesto + | - |
| STT-MRAM-based strong PUF architecture / Vatajelu, E.I., Di Natale, G., Torres, L., Prinetto, P.E.. - ELETTRONICO. - 07-10-:(2015), pp. 467-472. (IEEE Computer Society Annual Symposium on VLSI, ISVLSI 2015 fra 2015) [10.1109/ISVLSI.2015.128]. | 1-gen-2015 | VATAJELU, ELENA IOANAPRINETTO, Paolo Ernesto + | - |
| On the impact of process variability and aging on the reliability of emerging memories (Embedded tutorial)2014 19th IEEE European Test Symposium (ETS) / Indaco, M., Prinetto, P.E., Vatajelu, E.I.. - ELETTRONICO. - (2014), pp. 1-10. (European Test Symposium 2014 ) [10.1109/ETS.2014.6847813]. | 1-gen-2014 | INDACO, MARCOPRINETTO, Paolo ErnestoVATAJELU, ELENA IOANA | - |