Archivio Istituzionale della RicercaBOSIO, ALBERTO
DEAR-CNN: Data-Efficient Assessment of Resiliency in Convolutional Neural Networks
2025 Bellarmino, Nicolo'; Bosio, Alberto; Cantoro, Riccardo; Ruospo, Annachiara; Sanchez, Ernesto
Investigating on Gradient Regularization for Testing Neural Networks
2025 Bellarmino, Nicolo; Bosio, Alberto; Cantoro, Riccardo; Ruospo, Annachiara; Sanchez, Ernesto; Squillero, Giovanni
Special Session: Reliability Assessment Recipes for DNN Accelerators
2024 Ahmadilivani, Mohammad Hasan; Bosio, Alberto; Deveautour, Bastien; Santos, Fernando Fernandes Dos; Guerrero-Balaguera, Juan-David; Jenihhin, Maksim; Kritikakou, Angeliki; Limas Sierra, Robert; Pappalardo, Salvatore; Raik, Jaan; Rodriguez Condia, Josie E.; Sonza Reorda, Matteo; Taheri, Mahdi; Traiola, Marcello
Special Session: Approximation and Fault Resiliency of DNN Accelerators
2023 Ahmadilivani, Mh; Barbareschi, M; Barone, S; Bosio, A; Daneshtalab, M; Della Torca, S; Gavarini, G; Jenihhin, M; Raik, J; Ruospo, A; Sanchez, E; Taheri, M
Cross-layer soft-error resilience analysis of computing systems
2020 Bosio, A.; Canal, R.; Di Carlo, S.; Gizopoulos, D.; Savino, A.
Design, Verification, Test and In-Field Implications of Approximate Computing Systems
2020 Bosio, A.; Di Carlo, S.; Girard, P.; Sanchez, E.; Savino, A.; Sekanina, L.; Traiola, M.; Vasicek, Z.; Virazel, A.
On the Analysis of Real-time Operating System Reliability in Embedded Systems
2020 Mamone, Dario; Bosio, Alberto; Savino, Alessandro; Hamdioui, Said; Rebaudengo, Maurizio
An Effective Fault-Injection Framework for Memory Reliability Enhancement Perspectives
2017 Harcha, Ghita; Girard, Patrick; Virazel, Arnaud; Bosio, Alberto; Bernardi, Paolo
An effective approach for functional test programs compaction
2016 Touati, A.; Bosio, Alberto; Girard, P.; Virazel, A.; Bernardi, Paolo; SONZA REORDA, Matteo
A Functional Verification based Fault Injection Environment
2007 Benso, Alfredo; Bosio, Alberto; DI CARLO, Stefano; Mariani, R.
Automating the IEEE std. 1500 compliance verification for embedded cores
2007 Benso, Alfredo; DI CARLO, Stefano; Prinetto, Paolo Ernesto; Bosio, Alberto
A 22n March Test for Realistic Static Linked Faults in SRAMs
2006 Benso, Alfredo; Bosio, Alberto; DI CARLO, Stefano; DI NATALE, Giorgio; Prinetto, Paolo Ernesto
A Black-Box-Oriented Test Methodology
2006 Benso, Alfredo; Bosio, Alberto; Prinetto, Paolo Ernesto; Savino, Alessandro
A tool for teaching memory testing based on BIST
2006 Fischerova, M.; Pikula, T.; Simlastik, M.; Bosio, Alberto; DI CARLO, Stefano; DI NATALE, Giorgio
A Unique March Test Algorithm for the Wide Spread of Realistic Memory Faults in SRAMs
2006 Benso, Alfredo; Bosio, Alberto; DI CARLO, Stefano; DI NATALE, Giorgio; Prinetto, Paolo Ernesto
ATPG for Dynamic Burn-In Test in Full-Scan Circuits
2006 Benso, Alfredo; Bosio, Alberto; DI CARLO, Stefano; DI NATALE, Giorgio; Prinetto, Paolo Ernesto
Automatic March tests generation for multi-port SRAMs
2006 Benso, Alfredo; Bosio, Alberto; DI CARLO, Stefano; DI NATALE, Giorgio; Prinetto, Paolo Ernesto
Automatic March Tests Generations for Static Linked Faults in SRAMs
2006 Benso, Alfredo; Bosio, Alberto; DI CARLO, Stefano; DI NATALE, Giorgio; Prinetto, Paolo Ernesto
Interactive Educational Tool for Memory Testing
2006 Bosio, Alberto; DI CARLO, Stefano; DI NATALE, Giorgio; Fisherova, M.; Pikula, T.; Simlastik, M.
Memory Fault Simulator for Static-Linked Faults
2006 Benso, Alfredo; Bosio, Alberto; DI CARLO, Stefano; DI NATALE, Giorgio; Prinetto, Paolo Ernesto
| Citazione | Data di pubblicazione | Autori | File |
|---|---|---|---|
| DEAR-CNN: Data-Efficient Assessment of Resiliency in Convolutional Neural Networks / Bellarmino, N., Bosio, A., Cantoro, R., Ruospo, A., Sanchez, E.. - ELETTRONICO. - (2025), pp. 13-18. (28th IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS) Lyon (FRA) May 5-7, 2025) [10.1109/DDECS63720.2025.11006797]. | 1-gen-2025 | Nicolo' BellarminoAlberto BosioRiccardo CantoroAnnachiara RuospoErnesto Sanchez | 2025_DDECS_DNN_TEST_COMPACTION_CONFERENCE (1).pdf; DEAR-CNN_Data-Efficient_Assessment_of_Resiliency_in_Convolutional_Neural_Networks.pdf |
| Investigating on Gradient Regularization for Testing Neural Networks / Bellarmino, N., Bosio, A., Cantoro, R., Ruospo, A., Sanchez, E., Squillero, G.. - ELETTRONICO. - 15509:(2025), pp. 67-81. (10th International Conference on machine Learning, Optimization and Data science (LOD 2024) Castiglione della Pescaia (ITA) September 22 – 25, 2024) [10.1007/978-3-031-82484-5_6]. | 1-gen-2025 | Bellarmino, NicoloBosio, AlbertoCantoro, RiccardoRuospo, AnnachiaraSanchez, ErnestoSquillero, Giovanni | 2024_LOD_GRADIENT_PENALIZATION.pdf; 978-3-031-82484-5_6.pdf |
| Special Session: Reliability Assessment Recipes for DNN Accelerators / Ahmadilivani, M.H., Bosio, A., Deveautour, B., Santos, F.F.D., Guerrero-Balaguera, J., Jenihhin, M., Kritikakou, A., Limas Sierra, R., Pappalardo, S., Raik, J., Rodriguez Condia, J.E., Sonza Reorda, M., Taheri, M., Traiola, M.. - ELETTRONICO. - (2024). (2024 IEEE 42nd VLSI Test Symposium (VTS) Tempe (USA) 22-24 April 2024) [10.1109/vts60656.2024.10538707]. | 1-gen-2024 | Bosio, AlbertoGuerrero-Balaguera, Juan-DavidLimas Sierra, RobertRodriguez Condia, Josie E.Sonza Reorda, Matteo + | Special_Session_Reliability_Assessment_Recipes_for_DNN_Accelerators.pdf |
| Special Session: Approximation and Fault Resiliency of DNN Accelerators / Ahmadilivani, M.h., Barbareschi, M., Barone, S., Bosio, A., Daneshtalab, M., Della Torca, S., Gavarini, G., Jenihhin, M., Raik, J., Ruospo, A., Sanchez, E., Taheri, M.. - (2023), pp. 1-10. (2023 IEEE 41st VLSI Test Symposium (VTS) San Diego (USA) 24-26 April 2023) [10.1109/VTS56346.2023.10140043]. | 1-gen-2023 | Barone, SBosio, AGavarini, GRuospo, ASanchez, E + | Special_Session_Approximation_and_Fault_Resiliency_of_DNN_Accelerators.pdf |
| Cross-layer soft-error resilience analysis of computing systems / Bosio, A., Canal, R., Di Carlo, S., Gizopoulos, D., Savino, A.. - STAMPA. - (2020), pp. 79-79. (50th Annual IEEE/IFIP International Conference on Dependable Systems and Networks: Supplemental Volume, DSN-S 2020 Valencia, Spain, Spain 29 June-2 July 2020) [10.1109/DSN-S50200.2020.00042]. | 1-gen-2020 | Bosio A.Di Carlo S.Savino A. + | 09159134.pdf; one_page_tutorial.pdf |
| Design, Verification, Test and In-Field Implications of Approximate Computing Systems / Bosio, A., Di Carlo, S., Girard, P., Sanchez, E., Savino, A., Sekanina, L., Traiola, M., Vasicek, Z., Virazel, A.. - STAMPA. - (2020), pp. 1-10. (2020 IEEE European Test Symposium (ETS) Tallinn, Estonia, Estonia 25-29 May 2020) [10.1109/ETS48528.2020.9131557]. | 1-gen-2020 | Bosio, A.Di Carlo, S.Sanchez, E.Savino, A. + | 09131557.pdf; paper.pdf |
| On the Analysis of Real-time Operating System Reliability in Embedded Systems / Mamone, D., Bosio, A., Savino, A., Hamdioui, S., Rebaudengo, M.. - STAMPA. - (2020), pp. 1-6. (33rd IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems Frascati, Italy, Italy 19-21 Oct. 2020) [10.1109/DFT50435.2020.9250861]. | 1-gen-2020 | Bosio, AlbertoSavino, AlessandroRebaudengo, Maurizio + | 09250861.pdf; camera_ready.pdf |
| An Effective Fault-Injection Framework for Memory Reliability Enhancement Perspectives / Harcha, G., Girard, P., Virazel, A., Bosio, A., Bernardi, P.. - (2017). (Design &Technology of Integrated Systems in Nanoscale Era ). | 1-gen-2017 | BOSIO, ALBERTOBERNARDI, PAOLO + | - |
| An effective approach for functional test programs compaction / Touati, A., Bosio, A., Girard, P., Virazel, A., Bernardi, P., SONZA REORDA, M.. - STAMPA. - (2016), pp. 1-6. (19th IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems, DDECS 2016 svk 2016) [10.1109/DDECS.2016.7482466]. | 1-gen-2016 | BOSIO, ALBERTOBERNARDI, PAOLOSONZA REORDA, Matteo + | - |
| A Functional Verification based Fault Injection Environment / Benso, A., Bosio, A., DI CARLO, S., Mariani, R.. - STAMPA. - (2007), pp. 114-122. (IEEE 22nd International Symposium on Defect and Fault Tolerance in VLSI Systems (DFTS) Roma, IT 26-28 Sept. 2007) [10.1109/DFT.2007.31]. | 1-gen-2007 | BENSO, AlfredoBOSIO, ALBERTODI CARLO, STEFANO + | 2007-DFT-FaultSim.pdf |
| Automating the IEEE std. 1500 compliance verification for embedded cores / Benso, A., DI CARLO, S., Prinetto, P.E., Bosio, A.. - STAMPA. - (2007), pp. 171-178. (IEEE International High Level Design Validation and Test Workshop (HLDVT) Irvine (CA), USA 7-9 Nov. 2007) [10.1109/HLDVT.2007.4392810]. | 1-gen-2007 | BENSO, AlfredoDI CARLO, STEFANOPRINETTO, Paolo ErnestoBOSIO, ALBERTO | 2007-HLDVT-IEEE1500.pdf |
| A 22n March Test for Realistic Static Linked Faults in SRAMs / Benso, A., Bosio, A., DI CARLO, S., DI NATALE, G., Prinetto, P.E.. - STAMPA. - (2006), pp. 49-54. (IEEE 11th European Test Symposium (ETS) SouthAmpton, UK 21-24 May 2006) [10.1109/ETS.2006.2]. | 1-gen-2006 | BENSO, AlfredoBOSIO, ALBERTODI CARLO, STEFANODI NATALE, GiorgioPRINETTO, Paolo Ernesto | 2006-ETS-March.pdf |
| A Black-Box-Oriented Test Methodology / Benso, A., Bosio, A., Prinetto, P.E., Savino, A.. - STAMPA. - (2006), pp. 11-15. (IEEE East-West Design & Test Workshop (EWDTW06) Sochi (Russia) Sept. 15-19, 2006). | 1-gen-2006 | BENSO, AlfredoBOSIO, ALBERTOPRINETTO, Paolo ErnestoSAVINO, ALESSANDRO | - |
| A tool for teaching memory testing based on BIST / Fischerova, M., Pikula, T., Simlastik, M., Bosio, A., DI CARLO, S., DI NATALE, G.. - STAMPA. - (2006), pp. 187-190. (IEEE International Biennal Baltic Electronics Conference (BEC) Tallin, EE 2-4 Oct. 2006) [10.1109/BEC.2006.311094]. | 1-gen-2006 | BOSIO, ALBERTODI CARLO, STEFANODI NATALE, Giorgio + | 2006-BEC-MemoryApplets-AuthorVersion.pdf |
| A Unique March Test Algorithm for the Wide Spread of Realistic Memory Faults in SRAMs / Benso, A., Bosio, A., DI CARLO, S., DI NATALE, G., Prinetto, P.E.. - STAMPA. - (2006), pp. 155-156. (IEEE 9th Workshop on Design and Diagnostics of Electronic Circuits and Systems (DDECS) Prague, CZ 18-21 Apr. 2006) [10.1109/DDECS.2006.1649602]. | 1-gen-2006 | BENSO, AlfredoBOSIO, ALBERTODI CARLO, STEFANODI NATALE, GiorgioPRINETTO, Paolo Ernesto | 2006-DDECS-MarchTest.pdf |
| ATPG for Dynamic Burn-In Test in Full-Scan Circuits / Benso, A., Bosio, A., DI CARLO, S., DI NATALE, G., Prinetto, P.E.. - STAMPA. - (2006), pp. 75-82. (IEEE 15th Asian Test Symposium (ATS) Fukuoka, JP 20-23 Nov. 2006) [10.1109/ATS.2006.260996]. | 1-gen-2006 | BENSO, AlfredoBOSIO, ALBERTODI CARLO, STEFANODI NATALE, GiorgioPRINETTO, Paolo Ernesto | 2006-ATS-BurnIn.pdf |
| Automatic March tests generation for multi-port SRAMs / Benso, A., Bosio, A., DI CARLO, S., DI NATALE, G., Prinetto, P.E.. - STAMPA. - (2006), pp. 385-392. (IEEE 3rd International Workshop on Electronic Design, Test and Applications (DELTA) Kuala Lumpur, MY 17-19 Jan. 2006) [10.1109/DELTA.2006.17]. | 1-gen-2006 | BENSO, AlfredoBOSIO, ALBERTODI CARLO, STEFANODI NATALE, GiorgioPRINETTO, Paolo Ernesto | 2006-DELTA-Multiport.pdf |
| Automatic March Tests Generations for Static Linked Faults in SRAMs / Benso, A., Bosio, A., DI CARLO, S., DI NATALE, G., Prinetto, P.E.. - STAMPA. - 1:(2006), pp. 1-6. (Design, Automation and Test in Europe, Conference and Exhibition (DATE) Munich, DE 6-10 Mar. 2006) [10.1109/DATE.2006.244097]. | 1-gen-2006 | BENSO, AlfredoBOSIO, ALBERTODI CARLO, STEFANODI NATALE, GiorgioPRINETTO, Paolo Ernesto | 2006-DATE-MarchTest.pdf |
| Interactive Educational Tool for Memory Testing / Bosio, A., DI CARLO, S., DI NATALE, G., Fisherova, M., Pikula, T., Simlastik, M.. - STAMPA. - (2006), pp. 100-103. (6th International Workshop on Microelectronic Education Stockholm, SE 8-9 Jun. 2006). | 1-gen-2006 | BOSIO, ALBERTODI CARLO, STEFANODI NATALE, Giorgio + | 2006-EWME-MemApplet-AuthorVersion.pdf |
| Memory Fault Simulator for Static-Linked Faults / Benso, A., Bosio, A., DI CARLO, S., DI NATALE, G., Prinetto, P.E.. - STAMPA. - (2006), pp. 31-36. (IEEE 15th AsianTest Symposium (ATS) Fukuoka, JP 20-23 Nov. 2006) [10.1109/ATS.2006.260989]. | 1-gen-2006 | BENSO, AlfredoBOSIO, ALBERTODI CARLO, STEFANODI NATALE, GiorgioPRINETTO, Paolo Ernesto | 2006-ATS-MemorySim.pdf; 2006-ATS-MemorySim-AuthorVersion.pdf |