Memories are one of the most important components in digital systems like SoCs. The high density of their cell array makes memories extremely vulnerable to physical defects. Hence, memory testing and Design-for-Test became one of the crucial tasks in the design of complex and heterogeneous SoCs. Politecnico di Torino and the Institute of Informatics have a wide experience in the field of RAM testing (i.e., automatic march test generation, fault simulators, memory BIST generators etc.). This work is a tentative to put the joint experience of our research groups in developing an interactive educational tool for the students that should introduce standard and well-known methods of memory testing based on BIST. The MemBIST Java Applet and the March Test Generator were two individual tools designed and implemented at the two mentioned institutions. They were merged into one tool in order to facilitate its usage also by the professionals.
Interactive Educational Tool for Memory Testing / Bosio, Alberto; DI CARLO, Stefano; DI NATALE, Giorgio; Fisherova, M.; Pikula, T.; Simlastik, M.. - STAMPA. - (2006), pp. 100-103. (Intervento presentato al convegno 6th International Workshop on Microelectronic Education tenutosi a Stockholm, SE nel 8-9 Jun. 2006).
Interactive Educational Tool for Memory Testing
BOSIO, ALBERTO;DI CARLO, STEFANO;DI NATALE, Giorgio;
2006
Abstract
Memories are one of the most important components in digital systems like SoCs. The high density of their cell array makes memories extremely vulnerable to physical defects. Hence, memory testing and Design-for-Test became one of the crucial tasks in the design of complex and heterogeneous SoCs. Politecnico di Torino and the Institute of Informatics have a wide experience in the field of RAM testing (i.e., automatic march test generation, fault simulators, memory BIST generators etc.). This work is a tentative to put the joint experience of our research groups in developing an interactive educational tool for the students that should introduce standard and well-known methods of memory testing based on BIST. The MemBIST Java Applet and the March Test Generator were two individual tools designed and implemented at the two mentioned institutions. They were merged into one tool in order to facilitate its usage also by the professionals.File | Dimensione | Formato | |
---|---|---|---|
2006-EWME-MemApplet-AuthorVersion.pdf
accesso aperto
Descrizione: Manuscript author version
Tipologia:
2. Post-print / Author's Accepted Manuscript
Licenza:
Pubblico - Tutti i diritti riservati
Dimensione
5 MB
Formato
Adobe PDF
|
5 MB | Adobe PDF | Visualizza/Apri |
Pubblicazioni consigliate
I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.
https://hdl.handle.net/11583/1499979
Attenzione
Attenzione! I dati visualizzati non sono stati sottoposti a validazione da parte dell'ateneo