Archivio Istituzionale della RicercaThe paper presents a tool that explains and demonstrates the essentials of RAM testing and memory built-in self-test. It also generates the BIST structure for the given memory matrix together with a march test which is provided by the march test generator according to the defined list of faults. The developed system was implemented as a Java applet what means its good compatibility regarding different hardware and operating system platforms, its safety and accessibility while it is placed on Internet. The presented tool has been utilised as the educational instrument in laboratory works.
A tool for teaching memory testing based on BIST / Fischerova, M.; Pikula, T.; Simlastik, M.; Bosio, Alberto; DI CARLO, Stefano; DI NATALE, Giorgio. - STAMPA. - (2006), pp. 187-190. (Intervento presentato al convegno IEEE International Biennal Baltic Electronics Conference (BEC) tenutosi a Tallin, EE nel 2-4 Oct. 2006) [10.1109/BEC.2006.311094].
A tool for teaching memory testing based on BIST
BOSIO, ALBERTO;DI CARLO, STEFANO;DI NATALE, Giorgio
2006
Abstract
The paper presents a tool that explains and demonstrates the essentials of RAM testing and memory built-in self-test. It also generates the BIST structure for the given memory matrix together with a march test which is provided by the march test generator according to the defined list of faults. The developed system was implemented as a Java applet what means its good compatibility regarding different hardware and operating system platforms, its safety and accessibility while it is placed on Internet. The presented tool has been utilised as the educational instrument in laboratory works.
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2006-BEC-MemoryApplets-AuthorVersion.pdf
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https://hdl.handle.net/11583/1499973
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