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EnglishMemory testing commonly faces two issues: the characterisation of detailed and realistic fault models, and the definition of time-efficient test algorithms able to detect them. Among the different types of algorithms proposed for testing static random access memories (SRAMs), march tests have proven to be faster, simpler and regularly structured. The continuous evolution of the memory technology requires the constant introduction of new classes of faults, such as dynamic and linked faults. Presented here is March AB, a march test targeting realistic memory static linked faults and dynamic unlinked faults. Comparison results show that the proposed march test provides the same fault coverage of already published algorithms reducing the test complexity and therefore the test time
March AB, a State-of-the-Art March Test for Realistic Static Linked Faults and Dynamic Faults in SRAMs / Bosio A.; Di Carlo S.; Di Natale G.; Prinetto P.. - In: IET COMPUTERS & DIGITAL TECHNIQUES. - ISSN 1751-8601. - STAMPA. - 1:3(2007), pp. 237-245. [10.1049/iet-cdt:20060137]
| Titolo: | March AB, a State-of-the-Art March Test for Realistic Static Linked Faults and Dynamic Faults in SRAMs | |
| Autori: | ||
| Data di pubblicazione: | 2007 | |
| Rivista: | ||
| Digital Object Identifier (DOI): | http://dx.doi.org/10.1049/iet-cdt:20060137 | |
| Appare nelle tipologie: | 1.1 Articolo in rivista |
File in questo prodotto:
| File | Descrizione | Tipologia | Licenza | |
|---|---|---|---|---|
| 2007-IET-CDT-MarchAB-AuthorVersion.pdf | Manuscript author version | 2. Post-print / Author's Accepted Manuscript | PUBBLICO - Tutti i diritti riservati | Visibile a tuttiVisualizza/Apri |
| 10.1049_iet-cdt_20060137.pdf | 2. Post-print / Author's Accepted Manuscript | Non Pubblico - Accesso privato/ristretto | Administrator Richiedi una copia |
http://hdl.handle.net/11583/1499980
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