A Multi-Label Active Learning Framework for Microcontroller Performance Screening

In safety-critical applications, microcontrollers have to be tested to satisfy strict quality and performances constraints. It has been demonstrated that on-chip ring oscillators can be be used as speed monitors to reliably predict the performances. However, any machine-learning model is likely to be inaccurate if trained on an inadequate dataset, and labeling data for training is quite a costly process. In this paper, we present a methodology based on active learning to select the best samples to be included in the training set, significantly reducing the time and cost required. Moreover, since different speed measurements are available, we designed a multi-label technique to take advantage of their correlations. Experimental results demonstrate that the approach halves the training-set size, with respect to a random labelling, while it increases the predictive accuracy, with respect to standard single-label machine-learning models.