Archivio Istituzionale della RicercaFEZZA, LORENZO
FEZZA, LORENZO
Dipartimento di Automatica e Informatica
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Exploiting spatial and temporal consistency for fault detection in semantic segmentation NN for indoor and outdoor exploration
2026 Fezza, Lorenzo; Porsia, Antonio; Ruospo, Annachiara; Sanchez, Ernesto; Sonza Reorda, Matteo; Turco, Vittorio
APSS Metrics for Fault Detection: Area, Position, Symmetry, and Shape in Image Segmentation
2025 Turco, Vittorio; Fezza, Lorenzo; Ruospo, Annachiara; Sanchez, Ernesto; Sonza Reorda, Matteo
| Citazione | Data di pubblicazione | Autori | File |
|---|---|---|---|
| Exploiting spatial and temporal consistency for fault detection in semantic segmentation NN for indoor and outdoor exploration / Fezza, L., Porsia, A., Ruospo, A., Sanchez, E., Sonza Reorda, M., Turco, V.. - In: MICROPROCESSORS AND MICROSYSTEMS. - ISSN 0141-9331. - ELETTRONICO. - 124:(2026). [10.1016/j.micpro.2026.105306] | 1-gen-2026 | Fezza, LorenzoPorsia, AntonioRuospo, AnnachiaraSanchez, ErnestoSonza Reorda, MatteoTurco, Vittorio | 1-s2.0-S0141933126000633-main.pdf |
| APSS Metrics for Fault Detection: Area, Position, Symmetry, and Shape in Image Segmentation / Turco, V., Fezza, L., Ruospo, A., Sanchez, E., Sonza Reorda, M.. - ELETTRONICO. - (2025). (DFT 2025 38th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems Barcellona (ESP) 21-23 October 2025) [10.1109/DFT66274.2025.11257474]. | 1-gen-2025 | Turco, VittorioFezza, LorenzoRuospo, AnnachiaraSanchez, ErnestoSonza Reorda, Matteo | DFT25___Segmentation_metrics.pdf; APSS_Metrics_for_Fault_Detection_Area_Position_Symmetry_and_Shape_in_Image_Segmentation.pdf |