Archivio Istituzionale della RicercaPERLO, GIACOMO
PERLO, GIACOMO
Dipartimento di Automatica e Informatica
112740
Advances in Testing and Reliability Benchmarks
2026 Angione, Francesco; Bernardi, Paolo; Giardino, Nicola Di Gruttola; Filipponi, Gabriele; Iaria, Giusy; Perlo, Giacomo; Pomeranz, Irith; Porsia, Antonio; Ruospo, Annachiara; Sanchez, Ernesto; Turco, Vittorio
Emulating SDC-1 Hardware Faults Through Application Level Bit-Flip Injections in QNNs
2026 Perlo, Giacomo; Porsia, Antonio; Ruospo, Annachiara; Sanchez, Ernesto
Vectorized in-Place CRC: a Zero Memory-Overhead Fault Detection Scheme for QNNs on RISC-V
2026 Perlo, G.; Ruospo, A.; Sanchez, E.
Image Test Libraries for the in-field test of ultra-low-power devices
2025 Porsia, Antonio; Perlo, Giacomo; Ruospo, Annachiara; Sanchez, Ernesto
On the resilience of INT8 Quantized Neural Networks on Low-Power RISC-V Devices
2025 Porsia, Antonio; Perlo, Giacomo; Ruospo, Annachiara; Sanchez, Ernesto
| Citazione | Data di pubblicazione | Autori | File |
|---|---|---|---|
| Advances in Testing and Reliability Benchmarks / Angione, F., Bernardi, P., Giardino, N.D.G., Filipponi, G., Iaria, G., Perlo, G., Pomeranz, I., Porsia, A., Ruospo, A., Sanchez, E., Turco, V.. - (2026), pp. 1-10. (31st IEEE European Test Symposium, ETS 2026 Chania (GRC) 25-29 May 2026) [10.1109/ets69887.2026.11591740]. | 1-gen-2026 | Angione, FrancescoBernardi, PaoloGiardino, Nicola Di GruttolaFilipponi, GabrieleIaria, GiusyPerlo, GiacomoPorsia, AntonioRuospo, AnnachiaraSanchez, ErnestoTurco, Vittorio + | Advances_in_Testing_and_Reliability_Benchmarks.pdf |
| Emulating SDC-1 Hardware Faults Through Application Level Bit-Flip Injections in QNNs / Perlo, G., Porsia, A., Ruospo, A., Sanchez, E.. - ELETTRONICO. - (2026), pp. 1-6. (2026 IEEE 27th Latin American Test Symposium (LATS) Florianópolis (BRA) 17-20 March 2026) [10.1109/lats70329.2026.11480360]. | 1-gen-2026 | Perlo, GiacomoPorsia, AntonioRuospo, AnnachiaraSanchez, Ernesto | - |
| Vectorized in-Place CRC: a Zero Memory-Overhead Fault Detection Scheme for QNNs on RISC-V / Perlo, G., Ruospo, A., Sanchez, E.. - ELETTRONICO. - (2026), pp. 1-7. (2026 IEEE 32nd International Symposium on On-Line Testing and Robust System Design (IOLTS) Polignano a Mare (IT) 01-03 July 2026) [10.1109/IOLTS69666.2026.11633783]. | 1-gen-2026 | Perlo G.Ruospo A.Sanchez E. | - |
| Image Test Libraries for the in-field test of ultra-low-power devices / Porsia, A., Perlo, G., Ruospo, A., Sanchez, E.. - ELETTRONICO. - (2025). (Latin American Test Workshop, LATW San Andrés (Colombia) 11-14 March 2025) [10.1109/LATS65346.2025.10963940]. | 1-gen-2025 | Porsia, AntonioPerlo, GiacomoRuospo, AnnachiaraSanchez, Ernesto | LATS25_ITL-3.pdf; Image_Test_Libraries_for_the_In-Field_Test_of_Ultra-Low-Power_Devices.pdf |
| On the resilience of INT8 Quantized Neural Networks on Low-Power RISC-V Devices / Porsia, A., Perlo, G., Ruospo, A., Sanchez, E.. - (2025), pp. 119-122. (AxC’25 The 10th Workshop on Approximate Computing Naples (Ita) June 23-26, 2025) [10.1109/DSN-W65791.2025.00049]. | 1-gen-2025 | Antonio PorsiaGiacomo PerloAnnachiara RuospoErnesto Sanchez | AxC2025.pdf; On_the_Resilience_of_INT8_Quantized_Neural_Networks_on_Low-Power_RISC-V_Devices.pdf |