Archivio Istituzionale della RicercaThis paper encompasses three contributions by university professors and researchers. The presentations vary from the state-of-the-art of VLSI benchmarks for testing and reliability and their importance for the research community, to the advent of new benchmarks to address the current complexity gap with industrial designs and enable researchers to effectively validate their methodologies.
Advances in Testing and Reliability Benchmarks / Angione, F., Bernardi, P., Giardino, N.D.G., Filipponi, G., Iaria, G., Perlo, G., Pomeranz, I., Porsia, A., Ruospo, A., Sanchez, E., Turco, V.. - (2026), pp. 1-10. (31st IEEE European Test Symposium, ETS 2026 Chania (GRC) 25-29 May 2026) [10.1109/ets69887.2026.11591740].
Advances in Testing and Reliability Benchmarks
Angione, Francesco;Bernardi, Paolo;Giardino, Nicola Di Gruttola;Filipponi, Gabriele;Iaria, Giusy;Perlo, Giacomo;Porsia, Antonio;Ruospo, Annachiara;Sanchez, Ernesto;Turco, Vittorio
2026
Abstract
This paper encompasses three contributions by university professors and researchers. The presentations vary from the state-of-the-art of VLSI benchmarks for testing and reliability and their importance for the research community, to the advent of new benchmarks to address the current complexity gap with industrial designs and enable researchers to effectively validate their methodologies.
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https://hdl.handle.net/11583/3013706