Archivio Istituzionale della RicercaFILIPPONI, GABRIELE
FILIPPONI, GABRIELE
Dipartimento di Automatica e Informatica
067548
A System-Level Test Methodology for Communication Peripherals in System-on-Chips
2024 Angione, Francesco; Bernardi, Paolo; DI GRUTTOLA GIARDINO, Nicola; Filipponi, Gabriele; Bertani, Claudia; Tancorre, Vincenzo
Logic Diagnosis Based on Logic Built-In Self-Test Signatures Collected In-Field from Failing System-on-Chips
2024 Bernardi, Paolo; Filipponi, Gabriele; Iaria, Giusy; Bertani, Claudia; Tancorre, Vincenzo
Collecting diagnostic information through dichotomic search from Logic BIST of failing in-field automotive SoCs with delay faults
2023 Bernardi, Paolo; Filipponi, Gabriele; Reorda, Matteo Sonza; Appello, Davide; Bertani, Claudia; Tancorre, Vincenzo
Low cost external serial interface watchdog for SoCs and FPGAs automatic characterization tests
2023 Bernardi, Paolo; Filipponi, Gabriele; Foscale, Tommaso; Insinga, Giorgio
An Optimized Burn-In Stress Flow targeting Interconnections logic to Embedded Memories in Automotive Systems-on-Chip
2022 Angione, Francesco; Bernardi, Paolo; Filipponi, Gabriele; SONZA REORDA, Matteo; Appello, Davide; Tancorre, Vincenzo; Ugioli, Roberto
In-field Data Collection System through Logic BIST for large Automotive Systems-on-Chip
2022 Filipponi, G.; Iaria, G.; Sonza Reorda, M.; Appello, D.; Garozzo, G.; Tancorre, V.
Online scheduling of concurrent Memory BISTs execution at Real-Time Operating-System level
2022 Angione, Francesco; Bernardi, Paolo; Filipponi, Gabriele; Tempesta, Claudia; SONZA REORDA, Matteo; Appello, Davide; Ugioli, Roberto; Tancorre, Vincenzo
| Citazione | Data di pubblicazione | Autori | File |
|---|---|---|---|
| A System-Level Test Methodology for Communication Peripherals in System-on-Chips / Angione, Francesco; Bernardi, Paolo; DI GRUTTOLA GIARDINO, Nicola; Filipponi, Gabriele; Bertani, Claudia; Tancorre, Vincenzo. - In: IEEE TRANSACTIONS ON COMPUTERS. - ISSN 0018-9340. - (2024). [10.1109/TC.2024.3500375] | 1-gen-2024 | Francesco AngionePaolo BernardiNicola di Gruttola GiardinoGabriele Filipponi + | A_System-Level_Test_Methodology_for_Communication_Peripherals_in_System-on-Chips.pdf |
| Logic Diagnosis Based on Logic Built-In Self-Test Signatures Collected In-Field from Failing System-on-Chips / Bernardi, Paolo; Filipponi, Gabriele; Iaria, Giusy; Bertani, Claudia; Tancorre, Vincenzo. - In: ELECTRONICS. - ISSN 2079-9292. - 13:21(2024). [10.3390/electronics13214234] | 1-gen-2024 | Paolo BernardiGabriele FilipponiGiusy Iaria + | electronics-13-04234.pdf |
| Collecting diagnostic information through dichotomic search from Logic BIST of failing in-field automotive SoCs with delay faults / Bernardi, Paolo; Filipponi, Gabriele; Reorda, Matteo Sonza; Appello, Davide; Bertani, Claudia; Tancorre, Vincenzo. - ELETTRONICO. - (2023), pp. 21-26. (Intervento presentato al convegno International Symposium on Design and Diagnostics of Electronic Circuits and Systems tenutosi a Tallinn (Estonia) nel 03-05 May 2023) [10.1109/DDECS57882.2023.10139670]. | 1-gen-2023 | Bernardi, PaoloFilipponi, GabrieleReorda, Matteo Sonza + | 2023058710.pdf; Collecting_diagnostic_information_through_dichotomic_search_from_Logic_BIST_of_failing_in-field_automotive_SoCs_with_delay_faults.pdf |
| Low cost external serial interface watchdog for SoCs and FPGAs automatic characterization tests / Bernardi, Paolo; Filipponi, Gabriele; Foscale, Tommaso; Insinga, Giorgio. - (2023). (Intervento presentato al convegno IEEE Latin-American Test Symposium tenutosi a Veracruz (Mexico) nel 21-24 March 2023) [10.1109/LATS58125.2023.10154486]. | 1-gen-2023 | Bernardi, PaoloFilipponi, GabrieleFoscale, TommasoInsinga, Giorgio | LATS_2023.pdf; Low_cost_external_serial_interface_watchdog_for_SoCs_and_FPGAs_automatic_characterization_tests.pdf |
| An Optimized Burn-In Stress Flow targeting Interconnections logic to Embedded Memories in Automotive Systems-on-Chip / Angione, Francesco; Bernardi, Paolo; Filipponi, Gabriele; SONZA REORDA, Matteo; Appello, Davide; Tancorre, Vincenzo; Ugioli, Roberto. - (2022), pp. 1-6. (Intervento presentato al convegno IEEE European Test Symposium tenutosi a Barcelona (Spain) nel 23-27 May 2022) [10.1109/ETS54262.2022.9810396]. | 1-gen-2022 | Francesco ANGIONEPaolo BERNARDIGabriele FILIPPONIMatteo SONZA REORDA + | An_Optimized_Burn-In_Stress_Flow_targeting_Interconnections_logic_to_Embedded_Memories_in_Automotive_Systems-on-Chip.pdf |
| In-field Data Collection System through Logic BIST for large Automotive Systems-on-Chip / Filipponi, G.; Iaria, G.; Sonza Reorda, M.; Appello, D.; Garozzo, G.; Tancorre, V.. - (2022), pp. 646-649. (Intervento presentato al convegno 2022 IEEE International Test Conference (ITC) tenutosi a Anaheim (USA) nel 23-30 September 2022) [10.1109/ITC50671.2022.00090]. | 1-gen-2022 | Filipponi, G.Iaria, G.Sonza Reorda, M. + | In-field_Data_Collection_System_through_Logic_BIST_for_large_Automotive_Systems-on-Chip.pdf |
| Online scheduling of concurrent Memory BISTs execution at Real-Time Operating-System level / Angione, Francesco; Bernardi, Paolo; Filipponi, Gabriele; Tempesta, Claudia; SONZA REORDA, Matteo; Appello, Davide; Ugioli, Roberto; Tancorre, Vincenzo. - (2022). (Intervento presentato al convegno International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems tenutosi a Austin (USA) nel 19-21 October 2022) [10.1109/DFT56152.2022.9962338]. | 1-gen-2022 | Francesco AngionePaolo BernardiGabriele FilipponiClaudia TempestaMatteo Sonza Reorda + | Online_scheduling_of_concurrent_Memory_BISTs_execution_at_Real-Time_Operating-System_level.pdf |