FILIPPONI, GABRIELE

FILIPPONI, GABRIELE  

Dipartimento di Automatica e Informatica  

067548  

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Citazione Data di pubblicazione Autori File
Collecting diagnostic information through dichotomic search from Logic BIST of failing in-field automotive SoCs with delay faults / Bernardi, Paolo; Filipponi, Gabriele; Reorda, Matteo Sonza; Appello, Davide; Bertani, Claudia; Tancorre, Vincenzo. - ELETTRONICO. - (2023), pp. 21-26. (Intervento presentato al convegno International Symposium on Design and Diagnostics of Electronic Circuits and Systems tenutosi a Tallinn (Estonia) nel 03-05 May 2023) [10.1109/DDECS57882.2023.10139670]. 1-gen-2023 Bernardi, PaoloFilipponi, GabrieleReorda, Matteo Sonza + 2023058710.pdfCollecting_diagnostic_information_through_dichotomic_search_from_Logic_BIST_of_failing_in-field_automotive_SoCs_with_delay_faults.pdf
Low cost external serial interface watchdog for SoCs and FPGAs automatic characterization tests / Bernardi, Paolo; Filipponi, Gabriele; Foscale, Tommaso; Insinga, Giorgio. - (2023). (Intervento presentato al convegno IEEE Latin-American Test Symposium tenutosi a Veracruz (Mexico) nel 21-24 March 2023) [10.1109/LATS58125.2023.10154486]. 1-gen-2023 Bernardi, PaoloFilipponi, GabrieleFoscale, TommasoInsinga, Giorgio LATS_2023.pdfLow_cost_external_serial_interface_watchdog_for_SoCs_and_FPGAs_automatic_characterization_tests.pdf
An Optimized Burn-In Stress Flow targeting Interconnections logic to Embedded Memories in Automotive Systems-on-Chip / Angione, Francesco; Bernardi, Paolo; Filipponi, Gabriele; SONZA REORDA, Matteo; Appello, Davide; Tancorre, Vincenzo; Ugioli, Roberto. - (2022), pp. 1-6. (Intervento presentato al convegno IEEE European Test Symposium tenutosi a Barcelona (Spain) nel 23-27 May 2022) [10.1109/ETS54262.2022.9810396]. 1-gen-2022 Francesco ANGIONEPaolo BERNARDIGabriele FILIPPONIMatteo SONZA REORDA + An_Optimized_Burn-In_Stress_Flow_targeting_Interconnections_logic_to_Embedded_Memories_in_Automotive_Systems-on-Chip.pdf
In-field Data Collection System through Logic BIST for large Automotive Systems-on-Chip / Filipponi, G.; Iaria, G.; Sonza Reorda, M.; Appello, D.; Garozzo, G.; Tancorre, V.. - (2022), pp. 646-649. (Intervento presentato al convegno 2022 IEEE International Test Conference (ITC) tenutosi a Anaheim (USA) nel 23-30 September 2022) [10.1109/ITC50671.2022.00090]. 1-gen-2022 Filipponi, G.Iaria, G.Sonza Reorda, M. + In-field_Data_Collection_System_through_Logic_BIST_for_large_Automotive_Systems-on-Chip.pdf
Online scheduling of concurrent Memory BISTs execution at Real-Time Operating-System level / Angione, Francesco; Bernardi, Paolo; Filipponi, Gabriele; Tempesta, Claudia; SONZA REORDA, Matteo; Appello, Davide; Ugioli, Roberto; Tancorre, Vincenzo. - (2022). (Intervento presentato al convegno International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems tenutosi a Austin (USA) nel 19-21 October 2022) [10.1109/DFT56152.2022.9962338]. 1-gen-2022 Francesco AngionePaolo BernardiGabriele FilipponiClaudia TempestaMatteo Sonza Reorda + Online_scheduling_of_concurrent_Memory_BISTs_execution_at_Real-Time_Operating-System_level.pdf