FILIPPONI, GABRIELE
FILIPPONI, GABRIELE
Dipartimento di Automatica e Informatica
067548
Netlist-Independent Functional Stress Pattern generation strategy for AI HW Accelerators embedded into SoCs
2026 Filipponi, Gabriele; Schwachhofer, Denis; Angione, Francesco; Bertani, Claudia; Corbellini, Simone; Di Gruttola Giardino, Nicola; Garozzo, Giuseppe; Insinga, Giorgio; Tancorre, Vincenzo; Bernardi, Paolo
A System-Level Test Methodology for Communication Peripherals in System-on-Chips
2025 Angione, Francesco; Bernardi, Paolo; Di Gruttola Giardino, Nicola; Filipponi, Gabriele; Bertani, Claudia; Tancorre, Vincenzo
Logic Diagnosis Based on Logic Built-In Self-Test Signatures Collected In-Field from Failing System-on-Chips
2024 Bernardi, Paolo; Filipponi, Gabriele; Iaria, Giusy; Bertani, Claudia; Tancorre, Vincenzo
| Citazione | Data di pubblicazione | Autori | File |
|---|---|---|---|
| Netlist-Independent Functional Stress Pattern generation strategy for AI HW Accelerators embedded into SoCs / Filipponi, Gabriele; Schwachhofer, Denis; Angione, Francesco; Bertani, Claudia; Corbellini, Simone; Di Gruttola Giardino, Nicola; Garozzo, Giuseppe; Insinga, Giorgio; Tancorre, Vincenzo; Bernardi, Paolo. - In: IEEE TRANSACTIONS ON COMPUTERS. - ISSN 1557-9956. - 75:2(2026), pp. 554-566. | 1-gen-2026 | Gabriele FilipponiFrancesco AngioneSimone CorbelliniNicola di Gruttola GiardinoGiorgio InsingaPaolo Bernardi + | Netlist-Independent_Functional_Stress_Pattern_Generation_Strategy_for_AI_HW_Accelerators_Embedded_into_SoCs.pdf |
| A System-Level Test Methodology for Communication Peripherals in System-on-Chips / Angione, Francesco; Bernardi, Paolo; Di Gruttola Giardino, Nicola; Filipponi, Gabriele; Bertani, Claudia; Tancorre, Vincenzo. - In: IEEE TRANSACTIONS ON COMPUTERS. - ISSN 0018-9340. - 74:2(2025), pp. 731-739. [10.1109/TC.2024.3500375] | 1-gen-2025 | Francesco AngionePaolo BernardiNicola di Gruttola GiardinoGabriele Filipponi + | A_System-Level_Test_Methodology_for_Communication_Peripherals_in_System-on-Chips.pdf |
| Logic Diagnosis Based on Logic Built-In Self-Test Signatures Collected In-Field from Failing System-on-Chips / Bernardi, Paolo; Filipponi, Gabriele; Iaria, Giusy; Bertani, Claudia; Tancorre, Vincenzo. - In: ELECTRONICS. - ISSN 2079-9292. - 13:21(2024). [10.3390/electronics13214234] | 1-gen-2024 | Paolo BernardiGabriele FilipponiGiusy Iaria + | electronics-13-04234.pdf |