In-field Data Collection System through Logic BIST for large Automotive Systems-on-Chip

Embedded nano-electronic systems are becoming more prevalent in people's daily lives. As a result, chip and embedded system manufacturing has become increasingly complicated and huge in recent years. Considering safety-critical sectors, such as automotive, it is evident how managing system anomalies and defects becomes vital. Thus, it is necessary to develop and investigate innovative methodologies that can guarantee high reliability despite modern Systems-on-Chip's complexity in critical safety fields. Significant attempts were made to market incredibly reliable microelectronic components. In order to ensure the reliability of the devices, the Automotive field has also started focusing on collecting large amounts of data from car fleets. The data are collected in-field during the life cycle of the devices and create effective feedback for designers and manufacturers. This paper proposes a methodology to store and collect data from key-on and key-off tests performed by Logic BIST for an industrial case study produced by STMicroelectronics.