Archivio Istituzionale della RicercaPIUMATTI, DAVIDE
PIUMATTI, DAVIDE
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On the integration and hardening of Software Test Libraries in Real-Time Operating Systems
2023 Angione, Francesco; Bernardi, Paolo; Cantoro, Riccardo; Di Gruttola Giardino, Nicola; Piumatti, Davide; Reorda, Matteo Sonza; Appello, Davide; Tancorre, Vincenzo
An innovative Strategy to Quickly Grade Functional Test Programs
2022 Angione, Francesco; Bernardi, Paolo; Calabrese, Andrea; Cardone, Lorenzo; Niccoletti, Alessandro; Piumatti, Davide; Quer, Stefano; Appello, Davide; Tancorre, Vincenzo; Ugioli, Roberto
A Suitability analysis of software based testing strategies for the on-line testing of artificial neural networks applications in embedded devices
2021 Ruospo, A.; Piumatti, D.; Floridia, A.; Sanchez, E.
Deterministic Cache-based Execution of On-line Self-Test Routines in Multi-core Automotive System-on-Chips
2020 Floridia, Andrea; Carmona, Tzamn Melendez; Piumatti, Davide; Ruospo, Annachiara; Sanchez, Ernesto; Luca, Sergio De; Martorana, Rosario; Pernice, Mose Alessandro
Testing Heatsink Faults in Power Transistors by means of Thermal Model
2020 Piumatti, Davide; Quitadamo, Matteo Vincenzo; Reorda, Matteo Sonza; Fiori, Franco
A Decentralized Scheduler for On-line Self-test Routines in Multi-core Automotive System-on-Chips
2019 Floridia, Andrea; Piumatti, Davide; Ruospo, Annachiara; Ernesto, Sanchez; Sergio De Luca, ; Rosario, Martorana
Assessing the Effectiveness of the Test of Power Devices at the Board Level
2019 Piumatti, Davide; Borlo, Stefano; Mandrile, Fabio; SONZA REORDA, Matteo; Bojoi, IUSTIN RADU
Facilitating Fault-Simulation Comprehension through a Fault-Lists Analysis Tool
2019 Bernardi, P.; Piumatti, D.; Sanchez, E.
Hybrid on-line self-test architecture for computational units on embedded processor cores
2019 Floridia, Andrea; Mongano, Gianmarco; Piumatti, Davide; Sanchez, Ernesto
New categories of Safe Faults in a processor-based Embedded System
2019 Gursoy, C.; Jenihhin, M.; Oyeniran, A. S.; Piumatti, D.; Raik, J.; Reorda, M. Sonza; Ubar, R.
Non-Intrusive Self-Test Library for Automotive Critical Applications: Constraints and Solutions
2019 Bernardi, P.; Cantoro, R.; Floridia, A.; Piumatti, D.; Pogonea, C.; Ruospo, A.; Sanchez, E.; De Luca, S.; Sansonetti, A.
About on-line functionally untestable fault identification in microprocessor cores for safety-critical applications
2018 Cantoro, R.; Firrincieli, Andrea; Piumatti, D.; Restifo, M.; Sanchez, E.; Reorda, M. Sonza
Assessing Test Procedure Effectiveness for Power Devices
2018 Piumatti, Davide; Sonza Reorda, M.
Parallel software-based self-test suite for multi-core system-on-chip: Migration from single-core to multi-core automotive microcontrollers
2018 Floridia, A.; Piumatti, D.; Sanchez, E.; De Luca, S.; Sansonetti, A.
On the In-field Testing of Spare Modules in Automotive Microprocessors
2017 Piumatti, Davide; Bernardi, Paolo; SANCHEZ SANCHEZ, EDGAR ERNESTO; Regis, Simone; Luca, Segio De; Sansonetti, Alessandro
Robustness in Automotive Electronics: an industrial overview of major concerns
2017 Backhausen, Ulrich; Ballan, Oscar; Bernardi, Paolo; Luca, Sergio De; Henzler, Julie; Kern, Thomas; Piumatti, Davide; Rabenalt, Thomas; Ramamoorthy, Krishnapriya Chakiat; SANCHEZ SANCHEZ, EDGAR ERNESTO; Sansonetti, Alessandro; Ullmann, Rudolf; Venini, Federico; Wiesner, Robert
In-field functional test programs development flow for embedded FPUs
2016 Cantoro, Riccardo; Piumatti, Davide; Bernardi, Paolo; De Luca, S.; Sansonetti, A.
Software-based self-test techniques of computational modules in dual issue embedded processors
2015 Bernardi, Paolo; Bovi, C.; Cantoro, Riccardo; De Luca, S.; Meregalli, R.; Piumatti, Davide; SANCHEZ SANCHEZ, Edgar Ernesto; Sansonetti, A.
| Citazione | Data di pubblicazione | Autori | File |
|---|---|---|---|
| On the integration and hardening of Software Test Libraries in Real-Time Operating Systems / Angione, Francesco; Bernardi, Paolo; Cantoro, Riccardo; Di Gruttola Giardino, Nicola; Piumatti, Davide; Reorda, Matteo Sonza; Appello, Davide; Tancorre, Vincenzo. - (2023), pp. 1-6. (Intervento presentato al convegno Latin American Test Symposium tenutosi a Veracruz (Mexico) nel 21-24 March 2023) [10.1109/LATS58125.2023.10154492]. | 1-gen-2023 | Angione, FrancescoBernardi, PaoloCantoro, RiccardoDi Gruttola Giardino, NicolaPiumatti, DavideReorda, Matteo Sonza + | On_the_integration_and_hardening_of_Software_Test_Libraries_in_Real-Time_Operating_Systems.pdf |
| An innovative Strategy to Quickly Grade Functional Test Programs / Angione, Francesco; Bernardi, Paolo; Calabrese, Andrea; Cardone, Lorenzo; Niccoletti, Alessandro; Piumatti, Davide; Quer, Stefano; Appello, Davide; Tancorre, Vincenzo; Ugioli, Roberto. - (2022), pp. 355-364. (Intervento presentato al convegno International Test Conference tenutosi a Anaheim, CA (USA) nel 23-30 September 2022) [10.1109/ITC50671.2022.00044]. | 1-gen-2022 | Francesco AngionePaolo BernardiAndrea CalabreseLorenzo CardoneDavide PiumattiStefano Quer + | An_innovative_Strategy_to_Quickly_Grade_Functional_Test_Programs.pdf |
| A Suitability analysis of software based testing strategies for the on-line testing of artificial neural networks applications in embedded devices / Ruospo, A.; Piumatti, D.; Floridia, A.; Sanchez, E.. - ELETTRONICO. - (2021), pp. 1-6. (Intervento presentato al convegno 27th IEEE International Symposium on On-Line Testing and Robust System Design, IOLTS 2021 tenutosi a Torino, Italy nel 2021) [10.1109/IOLTS52814.2021.9486704]. | 1-gen-2021 | Ruospo A.Piumatti D.Floridia A.Sanchez E. | FINAL_PUBLISHED.pdf |
| Deterministic Cache-based Execution of On-line Self-Test Routines in Multi-core Automotive System-on-Chips / Floridia, Andrea; Carmona, Tzamn Melendez; Piumatti, Davide; Ruospo, Annachiara; Sanchez, Ernesto; Luca, Sergio De; Martorana, Rosario; Pernice, Mose Alessandro. - ELETTRONICO. - (2020), pp. 1235-1240. (Intervento presentato al convegno 2020 Design, Automation & Test in Europe Conference & Exhibition (DATE) tenutosi a Grenoble, France nel 9-13 March, 2020) [10.23919/DATE48585.2020.9116239]. | 1-gen-2020 | Floridia, AndreaPiumatti, DavideRuospo, AnnachiaraSanchez, Ernesto + | DATE_CACHES.pdf; post_print_IEEE.pdf |
| Testing Heatsink Faults in Power Transistors by means of Thermal Model / Piumatti, Davide; Quitadamo, Matteo Vincenzo; Reorda, Matteo Sonza; Fiori, Franco. - (2020), pp. 1-6. (Intervento presentato al convegno 21st IEEE Latin-American Test Symposium (LATS20) tenutosi a Jatiúca (Maceió), Brazil nel 30th March - 2nd April 2020) [10.1109/LATS49555.2020.9093674]. | 1-gen-2020 | Piumatti, DavideQuitadamo, Matteo VincenzoReorda, Matteo SonzaFiori, Franco | 09093674.pdf; Thermal_faults_V_4_CR_no_layout_editoriale.pdf |
| A Decentralized Scheduler for On-line Self-test Routines in Multi-core Automotive System-on-Chips / Floridia, Andrea; Piumatti, Davide; Ruospo, Annachiara; Ernesto, Sanchez; Sergio De Luca, ; Rosario, Martorana. - ELETTRONICO. - (2019), pp. 1-10. (Intervento presentato al convegno 2019 IEEE International Test Conference (ITC) tenutosi a Washington (USA) nel 9 - 15 November, 2019) [10.1109/ITC44170.2019.9000129]. | 1-gen-2019 | Andrea FloridiaDavide PiumattiRUOSPO, ANNACHIARAErnesto Sanchez + | pre_print_IEEE.pdf; post_print_IEEE.pdf |
| Assessing the Effectiveness of the Test of Power Devices at the Board Level / Piumatti, Davide; Borlo, Stefano; Mandrile, Fabio; SONZA REORDA, Matteo; Bojoi, IUSTIN RADU. - 2019 34th Conference on Design of Circuits and Integrated Systems, DCIS 2019:(2019), pp. 1-6. (Intervento presentato al convegno 34th IEEE Conference on Design of Circuits and Integrated Systems (DCIS 19) tenutosi a Bilbao, Spain nel November 20 – 22, 2019) [10.1109/DCIS201949030.2019.8959845]. | 1-gen-2019 | Davide PiumattiBORLO, STEFANOFabio MandrileMatteo Sonza ReordaRadu Bojoi | Assessing the Effectiveness of the Test of Power Devices at the Board Level (5C7B5).pdf; 08959845.pdf |
| Facilitating Fault-Simulation Comprehension through a Fault-Lists Analysis Tool / Bernardi, P.; Piumatti, D.; Sanchez, E.. - ELETTRONICO. - (2019), pp. 77-80. (Intervento presentato al convegno 10th IEEE Latin American Symposium on Circuits and Systems 2019 (LASCAS19) tenutosi a Armenia, Quindío, Colombia nel February 24 - 27, 2019) [10.1109/LASCAS.2019.8667573]. | 1-gen-2019 | Bernardi, P.Piumatti, D.Sanchez, E. | - |
| Hybrid on-line self-test architecture for computational units on embedded processor cores / Floridia, Andrea; Mongano, Gianmarco; Piumatti, Davide; Sanchez, Ernesto. - IEEE DDECS19:(2019), pp. 1-6. (Intervento presentato al convegno Design and Diagnostics of Electronic Circuits and Systems (DDECS) tenutosi a Cluj-Napoca nel April 24-26, 2019) [10.1109/DDECS.2019.8724647]. | 1-gen-2019 | Floridia, AndreaPiumatti, DavideSanchez, Ernesto + | - |
| New categories of Safe Faults in a processor-based Embedded System / Gursoy, C.; Jenihhin, M.; Oyeniran, A. S.; Piumatti, D.; Raik, J.; Reorda, M. Sonza; Ubar, R.. - DDECS19:(2019), pp. 1-4. (Intervento presentato al convegno Design and Diagnostics of Electronic Circuits and Systems (DDECS) tenutosi a Cluj-Napoca nel April 24-26, 2019) [10.1109/DDECS.2019.8724642]. | 1-gen-2019 | Piumatti, D.Reorda, M. Sonza + | - |
| Non-Intrusive Self-Test Library for Automotive Critical Applications: Constraints and Solutions / Bernardi, P.; Cantoro, R.; Floridia, A.; Piumatti, D.; Pogonea, C.; Ruospo, A.; Sanchez, E.; De Luca, S.; Sansonetti, A.. - IEEE DATE 2019:(2019), pp. 920-923. (Intervento presentato al convegno Design, Automation and Test in Europe; DATE 2019) [10.23919/DATE.2019.8714780]. | 1-gen-2019 | Bernardi, P.Cantoro, R.Floridia, A.Piumatti, D.Ruospo, A.Sanchez, E. + | - |
| About on-line functionally untestable fault identification in microprocessor cores for safety-critical applications / Cantoro, R.; Firrincieli, Andrea; Piumatti, D.; Restifo, M.; Sanchez, E.; Reorda, M. Sonza. - STAMPA. - 2018-:(2018), pp. 1-6. (Intervento presentato al convegno 19th IEEE Latin-American Test Symposium, LATS 2018 tenutosi a bra nel 2018) [10.1109/LATW.2018.8349679]. | 1-gen-2018 | Cantoro, R.FIRRINCIELI, ANDREAPiumatti, D.Restifo, M.Sanchez, E.Reorda, M. Sonza | lats18 preprint.pdf |
| Assessing Test Procedure Effectiveness for Power Devices / Piumatti, Davide; Sonza Reorda, M.. - ELETTRONICO. - 2018:(2018), pp. 1-6. (Intervento presentato al convegno 33th IEEE Conference on Design of Circuits and Integrated Systems tenutosi a Lione, Francia nel November 14-16 2018) [10.1109/DCIS.2018.8681495]. | 1-gen-2018 | PIUMATTI, DAVIDEM. Sonza Reorda | - |
| Parallel software-based self-test suite for multi-core system-on-chip: Migration from single-core to multi-core automotive microcontrollers / Floridia, A.; Piumatti, D.; Sanchez, E.; De Luca, S.; Sansonetti, A.. - STAMPA. - (2018), pp. 1-6. (Intervento presentato al convegno 2018 13th International Conference on Design & Technology of Integrated Systems In Nanoscale Era (DTIS) tenutosi a Taormina, Italy nel 9-12 April 2018) [10.1109/DTIS.2018.8368558]. | 1-gen-2018 | Floridia, A.Piumatti, D.Sanchez, E. + | - |
| On the In-field Testing of Spare Modules in Automotive Microprocessors / Piumatti, Davide; Bernardi, Paolo; SANCHEZ SANCHEZ, EDGAR ERNESTO; Regis, Simone; Luca, Segio De; Sansonetti, Alessandro. - (2017). (Intervento presentato al convegno 25th IFIP/IEEE International Conference on Very Large Scale Integration (VLSI-SoC)). | 1-gen-2017 | PIUMATTI, DAVIDEBERNARDI, PAOLOSANCHEZ SANCHEZ, EDGAR ERNESTO + | - |
| Robustness in Automotive Electronics: an industrial overview of major concerns / Backhausen, Ulrich; Ballan, Oscar; Bernardi, Paolo; Luca, Sergio De; Henzler, Julie; Kern, Thomas; Piumatti, Davide; Rabenalt, Thomas; Ramamoorthy, Krishnapriya Chakiat; SANCHEZ SANCHEZ, EDGAR ERNESTO; Sansonetti, Alessandro; Ullmann, Rudolf; Venini, Federico; Wiesner, Robert. - (2017). (Intervento presentato al convegno 23rd IEEE International Symposium on On-Line Testing and Robust System Design). | 1-gen-2017 | BERNARDI, PAOLOPIUMATTI, DAVIDESANCHEZ SANCHEZ, EDGAR ERNESTOVENINI, FEDERICO + | - |
| In-field functional test programs development flow for embedded FPUs / Cantoro, Riccardo; Piumatti, Davide; Bernardi, Paolo; De Luca, S.; Sansonetti, A.. - STAMPA. - (2016), pp. 107-110. (Intervento presentato al convegno 2016 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) tenutosi a Storrs (USA) nel 19-20 Sept. 2016) [10.1109/DFT.2016.7684079]. | 1-gen-2016 | CANTORO, RICCARDOPIUMATTI, DAVIDEBERNARDI, PAOLO + | - |
| Software-based self-test techniques of computational modules in dual issue embedded processors / Bernardi, Paolo; Bovi, C.; Cantoro, Riccardo; De Luca, S.; Meregalli, R.; Piumatti, Davide; SANCHEZ SANCHEZ, Edgar Ernesto; Sansonetti, A.. - STAMPA. - (2015), pp. 1-2. (Intervento presentato al convegno 2015 20th IEEE European Test Symposium (ETS) tenutosi a Cluj-Napoca nel 25-29 May 2015) [10.1109/ETS.2015.7138730]. | 1-gen-2015 | BERNARDI, PAOLOCANTORO, RICCARDOPIUMATTI, DAVIDESANCHEZ SANCHEZ, Edgar Ernesto + | - |