Archivio Istituzionale della RicercaSelf-Test strategies for testing embedded processors are increasingly diffused. In this paper, we describe a set of self-test techniques tackling dual issue embedded processors. The paper details how to produce test programs suitable to detect stuck-at faults in computational modules belonging to dual issue processors. The proposed technique is aimed at extending single issue test programs; results are illustrated for a 32-bit processor included in an automotive System-on-Chip manufactured by STMicroelectronics and implementing a dual issue strategy with static dispatch of instructions.
Software-based self-test techniques of computational modules in dual issue embedded processors / Bernardi, P., Bovi, C., Cantoro, R., De Luca, S., Meregalli, R., Piumatti, D., SANCHEZ SANCHEZ, E.E., Sansonetti, A.. - STAMPA. - (2015), pp. 1-2. (2015 20th IEEE European Test Symposium (ETS) Cluj-Napoca 25-29 May 2015) [10.1109/ETS.2015.7138730].
Software-based self-test techniques of computational modules in dual issue embedded processors
BERNARDI, PAOLO;CANTORO, RICCARDO;PIUMATTI, DAVIDE;SANCHEZ SANCHEZ, Edgar Ernesto;
2015
Abstract
Self-Test strategies for testing embedded processors are increasingly diffused. In this paper, we describe a set of self-test techniques tackling dual issue embedded processors. The paper details how to produce test programs suitable to detect stuck-at faults in computational modules belonging to dual issue processors. The proposed technique is aimed at extending single issue test programs; results are illustrated for a 32-bit processor included in an automotive System-on-Chip manufactured by STMicroelectronics and implementing a dual issue strategy with static dispatch of instructions.
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https://hdl.handle.net/11583/2616967
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