Software-based self-test techniques of computational modules in dual issue embedded processors

Self-Test strategies for testing embedded processors are increasingly diffused. In this paper, we describe a set of self-test techniques tackling dual issue embedded processors. The paper details how to produce test programs suitable to detect stuck-at faults in computational modules belonging to dual issue processors. The proposed technique is aimed at extending single issue test programs; results are illustrated for a 32-bit processor included in an automotive System-on-Chip manufactured by STMicroelectronics and implementing a dual issue strategy with static dispatch of instructions.