Archivio Istituzionale della RicercaQUITADAMO, MATTEO VINCENZO
QUITADAMO, MATTEO VINCENZO
Dipartimento di Elettronica e Telecomunicazioni
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Risultati 1 - 11 di 11 (tempo di esecuzione: 0.015 secondi).
A New Technique to Check the Correct Mounting of the Power Module Heatsinks
2022 Quitadamo, Matteo Vincenzo; Piumatti, Davide; Raviola, Erica; Fiori, Franco; Sonza Reorda, Matteo
A SPICE model of Operational Amplifiers for Electromagnetic Compatibility Analysis
2022 Quitadamo, MATTEO VINCENZO; Fiori, Franco
Investigations on Operating Condition Variations in Open-Loop Active Gate Drivers
2021 Raviola, Erica; Quitadamo, Matteo Vincenzo; Fiori, Franco
Optimal Tuning of AGDs Parameters and a Technique for Testing the Correct Mounting of Heatsinks on Power Transistors
2021 Quitadamo, MATTEO VINCENZO
Faults Detection in the Heatsinks Mounted on Power Electronic Transistors
2020 Quitadamo, Matteo V.; Piumatti, Davide; SONZA REORDA, Matteo; Fiori, Franco
Test Solution for Heatsinks in Power Electronics Applications
2020 Piumatti, Davide; Borlo, Stefano; Quitadamo, Matteo Vincenzo; Sonza Reorda, Matteo; Giacomo Armando, Eric; Fiori, Franco
Testing Heatsink Faults in Power Transistors by means of Thermal Model
2020 Piumatti, Davide; Quitadamo, Matteo Vincenzo; Reorda, Matteo Sonza; Fiori, Franco
A Criterion for an Optimal Switching of Power Transistors
2019 Quitadamo, MATTEO VINCENZO; Raviola, Erica; Fiori, Franco
Investigation on the Switching Waveforms of GaN Power Devices to Gate Current Profiles
2019 Quitadamo, MATTEO VINCENZO; Raviola, Erica; Fiori, Franco
Novel Solutions to Reduce the EM Emissions of Power Switching Circuits
2019 Fiori, Franco; Quitadamo, MATTEO VINCENZO; Perotti, Michele
A New Approach to Characterize Complex ICs in Terms of Scattering Parameters
2017 Quitadamo, Matteo Vincenzo; Fiori, Franco
| Citazione | Data di pubblicazione | Autori | File |
|---|---|---|---|
| A New Technique to Check the Correct Mounting of the Power Module Heatsinks / Quitadamo, Matteo Vincenzo; Piumatti, Davide; Raviola, Erica; Fiori, Franco; Sonza Reorda, Matteo. - In: MICROELECTRONICS RELIABILITY. - ISSN 0026-2714. - ELETTRONICO. - 128:(2022). [10.1016/j.microrel.2021.114416] | 1-gen-2022 | Quitadamo, Matteo VincenzoPiumatti, DavideRaviola, EricaFiori, FrancoSonza Reorda, Matteo | Termico_FINALpoof.pdf; 1-s2.0-S0026271421003826-main.pdf |
| A SPICE model of Operational Amplifiers for Electromagnetic Compatibility Analysis / Quitadamo, MATTEO VINCENZO; Fiori, Franco. - In: IEEE TRANSACTIONS ON ELECTROMAGNETIC COMPATIBILITY. - ISSN 0018-9375. - STAMPA. - 64:2(2022), pp. 418-428. [10.1109/TEMC.2021.3135114] | 1-gen-2022 | Quitadamo Matteo VincenzoFiori Franco | FINAL VERSION.pdf; Fiori-ASpice.pdf |
| Investigations on Operating Condition Variations in Open-Loop Active Gate Drivers / Raviola, Erica; Quitadamo, Matteo Vincenzo; Fiori, Franco. - ELETTRONICO. - 1:(2021), pp. 1-2. (Intervento presentato al convegno 52nd ANNUAL MEETING OF THE ASSOCIAZIONE SOCIETÀ ITALIANA DI ELETTRONICA tenutosi a Trieste, Italy nel 7-9 July 2021). | 1-gen-2021 | Raviola, EricaQuitadamo, Matteo VincenzoFiori, Franco | SIE-2021_paper_48.pdf |
| Optimal Tuning of AGDs Parameters and a Technique for Testing the Correct Mounting of Heatsinks on Power Transistors / Quitadamo, MATTEO VINCENZO. - (2021 Dec 10), pp. 1-157. | 10-dic-2021 | QUITADAMO, MATTEO VINCENZO | conv_thesis_quitadamo_s251963.pdf; conv_abstract_quitadamo_s251963.pdf |
| Faults Detection in the Heatsinks Mounted on Power Electronic Transistors / Quitadamo, Matteo V.; Piumatti, Davide; SONZA REORDA, Matteo; Fiori, Franco. - In: INTERNATIONAL JOURNAL OF ELECTRICAL AND ELECTRONIC ENGINEERING AND TELECOMMUNICATIONS. - ISSN 2319-2518. - STAMPA. - 9:4(2020), pp. 206-212. [10.18178/ijeetc.9.4.206-212] | 1-gen-2020 | Matteo V. QuitadamoDavide PiumattiMatteo Sonza ReordaFranco Fiori | 5fad2e2165a91658384c85f25b0f4f87d3ef.pdf |
| Test Solution for Heatsinks in Power Electronics Applications / Piumatti, Davide; Borlo, Stefano; Quitadamo, Matteo Vincenzo; Sonza Reorda, Matteo; Giacomo Armando, Eric; Fiori, Franco. - In: ELECTRONICS. - ISSN 2079-9292. - ELETTRONICO. - 9:6(2020), pp. 1-15. [10.3390/electronics9061020] | 1-gen-2020 | Piumatti, DavideBorlo, StefanoQuitadamo, Matteo VincenzoSonza Reorda, MatteoGiacomo Armando, EricFiori, Franco | electronics-09-01020.pdf |
| Testing Heatsink Faults in Power Transistors by means of Thermal Model / Piumatti, Davide; Quitadamo, Matteo Vincenzo; Reorda, Matteo Sonza; Fiori, Franco. - (2020), pp. 1-6. (Intervento presentato al convegno 21st IEEE Latin-American Test Symposium (LATS20) tenutosi a Jatiúca (Maceió), Brazil nel 30th March - 2nd April 2020) [10.1109/LATS49555.2020.9093674]. | 1-gen-2020 | Piumatti, DavideQuitadamo, Matteo VincenzoReorda, Matteo SonzaFiori, Franco | 09093674.pdf; Thermal_faults_V_4_CR_no_layout_editoriale.pdf |
| A Criterion for an Optimal Switching of Power Transistors / Quitadamo, MATTEO VINCENZO; Raviola, Erica; Fiori, Franco. - STAMPA. - (2019). (Intervento presentato al convegno 2019 IEEE 12th Workshop on Electromagnetic Compatibility of Integrated Circuits (EMC Compo) tenutosi a Haining, Hangzhou (China) nel 21-23 October 2019) [10.1109/EMCCompo.2019.8919738]. | 1-gen-2019 | Matteo Vincenzo QuitadamoErica RaviolaFranco Fiori | DriverPaperConf_3pag.pdf; Fiori-ACriterion.pdf |
| Investigation on the Switching Waveforms of GaN Power Devices to Gate Current Profiles / Quitadamo, MATTEO VINCENZO; Raviola, Erica; Fiori, Franco. - STAMPA. - (2019). (Intervento presentato al convegno International Conference On Power Electronics, Control & Automation (ICPECA 2019) tenutosi a New Delhi (India) nel 16-17 November 2019) [10.1109/ICPECA47973.2019.8975559]. | 1-gen-2019 | Matteo Vincenzo QuitadamoErica RaviolaFranco Fiori | GaNDriverPaperConf2.pdf; Fiori-InvestigationOnThe.pdf |
| Novel Solutions to Reduce the EM Emissions of Power Switching Circuits / Fiori, Franco; Quitadamo, MATTEO VINCENZO; Perotti, Michele. - STAMPA. - (2019). (Intervento presentato al convegno 12th international workshop on the electromagnetic compatibility of integrated circuits tenutosi a Haining, Hangzhou, china nel 21-23 Ottobre 2019). | 1-gen-2019 | Franco FioriMatteo Vincenzo QuitadamoMichele Perotti | - |
| A New Approach to Characterize Complex ICs in Terms of Scattering Parameters / Quitadamo, Matteo Vincenzo; Fiori, Franco. - ELETTRONICO. - 1:(2017), pp. 148-149. (Intervento presentato al convegno 49TH ANNUAL MEETING OF THE ASSOCIAZIONE SOCIETÀ ITALIANA DI ELETTRONICA tenutosi a Palermo (Italy) nel 21-23 June 2017). | 1-gen-2017 | Quitadamo, Matteo VincenzoFiori, Franco | - |