QUITADAMO, MATTEO VINCENZO

QUITADAMO, MATTEO VINCENZO  

Dipartimento di Elettronica e Telecomunicazioni  

042900  

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Citazione Data di pubblicazione Autori File
A Criterion for an Optimal Switching of Power Transistors / Quitadamo, MATTEO VINCENZO; Raviola, Erica; Fiori, Franco. - STAMPA. - (2019). ((Intervento presentato al convegno 12th international workshop on the electromagnetic compatibility of integrated circuits tenutosi a Haining, Hangzhou, china nel 21-23 Ottobre 2019. 1-gen-2019 matteo vincenzo quitadamoRAVIOLA, ERICAfranco fiori DriverPaperConf_3pag.pdf
Faults Detection in the Heatsinks Mounted on Power Electronic Transistors / Quitadamo, Matteo V.; Piumatti, Davide; SONZA REORDA, Matteo; Fiori, Franco. - In: INTERNATIONAL JOURNAL OF ELECTRICAL AND ELECTRONIC ENGINEERING AND TELECOMMUNICATIONS. - ISSN 2319-2518. - STAMPA. - (2019). [10.18178/injeet.191001] 1-gen-2019 Matteo V. QuitadamoDavide PiumattiMatteo Sonza ReordaFranco Fiori 20191209042309355.pdf
Investigation on the Switching Waveforms of GaN Power Devices to Gate Current Profiles / Quitadamo, MATTEO VINCENZO; Raviola, Erica; Fiori, Franco. - STAMPA. - (2019). ((Intervento presentato al convegno International Conference On Power Electronics, Control & Automation (ICPECA 2019) tenutosi a New Delhi - India nel 16-17 novembre 2019. 1-gen-2019 Matteo Vincenzo QuitadamoErica RaviolaFranco Fiori GaNDriverPaperConf2.pdf
Investigations on Operating Condition Variations in Open-Loop Active Gate Drivers / Raviola, Erica; Quitadamo, Matteo Vincenzo; Fiori, Franco. - ELETTRONICO. - 1:(2021), pp. 1-2. ((Intervento presentato al convegno 52nd ANNUAL MEETING OF THE ASSOCIAZIONE SOCIETÀ ITALIANA DI ELETTRONICA tenutosi a Trieste, Italy nel 7-9 July 2021. 1-gen-2021 Raviola, EricaQuitadamo, Matteo VincenzoFiori, Franco SIE-2021_paper_48.pdf
A New Approach to Characterize Complex ICs in Terms of Scattering Parameters / Quitadamo, Matteo Vincenzo; Fiori, Franco. - ELETTRONICO. - 1:(2017), pp. 148-149. ((Intervento presentato al convegno 49TH ANNUAL MEETING OF THE ASSOCIAZIONE SOCIETÀ ITALIANA DI ELETTRONICA tenutosi a Palermo (Italy) nel 21-23 June 2017. 1-gen-2017 Quitadamo, Matteo VincenzoFiori, Franco SIE2017-Palermo-Book-of-Abstracts.pdf
A New Technique to Check the Correct Mounting of the Power Module Heatsinks / Quitadamo, Matteo Vincenzo; Piumatti, Davide; Raviola, Erica; Fiori, Franco; Sonza Reorda, Matteo. - In: MICROELECTRONICS RELIABILITY. - ISSN 0026-2714. - ELETTRONICO. - 128:(2022). [10.1016/j.microrel.2021.114416] 1-gen-2022 Quitadamo, Matteo VincenzoPiumatti, DavideRaviola, EricaFiori, FrancoSonza Reorda, Matteo Termico_FINALpoof.pdf1-s2.0-S0026271421003826-main.pdf
Novel Solutions to Reduce the EM Emissions of Power Switching Circuits / Fiori, Franco; Quitadamo, MATTEO VINCENZO; Perotti, Michele. - STAMPA. - (2019). ((Intervento presentato al convegno 12th international workshop on the electromagnetic compatibility of integrated circuits tenutosi a Haining, Hangzhou, china nel 21-23 Ottobre 2019. 1-gen-2019 Franco FioriMatteo Vincenzo QuitadamoMichele Perotti NovelSolutionsEMI_ff7_5.pdf
Optimal Tuning of AGDs Parameters and a Technique for Testing the Correct Mounting of Heatsinks on Power Transistors / Quitadamo, MATTEO VINCENZO. - (2021 Dec 10), pp. 1-157. 10-dic-2021 QUITADAMO, MATTEO VINCENZO conv_thesis_quitadamo_s251963.pdfconv_abstract_quitadamo_s251963.pdf
A SPICE model of Operational Amplifiers for Electromagnetic Compatibility Analysis / Quitadamo, MATTEO VINCENZO; Fiori, Franco. - In: IEEE TRANSACTIONS ON ELECTROMAGNETIC COMPATIBILITY. - ISSN 0018-9375. - STAMPA. - 64:2(2022), pp. 418-428. [10.1109/TEMC.2021.3135114] 1-gen-2022 Quitadamo Matteo VincenzoFiori Franco FINAL VERSION.pdfFiori-ASpice.pdf
Test Solution for Heatsinks in Power Electronics Applications / Piumatti, Davide; Borlo, Stefano; Quitadamo, Matteo Vincenzo; Sonza Reorda, Matteo; Giacomo Armando, Eric; Fiori, Franco. - In: ELECTRONICS. - ISSN 2079-9292. - ELETTRONICO. - 9:6(2020), pp. 1-15. [10.3390/electronics9061020] 1-gen-2020 Piumatti, DavideBorlo, StefanoQuitadamo, Matteo VincenzoSonza Reorda, MatteoGiacomo Armando, EricFiori, Franco electronics-09-01020.pdf
Testing Heatsink Faults in Power Transistors by means of Thermal Model / Piumatti, Davide; Quitadamo, Matteo Vincenzo; Reorda, Matteo Sonza; Fiori, Franco. - (2020), pp. 1-6. ((Intervento presentato al convegno 21st IEEE Latin-American Test Symposium (LATS20) tenutosi a Jatiúca (Maceió), Brazil nel 30th March - 2nd April 2020 [10.1109/LATS49555.2020.9093674]. 1-gen-2020 Piumatti, DavideQuitadamo, Matteo VincenzoReorda, Matteo SonzaFiori, Franco 09093674.pdfThermal_faults_V_4_CR_no_layout_editoriale.pdf