Archivio Istituzionale della RicercaBERNARDI, PAOLO
BERNARDI, PAOLO
Dipartimento di Automatica e Informatica
012326
Fast Circuit Analysis via Neighborhood-Guided Maximum Common Subgraph
In corso di stampa Cardone, Lorenzo; Quer, Stefano; Bernardi, Paolo
Smart Heuristics for Maximum Common Subgraph Sub-Estimation in Large Digital Circuits
In corso di stampa Bernardi, Paolo; Cardone, Lorenzo; Quer, Stefano
Advances in Testing and Reliability Benchmarks
2026 Angione, Francesco; Bernardi, Paolo; Giardino, Nicola Di Gruttola; Filipponi, Gabriele; Iaria, Giusy; Perlo, Giacomo; Pomeranz, Irith; Porsia, Antonio; Ruospo, Annachiara; Sanchez, Ernesto; Turco, Vittorio
Off-Chip Super-Resolution AI Model to Support Embedded Memory Diagnosis
2026 Anedda, Simone; Bernardi, Paolo; Coppetta, Matteo; Insinga, Giorgio; Montedoro, Tommaso; Ruospo, Annachiara; Ullmann, Rudolf; Tengler, Felix
Optimizing Scan Test Economics Trade-Offs in Homogeneous 3D SICs via Cost Modeling
2026 Iaria, Giusy; Bernardi, Paolo; Bertani, Claudia; Garozzo, Giuseppe; Tancorre, Vincenzo
ARBoard: Augmented Reality for PCB Operations in Industry 5.0
2025 Insinga, Giorgio; Anzoino, Francesco; Bella, Pietro; Bernardi, Paolo; Filippetti, Luca; Khattar, Reem
Enhancing Logic Diagnosis of field returns through Logic BIST in Automotive SoCs
2025 Bernardi, Paolo; Filipponi, Gabriele; Iaria, Giusy; Bertani, Claudia; Tancorre, Vincenzo
European Test Symposium Teams: an Anniversary Snapshot
2025 Jenihhin, M.; Raik, J.; Jutman, A.; Cherezova, N.; Ubar, R.; Miclea, L.; Enyedi, S.; Ştefan, I.; Stan, O.; Corcheş, C.; Peng, Z.; Eles, P.; Drechsler, R.; Eggersglüß, S.; Fey, G.; Glowatz, A.; Tille, D.; Gielen, G.; Coyette, A.; Dobbelaere, W.; Vanhooren, R.; Chuang, P. -Y.; Marinissen, E. J.; Di Natale, G.; Barragan, M.; Maistri, P.; Mir, S.; Vatajelu, E. -I.; Bernardi, P.; Di Carlo, S.; Prinetto, P.; Reorda, M. Sonza; Violante, M.; Stratigopoulos, H. -G.; Michael, M. K.; Neophytou, S.; Hadjitheophanous, S.; Christou, K.; Skitsas, M.; Bosio, A.; Deveautour, B.; Girard, P.; Traiola, M.; Virazel, A.; Dos Santos, F. Fernandes; Kritikakou, A.; Casagranda, G.; Vallero, M.; Vella, F.; Rech, P.; Bolzani Poehls, L. M.; Krstic, M.; Andjelkovic, M.; Vargas, F.; Tshagharyan, G.; Harutyunyan, G.; Vardanian, V.; Shoukourian, S.; Zorian, Y.; Dworak, J.; Nepal, K.; Manikas, T.; Taouil, M.; Fieback, M.; Gebregiorgis, A.; Bishnoi, R.; Hamdioui, S.; Chatterjee, A.; Saha, A.; Komarraju, S.; Ma, K.; Amarnath, C.; Tahoori, M.; Mayahinia, M.; Rajabalipanah, M.; Basharkhah, K.; Nosrati, N.; Jahanpeima, Z.; Navabi, Z.; Wunderlich, H. -J.; Hellebrand, S.
Exploiting weak detections for optimizing pattern generation in Defect-Oriented Cell-Aware ATPG
2025 Ciullo, Alessandro; Eggersglüß, Stephan; Tille, Daniel; Glowatz, Andreas; Iaria, Giusy; Bernardi, Paolo
From Structural Test Escapes to Silent Data Errors: A preliminary analysis
2025 Angione, Francesco; Bernardi, Paolo; Sinha, Arani
HW/SW Co-Design of a Reliable Deep Space System exploiting Application-profiled RAM Scrubbing
2025 Di Gruttola Giardino, Nicola; Bernardi, Paolo; Corpino, Sabrina; Stesina, Fabrizio
Leveraging ATE to optimize System-Level-Test for Multicore Automotive SoCs
2025 Angione, Francesco; Bernardi, Paolo; Bertani, Claudia; Bertetto, Lorenzo; Cardone, Lorenzo; DI GRUTTOLA GIARDINO, Nicola; Quer, Stefano; Tancorre, Vincenzo
Special Session: Trustworthy Hardware-AI at the Cloud
2025 Angione, Francesco; Bernardi, Paolo; Bosio, Alberto; Dattatraya Dixit, Harish; Pappalardo, Salvatore; Ruospo, Annachiara; Sanchez, Ernesto; Sinha, Arani; Turco, Vittorio
System-Level Test techniques for Automotive SoCs
2025 Angione, Francesco; Bernardi, Paolo; Cantoro, Riccardo
A 6-bit Low-Area Hybrid ADC Design For System-on-Chip Measurements
2024 Bernardi, Paolo; Kolahimahmoudi, Nima; Insinga, Giorgio
A Flexible FPGA-based Test Equipment for Enabling Out-of-Production Manufacturing Test Flow of Digital Systems
2024 Di Gruttola Giardino, Nicola; Angione, Francesco; Bernardi, Paolo; Foscale, Tommaso; Bertani And Vincenzo Tancorre, Claudia
Exploring trade-offs in multi-site wafer testing
2024 Bernardi, Paolo; Cardone, Lorenzo; Foscale, Tommaso
Optimizing System-Level Test Program Generation via Genetic Programming
2024 Schwachhofer, D.; Angione, F.; Becker, S.; Wagner, S.; Sauer, M.; Bernardi, P.; Polian, I.
A guided debugger-based fault injection methodology for assessing functional test programs
2023 Angione, Francesco; Bernardi, Paolo; Di Gruttola Giardino, Nicola; Appello, Davide; Bertani, Claudia; Tancorre, Vincenzo
A Novel Approach to Extract Embedded Memory Design Parameter Through Irradiation Test
2023 Bernardi, Paolo; Kolahimahmoudi, Nima; Insinga, Giorgio
| Citazione | Data di pubblicazione | Autori | File |
|---|---|---|---|
| Fast Circuit Analysis via Neighborhood-Guided Maximum Common Subgraph / Cardone, L., Quer, S., Bernardi, P.. - (In corso di stampa). (European Test Symposium 2026 Platanias (GR) 25/05/2026 - 29/05/2026). | In corso di stampa | Cardone,LorenzoQuer,StefanoBernardi,Paolo | 2026_ETS.pdf |
| Smart Heuristics for Maximum Common Subgraph Sub-Estimation in Large Digital Circuits / Bernardi, P., Cardone, L., Quer, S.. - (In corso di stampa). (IWLS 2025 Verona (IT) 20/05/2024 - 24/05/2024). | In corso di stampa | Bernardi,PaoloCardone,LorenzoQuer,Stefano | - |
| Advances in Testing and Reliability Benchmarks / Angione, F., Bernardi, P., Giardino, N.D.G., Filipponi, G., Iaria, G., Perlo, G., Pomeranz, I., Porsia, A., Ruospo, A., Sanchez, E., Turco, V.. - (2026), pp. 1-10. (31st IEEE European Test Symposium, ETS 2026 Chania (GRC) 25-29 May 2026) [10.1109/ets69887.2026.11591740]. | 1-gen-2026 | Angione, FrancescoBernardi, PaoloGiardino, Nicola Di GruttolaFilipponi, GabrieleIaria, GiusyPerlo, GiacomoPorsia, AntonioRuospo, AnnachiaraSanchez, ErnestoTurco, Vittorio + | Advances_in_Testing_and_Reliability_Benchmarks.pdf |
| Off-Chip Super-Resolution AI Model to Support Embedded Memory Diagnosis / Anedda, S., Bernardi, P., Coppetta, M., Insinga, G., Montedoro, T., Ruospo, A., Ullmann, R., Tengler, F.. - (2026). (2026 IEEE European Test Symposium (ETS) Chania, Crete May 25-29, 2026) [10.1109/ETS69887.2026.11591702]. | 1-gen-2026 | Paolo BernardiGiorgio InsingaAnnachiara Ruospo + | RS3-3.pdf; Off-Chip_Super-Resolution_AI_Model_to_Support_Embedded_Memory_Diagnosis.pdf |
| Optimizing Scan Test Economics Trade-Offs in Homogeneous 3D SICs via Cost Modeling / Iaria, G., Bernardi, P., Bertani, C., Garozzo, G., Tancorre, V.. - (2026), pp. 1-7. (2026 IEEE 32nd International Symposium on On-Line Testing and Robust System Design (IOLTS) Polignano a Mare (ITA) 01-03 July 2026) [10.1109/iolts69666.2026.11633775]. | 1-gen-2026 | Iaria, GiusyBernardi, Paolo + | Optimizing_Scan_Test_Economics_Trade-Offs_in_Homogeneous_3D_SICs_via_Cost_Modeling.pdf; 2026222191.pdf |
| ARBoard: Augmented Reality for PCB Operations in Industry 5.0 / Insinga, G., Anzoino, F., Bella, P., Bernardi, P., Filippetti, L., Khattar, R.. - (2025). (2025 IEEE International Symposium on Emerging Metaverse (ISEMV) Honolulu, HI (USA) 19-20 October 2025) [10.1109/ISEMV67326.2025.00014]. | 1-gen-2025 | Insinga, GiorgioAnzoino, FrancescoBella, PietroBernardi, PaoloFilippetti, LucaKhattar, Reem | ARBoard_Augmented_Reality_for_PCB_Operations_in_Industry_5.0.pdf; ARBoard_6_pages_IEEE_ISEMV_2025___camera_ready (1).pdf |
| Enhancing Logic Diagnosis of field returns through Logic BIST in Automotive SoCs / Bernardi, P., Filipponi, G., Iaria, G., Bertani, C., Tancorre, V.. - (2025). (2025 IEEE Latin American Test Symposium San Andres Islas (COL) 11-14 March 2025) [10.1109/LATS65346.2025.10963955]. | 1-gen-2025 | Paolo BernardiGabriele FilipponiGiusy Iaria + | LATS_2025.pdf; Enhancing_Logic_Diagnosis_of_Field_Returns_Through_Logic_BIST_in_Automotive_SoCs.pdf |
| European Test Symposium Teams: an Anniversary Snapshot / Jenihhin, M., Raik, J., Jutman, A., Cherezova, N., Ubar, R., Miclea, L., Enyedi, S., Ştefan, I., Stan, O., Corcheş, C., Peng, Z., Eles, P., Drechsler, R., Eggersglüß, S., Fey, G., Glowatz, A., Tille, D., Gielen, G., Coyette, A., Dobbelaere, W., et al.. - ELETTRONICO. - (2025), pp. 1-48. (2025 IEEE European Test Symposium, ETS 2025 Tallinn, Estonia 26-30 May 2025) [10.1109/ets63895.2025.11049652]. | 1-gen-2025 | Bernardi, P.Di Carlo, S.Prinetto, P.Reorda, M. SonzaViolante, M. + | European_Test_Symposium_Teams_an_Anniversary_Snapshot.pdf; ETSteams_2025_Draft1.pdf |
| Exploiting weak detections for optimizing pattern generation in Defect-Oriented Cell-Aware ATPG / Ciullo, A., Eggersglüß, S., Tille, D., Glowatz, A., Iaria, G., Bernardi, P.. - (2025), pp. 72-77. (IEEE International Test Conference ASIA 2025 Tokyo (JPN) December 16–19, 2025) [10.1109/ITC-Asia67627.2025.00021]. | 1-gen-2025 | Iaria, GiusyBernardi, Paolo + | Exploiting_weak_detections_for_optimizing_pattern_generation_in_Defect-Oriented_Cell-Aware_ATPG.pdf |
| From Structural Test Escapes to Silent Data Errors: A preliminary analysis / Angione, F., Bernardi, P., Sinha, A.. - ELETTRONICO. - (2025). (2025 IEEE 9th International Test Conference India (ITC India) Bangalore (IND) 20-22 July 2025) [10.1109/ITCIndia66078.2025.11141623]. | 1-gen-2025 | Francesco AngionePaolo Bernardi + | From_Structural_Test_Escapes_to_Silent_Data_Errors_A_Preliminary_Analysis.pdf |
| HW/SW Co-Design of a Reliable Deep Space System exploiting Application-profiled RAM Scrubbing / Di Gruttola Giardino, N., Bernardi, P., Corpino, S., Stesina, F.. - (2025). (38th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems Barcelona (Spain) 21-23 October 2025) [10.1109/DFT66274.2025.11257434]. | 1-gen-2025 | Nicola di Gruttola GiardinoPaolo BernardiSabrina CorpinoFabrizio Stesina | DFTS25_ECC_Methodologies_Camera_Ready_IEEE_Approved.pdf; HW_SW_Co-Design_of_a_Reliable_Deep_Space_System_Exploiting_Application-Profiled_RAM_Scrubbing.pdf |
| Leveraging ATE to optimize System-Level-Test for Multicore Automotive SoCs / Angione, F., Bernardi, P., Bertani, C., Bertetto, L., Cardone, L., DI GRUTTOLA GIARDINO, N., Quer, S., Tancorre, V.. - (2025), pp. 1-6. (Latin American Test Symposium San Andres Islas, Colombia 11-14 March 2025) [10.1109/LATS65346.2025.10963947]. | 1-gen-2025 | Francesco AngionePaolo BernardiLorenzo BertettoLorenzo CardoneNicola Di Gruttola GiardinoStefano Quer + | Leveraging_ATE_to_Optimize_System-Level-Test_for_Multicore_Automotive_SoCs.pdf |
| Special Session: Trustworthy Hardware-AI at the Cloud / Angione, F., Bernardi, P., Bosio, A., Dattatraya Dixit, H., Pappalardo, S., Ruospo, A., Sanchez, E., Sinha, A., Turco, V.. - ELETTRONICO. - (2025). (IEEE VLSI Test Symposium 2025 Tempe, Arizona (USA) 28-30 April 2025) [10.1109/VTS65138.2025.11022869]. | 1-gen-2025 | Francesco AngionePaolo BernardiAnnachiara RuospoErnesto SanchezVittorio Turco + | VTS25___Special_Session.pdf; Special_Session_Trustworthy_Hardware-AI_at_the_Cloud.pdf |
| System-Level Test techniques for Automotive SoCs / Angione, F., Bernardi, P., Cantoro, R.. - (2025), pp. 568-577. (International Test Conference (ITC) San Diego, CA (USA) 20-26 September 2025) [10.1109/itc58126.2025.00093]. | 1-gen-2025 | Angione, FrancescoBernardi, PaoloCantoro, Riccardo | System-Level_Test_techniques_for_Automotive_SoCs.pdf |
| A 6-bit Low-Area Hybrid ADC Design For System-on-Chip Measurements / Bernardi, P., Kolahimahmoudi, N., Insinga, G.. - (2024). (IEEE International conference on Design, Test & Technology of Integrated Systems (DTTIS) Aix-en-Provence (FR) 14-16 October 2024) [10.1109/DTTIS62212.2024.10780233]. | 1-gen-2024 | Bernardi, PaoloKolahimahmoudi, NimaInsinga, Giorgio | DTTIS24_6_pages.pdf; A_6-bit_Low-Area_Hybrid_ADC_Design_For_System-on-Chip_Measurements.pdf |
| A Flexible FPGA-based Test Equipment for Enabling Out-of-Production Manufacturing Test Flow of Digital Systems / Di Gruttola Giardino, N., Angione, F., Bernardi, P., Foscale, T., Bertani And Vincenzo Tancorre, C.. - (2024). (International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFTS) Didcot (UK) 08-10 October 2024) [10.1109/DFT63277.2024.10753536]. | 1-gen-2024 | Nicola di Gruttola GiardinoFrancesco AngionePaolo BernardiTommaso Foscale + | A_Flexible_FPGA-Based_Test_Equipment_for_Enabling_Out-of-Production_Manufacturing_Test_Flow_of_Digital_Systems.pdf |
| Exploring trade-offs in multi-site wafer testing / Bernardi, P., Cardone, L., Foscale, T.. - (2024). (25th IEEE Latin American Test Symposium 2024 Maceio (BRA) 09-12 April 2024) [10.1109/lats62223.2024.10534596]. | 1-gen-2024 | Bernardi, PaoloCardone, LorenzoFoscale, Tommaso | Exploring_trade-offs_in_multi-site_wafer_testing.pdf |
| Optimizing System-Level Test Program Generation via Genetic Programming / Schwachhofer, D., Angione, F., Becker, S., Wagner, S., Sauer, M., Bernardi, P., Polian, I.. - (2024). (2024 IEEE European Test Symposium (ETS) The Hague (NL) 20-24 May 2024) [10.1109/ETS61313.2024.10567817]. | 1-gen-2024 | Angione F.Bernardi P. + | Optimizing_System-Level_Test_Program_Generation_via_Genetic_Programming.pdf |
| A guided debugger-based fault injection methodology for assessing functional test programs / Angione, F., Bernardi, P., Di Gruttola Giardino, N., Appello, D., Bertani, C., Tancorre, V.. - (2023), pp. 1-7. (VLSI Test Symposium San Diego (USA) 24-26 April 2023) [10.1109/VTS56346.2023.10140099]. | 1-gen-2023 | Angione, FrancescoBernardi, PaoloDi Gruttola Giardino, Nicola + | A_guided_debugger-based_fault_injection_methodology_for_assessing_functional_test_programs.pdf |
| A Novel Approach to Extract Embedded Memory Design Parameter Through Irradiation Test / Bernardi, P., Kolahimahmoudi, N., Insinga, G.. - (2023), pp. 1-6. (Conference on Very Large Scale Integration (VLSI-SoC 2023) Dubai (United Arab Emirates) October 16 - 18, 2023) [10.1109/VLSI-SoC57769.2023.10321848]. | 1-gen-2023 | Bernardi, PaoloKolahimahmoudi, NimaInsinga, Giorgio | A_Novel_Approach_to_Extract_Embedded_Memory_Design_Parameter_Through_Irradiation_Test.pdf; A_Novel_Approach_to_Extract_Embedded_Memory_Design_Parameter_Through_Irradiation_Test.pdf |