BERNARDI, PAOLO

BERNARDI, PAOLO  

Dipartimento di Automatica e Informatica  

012326  

Mostra records
Risultati 1 - 20 di 125 (tempo di esecuzione: 0.102 secondi).
Citazione Data di pubblicazione Autori File
A guided debugger-based fault injection methodology for assessing functional test programs / Angione, Francesco; Bernardi, Paolo; Di Gruttola Giardino, Nicola; Appello, Davide; Bertani, Claudia; Tancorre, Vincenzo. - (2023), pp. 1-7. (Intervento presentato al convegno VLSI Test Symposium tenutosi a San Diego (USA) nel 24-26 April 2023) [10.1109/VTS56346.2023.10140099]. 1-gen-2023 Angione, FrancescoBernardi, PaoloDi Gruttola Giardino, Nicola + A_guided_debugger-based_fault_injection_methodology_for_assessing_functional_test_programs.pdf
A Novel Approach to Extract Embedded Memory Design Parameter Through Irradiation Test / Bernardi, Paolo; Kolahimahmoudi, Nima; Insinga, Giorgio. - (2023), pp. 1-6. (Intervento presentato al convegno Conference on Very Large Scale Integration (VLSI-SoC 2023) tenutosi a Dubai (United Arab Emirates) nel October 16 - 18, 2023) [10.1109/VLSI-SoC57769.2023.10321848]. 1-gen-2023 Bernardi, PaoloKolahimahmoudi, NimaInsinga, Giorgio A_Novel_Approach_to_Extract_Embedded_Memory_Design_Parameter_Through_Irradiation_Test.pdfA_Novel_Approach_to_Extract_Embedded_Memory_Design_Parameter_Through_Irradiation_Test.pdf
About the correlation between logical identified faulty gates and their layout characteristics / Bernardi, Paolo; Cardone, Lorenzo; Iaria, Giusy; Appello, Davide; Garozzo, Giuseppe; Tancorre, Vincenzo. - (2023). (Intervento presentato al convegno IEEE International Symposium on On-Line Testing and Robust System Design tenutosi a 03-05 July 2023 nel Crete, Greece) [10.1109/IOLTS59296.2023.10224897]. 1-gen-2023 Bernardi, PaoloCardone, LorenzoIaria, Giusy + IOLTS_2023_FaultsLayoutAnalysis (4).pdfAbout_the_Correlation_between_Logical_Identified_Faulty_Gates_and_their_Layout_Characteristics.pdf
Collecting diagnostic information through dichotomic search from Logic BIST of failing in-field automotive SoCs with delay faults / Bernardi, Paolo; Filipponi, Gabriele; Reorda, Matteo Sonza; Appello, Davide; Bertani, Claudia; Tancorre, Vincenzo. - ELETTRONICO. - (2023), pp. 21-26. (Intervento presentato al convegno International Symposium on Design and Diagnostics of Electronic Circuits and Systems tenutosi a Tallinn (Estonia) nel 03-05 May 2023) [10.1109/DDECS57882.2023.10139670]. 1-gen-2023 Bernardi, PaoloFilipponi, GabrieleReorda, Matteo Sonza + 2023058710.pdfCollecting_diagnostic_information_through_dichotomic_search_from_Logic_BIST_of_failing_in-field_automotive_SoCs_with_delay_faults.pdf
Low cost external serial interface watchdog for SoCs and FPGAs automatic characterization tests / Bernardi, Paolo; Filipponi, Gabriele; Foscale, Tommaso; Insinga, Giorgio. - (2023). (Intervento presentato al convegno IEEE Latin-American Test Symposium tenutosi a Veracruz (Mexico) nel 21-24 March 2023) [10.1109/LATS58125.2023.10154486]. 1-gen-2023 Bernardi, PaoloFilipponi, GabrieleFoscale, TommasoInsinga, Giorgio LATS_2023.pdfLow_cost_external_serial_interface_watchdog_for_SoCs_and_FPGAs_automatic_characterization_tests.pdf
On the integration and hardening of Software Test Libraries in Real-Time Operating Systems / Angione, Francesco; Bernardi, Paolo; Cantoro, Riccardo; Di Gruttola Giardino, Nicola; Piumatti, Davide; Reorda, Matteo Sonza; Appello, Davide; Tancorre, Vincenzo. - (2023), pp. 1-6. (Intervento presentato al convegno Latin American Test Symposium tenutosi a Veracruz (Mexico) nel 21-24 March 2023) [10.1109/LATS58125.2023.10154492]. 1-gen-2023 Angione, FrancescoBernardi, PaoloCantoro, RiccardoDi Gruttola Giardino, NicolaPiumatti, DavideReorda, Matteo Sonza + On_the_integration_and_hardening_of_Software_Test_Libraries_in_Real-Time_Operating_Systems.pdf
A novel Pattern Selection Algorithm to reduce the Test Cost of large Automotive Systems-on-Chip / Iaria, Giusy; Angione, Francesco; Bernardi, Paolo; SONZA REORDA, Matteo; Davide, Appello; Giuseppe, Garozzo; Vincenzo, Tancorre. - (2022). (Intervento presentato al convegno Latin American Test Symposium tenutosi a Montevideo (Uruguay) nel 05-08 September 2022) [10.1109/LATS57337.2022.9936975]. 1-gen-2022 Iaria GiusyFrancesco AngionePaolo BernardiMatteo Sonza Reorda + A_novel_Pattern_Selection_Algorithm_to_reduce_the_Test_Cost_of_large_Automotive_Systems-on-Chip.pdf
A novel SEU injection setup for Automotive SoC / Iaria, G.; Foscale, T.; Bernardi, P.; Presicce, L.; Sonza Reorda, M.; Appello, D.; Tancorre, V.; Ugioli, R.. - (2022), pp. 623-626. (Intervento presentato al convegno 2022 IEEE International Symposium on Industrial Electronics tenutosi a Anchorage, AK (USA) nel 01-03 June 2022) [10.1109/ISIE51582.2022.9831533]. 1-gen-2022 G. IariaT. FoscaleP. BernardiL. PresicceM. Sonza Reorda + A_novel_SEU_injection_setup_for_Automotive_SoC.pdf
An innovative Strategy to Quickly Grade Functional Test Programs / Angione, Francesco; Bernardi, Paolo; Calabrese, Andrea; Cardone, Lorenzo; Niccoletti, Alessandro; Piumatti, Davide; Quer, Stefano; Appello, Davide; Tancorre, Vincenzo; Ugioli, Roberto. - (2022), pp. 355-364. (Intervento presentato al convegno International Test Conference tenutosi a Anaheim, CA (USA) nel 23-30 September 2022) [10.1109/ITC50671.2022.00044]. 1-gen-2022 Francesco AngionePaolo BernardiAndrea CalabreseLorenzo CardoneDavide PiumattiStefano Quer + An_innovative_Strategy_to_Quickly_Grade_Functional_Test_Programs.pdf
An Optimized Burn-In Stress Flow targeting Interconnections logic to Embedded Memories in Automotive Systems-on-Chip / Angione, Francesco; Bernardi, Paolo; Filipponi, Gabriele; SONZA REORDA, Matteo; Appello, Davide; Tancorre, Vincenzo; Ugioli, Roberto. - (2022), pp. 1-6. (Intervento presentato al convegno IEEE European Test Symposium tenutosi a Barcelona (Spain) nel 23-27 May 2022) [10.1109/ETS54262.2022.9810396]. 1-gen-2022 Francesco ANGIONEPaolo BERNARDIGabriele FILIPPONIMatteo SONZA REORDA + An_Optimized_Burn-In_Stress_Flow_targeting_Interconnections_logic_to_Embedded_Memories_in_Automotive_Systems-on-Chip.pdf
Online scheduling of concurrent Memory BISTs execution at Real-Time Operating-System level / Angione, Francesco; Bernardi, Paolo; Filipponi, Gabriele; Tempesta, Claudia; SONZA REORDA, Matteo; Appello, Davide; Ugioli, Roberto; Tancorre, Vincenzo. - (2022). (Intervento presentato al convegno International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems tenutosi a Austin (USA) nel 19-21 October 2022) [10.1109/DFT56152.2022.9962338]. 1-gen-2022 Francesco AngionePaolo BernardiGabriele FilipponiClaudia TempestaMatteo Sonza Reorda + Online_scheduling_of_concurrent_Memory_BISTs_execution_at_Real-Time_Operating-System_level.pdf
Optimized diagnostic strategy for embedded memories of Automotive Systems-on-Chip / Bernardi, Paolo; Insinga, Giorgio; Paganini, Giovanni; Cantoro, Riccardo; Beer, Peter; Mautone, Nellina; Scaramuzza, Pierre; Carnevale, Giambattista; Coppetta, Matteo; Ullmann, Rudolf. - (2022), pp. 1-6. (Intervento presentato al convegno IEEE European Test Symposium tenutosi a Barcelona (Spain) nel 23-27 May 2022) [10.1109/ETS54262.2022.9810445]. 1-gen-2022 Paolo BERNARDIGiorgio INSINGAGiovanni PAGANINIRiccardo CANTORO + Optimized_diagnostic_strategy_for_embedded_memories_of_Automotive_Systems-on-Chip.pdf
Recent Trends and Perspectives on Defect-Oriented Testing / Bernardi, P.; Cantoro, R.; Coyette, A.; Dobbeleare, W.; Fieback, M.; Floridia, A.; Gielen, G.; Gomez, J.; Grosso, M.; Guerriero, A. M.; Guglielminetti, I.; Hamdioui, S.; Insinga, G.; Mautone, N.; Mirabella, N.; Sartoni, S.; Sonza Reorda, M.; Ullmann, R.; Vanhooren, R.; Xama, N.; Wu, L.. - (2022). (Intervento presentato al convegno The 28th IEEE International Symposium on On-Line Testing and Robust System Design (IOLTS) tenutosi a Torino (Italy) nel 12-14 September 2022) [10.1109/IOLTS56730.2022.9897647]. 1-gen-2022 P. BernardiR. CantoroA. FloridiaM. GrossoS. HamdiouiG. InsingaN. MirabellaS. SartoniM. Sonza ReordaL. Wu + _IOLTS2022__Special_Session__Recent_Trends_and_Perspectives_on_Defect_Oriented_Testing.pdfRecent_Trends_and_Perspectives_on_Defect-Oriented_Testing.pdf
Test, Reliability and Functional Safety trends for Automotive System-on-Chip / Angione, F.; Appello, D.; Aribido, J.; Bellarmino, N.; Bernardi, P.; Cantoro, R.; de Sio, C.; Foscale, T.; Gavarini, G.; Huch, M.; Kilian, T; Mariani, R.; Martone, R.; Ruospo, A.; Sanchez, E.; Schlichtmann, U.; Squillero, G.; Sonza Reorda, M.; Sterpone, L.; Tancorre, V.; Ugioli, R.. - (2022). (Intervento presentato al convegno IEEE European Test Symposium). 1-gen-2022 F. AngioneN. BellarminoP. BernardiR. CantoroC. de SioT. FoscaleG. GavariniA. RuospoE. SanchezG. SquilleroM. Sonza ReordaL. Sterpone + 01_ETS_special_session_ABSTRACT.pdf
Test, Reliability and Functional Safety Trends for Automotive System-on-Chip / Angione, F.; Appello, D.; Aribido, J.; Athavale, J.; Bellarmino, N.; Bernardi, P.; Cantoro, R.; De Sio, C.; Foscale, T.; Gavarini, G.; Guerrero, J.; Huch, M.; Iaria, G.; Kilian, T.; Mariani, R.; Martone, R.; Ruospo, A.; Sanchez, E.; Schlichtmann, U.; Squillero, G.; Sonza Reorda, M.; Sterpone, L.; Tancorre, V.; Ugioli, R.. - (2022), pp. 1-10. (Intervento presentato al convegno 2022 IEEE European Test Symposium (ETS) tenutosi a Barcelona (Spain) nel 23-27 May 2022) [10.1109/ETS54262.2022.9810388]. 1-gen-2022 F. AngioneN. BellarminoP. BernardiR. CantoroC. De SioT. FoscaleG. GavariniJ. GuerreroG. IariaR. MarianiA. RuospoG. SquilleroM. Sonza ReordaL. Sterpone + 2022_ETS_SpecialSession.pdfTest_Reliability_and_Functional_Safety_Trends_for_Automotive_System-on-Chip.pdf
Accelerated Analysis of Simulation Dumps through Parallelization on Multicore Architectures / Appello, D.; Bernardi, P.; Calabrese, A.; Littardi, S.; Pollaccia, G.; Quer, S.; Tancorre, V.; Ugioli, R.. - (2021), pp. 69-74. (Intervento presentato al convegno 24th International Symposium on Design and Diagnostics of Electronic Circuits and Systems, DDECS 2021 tenutosi a aut nel 2021) [10.1109/DDECS52668.2021.9417048]. 1-gen-2021 Bernardi P.Calabrese A.Littardi S.Quer S. + 09417048.pdf
Industrial best practice: cases of study by automotive chip- makers / Abbati, L. Degli; Ullmann, R.; Paganini, G.; Coppetta, M.; Zaia, L.; Huard, V.; Montfort, O.; Cantoro, R.; Insinga, G.; Venini, F.; Calao, P.; Bernardi, P.. - (2021), pp. 1-6. (Intervento presentato al convegno 2021 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) nel 06-08 October 2021) [10.1109/DFT52944.2021.9568350]. 1-gen-2021 Paganini, G.Cantoro, R.Insinga, G.Venini, F.Calao, P.Bernardi, P. + Industrial_best_practice_cases_of_study_by_automotive_chip-_makers.pdf
Innovative methods for Burn-In related Stress Metrics Computation / Ruggeri, Walter; Bernardi, Paolo; Littardi, Stefano; Reorda, Matteo Sonza; Appello, Davide; Bertani, Claudia; Pollaccia, Giorgio; Tancorre, Vincenzo; Ugioli, Roberto. - ELETTRONICO. - (2021), pp. 1-6. (Intervento presentato al convegno 16th International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS) nel 28-30 June 2021) [10.1109/DTIS53253.2021.9505067]. 1-gen-2021 Ruggeri, WalterBernardi, PaoloLittardi, StefanoReorda, Matteo Sonza + innovative_methods_for_burn-in_related_stress_metrics_computation.pdfInnovative_methods_for_Burn-In_related_Stress_Metrics_Computation.pdf
System-Level Test: State of the Art and Challenges / Appello, D.; Chen, H. H.; Sauer, M.; Polian, I.; Bernardi, P.; Reorda, M. S.. - (2021), pp. 1-7. (Intervento presentato al convegno 27th IEEE International Symposium on On-Line Testing and Robust System Design, IOLTS 2021 nel 2021) [10.1109/IOLTS52814.2021.9486708]. 1-gen-2021 Bernardi P.Reorda M. S. + System-Level_Test_State_of_the_Art_and_Challenges.pdf
Accelerated Analysis of Simulation Dumps through Parallelization on Multicore Architectures / Calabrese, A.; Bernardi, P.; Littardi, S.; Quer, S.. - ELETTRONICO. - (2020), pp. 1-1. (Intervento presentato al convegno International Test Conference 2020 (ITC2020) nel 3-5 November 2020). 1-gen-2020 A. CalabreseP. BernardiS. LittardiS. Quer poster.pdf