The cost of Burn-In is a major concern for the testing of Automotive Systems-on-Chip (SoC). This paper highlights problematic aspects of a Burn-In flow and describes a two-layered adaptive technique that permits to optimize the stress application and strongly reduce BI test time. At the SoC level, the described methodology adaptively copes with FLASH erase time uncertainties; at the Automatic Test Equipment (ATE) level, the strategy relies on power monitors and tester intelligence. The paper reports experimental results on a SoC manufactured by STMicroelectronics; figures show an optimized usage of stress resources and demonstrates a reduction of 25% of the BI test time when using the proposed adaptive techniques.
Adaptive Management Techniques for Optimized Burn-In of Safety-Critical SoC / Appello, Davide; Bernardi, Paolo; Bugeja, Conrad; Cantoro, Riccardo; Pollaccia, Giorgio; Restifo, Marco; Venini, Federico. - In: JOURNAL OF ELECTRONIC TESTING. - ISSN 0923-8174. - STAMPA. - 34(2018), pp. 43-52.
Titolo: | Adaptive Management Techniques for Optimized Burn-In of Safety-Critical SoC |
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Data di pubblicazione: | 2018 |
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Digital Object Identifier (DOI): | http://dx.doi.org/10.1007/s10836-018-5705-1 |
Appare nelle tipologie: | 1.1 Articolo in rivista |
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http://hdl.handle.net/11583/2698574