SANCHEZ SANCHEZ, EDGAR ERNESTO

SANCHEZ SANCHEZ, EDGAR ERNESTO  

Dipartimento di Automatica e Informatica  

Sanchez, Ernesto; E. Sanchez; Sanchez E.; Ernesto Sanchez; SANCHEZ EDGAR; SANCHEZ E.; SANCHEZ SANCHEZ EDGAR ERNESTO; SANCHEZ SANCHEZ E.  

012684  

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Risultati 1 - 20 di 34 (tempo di esecuzione: 0.036 secondi).
Citazione Data di pubblicazione Autori File
A Survey on Deep Learning Resilience Assessment Methodologies / Ruospo, Annachiara; Sanchez, Ernesto; Matana Luza, Lucas; Dilillo, Luigi; Traiola, Marcello; Bosio, Alberto. - In: COMPUTER. - ISSN 0018-9162. - ELETTRONICO. - 56:2(2023), pp. 57-66. [10.1109/MC.2022.3217841] 1-gen-2023 Ruospo, AnnachiaraSanchez, Ernesto + A_Survey_on_Deep_Learning_Resilience_Assessment_Methodologies_CR.pdfA_Survey_on_Deep_Learning_Resilience_Assessment_Methodologies.pdf
EXT-TAURUM P2T: an Extended Secure CAN-FD Architecture for Road Vehicles / Oberti, F.; Savino, A.; Sanchez, E.; Parisi, F.; Di Carlo, S.. - In: IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY. - ISSN 1530-4388. - STAMPA. - 22:2(2022), pp. 98-110. [10.1109/TDMR.2022.3157000] 1-gen-2022 Oberti F.Savino A.Sanchez E.Di Carlo S. + TAURUM P2T Secure CAN BUS Architecture Camera Extented paper.pdfEXT-TAURUM_P2T_An_Extended_Secure_CAN-FD_Architecture_for_Road_Vehicles.pdf
Machine Learning for Hardware Security: Classifier-based Identification of Trojans in Pipelined Microprocessors / Damljanovic, Aleksa; Ruospo, Annachiara; Sanchez, Ernesto; Squillero, Giovanni. - In: APPLIED SOFT COMPUTING. - ISSN 1568-4946. - ELETTRONICO. - 116:(2022), pp. 1-16. [10.1016/j.asoc.2021.108068] 1-gen-2022 Aleksa DamljanovicAnnachiara RuospoErnesto SanchezGiovanni Squillero HT_ML_Elsevier.pdf1-s2.0-S1568494621009753-main.pdf
Emulating the Effects of Radiation-Induced Soft-Errors for the Reliability Assessment of Neural Networks / Matana Luza, Lucas; Ruospo, Annachiara; Soderstrom, Daniel; Cazzaniga, Carlo; Kastriotou, Maria; Sanchez, Ernesto; Bosio, Alberto; Dilillo, Luigi. - In: IEEE TRANSACTIONS ON EMERGING TOPICS IN COMPUTING. - ISSN 2168-6750. - ELETTRONICO. - 10:4(2021), pp. 1867-1882. [10.1109/TETC.2021.3116999] 1-gen-2021 Ruospo, AnnachiaraSanchez, Ernesto + 2021_TETC___Emulating_the_Effects_of_Radiation_Induced_Soft_Errors_for_the_Reliability_Assessment_of_Neural_Networks.pdfPUBLISHED_Emulating_the_Effects_of_Radiation-Induced_Soft-Errors_for_the_Reliability_Assessment_of_Neural_Networks.pdf
Investigating data representation for efficient and reliable Convolutional Neural Networks / Ruospo, Annachiara; Sanchez, Ernesto; Traiola, Marcello; O’Connor, Ian; Bosio, Alberto. - In: MICROPROCESSORS AND MICROSYSTEMS. - ISSN 0141-9331. - ELETTRONICO. - 86:(2021), p. 104318. [10.1016/j.micpro.2021.104318] 1-gen-2021 Ruospo, AnnachiaraSanchez, Ernesto + FINAL_POSTPRODUCTION_PUBLISHED.pdf
On the Reliability Assessment of Artificial Neural Networks Running on AI-Oriented MPSoCs / Ruospo, Annachiara; Ernesto, Sanchez. - In: APPLIED SCIENCES. - ISSN 2076-3417. - ELETTRONICO. - 11:14(2021). [10.3390/app11146455] 1-gen-2021 Annachiara RuospoErnesto Sanchez applsci-11-06455.pdfOn_the_Reliability_Assessment_of_Artificial_Neural_Networks_Running_on_AI_Oriented_MPSoCs_final.pdf
An efficient strategy for the development of software test libraries for an automotive microcontroller family / Piumatti, D.; Sanchez, E.; Bernardi, P.; Martorana, R.; Pernice, M. A.. - In: MICROELECTRONICS RELIABILITY. - ISSN 0026-2714. - ELETTRONICO. - 115:(2020), p. 113962. [10.1016/j.microrel.2020.113962] 1-gen-2020 Piumatti, D.Sanchez, E.Bernardi, P. + 1-s2.0-S0026271420307939-main-post print.pdfVersione editoriale pre print.pdf
On-line Self-test Mechanism for Dual-Core Lockstep System-on-Chips / Floridia, Andrea; Sanchez, Ernesto. - In: MICROELECTRONICS RELIABILITY. - ISSN 0026-2714. - ELETTRONICO. - 112C:(2020), pp. 1-10. [10.1016/j.microrel.2020.113770] 1-gen-2020 Floridia, AndreaSanchez, Ernesto manuscript_word.pdf1-s2.0-S0026271420300317-main.pdf
Fault Grading Techniques of Software Test Libraries for Safety-Critical Applications / Floridia, Andrea; Sanchez, Ernesto; Sonza Reorda, Matteo. - In: IEEE ACCESS. - ISSN 2169-3536. - ELETTRONICO. - 7:(2019), pp. 63578-63587. [10.1109/ACCESS.2019.2917036] 1-gen-2019 Floridia, AndreaSanchez, ErnestoSonza Reorda, Matteo 08715776.pdf
An Evolutionary Algorithm Approach to Stress Program Generation During Burn-In / Appello, Davide; Bernardi, Paolo; Cantoro, Riccardo; Colazzo, Andrea; Motta, Alessandro; Pagani, Alberto; Pollaccia, Giorgio; Restifo, Marco; Ernesto, Sanchez; Venini, Federico. - In: JOURNAL OF LOW POWER ELECTRONICS. - ISSN 1546-1998. - STAMPA. - (2018), pp. 86-98. [10.1166/jolpe.2018.1542] 1-gen-2018 Paolo BernardiRiccardo CantoroMarco RestifoErnesto Sanchezand Federico Venini + -
An Optimized Test During Burn-In for Automotive SoC / Appello, Davide; Bernardi, Paolo; Bugeja, Conrad; Cantoro, Riccardo; Pollaccia, Giorgio; Restifo, Marco; Ernesto, Sanchez; Venini, Federico. - In: IEEE DESIGN & TEST. - ISSN 2168-2356. - STAMPA. - (2018), pp. 46-53. [10.1109/MDAT.2018.2799807] 1-gen-2018 Paolo BernardiRiccardo CantoroMarco RestifoErnesto SanchezFederico Venini + PREPRINT_DT_DTSI-2017-04-0096.R2.pdf08272388.pdf
A Fault-Tolerant Ripple-Carry Adder with Controllable-Polarity Transistors / Mohammadi, Hassan Ghasemzadeh; Gaillardon, Pierre Emmanuel; Zhang, Jian; Micheli, Giovanni De; SANCHEZ SANCHEZ, EDGAR ERNESTO; SONZA REORDA, Matteo. - In: ACM JOURNAL ON EMERGING TECHNOLOGIES IN COMPUTING SYSTEMS. - ISSN 1550-4832. - STAMPA. - 13:2(2017), pp. 1-13. [10.1145/2988234] 1-gen-2017 SANCHEZ SANCHEZ, EDGAR ERNESTOSONZA REORDA, Matteo + -
An FPGA-based dynamically reconfigurable platform for emulation of permanent faults in ASICs / Ullah, A.; Sanchez, E.; Sterpone, L.; Cardona, L. A.; Ferrer, C.. - In: MICROELECTRONICS RELIABILITY. - ISSN 0026-2714. - STAMPA. - 75:(2017), pp. 110-120. [10.1016/j.microrel.2017.06.032] 1-gen-2017 Ullah, A.Sanchez, E.Sterpone, L. + fpga_fault_sim.pdf
Software-Based Self-Test Techniques for Dual-Issue Embedded Processors / Bernardi, Paolo; Cantoro, Riccardo; De Luca, Sergio; SANCHEZ SANCHEZ, EDGAR ERNESTO; Sansonetti, Alessandro; Squillero, Giovanni. - In: IEEE TRANSACTIONS ON EMERGING TOPICS IN COMPUTING. - ISSN 2168-6750. - STAMPA. - (2017). [10.1109/TETC.2017.2758641] 1-gen-2017 BERNARDI, PAOLOCANTORO, RICCARDOSANCHEZ SANCHEZ, EDGAR ERNESTOSQUILLERO, GIOVANNI + -
Development Flow for On-Line Core Self-Test of Automotive Microcontrollers / Bernardi, Paolo; Cantoro, Riccardo; De Luca, Sergio; SANCHEZ SANCHEZ, EDGAR ERNESTO; Sansonetti, Alessandro. - In: IEEE TRANSACTIONS ON COMPUTERS. - ISSN 0018-9340. - STAMPA. - 65:3(2016), pp. 744-754. [10.1109/TC.2015.2498546] 1-gen-2016 BERNARDI, PAOLOCANTORO, RICCARDOSANCHEZ SANCHEZ, EDGAR ERNESTO + 07321794.pdf07321794-1.pdf
Observability solutions for in-field functional test of processor-based systems: a survey and quantitative test case evaluation / Perez Acle, Julio; Cantoro, Riccardo; SANCHEZ SANCHEZ, EDGAR ERNESTO; SONZA REORDA, Matteo; Squillero, Giovanni. - In: MICROPROCESSORS AND MICROSYSTEMS. - ISSN 0141-9331. - STAMPA. - 47:B(2016), pp. 392-403. [10.1016/j.micpro.2016.09.002] 1-gen-2016 CANTORO, RICCARDOSANCHEZ SANCHEZ, EDGAR ERNESTOSONZA REORDA, MatteoSQUILLERO, Giovanni + -
On the Functional Test of Branch Prediction Units / SANCHEZ SANCHEZ, EDGAR ERNESTO; SONZA REORDA, Matteo. - In: IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS. - ISSN 1063-8210. - STAMPA. - 23:9(2015), pp. 1675-1688. [10.1109/TVLSI.2014.2356612] 1-gen-2015 SANCHEZ SANCHEZ, EDGAR ERNESTOSONZA REORDA, Matteo 06913549.pdf
A Functional Approach for Testing the Reorder Buffer Memory / DI CARLO, Stefano; Gaudesi, Marco; SANCHEZ SANCHEZ, EDGAR ERNESTO; SONZA REORDA, Matteo. - In: JOURNAL OF ELECTRONIC TESTING. - ISSN 0923-8174. - STAMPA. - 30:4(2014), pp. 469-481. [10.1007/s10836-014-5461-9] 1-gen-2014 DI CARLO, STEFANOGAUDESI, MARCOSANCHEZ SANCHEZ, EDGAR ERNESTOSONZA REORDA, Matteo 2014-JETTA-ROB-AuthorVersion.pdf
Increasing the Fault Coverage of Processor Devices during the Operational Phase Functional Test / DE CARVALHO, Mauricio; Bernardi, Paolo; SANCHEZ SANCHEZ, EDGAR ERNESTO; SONZA REORDA, Matteo; Ballan, O.. - In: JOURNAL OF ELECTRONIC TESTING. - ISSN 0923-8174. - ELETTRONICO. - 30:(2014), pp. 317-328. [10.1007/s10836-014-5457-5] 1-gen-2014 DE CARVALHO, MAURICIOBERNARDI, PAOLOSANCHEZ SANCHEZ, EDGAR ERNESTOSONZA REORDA, MATTEO + -
MIHST: A Hardware Technique for Embedded Microprocessor Functional On-line Self-Test / Bernardi, Paolo; Ciganda, LYL MERCEDES; SANCHEZ SANCHEZ, EDGAR ERNESTO; SONZA REORDA, Matteo. - In: IEEE TRANSACTIONS ON COMPUTERS. - ISSN 0018-9340. - 63:11(2014), pp. 2760-2771. [10.1109/TC.2013.165] 1-gen-2014 BERNARDI, PAOLOCIGANDA, LYL MERCEDESSANCHEZ SANCHEZ, EDGAR ERNESTOSONZA REORDA, Matteo -