SANCHEZ SANCHEZ, EDGAR ERNESTO

SANCHEZ SANCHEZ, EDGAR ERNESTO  

Dipartimento di Automatica e Informatica  

Sanchez, Ernesto; E. Sanchez; Sanchez E.; Ernesto Sanchez; SANCHEZ EDGAR; SANCHEZ E.; SANCHEZ SANCHEZ EDGAR ERNESTO; SANCHEZ SANCHEZ E.  

012684  

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Risultati 1 - 20 di 32 (tempo di esecuzione: 0.028 secondi).
Citazione Data di pubblicazione Autori File
A Fault-Tolerant Ripple-Carry Adder with Controllable-Polarity Transistors / Mohammadi, Hassan Ghasemzadeh; Gaillardon, Pierre Emmanuel; Zhang, Jian; Micheli, Giovanni De; SANCHEZ SANCHEZ, EDGAR ERNESTO; SONZA REORDA, Matteo. - In: ACM JOURNAL ON EMERGING TECHNOLOGIES IN COMPUTING SYSTEMS. - ISSN 1550-4832. - STAMPA. - 13:2(2017), pp. 1-13. [10.1145/2988234] 1-gen-2017 SANCHEZ SANCHEZ, EDGAR ERNESTOSONZA REORDA, Matteo + a16-mohammadi.pdf
A Framework for Automated Detection of Power-Related Software Errors in Industrial Verification Processes / Gandini, S.; Ruzzarin, W.; SANCHEZ SANCHEZ, EDGAR ERNESTO; Squillero, Giovanni; Tonda, ALBERTO PAOLO. - In: JOURNAL OF ELECTRONIC TESTING. - ISSN 0923-8174. - STAMPA. - 26:(2010), pp. 689-697. [10.1007/s10836-010-5184-5] 1-gen-2010 SANCHEZ SANCHEZ, EDGAR ERNESTOSQUILLERO, GiovanniTONDA, ALBERTO PAOLO + jetta2010.pdf
A Functional Approach for Testing the Reorder Buffer Memory / DI CARLO, Stefano; Gaudesi, Marco; SANCHEZ SANCHEZ, EDGAR ERNESTO; SONZA REORDA, Matteo. - In: JOURNAL OF ELECTRONIC TESTING. - ISSN 0923-8174. - STAMPA. - 30:4(2014), pp. 469-481. [10.1007/s10836-014-5461-9] 1-gen-2014 DI CARLO, STEFANOGAUDESI, MARCOSANCHEZ SANCHEZ, EDGAR ERNESTOSONZA REORDA, Matteo 2014-JETTA-ROB.pdf2014-JETTA-ROB-AuthorVersion.pdf
A Survey on Deep Learning Resilience Assessment Methodologies / Ruospo, Annachiara; Sanchez, Ernesto; Matana Luza, Lucas; Dilillo, Luigi; Traiola, Marcello; Bosio, Alberto. - In: COMPUTER. - ISSN 0018-9162. - ELETTRONICO. - (In corso di stampa). In corso di stampa Ruospo, AnnachiaraSanchez, Ernesto + A_Survey_on_Deep_Learning_Resilience_Assessment_Methodologies_CR.pdf
An Effective technique for the Automatic Generation of Diagnosis-oriented Programs for Processor Cores / Bernardi, Paolo; SANCHEZ SANCHEZ, EDGAR ERNESTO; Schillaci, Massimiliano; Squillero, Giovanni; SONZA REORDA, Matteo. - In: IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS. - ISSN 0278-0070. - 27:(2008), pp. 570-574. [10.1109/TCAD.2008.915541] 1-gen-2008 BERNARDI, PAOLOSANCHEZ SANCHEZ, EDGAR ERNESTOSCHILLACI, MASSIMILIANOSQUILLERO, GiovanniSONZA REORDA, Matteo tcad2008.pdf
An efficient strategy for the development of software test libraries for an automotive microcontroller family / Piumatti, D.; Sanchez, E.; Bernardi, P.; Martorana, R.; Pernice, M. A.. - In: MICROELECTRONICS RELIABILITY. - ISSN 0026-2714. - ELETTRONICO. - 115:(2020), p. 113962. [10.1016/j.microrel.2020.113962] 1-gen-2020 Piumatti, D.Sanchez, E.Bernardi, P. + 1-s2.0-S0026271420307939-main-post print.pdfVersione editoriale pre print.pdf
An Evolutionary Algorithm Approach to Stress Program Generation During Burn-In / Appello, Davide; Bernardi, Paolo; Cantoro, Riccardo; Colazzo, Andrea; Motta, Alessandro; Pagani, Alberto; Pollaccia, Giorgio; Restifo, Marco; Ernesto, Sanchez; Venini, Federico. - In: JOURNAL OF LOW POWER ELECTRONICS. - ISSN 1546-1998. - STAMPA. - (2018), pp. 86-98. [10.1166/jolpe.2018.1542] 1-gen-2018 Paolo BernardiRiccardo CantoroMarco RestifoErnesto Sanchezand Federico Venini + JOLPE_FINAL.pdf
An Optimized Test During Burn-In for Automotive SoC / Appello, Davide; Bernardi, Paolo; Bugeja, Conrad; Cantoro, Riccardo; Pollaccia, Giorgio; Restifo, Marco; Ernesto, Sanchez; Venini, Federico. - In: IEEE DESIGN & TEST. - ISSN 2168-2356. - STAMPA. - (2018), pp. 46-53. [10.1109/MDAT.2018.2799807] 1-gen-2018 Paolo BernardiRiccardo CantoroMarco RestifoErnesto SanchezFederico Venini + PREPRINT_DT_DTSI-2017-04-0096.R2.pdf08272388.pdf
Automatic Test Generation for Verifying Microprocessors / Corno, Fulvio; SANCHEZ SANCHEZ, EDGAR ERNESTO; SONZA REORDA, Matteo; Squillero, Giovanni. - In: IEEE POTENTIALS. - ISSN 0278-6648. - 24:(2005), pp. 34-37. [10.1109/MP.2005.1405800] 1-gen-2005 CORNO, FulvioSANCHEZ SANCHEZ, EDGAR ERNESTOSONZA REORDA, MatteoSQUILLERO, Giovanni 71565_UPLOAD.pdf
Automatic Test Program Generation: a Case Study / Corno, Fulvio; SANCHEZ SANCHEZ, EDGAR ERNESTO; SONZA REORDA, Matteo; Squillero, Giovanni. - In: IEEE DESIGN & TEST OF COMPUTERS. - ISSN 0740-7475. - 21:(2004), pp. 102-109. [10.1109/MDT.2004.1277902] 1-gen-2004 CORNO, FulvioSANCHEZ SANCHEZ, EDGAR ERNESTOSONZA REORDA, MatteoSQUILLERO, Giovanni d&t2004.pdf
Code Generation for Functional Validation of Pipelined Microprocessors / Corno, Fulvio; SANCHEZ SANCHEZ, EDGAR ERNESTO; SONZA REORDA, Matteo; Squillero, Giovanni. - In: JOURNAL OF ELECTRONIC TESTING. - ISSN 0923-8174. - 20:(2004), pp. 269-278. 1-gen-2004 CORNO, FulvioSANCHEZ SANCHEZ, EDGAR ERNESTOSONZA REORDA, MatteoSQUILLERO, Giovanni 71570_UPLOAD.pdf
Design Validation of Multithreaded Processors using Threads Evolution / Ravotto, Danilo; SANCHEZ SANCHEZ, EDGAR ERNESTO; SONZA REORDA, Matteo; Squillero, Giovanni. - In: JICS. JOURNAL OF INTEGRATED CIRCUITS AND SYSTEMS. - ISSN 1807-1953. - 5:(2010), pp. 67-77. 1-gen-2010 RAVOTTO, DANILOSANCHEZ SANCHEZ, EDGAR ERNESTOSONZA REORDA, MatteoSQUILLERO, Giovanni jics2010.pdf
Development Flow for On-Line Core Self-Test of Automotive Microcontrollers / Bernardi, Paolo; Cantoro, Riccardo; De Luca, Sergio; SANCHEZ SANCHEZ, EDGAR ERNESTO; Sansonetti, Alessandro. - In: IEEE TRANSACTIONS ON COMPUTERS. - ISSN 0018-9340. - STAMPA. - 65:3(2016), pp. 744-754. [10.1109/TC.2015.2498546] 1-gen-2016 BERNARDI, PAOLOCANTORO, RICCARDOSANCHEZ SANCHEZ, EDGAR ERNESTO + 07321794.pdf07321794-1.pdf
Effective Diagnostic Pattern Generation Strategy forTransition-Delay Faults in Full-Scan SOCs / Appello, D; Bernardi, Paolo; Grosso, Michelangelo; SANCHEZ SANCHEZ, EDGAR ERNESTO; SONZA REORDA, Matteo. - In: IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS. - ISSN 1063-8210. - 17 (11):(2009), pp. 1654-1659. [10.1109/TVLSI.2008.2006177] 1-gen-2009 BERNARDI, PAOLOGROSSO, MICHELANGELOSANCHEZ SANCHEZ, EDGAR ERNESTOSONZA REORDA, Matteo + 1851511.pdf
Efficient Techniques for Automatic Verification-Oriented Test Set Optimization / SANCHEZ SANCHEZ, EDGAR ERNESTO; SONZA REORDA, Matteo; Squillero, Giovanni. - In: INTERNATIONAL JOURNAL OF PARALLEL PROGRAMMING. - ISSN 0885-7458. - 34:(2006), pp. 93-109. [10.1007/s10766-005-0005-7] 1-gen-2006 SANCHEZ SANCHEZ, EDGAR ERNESTOSONZA REORDA, MatteoSQUILLERO, Giovanni ijpp2006.pdf
Emulating the Effects of Radiation-Induced Soft-Errors for the Reliability Assessment of Neural Networks / Matana Luza, Lucas; Ruospo, Annachiara; Soderstrom, Daniel; Cazzaniga, Carlo; Kastriotou, Maria; Sanchez, Ernesto; Bosio, Alberto; Dilillo, Luigi. - In: IEEE TRANSACTIONS ON EMERGING TOPICS IN COMPUTING. - ISSN 2168-6750. - ELETTRONICO. - 10:4(2021), pp. 1867-1882. [10.1109/TETC.2021.3116999] 1-gen-2021 Ruospo, AnnachiaraSanchez, Ernesto + 2021_TETC___Emulating_the_Effects_of_Radiation_Induced_Soft_Errors_for_the_Reliability_Assessment_of_Neural_Networks.pdfPUBLISHED_Emulating_the_Effects_of_Radiation-Induced_Soft-Errors_for_the_Reliability_Assessment_of_Neural_Networks.pdf
Evolving assembly programs: how games help microprocessor validation / Corno, Fulvio; SANCHEZ SANCHEZ, EDGAR ERNESTO; Squillero, Giovanni. - In: IEEE TRANSACTIONS ON EVOLUTIONARY COMPUTATION. - ISSN 1089-778X. - 9:(2005), pp. 695-706. [10.1109/TEVC.2005.856207] 1-gen-2005 CORNO, FulvioSANCHEZ SANCHEZ, EDGAR ERNESTOSQUILLERO, Giovanni tec2005.pdf
EXT-TAURUM P2T: an Extended Secure CAN-FD Architecture for Road Vehicles / Oberti, F.; Savino, A.; Sanchez, E.; Parisi, F.; Di Carlo, S.. - In: IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY. - ISSN 1530-4388. - STAMPA. - 22:2(2022), pp. 98-110. [10.1109/TDMR.2022.3157000] 1-gen-2022 Oberti F.Savino A.Sanchez E.Di Carlo S. + TAURUM P2T Secure CAN BUS Architecture Camera Extented paper.pdfEXT-TAURUM_P2T_An_Extended_Secure_CAN-FD_Architecture_for_Road_Vehicles.pdf
Fast Power Evaluation for Effective Generation of Test Programs Maximizing Peak Power Consumption / Bernardi, Paolo; DE CARVALHO, Mauricio; SANCHEZ SANCHEZ, EDGAR ERNESTO; SONZA REORDA, Matteo; A., Bosio; L., Dilillo; M., Valka; P., Girard. - In: JOURNAL OF LOW POWER ELECTRONICS. - ISSN 1546-1998. - 9:(2013), pp. 253-263. [10.1166/jolpe.2013.1259] 1-gen-2013 BERNARDI, PAOLODE CARVALHO, MAURICIOSANCHEZ SANCHEZ, EDGAR ERNESTOSONZA REORDA, Matteo + -
Fault Grading Techniques of Software Test Libraries for Safety-Critical Applications / Floridia, Andrea; Sanchez, Ernesto; Sonza Reorda, Matteo. - In: IEEE ACCESS. - ISSN 2169-3536. - ELETTRONICO. - 7:(2019), pp. 63578-63587. [10.1109/ACCESS.2019.2917036] 1-gen-2019 Floridia, AndreaSanchez, ErnestoSonza Reorda, Matteo 08715776.pdf