Archivio Istituzionale della RicercaSANCHEZ SANCHEZ, EDGAR ERNESTO
SANCHEZ SANCHEZ, EDGAR ERNESTO
Dipartimento di Automatica e Informatica
Sanchez, Ernesto; E. Sanchez; Sanchez E.; Ernesto Sanchez; SANCHEZ EDGAR; SANCHEZ E.; SANCHEZ SANCHEZ EDGAR ERNESTO; SANCHEZ SANCHEZ E.
012684
APSS Metrics for Fault Detection: Area, Position, Symmetry, and Shape in Image Segmentation
In corso di stampa Turco, Vittorio; Fezza, Lorenzo; Ruospo, Annachiara; Sanchez, Ernesto; Sonza Reorda, Matteo
Power Side-Channel Vulnerabilities of a RISC-V Cryptography Accelerator Integrated into CVA6 via Core-V eXtension Interface (CV-X-IF)
In corso di stampa Farnaghinejad, Behnam; Bellizia, Davide; Dolmeta, Alessandra; Masera, Guido; Porsia, Antonio; Ruospo, Annachiara; Di Carlo, Stefano; Savino, Alessandro; Sanchez, Ernesto
Bi-LORD: Bit-Wise Low-Cost Real Numbers Dependability Assessment in AI Applications
2025 Azziz, Julia; Ruospo, Annachiara; Sanchez, Ernesto; Acle, Julio Pérez
DEAR-CNN: Data-Efficient Assessment of Resiliency in Convolutional Neural Networks
2025 Bellarmino, Nicolo'; Bosio, Alberto; Cantoro, Riccardo; Ruospo, Annachiara; Sanchez, Ernesto
DOC: Detection of On-Line Failures in CNNs
2025 Turco, Vittorio; Bellarmino, Nicolò; Ruospo, Annachiara; Cantoro, Riccardo; Sanchez, Ernesto
Image Test Libraries for the in-field test of ultra-low-power devices
2025 Porsia, Antonio; Perlo, Giacomo; Ruospo, Annachiara; Sanchez, Ernesto
Investigating on Gradient Regularization for Testing Neural Networks
2025 Bellarmino, Nicolo; Bosio, Alberto; Cantoro, Riccardo; Ruospo, Annachiara; Sanchez, Ernesto; Squillero, Giovanni
Late Contribution: VeriSide: A Modified Verilator for Leakage Assessment at the RTL Level
2025 Farnaghinejad, Behnam; Porsia, Antonio; Ruospo, Annachiara; Savino, Alessandro; Di Carlo, Stefano; Sanchez, Ernesto
On the resilience of INT8 Quantized Neural Networks on Low-Power RISC-V Devices
2025 Porsia, Antonio; Perlo, Giacomo; Ruospo, Annachiara; Sanchez, Ernesto
Special Session: Trustworthy Hardware-AI at the Cloud
2025 Angione, Francesco; Bernardi, Paolo; Bosio, Alberto; Dattatraya Dixit, Harish; Pappalardo, Salvatore; Ruospo, Annachiara; Sanchez, Ernesto; Sinha, Arani; Turco, Vittorio
AI Eye Charts: measuring the visual acuity of Neural Networks with test images
2024 Porsia, Antonio; Ruospo, Annachiara; Sanchez, Ernesto
An Integrated Environment for the Reliability Assessment of CNNs Accelerators Implemented in FPGAs
2024 Mesa, Luis Ariel; Guerrero-Balaguera, Juan-David; Castañeda, Erika D.; Sanchez, Ernesto; Pérez-Holguín, Wilson-Javier
Approximate Fault-Tolerant Neural Network Systems
2024 Traiola, Marcello; Pappalardo, Salvatore; Piri, Ali; Ruospo, Annachiara; Deveautour, Bastien; Sanchez, Ernesto; Bosio, Alberto; Saeedi, Sepide; Carpegna, Alessio; Göğebakan, Anıl Bayram; Magliano, Enrico; Savino, Alessandro
Early Detection of Permanent Faults in DNNs Through the Application of Tensor-Related Metrics
2024 Turco, V.; Ruospo, A.; Sanchez, E.; Sonza Reorda, M.
Model theft attack against a tinyML application running on an Ultra-Low-Power Open-Source SoC
2024 Porsia, Antonio; Ruospo, Annachiara; Sanchez, Ernesto
Reliable and Efficient hardware for Trustworthy Deep Neural Networks
2024 Pappalardo, Salvatore; Piri, Ali; Ruospo, Annachiara; Deveautour, Bastien; Sanchez, Ernesto; Bosio, Alberto
Resiliency approaches in Convolutional, Photonic, and Spiking Neural Networks
2024 Bosio, Alberto; Gomes, Mauricio; Pavanello, Fabio; Porsia, Antonio; Ruospo, Annachiara; Sanchez, Ernesto; Vatajelu, Elena Ioana
A Fast Reliability Analysis of Image Segmentation Neural Networks Exploiting Statistical Fault Injections
2023 Gavarini, G; Ruospo, A; Sanchez, E
A Fault Injection Framework for AI Hardware Accelerators
2023 Pappalardo, S; Ruospo, A; O'Connor, I; Deveautour, B; Sanchez, E; Bosio, A
Assessing Convolutional Neural Networks Reliability through Statistical Fault Injections
2023 Ruospo, Annachiara; Gavarini, Gabriele; De Sio, Corrado; Guerrero Balaguera, Juan David; Sterpone, Luca; Sonza Reorda, Matteo; Sanchez, Ernesto; Mariani, Riccardo; Aribido, Joseph; Athavale, Jyotika
| Citazione | Data di pubblicazione | Autori | File |
|---|---|---|---|
| APSS Metrics for Fault Detection: Area, Position, Symmetry, and Shape in Image Segmentation / Turco, Vittorio; Fezza, Lorenzo; Ruospo, Annachiara; Sanchez, Ernesto; Sonza Reorda, Matteo. - ELETTRONICO. - (In corso di stampa). (Intervento presentato al convegno DFT 2025 38th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems tenutosi a Barcellona (ESP) nel 21-23 October 2025). | In corso di stampa | Turco,VittorioFezza,LorenzoRuospo,AnnachiaraSanchez,ErnestoSonza Reorda,Matteo | DFT25___Segmentation_metrics.pdf |
| Power Side-Channel Vulnerabilities of a RISC-V Cryptography Accelerator Integrated into CVA6 via Core-V eXtension Interface (CV-X-IF) / Farnaghinejad, Behnam; Bellizia, Davide; Dolmeta, Alessandra; Masera, Guido; Porsia, Antonio; Ruospo, Annachiara; Di Carlo, Stefano; Savino, Alessandro; Sanchez, Ernesto. - (In corso di stampa), pp. 1-10. (Intervento presentato al convegno International Test Conference 2025 tenutosi a San Diego, California (USA) nel September 21-26, 2025). | In corso di stampa | Behnam FarnaghinejadAlessandra DolmetaGuido MaseraAntonio PorsiaAnnachiara RuospoStefano Di CarloAlessandro SavinoErnesto Sanchez + | ITC2025___Power_Side_Channel_Vulnerabilities_of_a_RISC_V_Cryptography_Accelerator_Integrated_into_CVA6_via_CV_X_IF.pdf |
| Bi-LORD: Bit-Wise Low-Cost Real Numbers Dependability Assessment in AI Applications / Azziz, Julia; Ruospo, Annachiara; Sanchez, Ernesto; Acle, Julio Pérez. - (2025), pp. 1-6. (Intervento presentato al convegno 26th IEEE Latin American Test Symposium, LATS 2025 tenutosi a San Andres Island (COL) nel 11-14 March 2025) [10.1109/lats65346.2025.10963952]. | 1-gen-2025 | Ruospo, AnnachiaraSanchez, Ernesto + | lats25_posit.pdf; Bi-LORD_Bit-Wise_Low-Cost_Real_Numbers_Dependability_Assessment_in_AI_Applications.pdf |
| DEAR-CNN: Data-Efficient Assessment of Resiliency in Convolutional Neural Networks / Bellarmino, Nicolo'; Bosio, Alberto; Cantoro, Riccardo; Ruospo, Annachiara; Sanchez, Ernesto. - ELETTRONICO. - (2025), pp. 13-18. (Intervento presentato al convegno 28th IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS) tenutosi a Lyon (FRA) nel May 5-7, 2025) [10.1109/DDECS63720.2025.11006797]. | 1-gen-2025 | Nicolo' BellarminoAlberto BosioRiccardo CantoroAnnachiara RuospoErnesto Sanchez | 2025_DDECS_DNN_TEST_COMPACTION_CONFERENCE (1).pdf; DEAR-CNN_Data-Efficient_Assessment_of_Resiliency_in_Convolutional_Neural_Networks.pdf |
| DOC: Detection of On-Line Failures in CNNs / Turco, Vittorio; Bellarmino, Nicolò; Ruospo, Annachiara; Cantoro, Riccardo; Sanchez, Ernesto. - ELETTRONICO. - (2025). (Intervento presentato al convegno Latin American Test Workshop, LATW tenutosi a San Andrés (COL) nel 11-14 March 2025) [10.1109/LATS65346.2025.10963935]. | 1-gen-2025 | Turco VittorioNicolò BellarminoAnnachiara RuospoCantoro RiccardoErnesto Sanchez | LATS2025_On_line_detection (3).pdf; DOC_Detection_of_On-Line_Failures_in_CNNs.pdf |
| Image Test Libraries for the in-field test of ultra-low-power devices / Porsia, Antonio; Perlo, Giacomo; Ruospo, Annachiara; Sanchez, Ernesto. - ELETTRONICO. - (2025). (Intervento presentato al convegno Latin American Test Workshop, LATW tenutosi a San Andrés (Colombia) nel 11-14 March 2025) [10.1109/LATS65346.2025.10963940]. | 1-gen-2025 | Porsia, AntonioPerlo, GiacomoRuospo, AnnachiaraSanchez, Ernesto | LATS25_ITL-3.pdf; Image_Test_Libraries_for_the_In-Field_Test_of_Ultra-Low-Power_Devices.pdf |
| Investigating on Gradient Regularization for Testing Neural Networks / Bellarmino, Nicolo; Bosio, Alberto; Cantoro, Riccardo; Ruospo, Annachiara; Sanchez, Ernesto; Squillero, Giovanni. - ELETTRONICO. - 15509:(2025), pp. 67-81. (Intervento presentato al convegno 10th International Conference on machine Learning, Optimization and Data science (LOD 2024) tenutosi a Castiglione della Pescaia (ITA) nel September 22 – 25, 2024) [10.1007/978-3-031-82484-5_6]. | 1-gen-2025 | Bellarmino, NicoloBosio, AlbertoCantoro, RiccardoRuospo, AnnachiaraSanchez, ErnestoSquillero, Giovanni | 2024_LOD_GRADIENT_PENALIZATION.pdf; 978-3-031-82484-5_6.pdf |
| Late Contribution: VeriSide: A Modified Verilator for Leakage Assessment at the RTL Level / Farnaghinejad, Behnam; Porsia, Antonio; Ruospo, Annachiara; Savino, Alessandro; Di Carlo, Stefano; Sanchez, Ernesto. - (2025), pp. 1-2. (Intervento presentato al convegno 26th IEEE Latin American Test Samposium 2025 tenutosi a San Andres Islas (COL) nel 11-14 March 2025) [10.1109/lats65346.2025.10963943]. | 1-gen-2025 | Farnaghinejad, BehnamPorsia, AntonioRuospo, AnnachiaraSavino, AlessandroDi Carlo, StefanoSanchez, Ernesto | LATS2025_IRIS.pdf; Late_Contribution_VeriSide_A_Modified_Verilator_for_Leakage_Assessment_at_the_RTL_Level.pdf |
| On the resilience of INT8 Quantized Neural Networks on Low-Power RISC-V Devices / Porsia, Antonio; Perlo, Giacomo; Ruospo, Annachiara; Sanchez, Ernesto. - (2025), pp. 119-122. (Intervento presentato al convegno AxC’25 The 10th Workshop on Approximate Computing tenutosi a Naples (Ita) nel June 23-26, 2025) [10.1109/DSN-W65791.2025.00049]. | 1-gen-2025 | Antonio PorsiaGiacomo PerloAnnachiara RuospoErnesto Sanchez | AxC2025.pdf; On_the_Resilience_of_INT8_Quantized_Neural_Networks_on_Low-Power_RISC-V_Devices.pdf |
| Special Session: Trustworthy Hardware-AI at the Cloud / Angione, Francesco; Bernardi, Paolo; Bosio, Alberto; Dattatraya Dixit, Harish; Pappalardo, Salvatore; Ruospo, Annachiara; Sanchez, Ernesto; Sinha, Arani; Turco, Vittorio. - ELETTRONICO. - (2025). (Intervento presentato al convegno IEEE VLSI Test Symposium 2025 tenutosi a Tempe, Arizona (USA) nel 28-30 April 2025) [10.1109/VTS65138.2025.11022869]. | 1-gen-2025 | Francesco AngionePaolo BernardiAnnachiara RuospoErnesto SanchezVittorio Turco + | VTS25___Special_Session.pdf; Special_Session_Trustworthy_Hardware-AI_at_the_Cloud.pdf |
| AI Eye Charts: measuring the visual acuity of Neural Networks with test images / Porsia, Antonio; Ruospo, Annachiara; Sanchez, Ernesto. - ELETTRONICO. - (2024), pp. 1-5. (Intervento presentato al convegno IEEE 2nd International conference on Design, Test & Technology of Integrated Systems tenutosi a Aix-en-Provence (FR) nel 14-16 October 2024) [10.1109/DTTIS62212.2024.10780079]. | 1-gen-2024 | Porsia, AntonioRuospo, AnnachiaraSanchez, Ernesto | ITL_SpecialSession-1.pdf; AI_Eye_Charts_measuring_the_visual_acuity_of_Neural_Networks_with_test_images.pdf |
| An Integrated Environment for the Reliability Assessment of CNNs Accelerators Implemented in FPGAs / Mesa, Luis Ariel; Guerrero-Balaguera, Juan-David; Castañeda, Erika D.; Sanchez, Ernesto; Pérez-Holguín, Wilson-Javier. - ELETTRONICO. - (2024). (Intervento presentato al convegno 2024 IEEE 25th Latin American Test Symposium (LATS) tenutosi a Maceio (BRA) nel 09-12 April 2024) [10.1109/lats62223.2024.10534609]. | 1-gen-2024 | Guerrero-Balaguera, Juan-DavidSanchez, Ernesto + | An_Integrated_Environment_for_the_Reliability_Assessment_of_CNNs_Accelerators_Implemented_in_FPGAs.pdf |
| Approximate Fault-Tolerant Neural Network Systems / Traiola, Marcello; Pappalardo, Salvatore; Piri, Ali; Ruospo, Annachiara; Deveautour, Bastien; Sanchez, Ernesto; Bosio, Alberto; Saeedi, Sepide; Carpegna, Alessio; Göğebakan, Anıl Bayram; Magliano, Enrico; Savino, Alessandro. - ELETTRONICO. - (2024), pp. 1-10. (Intervento presentato al convegno IEEE European Test Symposium (ETS) 2024 tenutosi a Der Haag (NL) nel 20-24 May 2024) [10.1109/ets61313.2024.10567290]. | 1-gen-2024 | Ruospo, AnnachiaraSanchez, ErnestoSaeedi, SepideCarpegna, AlessioMagliano, EnricoSavino, Alessandro + | Paper___ETS24___Embedded_Tutorial.pdf; Approximate_Fault-Tolerant_Neural_Network_Systems.pdf |
| Early Detection of Permanent Faults in DNNs Through the Application of Tensor-Related Metrics / Turco, V.; Ruospo, A.; Sanchez, E.; Sonza Reorda, M.. - ELETTRONICO. - (2024), pp. 13-18. (Intervento presentato al convegno 2024 27th International Symposium on Design & Diagnostics of Electronic Circuits & Systems (DDECS) tenutosi a Kielce (POL) nel 03-05 April 2024) [10.1109/DDECS60919.2024.10508918]. | 1-gen-2024 | Turco V.Ruospo A.Sanchez E.Sonza Reorda M. | Early_Detection_of_Permanent_Faults_in_DNNs_Through_the_Application_of_Tensor-Related_Metrics.pdf |
| Model theft attack against a tinyML application running on an Ultra-Low-Power Open-Source SoC / Porsia, Antonio; Ruospo, Annachiara; Sanchez, Ernesto. - ELETTRONICO. - (2024), pp. 63-66. (Intervento presentato al convegno 21st ACM International Conference on Computing Frontiers Workshops and Special Sessions (CF '24 Companion) tenutosi a Ischia (IT) nel 07-09/05/2024) [10.1145/3637543.3652877]. | 1-gen-2024 | Porsia, AntonioRuospo, AnnachiaraSanchez, Ernesto | OSHW24.pdf; 3637543.3652877.pdf |
| Reliable and Efficient hardware for Trustworthy Deep Neural Networks / Pappalardo, Salvatore; Piri, Ali; Ruospo, Annachiara; Deveautour, Bastien; Sanchez, Ernesto; Bosio, Alberto. - ELETTRONICO. - (2024), pp. 1-5. (Intervento presentato al convegno 2024 IEEE International Conference on Design, Test and Technology of Integrated Systems, DTTIS 2024 tenutosi a Aix-en-Provence (FRA) nel 14-16 October 2024) [10.1109/dttis62212.2024.10780183]. | 1-gen-2024 | Ruospo, AnnachiaraSanchez, Ernesto + | DTTIS2024_SS.pdf; Reliable_and_Efficient_hardware_for_Trustworthy_Deep_Neural_Networks.pdf |
| Resiliency approaches in Convolutional, Photonic, and Spiking Neural Networks / Bosio, Alberto; Gomes, Mauricio; Pavanello, Fabio; Porsia, Antonio; Ruospo, Annachiara; Sanchez, Ernesto; Vatajelu, Elena Ioana. - ELETTRONICO. - (2024), pp. 1-10. (Intervento presentato al convegno 2024 IEEE 25th Latin American Test Symposium (LATS) tenutosi a Maceió (BRA) nel 09-12 April 2024) [10.1109/LATS62223.2024.10534615]. | 1-gen-2024 | Porsia, AntonioRuospo, AnnachiaraSanchez, Ernesto + | LATS24_SpecialSession.pdf; Resiliency_Approaches_in_Convolutional_Photonic_and_Spiking_Neural_Networks.pdf |
| A Fast Reliability Analysis of Image Segmentation Neural Networks Exploiting Statistical Fault Injections / Gavarini, G; Ruospo, A; Sanchez, E. - (2023), pp. 1-6. (Intervento presentato al convegno 2023 IEEE 24th Latin American Test Symposium (LATS) tenutosi a Veracruz (Mexico) nel 21-24 March 2023) [10.1109/LATS58125.2023.10154488]. | 1-gen-2023 | Gavarini, GRuospo, ASanchez, E | A_Fast_Reliability_Analysis_of_Image_Segmentation_Neural_Networks_Exploiting_Statistical_Fault_Injections.pdf |
| A Fault Injection Framework for AI Hardware Accelerators / Pappalardo, S; Ruospo, A; O'Connor, I; Deveautour, B; Sanchez, E; Bosio, A. - ELETTRONICO. - (2023), pp. 1-6. (Intervento presentato al convegno 2023 IEEE 24th Latin American Test Symposium (LATS) tenutosi a Veracruz, Mexico nel 21-24 March 2023) [10.1109/LATS58125.2023.10154505]. | 1-gen-2023 | Ruospo, ASanchez, E + | _LATS23__A_Fault_Injection_Framework_for_AI_Hardware_Accelerators.pdf; A_Fault_Injection_Framework_for_AI_Hardware_Accelerators.pdf |
| Assessing Convolutional Neural Networks Reliability through Statistical Fault Injections / Ruospo, Annachiara; Gavarini, Gabriele; De Sio, Corrado; Guerrero Balaguera, Juan David; Sterpone, Luca; Sonza Reorda, Matteo; Sanchez, Ernesto; Mariani, Riccardo; Aribido, Joseph; Athavale, Jyotika. - (2023), pp. 1-6. (Intervento presentato al convegno IEEE Design, Automation and Test in Europe Conference (DATE) tenutosi a Antwerp (Belgium) nel 17 - 19 April 2023) [10.23919/DATE56975.2023.10136998]. | 1-gen-2023 | Ruospo, AnnachiaraGavarini, GabrieleDe Sio, CorradoGuerrero Balaguera, Juan DavidSterpone, LucaSonza Reorda, MatteoSanchez, Ernesto + | date_2023_acceptedVersion.pdf; Assessing_Convolutional_Neural_Networks_Reliability_through_Statistical_Fault_Injections.pdf |