SANCHEZ SANCHEZ, EDGAR ERNESTO

SANCHEZ SANCHEZ, EDGAR ERNESTO  

Dipartimento di Automatica e Informatica  

Sanchez, Ernesto; E. Sanchez; Sanchez E.; Ernesto Sanchez; SANCHEZ EDGAR; SANCHEZ E.; SANCHEZ SANCHEZ EDGAR ERNESTO; SANCHEZ SANCHEZ E.  

012684  

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Citazione Data di pubblicazione Autori File
A Fast Reliability Analysis of Image Segmentation Neural Networks Exploiting Statistical Fault Injections / Gavarini, G; Ruospo, A; Sanchez, E. - (2023), pp. 1-6. (Intervento presentato al convegno 2023 IEEE 24th Latin American Test Symposium (LATS) tenutosi a Veracruz (Mexico) nel 21-24 March 2023) [10.1109/LATS58125.2023.10154488]. 1-gen-2023 Gavarini, GRuospo, ASanchez, E A_Fast_Reliability_Analysis_of_Image_Segmentation_Neural_Networks_Exploiting_Statistical_Fault_Injections.pdf
A Fault Injection Framework for AI Hardware Accelerators / Pappalardo, S; Ruospo, A; O'Connor, I; Deveautour, B; Sanchez, E; Bosio, A. - ELETTRONICO. - (2023), pp. 1-6. (Intervento presentato al convegno 2023 IEEE 24th Latin American Test Symposium (LATS) tenutosi a Veracruz, Mexico nel 21-24 March 2023) [10.1109/LATS58125.2023.10154505]. 1-gen-2023 Ruospo, ASanchez, E + _LATS23__A_Fault_Injection_Framework_for_AI_Hardware_Accelerators.pdfA_Fault_Injection_Framework_for_AI_Hardware_Accelerators.pdf
Assessing Convolutional Neural Networks Reliability through Statistical Fault Injections / Ruospo, Annachiara; Gavarini, Gabriele; De Sio, Corrado; Guerrero Balaguera, Juan David; Sterpone, Luca; Sonza Reorda, Matteo; Sanchez, Ernesto; Mariani, Riccardo; Aribido, Joseph; Athavale, Jyotika. - (2023), pp. 1-6. (Intervento presentato al convegno IEEE Design, Automation and Test in Europe Conference (DATE) tenutosi a Antwerp (Belgium) nel 17 - 19 April 2023) [10.23919/DATE56975.2023.10136998]. 1-gen-2023 Ruospo, AnnachiaraGavarini, GabrieleDe Sio, CorradoGuerrero Balaguera, Juan DavidSterpone, LucaSonza Reorda, MatteoSanchez, Ernesto + date_2023_acceptedVersion.pdfAssessing_Convolutional_Neural_Networks_Reliability_through_Statistical_Fault_Injections.pdf
Evaluation and mitigation of faults affecting Swin Transformers / Gavarini, Gabriele; Ruospo, Annachiara; Sanchez, Ernesto. - ELETTRONICO. - (2023), pp. 1-7. (Intervento presentato al convegno 29th IEEE International Symposium on On-Line Testing and Robust System Design (IOLTS 2023) tenutosi a Chania,Crete (Greece) nel July 3rd - 5th, 2023) [10.1109/IOLTS59296.2023.10224882]. 1-gen-2023 Gabriele GavariniAnnachiara RuospoErnesto Sanchez IOLTS23_TransformerCaseStudy.pdfEvaluation_and_Mitigation_of_Faults_Affecting_Swin_Transformers.pdf
Image Test Libraries for the on-line self-test of functional units in GPUs running CNNs / Ruospo, Annachiara; Gavarini, Gabriele; Porsia, Antonio; Sonza Reorda, Matteo; Sanchez, Ernesto; Mariani, Riccardo; Aribido, Joseph; Athavale, Jyotika. - (2023), pp. 1-6. (Intervento presentato al convegno 28th IEEE European Test Symposium 2023 tenutosi a Venice (Italy) nel May 22 - 26, 2023) [10.1109/ETS56758.2023.10174176]. 1-gen-2023 Ruospo, AnnachiaraGavarini, GabrielePorsia, AntonioSonza Reorda, MatteoSanchez, Ernesto + OnlineTestImages_ETS23.pdfImage_Test_Libraries_for_the_on-line_self-test_of_functional_units_in_GPUs_running_CNNs.pdf
On the resilience of representative and novel data formats in CNNs / Gavarini, G.; Ruospo, A.; Sanchez, E.. - (2023). (Intervento presentato al convegno International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems tenutosi a Juan-Les-Pins (FR) nel 03-05 October 2023) [10.1109/DFT59622.2023.10313551]. 1-gen-2023 Gavarini G.Ruospo A.Sanchez E. On_the_resilience_of_representative_and_novel_data_formats_in_CNNs.pdf
PSP Framework: A novel risk assessment method in compliance with ISO/SAE-21434 / Oberti, Franco; Sanchez, Ernesto; Savino, Alessandro; Parisi, Filippo; Di Carlo, Stefano. - ELETTRONICO. - (2023), pp. 60-67. (Intervento presentato al convegno 2023 53rd Annual IEEE/IFIP International Conference on Dependable Systems and Networks Workshops (DSN-W) tenutosi a Porto (PRT) nel 27-30 June 2023) [10.1109/DSN-W58399.2023.00031]. 1-gen-2023 Oberti, FrancoSanchez, ErnestoSavino, AlessandroDi Carlo, Stefano + PSP_Framework_A_novel_risk_assessment_method_in_compliance_with_ISO_SAE-21434.pdfA novel methodology for threat analysis and risk assessment according to ISO-SAE 21434.tex.pdf
Resilience-Performance Tradeoff Analysis of a Deep Neural Network Accelerator / Pappalardo, S; Ruospo, A; O'Connor, I; Deveautour, B; Sanchez, E; Bosio, A. - (2023), pp. 181-186. (Intervento presentato al convegno 2023 26th International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS) tenutosi a Tallin, Estonia nel 03-05 May 2023) [10.1109/DDECS57882.2023.10139704]. 1-gen-2023 Ruospo, ASanchez, E + _DDECS__Resilence_Performance_Tradeoff_Analisys_of_Deep_Neural_Network_Accelerator.pdfResilience-Performance_Tradeoff_Analysis_of_a_Deep_Neural_Network_Accelerator.pdf
SCI-FI: a Smart, aCcurate and unIntrusive Fault-Injector for Deep Neural Networks / Gavarini, G; Ruospo, A; Sanchez, E. - (2023), pp. 1-6. (Intervento presentato al convegno 2023 IEEE European Test Symposium (ETS) tenutosi a Venice (Italy) nel 22-26 May 2023) [10.1109/ETS56758.2023.10173957]. 1-gen-2023 Gavarini, GRuospo, ASanchez, E SCI-FI_a_Smart_aCcurate_and_unIntrusive_Fault-Injector_for_Deep_Neural_Networks.pdf
Special Session: Approximation and Fault Resiliency of DNN Accelerators / Ahmadilivani, Mh; Barbareschi, M; Barone, S; Bosio, A; Daneshtalab, M; Della Torca, S; Gavarini, G; Jenihhin, M; Raik, J; Ruospo, A; Sanchez, E; Taheri, M. - (2023), pp. 1-10. (Intervento presentato al convegno 2023 IEEE 41st VLSI Test Symposium (VTS) tenutosi a San Diego (USA) nel 24-26 April 2023) [10.1109/VTS56346.2023.10140043]. 1-gen-2023 Barone, SBosio, AGavarini, GRuospo, ASanchez, E + Special_Session_Approximation_and_Fault_Resiliency_of_DNN_Accelerators.pdf
Uncovering hidden vulnerabilities in CNNs through evolutionary-based Image Test Libraries / Turco, V.; Ruospo, A.; Gavarini, G.; Sanchez, E.; Sonza Reorda, M.. - (2023). (Intervento presentato al convegno International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems tenutosi a Juan-Les-Pins (FR) nel 03-05 October 2023) [10.1109/DFT59622.2023.10313530]. 1-gen-2023 V. TurcoA. RuospoG. GavariniE. SanchezM. Sonza Reorda Uncovering_hidden_vulnerabilities_in_CNNs_through_evolutionary-based_Image_Test_Libraries.pdf
Evaluating the impact of Permanent Faults in a GPU running a Deep Neural Network / Juan-David, Guerrero-Balaguera; Galasso, Luigi; LIMAS SIERRA, ROBERT ALEXANDER; Ernesto, Sanchez; SONZA REORDA, Matteo. - (2022), pp. 96-101. (Intervento presentato al convegno 2022 {IEEE} International Test Conference in Asia ({ITC}-Asia) tenutosi a Taipei (Taiwan) nel 24-26 August 2022) [10.1109/itcasia55616.2022.00027]. 1-gen-2022 Juan-David Guerrero-BalagueraRobert Limas SierraErnesto SanchezMatteo Sonza Reorda + 2022_ITC_ASIA_CNNs_Reliability_Registers_cameraready.pdfEvaluating_the_impact_of_Permanent_Faults_in_a_GPU_running_a_Deep_Neural_Network.pdf
LIN-MM: Multiplexed Message Authentication Code for Local Interconnect Network message authentication in road vehicles / Oberti, Franco; Sanchez, Ernesto; Savino, Alessandro; Parisi, Filippo; Brero, Mirco; DI CARLO, Stefano. - ELETTRONICO. - (2022), pp. 1-7. (Intervento presentato al convegno IEEE 28th International Symposium on On-Line Testing and Robust System Design IOLTS 2022 tenutosi a Torino nel 12-14 September 2022) [10.1109/IOLTS56730.2022.9897819]. 1-gen-2022 Franco ObertiErnesto SanchezAlessandro SavinoStefano Di Carlo + IOLTS2022__LIN_Multiplexed_MAC_..pdfLIN-MM_Multiplexed_Message_Authentication_Code_for_Local_Interconnect_Network_message_authentication_in_road_vehicles.pdf
Selective Hardening of Critical Neurons in Deep Neural Networks / Ruospo, Annachiara; Gavarini, Gabriele; Bragaglia, Ilaria; Traiola, Marcello; Bosio, Alberto; Sanchez, Ernesto. - ELETTRONICO. - (2022), pp. 136-141. (Intervento presentato al convegno 25th International Symposium on Design and Diagnostics of Electronic Circuits and Systems – DDECS 2022 tenutosi a Prague, Czech Republic nel April 6 – 8, 2022) [10.1109/DDECS54261.2022.9770168]. 1-gen-2022 Ruospo, AnnachiaraGavarini, GabrieleSanchez, Ernesto + DDECS_2022__TMR_critical_neurons.pdfSelective_Hardening_of_Critical_Neurons_in_Deep_Neural_Networks.pdf
Test, Reliability and Functional Safety trends for Automotive System-on-Chip / Angione, F.; Appello, D.; Aribido, J.; Bellarmino, N.; Bernardi, P.; Cantoro, R.; de Sio, C.; Foscale, T.; Gavarini, G.; Huch, M.; Kilian, T; Mariani, R.; Martone, R.; Ruospo, A.; Sanchez, E.; Schlichtmann, U.; Squillero, G.; Sonza Reorda, M.; Sterpone, L.; Tancorre, V.; Ugioli, R.. - (2022). (Intervento presentato al convegno IEEE European Test Symposium). 1-gen-2022 F. AngioneN. BellarminoP. BernardiR. CantoroC. de SioT. FoscaleG. GavariniA. RuospoE. SanchezG. SquilleroM. Sonza ReordaL. Sterpone + 01_ETS_special_session_ABSTRACT.pdf
A Benchmark Suite of RT-level Hardware Trojansfor Pipelined Microprocessor Cores / Damljanovic, Aleksa; Ruospo, Annachiara; Sanchez Sanchez, Ernesto; Squillero, Giovanni. - ELETTRONICO. - (2021). (Intervento presentato al convegno 24th IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS) tenutosi a Vienna, Austria nel April 7-9). 1-gen-2021 Damljanovic, AleksaRuospo, AnnachiaraSanchez Sanchez, ErnestoSquillero, Giovanni Trojan2021_DDECS_.pdf
A JTAG-based Fault Emulation Platform for Dependability Analyses of Processor-based ASICs / Floridia, Andrea; Sanchez Sanchez, Ernesto. - ELETTRONICO. - 2021 12th IEEE Latin America Symposium on Circuits and System:(2021), pp. 1-4. (Intervento presentato al convegno 12th IEEE Latin America Symposium on Circuits and System tenutosi a Arequipa (Perú) nel February 21-25, 2021). 1-gen-2021 Floridia, AndreaSanchez Sanchez, Ernesto A_JTAG-based_Fault_Emulation_Platform_for_Dependability_Analyses_of_Processor-based_ASICs.pdf
A Model-Based Framework to Assess the Reliability of Safety-Critical Applications / Matana Luza, Lucas; Ruospo, Annachiara; Bosio, Alberto; Ernesto, Sanchez; Dilillo, Luigi. - ELETTRONICO. - (2021), pp. 41-44. (Intervento presentato al convegno 2021 24th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS) tenutosi a Vienna, Austria nel 7-9 April 2021) [10.1109/DDECS52668.2021.9417059]. 1-gen-2021 Annachiara RuospoErnesto Sanchez + 2021_DDECS___preprint.pdf09417059_postprint.pdf
A Suitability analysis of software based testing strategies for the on-line testing of artificial neural networks applications in embedded devices / Ruospo, A.; Piumatti, D.; Floridia, A.; Sanchez, E.. - ELETTRONICO. - (2021), pp. 1-6. (Intervento presentato al convegno 27th IEEE International Symposium on On-Line Testing and Robust System Design, IOLTS 2021 tenutosi a Torino, Italy nel 2021) [10.1109/IOLTS52814.2021.9486704]. 1-gen-2021 Ruospo A.Piumatti D.Floridia A.Sanchez E. FINAL_PUBLISHED.pdf
Mitigation of Automotive Control Modules Hardware Replacement-based Attacks Through Hardware Signature / Oberti, Franco; Sanchez, Ernesto; Savino, Alessandro; Parisi, Filippo; Di Carlo, Stefano. - ELETTRONICO. - (2021), pp. 13-14. (Intervento presentato al convegno 51st Annual IEEE/IFIP International Conference on Dependable Systems and Networks 2021 (DSN2021) tenutosi a Taipei, Taiwan nel 21-24 June 2021) [10.1109/DSN-S52858.2021.00017]. 1-gen-2021 Oberti, FrancoSanchez, ErnestoSavino, AlessandroDi Carlo, Stefano + HardwareSignature.pdfMitigation_of_Automotive_Control_Modules_Hardware_Replacement-based_Attacks_Through_Hardware_Signature.pdf