MASANTE, RICCARDO

MASANTE, RICCARDO  

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Exploiting post-silicon debug hardware to improve the fault coverage of Software Test Libraries / Cantoro, Riccardo; Garau, Francesco; Masante, Riccardo; Sartoni, Sandro; Singh, Virendra; Reorda, Matteo Sonza. - (2022), pp. 1-7. ((Intervento presentato al convegno 2022 IEEE 40th VLSI Test Symposium (VTS) tenutosi a San Diego (USA) nel 25-27 Aprile 2022 [10.1109/VTS52500.2021.9794219]. 1-gen-2022 Cantoro, RiccardoGarau, FrancescoMasante, RiccardoSartoni, SandroReorda, Matteo Sonza + VTS22___Exploiting_post_silicon_debug_hardware_to_improve_the_fault_coverage_of_Software_Test_Libraries__CAMERA_READY_.pdfExploiting_post-silicon_debug_hardware_to_improve_the_fault_coverage_of_Software_Test_Libraries.pdf
Self-Test Libraries Analysis for Pipelined Processors Transition Fault Coverage Improvement / Cantoro, Riccardo; Girard, Patrick; Masante, Riccardo; Sartoni, Sandro; Reorda, Matteo Sonza; Virazel, Arnaud. - (2021), pp. 1-4. ((Intervento presentato al convegno 2021 IEEE 27th International Symposium on On-Line Testing and Robust System Design (IOLTS) nel 28-30 June 2021 [10.1109/IOLTS52814.2021.9486711]. 1-gen-2021 Cantoro, RiccardoMasante, RiccardoSartoni, SandroReorda, Matteo Sonza + IOLTS21__Self-Test_Libraries_Analysis_for_Pipelined_Processors_Transition_Fault_Coverage_Improvement.pdfSelf-Test_Libraries_Analysis_for_Pipelined_Processors_Transition_Fault_Coverage_Improvement.pdf