Archivio Istituzionale della RicercaMASANTE, RICCARDO
MASANTE, RICCARDO
Dipartimento di Automatica e Informatica
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Self-Test Library Generation for In-field Test of Path Delay faults
2023 Anghel, Lorena; Cantoro, Riccardo; Masante, Riccardo; Portolan, Michele; Sartoni, Sandro; SONZA REORDA, Matteo
Exploiting post-silicon debug hardware to improve the fault coverage of Software Test Libraries
2022 Cantoro, Riccardo; Garau, Francesco; Masante, Riccardo; Sartoni, Sandro; Singh, Virendra; Reorda, Matteo Sonza
Self-Test Libraries Analysis for Pipelined Processors Transition Fault Coverage Improvement
2021 Cantoro, Riccardo; Girard, Patrick; Masante, Riccardo; Sartoni, Sandro; Reorda, Matteo Sonza; Virazel, Arnaud
| Citazione | Data di pubblicazione | Autori | File |
|---|---|---|---|
| Self-Test Library Generation for In-field Test of Path Delay faults / Anghel, Lorena; Cantoro, Riccardo; Masante, Riccardo; Portolan, Michele; Sartoni, Sandro; SONZA REORDA, Matteo. - In: IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS. - ISSN 0278-0070. - 42:11(2023), pp. 4246-4259. [10.1109/TCAD.2023.3268210] | 1-gen-2023 | Riccardo CantoroRiccardo MasanteMichele PortolanSandro SartoniMatteo Sonza Reorda + | IEEE_TCAD_____Self_Test_Library_Generation_for_In_field_Test_of_Path_Delay_faults.pdf; Self-Test_Library_Generation_for_In-Field_Test_of_Path_Delay_Faults.pdf |
| Exploiting post-silicon debug hardware to improve the fault coverage of Software Test Libraries / Cantoro, Riccardo; Garau, Francesco; Masante, Riccardo; Sartoni, Sandro; Singh, Virendra; Reorda, Matteo Sonza. - (2022), pp. 1-7. (Intervento presentato al convegno 2022 IEEE 40th VLSI Test Symposium (VTS) tenutosi a San Diego (USA) nel 25-27 Aprile 2022) [10.1109/VTS52500.2021.9794219]. | 1-gen-2022 | Cantoro, RiccardoGarau, FrancescoMasante, RiccardoSartoni, SandroReorda, Matteo Sonza + | VTS22___Exploiting_post_silicon_debug_hardware_to_improve_the_fault_coverage_of_Software_Test_Libraries__CAMERA_READY_.pdf; Exploiting_post-silicon_debug_hardware_to_improve_the_fault_coverage_of_Software_Test_Libraries.pdf |
| Self-Test Libraries Analysis for Pipelined Processors Transition Fault Coverage Improvement / Cantoro, Riccardo; Girard, Patrick; Masante, Riccardo; Sartoni, Sandro; Reorda, Matteo Sonza; Virazel, Arnaud. - (2021), pp. 1-4. (Intervento presentato al convegno 2021 IEEE 27th International Symposium on On-Line Testing and Robust System Design (IOLTS) nel 28-30 June 2021) [10.1109/IOLTS52814.2021.9486711]. | 1-gen-2021 | Cantoro, RiccardoMasante, RiccardoSartoni, SandroReorda, Matteo Sonza + | IOLTS21__Self-Test_Libraries_Analysis_for_Pipelined_Processors_Transition_Fault_Coverage_Improvement.pdf; Self-Test_Libraries_Analysis_for_Pipelined_Processors_Transition_Fault_Coverage_Improvement.pdf |