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Evaluating the Impact of Aging on Path-Delay Self-Test Libraries
2023 Cantoro, Riccardo; Sartoni, Sandro; Reorda, Matteo Sonza; Anghel, Lorena; Portolan, Michele
New Techniques to Detect and Mitigate Aging Effects in Advanced Semiconductor Technologies
2023 Sartoni, Sandro
Self-Test Library Generation for In-field Test of Path Delay faults
2023 Anghel, Lorena; Cantoro, Riccardo; Masante, Riccardo; Portolan, Michele; Sartoni, Sandro; SONZA REORDA, Matteo
A Systematic Method to Generate Effective STLs for the In-Field Test of CAN Bus Controllers
2022 da Silva, Felipe Augusto; Cantoro, Riccardo; Hamdioui, Said; Sartoni, Sandro; Sauer, Christian; Sonza Reorda, Matteo
Effective techniques for automatically improving the transition delay fault coverage of Self-Test Libraries
2022 Cantoro, Riccardo; Garau, Francesco; Girard, Patrick; Kolahimahmoudi, Nima; Sartoni, Sandro; Reorda, Matteo Sonza; Virazel, Arnaud
Exploiting post-silicon debug hardware to improve the fault coverage of Software Test Libraries
2022 Cantoro, Riccardo; Garau, Francesco; Masante, Riccardo; Sartoni, Sandro; Singh, Virendra; Reorda, Matteo Sonza
Recent Trends and Perspectives on Defect-Oriented Testing
2022 Bernardi, P.; Cantoro, R.; Coyette, A.; Dobbeleare, W.; Fieback, M.; Floridia, A.; Gielen, G.; Gomez, J.; Grosso, M.; Guerriero, A. M.; Guglielminetti, I.; Hamdioui, S.; Insinga, G.; Mautone, N.; Mirabella, N.; Sartoni, S.; Sonza Reorda, M.; Ullmann, R.; Vanhooren, R.; Xama, N.; Wu, L.
Self-Test Libraries Analysis for Pipelined Processors Transition Fault Coverage Improvement
2021 Cantoro, Riccardo; Girard, Patrick; Masante, Riccardo; Sartoni, Sandro; Reorda, Matteo Sonza; Virazel, Arnaud
Determined-Safe Faults Identification: A step towards ISO26262 hardware compliant designs
2020 da Silva, Felipe Augusto; Bagbaba, Ahmet Cagri; Sartoni, Sandro; Cantoro, Riccardo; Reorda, Matteo Sonza; Hamdioui, Said; Sauer, Christian
In-field Functional Test of CAN Bus Controllers
2020 Cantoro, Riccardo; Sartoni, Sandro; Reorda, Matteo Sonza
New Perspectives on Core In-field Path Delay Test
2020 Cantoro, Riccardo; Foti, Dario; Sartoni, Sandro; Sonza Reorda, Matteo; Anghel, Lorena; Portolan, Michele
| Citazione | Data di pubblicazione | Autori | File |
|---|---|---|---|
| Evaluating the Impact of Aging on Path-Delay Self-Test Libraries / Cantoro, R., Sartoni, S., Reorda, M.S., Anghel, L., Portolan, M.. - (2023). (IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT) 2023 Juan-Les-Pins (FRA) 03-05 October 2023) [10.1109/dft59622.2023.10313531]. | 1-gen-2023 | Cantoro, RiccardoSartoni, SandroReorda, Matteo SonzaPortolan, Michele + | _DFTS2023__Evaluating_the_Impact_of_Aging_on_Path_Delay_Self_Test_Libraries-3.pdf; Evaluating_the_Impact_of_Aging_on_Path-Delay_Self-Test_Libraries.pdf |
| New Techniques to Detect and Mitigate Aging Effects in Advanced Semiconductor Technologies / Sartoni, Sandro. - (2023 Nov 03), pp. 1-177. | 3-nov-2023 | SARTONI, SANDRO | conv_phdthesis-final.pdf; conv_phd_summary-1.pdf |
| Self-Test Library Generation for In-field Test of Path Delay faults / Anghel, L., Cantoro, R., Masante, R., Portolan, M., Sartoni, S., SONZA REORDA, M.. - In: IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS. - ISSN 0278-0070. - 42:11(2023), pp. 4246-4259. [10.1109/TCAD.2023.3268210] | 1-gen-2023 | Riccardo CantoroRiccardo MasanteMichele PortolanSandro SartoniMatteo Sonza Reorda + | IEEE_TCAD_____Self_Test_Library_Generation_for_In_field_Test_of_Path_Delay_faults.pdf; Self-Test_Library_Generation_for_In-Field_Test_of_Path_Delay_Faults.pdf |
| A Systematic Method to Generate Effective STLs for the In-Field Test of CAN Bus Controllers / da Silva, F.A., Cantoro, R., Hamdioui, S., Sartoni, S., Sauer, C., Sonza Reorda, M.. - In: ELECTRONICS. - ISSN 2079-9292. - 11:16(2022), p. 2481. [10.3390/electronics11162481] | 1-gen-2022 | Cantoro, RiccardoHamdioui, SaidSartoni, SandroSonza Reorda, Matteo + | electronics-11-02481-v2.pdf |
| Effective techniques for automatically improving the transition delay fault coverage of Self-Test Libraries / Cantoro, R., Garau, F., Girard, P., Kolahimahmoudi, N., Sartoni, S., Reorda, M.S., Virazel, A.. - (2022), pp. 1-2. (2022 IEEE European Test Symposium Barcelona (SP) 23-27 Maggio 2022) [10.1109/ETS54262.2022.9810392]. | 1-gen-2022 | Cantoro, RiccardoGarau, FrancescoKolahimahmoudi, NimaSartoni, SandroReorda, Matteo Sonza + | ETS22___Effective_techniques_for_automatically_improving_the_transition_delay_fault_coverage_of_Self_Test_Libraries.pdf; Effective_techniques_for_automatically_improving_the_transition_delay_fault_coverage_of_Self-Test_Libraries.pdf |
| Exploiting post-silicon debug hardware to improve the fault coverage of Software Test Libraries / Cantoro, R., Garau, F., Masante, R., Sartoni, S., Singh, V., Reorda, M.S.. - (2022), pp. 1-7. (2022 IEEE 40th VLSI Test Symposium (VTS) San Diego (USA) 25-27 Aprile 2022) [10.1109/VTS52500.2021.9794219]. | 1-gen-2022 | Cantoro, RiccardoGarau, FrancescoMasante, RiccardoSartoni, SandroReorda, Matteo Sonza + | VTS22___Exploiting_post_silicon_debug_hardware_to_improve_the_fault_coverage_of_Software_Test_Libraries__CAMERA_READY_.pdf; Exploiting_post-silicon_debug_hardware_to_improve_the_fault_coverage_of_Software_Test_Libraries.pdf |
| Recent Trends and Perspectives on Defect-Oriented Testing / Bernardi, P., Cantoro, R., Coyette, A., Dobbeleare, W., Fieback, M., Floridia, A., Gielen, G., Gomez, J., Grosso, M., Guerriero, A.M., Guglielminetti, I., Hamdioui, S., Insinga, G., Mautone, N., Mirabella, N., Sartoni, S., Sonza Reorda, M., Ullmann, R., Vanhooren, R., Xama, N., et al.. - (2022). (The 28th IEEE International Symposium on On-Line Testing and Robust System Design (IOLTS) Torino (Italy) 12-14 September 2022) [10.1109/IOLTS56730.2022.9897647]. | 1-gen-2022 | P. BernardiR. CantoroA. FloridiaM. GrossoS. HamdiouiG. InsingaN. MirabellaS. SartoniM. Sonza ReordaL. Wu + | _IOLTS2022__Special_Session__Recent_Trends_and_Perspectives_on_Defect_Oriented_Testing.pdf; Recent_Trends_and_Perspectives_on_Defect-Oriented_Testing.pdf |
| Self-Test Libraries Analysis for Pipelined Processors Transition Fault Coverage Improvement / Cantoro, R., Girard, P., Masante, R., Sartoni, S., Reorda, M.S., Virazel, A.. - (2021), pp. 1-4. (2021 IEEE 27th International Symposium on On-Line Testing and Robust System Design (IOLTS) 28-30 June 2021) [10.1109/IOLTS52814.2021.9486711]. | 1-gen-2021 | Cantoro, RiccardoMasante, RiccardoSartoni, SandroReorda, Matteo Sonza + | IOLTS21__Self-Test_Libraries_Analysis_for_Pipelined_Processors_Transition_Fault_Coverage_Improvement.pdf; Self-Test_Libraries_Analysis_for_Pipelined_Processors_Transition_Fault_Coverage_Improvement.pdf |
| Determined-Safe Faults Identification: A step towards ISO26262 hardware compliant designs / da Silva, F.A., Bagbaba, A.C., Sartoni, S., Cantoro, R., Reorda, M.S., Hamdioui, S., Sauer, C.. - ELETTRONICO. - (2020), pp. 1-6. (2020 IEEE European Test Symposium (ETS) Tallinn, Estonia 25-29 May 2020) [10.1109/ETS48528.2020.9131568]. | 1-gen-2020 | Sartoni, SandroCantoro, RiccardoReorda, Matteo SonzaHamdioui, Said + | PUBLISHED-09131568.pdf; ETS20___Determined_Safe_Faults_Identification.pdf |
| In-field Functional Test of CAN Bus Controllers / Cantoro, R., Sartoni, S., Reorda, M.S.. - ELETTRONICO. - (2020), pp. 1-6. (IEEE VLSI Test Symposium 2020 ) [10.1109/VTS48691.2020.9107628]. | 1-gen-2020 | Cantoro, RiccardoSartoni, SandroReorda, Matteo Sonza | 09107628.pdf; VTS20___CAN_Test.pdf |
| New Perspectives on Core In-field Path Delay Test / Cantoro, R., Foti, D., Sartoni, S., Sonza Reorda, M., Anghel, L., Portolan, M.. - ELETTRONICO. - (2020), pp. 1-5. (2020 IEEE International Test Conference (ITC) Washington DC (USA) 01-06 November 2020) [10.1109/ITC44778.2020.9325260]. | 1-gen-2020 | Cantoro, RiccardoFoti, DarioSartoni, SandroSonza Reorda, MatteoPortolan, Michele + | New_Perspectives_on_Core_In-field_Path_Delay_Test.pdf; ITC20___New_Perspectives_on_Core_In_field_Path_Delay_Test.pdf |