MIRABELLA, NUNZIO

MIRABELLA, NUNZIO  

Dipartimento di Automatica e Informatica  

068077  

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Citazione Data di pubblicazione Autori File
Targeting different defect-oriented fault models in IC testing: an experimental approach / Mirabella, Nunzio; Floridia, Andrea; Cantoro, Riccardo; Grosso, Michelangelo; Sonza Reorda, Matteo. - ELETTRONICO. - (In corso di stampa), pp. 1-6. (Intervento presentato al convegno 26th Euromicro Conference Series on Digital System Design (DSD) tenutosi a Durres (ALB) nel 6-8 September, 2023). In corso di stampa Mirabella,NunzioFloridia, AndreaCantoro, RiccardoGrosso, MichelangeloSonza Reorda, Matteo DSD_Conference_paper_1.9_submitted.docx2023172914.pdf
A comparative overview of ATPG flows targeting traditional and cell-aware fault models / Mirabella, Nunzio; Floridia, Andrea; Cantoro, Riccardo; Grosso, Michelangelo; Sonza Reorda, Matteo. - ELETTRONICO. - (2022), pp. 1-4. (Intervento presentato al convegno 29th IEEE International Conference on Electronics Circuits and Systems (ICECS) tenutosi a Glasgow nel 24th - 26th October 2022) [10.1109/ICECS202256217.2022.9971003]. 1-gen-2022 Mirabella, NunzioFloridia, AndreaCantoro, RiccardoGrosso, MichelangeloSonza Reorda, Matteo ICECS_2022_1.2.pdfConference_paper_1.2_submitted.docxA_comparative_overview_of_ATPG_flows_targeting_traditional_and_cell-aware_fault_models.pdf
An Experimental Evaluation of Resistive Defects and Different Testing Solutions in Low-Power Back-Biased SRAM Cells / Mirabella, N.; Grosso, M.; Franchino, G.; Rinaudo, S.; Deretzis, I.; La Magna, A.; Reorda, M. S.. - In: ELECTRONICS. - ISSN 2079-9292. - ELETTRONICO. - 11:2(2022), p. 203. [10.3390/electronics11020203] 1-gen-2022 Mirabella N.Grosso M.Reorda M. S. + electronics-11-00203.pdfMDPI_Paper.pdf
Recent Trends and Perspectives on Defect-Oriented Testing / Bernardi, P.; Cantoro, R.; Coyette, A.; Dobbeleare, W.; Fieback, M.; Floridia, A.; Gielen, G.; Gomez, J.; Grosso, M.; Guerriero, A. M.; Guglielminetti, I.; Hamdioui, S.; Insinga, G.; Mautone, N.; Mirabella, N.; Sartoni, S.; Sonza Reorda, M.; Ullmann, R.; Vanhooren, R.; Xama, N.; Wu, L.. - (2022). (Intervento presentato al convegno The 28th IEEE International Symposium on On-Line Testing and Robust System Design (IOLTS) tenutosi a Torino (Italy) nel 12-14 September 2022) [10.1109/IOLTS56730.2022.9897647]. 1-gen-2022 P. BernardiR. CantoroA. FloridiaM. GrossoS. HamdiouiG. InsingaN. MirabellaS. SartoniM. Sonza ReordaL. Wu + _IOLTS2022__Special_Session__Recent_Trends_and_Perspectives_on_Defect_Oriented_Testing.pdfRecent_Trends_and_Perspectives_on_Defect-Oriented_Testing.pdf
Comparing different solutions for testing resistive defects in low-power SRAMs / Mirabella, Nunzio; Grosso, Michelangelo; Franchino, Giovanna; Rinaudo, Salvatore; Deretzis, Ioannis; La Magna, Antonino; Sonza Reorda, Matteo. - ELETTRONICO. - (2021), pp. 1-6. (Intervento presentato al convegno 22nd IEEE Latin-American Test Symposium 2021 tenutosi a Porto Alegre (Brazil) nel 27th - 29th October 2021) [10.1109/lats53581.2021.9651760]. 1-gen-2021 Mirabella, NunzioGrosso, MichelangeloSonza Reorda, Matteo + 2021170336.pdfLATS_PAPER-submitted.pdf
Testing single via related defectsin digital VLSI designs / Mirabella, Nunzio; Ricci, Maurizio; Calà, Ignazio; Lanza, Roberto; Grosso, Michelangelo. - In: MICROELECTRONICS RELIABILITY. - ISSN 0026-2714. - ELETTRONICO. - 120 (114100):(2021). [10.1016/j.microrel.2021.114100] 1-gen-2021 Mirabella, NunzioGrosso, Michelangelo + singlevia_microrel_v04.pdf1-s2.0-S0026271421000664-main (1).pdf
On the test of single via related defects in digital VLSI designs / Mirabella, N.; Ricci, M.; Grosso, M.. - ELETTRONICO. - (2020), pp. 1-6. (Intervento presentato al convegno 23rd International Symposium on Design and Diagnostics of Electronic Circuits and Systems, DDECS 2020 tenutosi a Serbia nel 2020) [10.1109/DDECS50862.2020.9095717]. 1-gen-2020 Mirabella N.Grosso M. + PID6429081.pdfDDECS-SingleVia.pdf