Archivio Istituzionale della RicercaMIRABELLA, NUNZIO
MIRABELLA, NUNZIO
Dipartimento di Automatica e Informatica
068077
New techniques for quality and reliability enhancement in electronic systems
2024 Mirabella, Nunzio
Targeting different defect-oriented fault models in IC testing: an experimental approach
2023 Mirabella, Nunzio; Floridia, Andrea; Cantoro, Riccardo; Grosso, Michelangelo; Sonza Reorda, Matteo
A comparative overview of ATPG flows targeting traditional and cell-aware fault models
2022 Mirabella, Nunzio; Floridia, Andrea; Cantoro, Riccardo; Grosso, Michelangelo; Sonza Reorda, Matteo
An Experimental Evaluation of Resistive Defects and Different Testing Solutions in Low-Power Back-Biased SRAM Cells
2022 Mirabella, N.; Grosso, M.; Franchino, G.; Rinaudo, S.; Deretzis, I.; La Magna, A.; Reorda, M. S.
Recent Trends and Perspectives on Defect-Oriented Testing
2022 Bernardi, P.; Cantoro, R.; Coyette, A.; Dobbeleare, W.; Fieback, M.; Floridia, A.; Gielen, G.; Gomez, J.; Grosso, M.; Guerriero, A. M.; Guglielminetti, I.; Hamdioui, S.; Insinga, G.; Mautone, N.; Mirabella, N.; Sartoni, S.; Sonza Reorda, M.; Ullmann, R.; Vanhooren, R.; Xama, N.; Wu, L.
Comparing different solutions for testing resistive defects in low-power SRAMs
2021 Mirabella, Nunzio; Grosso, Michelangelo; Franchino, Giovanna; Rinaudo, Salvatore; Deretzis, Ioannis; La Magna, Antonino; Sonza Reorda, Matteo
Testing single via related defectsin digital VLSI designs
2021 Mirabella, Nunzio; Ricci, Maurizio; Calà, Ignazio; Lanza, Roberto; Grosso, Michelangelo
On the test of single via related defects in digital VLSI designs
2020 Mirabella, N.; Ricci, M.; Grosso, M.
| Citazione | Data di pubblicazione | Autori | File |
|---|---|---|---|
| New techniques for quality and reliability enhancement in electronic systems / Mirabella, Nunzio. - (2024 Sep 11), pp. 1-103. | 11-set-2024 | MIRABELLA, NUNZIO | conv_nunzio_mirabella_phd_thesis.pdf; conv_thesis_synthesis.pdf |
| Targeting different defect-oriented fault models in IC testing: an experimental approach / Mirabella, Nunzio; Floridia, Andrea; Cantoro, Riccardo; Grosso, Michelangelo; Sonza Reorda, Matteo. - ELETTRONICO. - (2023), pp. 214-219. (Intervento presentato al convegno 26th Euromicro Conference Series on Digital System Design (DSD) tenutosi a Golem (ALB) nel 6-8 September, 2023) [10.1109/DSD60849.2023.00039]. | 1-gen-2023 | Mirabella, NunzioFloridia, AndreaCantoro, RiccardoGrosso, MichelangeloSonza Reorda, Matteo | DSD_Conference_paper_1.9_submitted.docx; 2023172914.pdf; Targeting_different_defect-oriented_fault_models_in_IC_testing_an_experimental_approach.pdf |
| A comparative overview of ATPG flows targeting traditional and cell-aware fault models / Mirabella, Nunzio; Floridia, Andrea; Cantoro, Riccardo; Grosso, Michelangelo; Sonza Reorda, Matteo. - ELETTRONICO. - (2022), pp. 1-4. (Intervento presentato al convegno 29th IEEE International Conference on Electronics Circuits and Systems (ICECS) tenutosi a Glasgow nel 24th - 26th October 2022) [10.1109/ICECS202256217.2022.9971003]. | 1-gen-2022 | Mirabella, NunzioFloridia, AndreaCantoro, RiccardoGrosso, MichelangeloSonza Reorda, Matteo | ICECS_2022_1.2.pdf; Conference_paper_1.2_submitted.docx; A_comparative_overview_of_ATPG_flows_targeting_traditional_and_cell-aware_fault_models.pdf |
| An Experimental Evaluation of Resistive Defects and Different Testing Solutions in Low-Power Back-Biased SRAM Cells / Mirabella, N.; Grosso, M.; Franchino, G.; Rinaudo, S.; Deretzis, I.; La Magna, A.; Reorda, M. S.. - In: ELECTRONICS. - ISSN 2079-9292. - ELETTRONICO. - 11:2(2022), p. 203. [10.3390/electronics11020203] | 1-gen-2022 | Mirabella N.Grosso M.Reorda M. S. + | electronics-11-00203.pdf; MDPI_Paper.pdf |
| Recent Trends and Perspectives on Defect-Oriented Testing / Bernardi, P.; Cantoro, R.; Coyette, A.; Dobbeleare, W.; Fieback, M.; Floridia, A.; Gielen, G.; Gomez, J.; Grosso, M.; Guerriero, A. M.; Guglielminetti, I.; Hamdioui, S.; Insinga, G.; Mautone, N.; Mirabella, N.; Sartoni, S.; Sonza Reorda, M.; Ullmann, R.; Vanhooren, R.; Xama, N.; Wu, L.. - (2022). (Intervento presentato al convegno The 28th IEEE International Symposium on On-Line Testing and Robust System Design (IOLTS) tenutosi a Torino (Italy) nel 12-14 September 2022) [10.1109/IOLTS56730.2022.9897647]. | 1-gen-2022 | P. BernardiR. CantoroA. FloridiaM. GrossoS. HamdiouiG. InsingaN. MirabellaS. SartoniM. Sonza ReordaL. Wu + | _IOLTS2022__Special_Session__Recent_Trends_and_Perspectives_on_Defect_Oriented_Testing.pdf; Recent_Trends_and_Perspectives_on_Defect-Oriented_Testing.pdf |
| Comparing different solutions for testing resistive defects in low-power SRAMs / Mirabella, Nunzio; Grosso, Michelangelo; Franchino, Giovanna; Rinaudo, Salvatore; Deretzis, Ioannis; La Magna, Antonino; Sonza Reorda, Matteo. - ELETTRONICO. - (2021), pp. 1-6. (Intervento presentato al convegno 22nd IEEE Latin-American Test Symposium 2021 tenutosi a Porto Alegre (Brazil) nel 27th - 29th October 2021) [10.1109/lats53581.2021.9651760]. | 1-gen-2021 | Mirabella, NunzioGrosso, MichelangeloSonza Reorda, Matteo + | 2021170336.pdf; LATS_PAPER-submitted.pdf |
| Testing single via related defectsin digital VLSI designs / Mirabella, Nunzio; Ricci, Maurizio; Calà, Ignazio; Lanza, Roberto; Grosso, Michelangelo. - In: MICROELECTRONICS RELIABILITY. - ISSN 0026-2714. - ELETTRONICO. - 120 (114100):(2021). [10.1016/j.microrel.2021.114100] | 1-gen-2021 | Mirabella, NunzioGrosso, Michelangelo + | singlevia_microrel_v04.pdf; 1-s2.0-S0026271421000664-main (1).pdf |
| On the test of single via related defects in digital VLSI designs / Mirabella, N.; Ricci, M.; Grosso, M.. - ELETTRONICO. - (2020), pp. 1-6. (Intervento presentato al convegno 23rd International Symposium on Design and Diagnostics of Electronic Circuits and Systems, DDECS 2020 tenutosi a Serbia nel 2020) [10.1109/DDECS50862.2020.9095717]. | 1-gen-2020 | Mirabella N.Grosso M. + | PID6429081.pdf; DDECS-SingleVia.pdf |