Low-power SRAM architectures are especially sensitive to many types of defects that may occur during manufacturing. Among these, resistive defects can appear. This paper analyzes some types of such defects that may impair the device functionalities in subtle ways, depending on the defect characteristics, and that may not be directly or easily detectable by traditional test methods, such as March algorithms. We analyze different methods to test such defects and discuss them in terms of complexity and test time.

Comparing different solutions for testing resistive defects in low-power SRAMs / Mirabella, Nunzio; Grosso, Michelangelo; Franchino, Giovanna; Rinaudo, Salvatore; Deretzis, Ioannis; La Magna, Antonino; Sonza Reorda, Matteo. - ELETTRONICO. - (2021), pp. 1-6. ((Intervento presentato al convegno 22nd IEEE Latin-American Test Symposium 2021 tenutosi a Porto Alegre (Brazil) nel 27th - 29th October 2021 [10.1109/lats53581.2021.9651760].

Comparing different solutions for testing resistive defects in low-power SRAMs

Mirabella, Nunzio;Grosso, Michelangelo;Sonza Reorda, Matteo
2021

Abstract

Low-power SRAM architectures are especially sensitive to many types of defects that may occur during manufacturing. Among these, resistive defects can appear. This paper analyzes some types of such defects that may impair the device functionalities in subtle ways, depending on the defect characteristics, and that may not be directly or easily detectable by traditional test methods, such as March algorithms. We analyze different methods to test such defects and discuss them in terms of complexity and test time.
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Utilizza questo identificativo per citare o creare un link a questo documento: http://hdl.handle.net/11583/2920394