Archivio Istituzionale della RicercaHAMDIOUI, SAID
Device-Aware Test for Anomalous Charge Trapping in FeFETs
2025 Yuan, Sicong; Wang, Changhao; Fieback, Moritz; Xun, Hanzhi; Taouil, Mottaqiallah; Li, Xiuyan; Wang, Lin; Chen, Danyang; Bellarmino, Nicolò; Cantoro, Riccardo; Hamdioui, Said
Device-Aware Test for Threshold Voltage Shifting in FeFET
2025 Wang, Changhao; Kolahimahmoudi, Nima; Bellarmino, Nicolo; Cantoro, Riccardo; Yuan, Sicong; Xun, Hanzhi; Chen, Danyang; Yin, Chujun; Taouil, Mottaqiallah; Fieback, Moritz; Li, Xiuyan; Wang, Lin; Li, Chaobo; Hamdioui, Said
Defects, Fault Modeling, and Test Development Framework for FeFETs
2024 Wang, Changhao; Yuan, Sicong; Xun, Hanzhi; Li, Chaobo; Taouil, Mottaqiallah; Fieback, Moritz; Chen, Danyang; Li, Xiuyan; Wang, Lin; Cantoro, Riccardo; Yin, Chujun; Hamdioui, Said
Recent Trends and Perspectives on Defect-Oriented Testing
2022 Bernardi, P.; Cantoro, R.; Coyette, A.; Dobbeleare, W.; Fieback, M.; Floridia, A.; Gielen, G.; Gomez, J.; Grosso, M.; Guerriero, A. M.; Guglielminetti, I.; Hamdioui, S.; Insinga, G.; Mautone, N.; Mirabella, N.; Sartoni, S.; Sonza Reorda, M.; Ullmann, R.; Vanhooren, R.; Xama, N.; Wu, L.
Determined-Safe Faults Identification: A step towards ISO26262 hardware compliant designs
2020 da Silva, Felipe Augusto; Bagbaba, Ahmet Cagri; Sartoni, Sandro; Cantoro, Riccardo; Reorda, Matteo Sonza; Hamdioui, Said; Sauer, Christian
Special Session: AutoSoC - A Suite of Open-Source Automotive SoC Benchmarks
2020 Da Silva, F. A.; Cagri Bagbaba, A.; Ruospo, A.; Mariani, R.; Kanawati, G.; Sanchez, E.; Reorda, M. S.; Jenihhin, M.; Hamdioui, S.; Sauer, C.
Untestable faults identification in GPGPUs for safety-critical applications
2019 Condia, Josie E. Rodriguez; Da Silva, Felipe A.; Hamdioui, S.; Sauer, C.; Reorda, M. Sonza
An efficient method for the test of embedded memory cores during the operational phase
2013 Bernardi, Paolo; Ciganda, Lyl Mercedes; Sonza Reorda, Matteo; Hamdioui, Said
| Citazione | Data di pubblicazione | Autori | File |
|---|---|---|---|
| Device-Aware Test for Anomalous Charge Trapping in FeFETs / Yuan, S., Wang, C., Fieback, M., Xun, H., Taouil, M., Li, X., Wang, L., Chen, D., Bellarmino, N., Cantoro, R., Hamdioui, S.. - (2025), pp. 635-641. (30th Asia and South Pacific Design Automation Conference ASP-DAC 2025 Tokyo (JPN) Jan. 20-23, 2025) [10.1145/3658617.3697755]. | 1-gen-2025 | Changhao WangNicolò BellarminoRiccardo CantoroSaid Hamdioui + | 3658617.3697755.pdf |
| Device-Aware Test for Threshold Voltage Shifting in FeFET / Wang, C., Kolahimahmoudi, N., Bellarmino, N., Cantoro, R., Yuan, S., Xun, H., Chen, D., Yin, C., Taouil, M., Fieback, M., Li, X., Wang, L., Li, C., Hamdioui, S.. - (2025), pp. 410-413. (IEEE International Test Conference 2025 San Diego (USA) 20-26 September 2025) [10.1109/ITC58126.2025.00052]. | 1-gen-2025 | Wang, ChanghaoKolahimahmoudi, NimaBellarmino, NicoloCantoro, RiccardoHamdioui, Said + | 2025_ITC__Device_Aware_Test_for_voltage_shifting_in_FeFET__4_pages_.pdf; Device-Aware_Test_for_Threshold_Voltage_Shifting_in_FeFET.pdf |
| Defects, Fault Modeling, and Test Development Framework for FeFETs / Wang, C., Yuan, S., Xun, H., Li, C., Taouil, M., Fieback, M., Chen, D., Li, X., Wang, L., Cantoro, R., Yin, C., Hamdioui, S.. - (2024), pp. 91-95. (International Test Conference (ITC) 2024 San Diego (USA) 03-08 November 2024) [10.1109/ITC51657.2024.00026]. | 1-gen-2024 | Riccardo, CantoroSaid, Hamdioui + | 2024_ITC_A_framework_of_defect_oritned_testing_for_FeFETs_2.pdf; Defects_Fault_Modeling_and_Test_Development_Framework_for_FeFETs.pdf |
| Recent Trends and Perspectives on Defect-Oriented Testing / Bernardi, P., Cantoro, R., Coyette, A., Dobbeleare, W., Fieback, M., Floridia, A., Gielen, G., Gomez, J., Grosso, M., Guerriero, A.M., Guglielminetti, I., Hamdioui, S., Insinga, G., Mautone, N., Mirabella, N., Sartoni, S., Sonza Reorda, M., Ullmann, R., Vanhooren, R., Xama, N., et al.. - (2022). (The 28th IEEE International Symposium on On-Line Testing and Robust System Design (IOLTS) Torino (Italy) 12-14 September 2022) [10.1109/IOLTS56730.2022.9897647]. | 1-gen-2022 | P. BernardiR. CantoroA. FloridiaM. GrossoS. HamdiouiG. InsingaN. MirabellaS. SartoniM. Sonza ReordaL. Wu + | _IOLTS2022__Special_Session__Recent_Trends_and_Perspectives_on_Defect_Oriented_Testing.pdf; Recent_Trends_and_Perspectives_on_Defect-Oriented_Testing.pdf |
| Determined-Safe Faults Identification: A step towards ISO26262 hardware compliant designs / da Silva, F.A., Bagbaba, A.C., Sartoni, S., Cantoro, R., Reorda, M.S., Hamdioui, S., Sauer, C.. - ELETTRONICO. - (2020), pp. 1-6. (2020 IEEE European Test Symposium (ETS) Tallinn, Estonia 25-29 May 2020) [10.1109/ETS48528.2020.9131568]. | 1-gen-2020 | Sartoni, SandroCantoro, RiccardoReorda, Matteo SonzaHamdioui, Said + | PUBLISHED-09131568.pdf; ETS20___Determined_Safe_Faults_Identification.pdf |
| Special Session: AutoSoC - A Suite of Open-Source Automotive SoC Benchmarks / Da Silva, F.A., Cagri Bagbaba, A., Ruospo, A., Mariani, R., Kanawati, G., Sanchez, E., Reorda, M.S., Jenihhin, M., Hamdioui, S., Sauer, C.. - ELETTRONICO. - 2020-:(2020), pp. 1-9. (38th IEEE VLSI Test Symposium, VTS 2020 usa 2020) [10.1109/VTS48691.2020.9107599]. | 1-gen-2020 | Ruospo A.Sanchez E.Reorda M. S.Hamdioui S. + | autosoc.pdf; AutoSoC___VTS_Special_Session_postprint.pdf |
| Untestable faults identification in GPGPUs for safety-critical applications / Condia, J.E.R., Da Silva, F.A., Hamdioui, S., Sauer, C., Reorda, M.S.. - ELETTRONICO. - (2019), pp. 570-573. (2019 26th IEEE International Conference on Electronics, Circuits and Systems (ICECS) Genova 27-29 Nov. 2019) [10.1109/ICECS46596.2019.8964677]. | 1-gen-2019 | Condia, Josie E. RodriguezHamdioui, S.Reorda, M. Sonza + | camera ready version.pdf; 08964677.pdf |
| An efficient method for the test of embedded memory cores during the operational phase / Bernardi, P., Ciganda, L.M., Sonza Reorda, M., Hamdioui, S.. - STAMPA. - (2013), pp. 227-232. (2013 22nd Asian Test Symposium Yilan, Taiwan Nov. 2013) [10.1109/ATS.2013.50]. | 1-gen-2013 | BERNARDI, PAOLOCIGANDA, LYL MERCEDESSONZA REORDA, MatteoHAMDIOUI, SAID | - |