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Defects, Fault Modeling, and Test Development Framework for FeFETs
In corso di stampa Wang, Changhao; Yuan, Sicong; Xun, Hanzhi; Li, Chaobo; Taouil, Mottaqiallah; Fieback, Moritz; Chen, Danyang; Li, Xiuyan; Wang, Lin; Cantoro, Riccardo; Yin, Chujun; Hamdioui, Said
Device-Aware Test for Anomalous Charge Trapping in FeFETs
In corso di stampa Yuan, Sicong; Wang, Changhao; Fieback, Moritz; Xun, Hanzhi; Taouil, Mottaqiallah; Li, Xiuyan; Wang, Lin; Chen, Danyang; Bellarmino, Nicolò; Cantoro, Riccardo; Hamdioui, Said
Recent Trends and Perspectives on Defect-Oriented Testing
2022 Bernardi, P.; Cantoro, R.; Coyette, A.; Dobbeleare, W.; Fieback, M.; Floridia, A.; Gielen, G.; Gomez, J.; Grosso, M.; Guerriero, A. M.; Guglielminetti, I.; Hamdioui, S.; Insinga, G.; Mautone, N.; Mirabella, N.; Sartoni, S.; Sonza Reorda, M.; Ullmann, R.; Vanhooren, R.; Xama, N.; Wu, L.
Determined-Safe Faults Identification: A step towards ISO26262 hardware compliant designs
2020 da Silva, Felipe Augusto; Bagbaba, Ahmet Cagri; Sartoni, Sandro; Cantoro, Riccardo; Reorda, Matteo Sonza; Hamdioui, Said; Sauer, Christian
Special Session: AutoSoC - A Suite of Open-Source Automotive SoC Benchmarks
2020 Da Silva, F. A.; Cagri Bagbaba, A.; Ruospo, A.; Mariani, R.; Kanawati, G.; Sanchez, E.; Reorda, M. S.; Jenihhin, M.; Hamdioui, S.; Sauer, C.
Untestable faults identification in GPGPUs for safety-critical applications
2019 Condia, Josie E. Rodriguez; Da Silva, Felipe A.; Hamdioui, S.; Sauer, C.; Reorda, M. Sonza
An efficient method for the test of embedded memory cores during the operational phase
2013 Bernardi, Paolo; Ciganda, LYL MERCEDES; SONZA REORDA, Matteo; Hamdioui, Said
| Citazione | Data di pubblicazione | Autori | File |
|---|---|---|---|
| Defects, Fault Modeling, and Test Development Framework for FeFETs / Wang, Changhao; Yuan, Sicong; Xun, Hanzhi; Li, Chaobo; Taouil, Mottaqiallah; Fieback, Moritz; Chen, Danyang; Li, Xiuyan; Wang, Lin; Cantoro, Riccardo; Yin, Chujun; Hamdioui, Said. - (In corso di stampa). (Intervento presentato al convegno International Test Conference (ITC) 2024 tenutosi a San Diego (USA) nel 3-8 Novembre 2024). | In corso di stampa | Riccardo, CantoroSaid, Hamdioui + | 2024_ITC_A_framework_of_defect_oritned_testing_for_FeFETs_2.pdf |
| Device-Aware Test for Anomalous Charge Trapping in FeFETs / Yuan, Sicong; Wang, Changhao; Fieback, Moritz; Xun, Hanzhi; Taouil, Mottaqiallah; Li, Xiuyan; Wang, Lin; Chen, Danyang; Bellarmino, Nicolò; Cantoro, Riccardo; Hamdioui, Said. - 30th Asia and South Pacific Design Automation Conference ASP-DAC 2025:(In corso di stampa). (Intervento presentato al convegno 30th Asia and South Pacific Design Automation Conference ASP-DAC 2025 tenutosi a Tokyo Odaiba Miraikan, Japan nel Jan. 20-23, 2025). | In corso di stampa | Nicolò BellarminoRiccardo CantoroSaid Hamdioui + | Sicong_2024_ASPDAC__Device_Aware_Test_for_Anomalous_Charge_Trapping_in_FeFETs.pdf |
| Recent Trends and Perspectives on Defect-Oriented Testing / Bernardi, P.; Cantoro, R.; Coyette, A.; Dobbeleare, W.; Fieback, M.; Floridia, A.; Gielen, G.; Gomez, J.; Grosso, M.; Guerriero, A. M.; Guglielminetti, I.; Hamdioui, S.; Insinga, G.; Mautone, N.; Mirabella, N.; Sartoni, S.; Sonza Reorda, M.; Ullmann, R.; Vanhooren, R.; Xama, N.; Wu, L.. - (2022). (Intervento presentato al convegno The 28th IEEE International Symposium on On-Line Testing and Robust System Design (IOLTS) tenutosi a Torino (Italy) nel 12-14 September 2022) [10.1109/IOLTS56730.2022.9897647]. | 1-gen-2022 | P. BernardiR. CantoroA. FloridiaM. GrossoS. HamdiouiG. InsingaN. MirabellaS. SartoniM. Sonza ReordaL. Wu + | _IOLTS2022__Special_Session__Recent_Trends_and_Perspectives_on_Defect_Oriented_Testing.pdf; Recent_Trends_and_Perspectives_on_Defect-Oriented_Testing.pdf |
| Determined-Safe Faults Identification: A step towards ISO26262 hardware compliant designs / da Silva, Felipe Augusto; Bagbaba, Ahmet Cagri; Sartoni, Sandro; Cantoro, Riccardo; Reorda, Matteo Sonza; Hamdioui, Said; Sauer, Christian. - ELETTRONICO. - (2020), pp. 1-6. (Intervento presentato al convegno 2020 IEEE European Test Symposium (ETS) tenutosi a Tallinn, Estonia nel 25-29 May 2020) [10.1109/ETS48528.2020.9131568]. | 1-gen-2020 | Sartoni, SandroCantoro, RiccardoReorda, Matteo SonzaHamdioui, Said + | PUBLISHED-09131568.pdf; ETS20___Determined_Safe_Faults_Identification.pdf |
| Special Session: AutoSoC - A Suite of Open-Source Automotive SoC Benchmarks / Da Silva, F. A.; Cagri Bagbaba, A.; Ruospo, A.; Mariani, R.; Kanawati, G.; Sanchez, E.; Reorda, M. S.; Jenihhin, M.; Hamdioui, S.; Sauer, C.. - ELETTRONICO. - 2020-:(2020), pp. 1-9. (Intervento presentato al convegno 38th IEEE VLSI Test Symposium, VTS 2020 tenutosi a usa nel 2020) [10.1109/VTS48691.2020.9107599]. | 1-gen-2020 | Ruospo A.Sanchez E.Reorda M. S.Hamdioui S. + | autosoc.pdf; AutoSoC___VTS_Special_Session_postprint.pdf |
| Untestable faults identification in GPGPUs for safety-critical applications / Condia, Josie E. Rodriguez; Da Silva, Felipe A.; Hamdioui, S.; Sauer, C.; Reorda, M. Sonza. - ELETTRONICO. - (2019), pp. 570-573. (Intervento presentato al convegno 2019 26th IEEE International Conference on Electronics, Circuits and Systems (ICECS) tenutosi a Genova nel 27-29 Nov. 2019) [10.1109/ICECS46596.2019.8964677]. | 1-gen-2019 | Condia, Josie E. RodriguezHamdioui, S.Reorda, M. Sonza + | camera ready version.pdf; 08964677.pdf |
| An efficient method for the test of embedded memory cores during the operational phase / Bernardi, Paolo; Ciganda, LYL MERCEDES; SONZA REORDA, Matteo; Hamdioui, Said. - STAMPA. - (2013), pp. 227-232. (Intervento presentato al convegno 2013 22nd Asian Test Symposium tenutosi a Yilan, Taiwan nel Nov. 2013). | 1-gen-2013 | BERNARDI, PAOLOCIGANDA, LYL MERCEDESSONZA REORDA, MatteoHAMDIOUI, SAID | - |