HAMDIOUI, SAID

HAMDIOUI, SAID  

028262  

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Citazione Data di pubblicazione Autori File
A Data-Driven ANN-Based Model for FeCAP & FeFET: Orienting to SPICE and Circuit Design / Wang, Changhao; Yuan, Sicong; Bellarmino, Nicolò; Chen, Danyang; Kolahimahmoudi, Nima; Wang, Honghao; Xun, Hanzhi; Li, Xiuyan; Wang, Lin; Yin, Chujun; Li, Chaobo; Taouil, Mottaqiallah; Fieback, Moritz; Hamdioui, Said; Squillero, Giovanni; Cantoro, Riccardo. - In: IEEE ELECTRON DEVICE LETTERS. - ISSN 0741-3106. - (2026), pp. 1-1. [10.1109/led.2026.3680006] 1-gen-2026 Wang, ChanghaoBellarmino, NicolòKolahimahmoudi, NimaHamdioui, SaidSquillero, GiovanniCantoro, Riccardo + A_Data-Driven_ANN-Based_Model_for_FeCAP_amp_FeFET_Orienting_to_SPICE_and_Circuit_Design.pdf
Using STLs for Effective In-field Test of GPUs / Rodriguez Condia, J.E., Augusto Da Silva, F., Cagri Bagbaba, A., Juan-David, G., Hamdioui, S., Sauer, C., SONZA REORDA, M.. - In: IEEE DESIGN & TEST. - ISSN 2168-2356. - ELETTRONICO. - 40:2(2023), pp. 109-117. [10.1109/MDAT.2022.3188573] 1-gen-2023 Josie E. Rodriguez CondiaJuan-David Guerrero-BalagueraSaid HamdiouiMatteo Sonza Reorda + DT_DT-2021-10-0106.R2_RODRIGUEZ CONDIA.pdfUsing_STLs_for_Effective_In-Field_Test_of_GPUs.pdf
A Systematic Method to Generate Effective STLs for the In-Field Test of CAN Bus Controllers / da Silva, F.A., Cantoro, R., Hamdioui, S., Sartoni, S., Sauer, C., Sonza Reorda, M.. - In: ELECTRONICS. - ISSN 2079-9292. - 11:16(2022), p. 2481. [10.3390/electronics11162481] 1-gen-2022 Cantoro, RiccardoHamdioui, SaidSartoni, SandroSonza Reorda, Matteo + electronics-11-02481-v2.pdf
Automated Identification of Application-Dependent Safe Faults in Automotive Systems-on-a-Chips / Bagbaba, A.C., da Silva, F.A., Reorda, M.S., Hamdioui, S., Jenihhin, M., Sauer, C.. - In: ELECTRONICS. - ISSN 2079-9292. - 11:3(2022), p. 319. [10.3390/electronics11030319] 1-gen-2022 Reorda M. S.Hamdioui S. + electronics-11-00319-v2.pdf