Archivio Istituzionale della RicercaCANTORO, RICCARDO
CANTORO, RICCARDO
Dipartimento di Automatica e Informatica
021727
Data-Efficient Cross-Generation Adaptation for Microcontroller Performance Screening
In corso di stampa Bellarmino, Nicolo; Vancini, Alessandro; Kilian, Tobias; Cantoro, Riccardo
Dynamic Workload Selection for Ranked Fault Injection via Sequential Bernoulli Discovery Modeling
In corso di stampa Bellarmino, Nicolo'; Bosio, Alberto; Cantoro, Riccardo
From Synthesis to Kinetics: A Data-Driven Deep Learning Framework for Process-Aware Ferroelectric Dynamics
In corso di stampa Wang, Changhao; Yao, Xinhao; Chen, Danyang; Li, Chaobo; Li, Xiuyan; Yuan, Sicong; Xun, Hanzhi; Hamdioui, Said; Bellarmino, Nicolo'; Cantoro, Riccardo
Implicit Activation Sparsity for Fault-Tolerant CNNs: A Training-Dynamics Perspective
In corso di stampa Bellarmino, Nicolo'; Bosio, Alberto; Ruospo, Annachiara; Ernesto, Sanchez; Cantoro, Riccardo
In-Context Learning for Microcontroller Performance Screening Using Tabular Foundation Models
In corso di stampa Bellarmino, Nicolò; Cantoro, Riccardo; Huch, Martin; Kilian, Tobias; Squillero, Giovanni
Performance-aware reliability optimization for digital designs
In corso di stampa Bartolomucci, Michelangelo; Tran, Uyen; Roland, Didier; Kingston, David; Nardi, Alessandra; Cantoro, Riccardo
Si-ATLAS: Autonomous Testing via LLM-Agent Synergy for RISC-V SBST Generation
In corso di stampa Wang, Changhao; Chen, Yijing; Bellarmino, Nicolo'; Rodriguez Condia, Josie Esteban; Li, Chaobo; Squillero, Giovanni; Cantoro, Riccardo
Transfer Learning in MCU Performance Screening
In corso di stampa Bellarmino, Nicolo; Cantoro, Riccardo; Huch, Martin; Kilian, Tobias; Schlichtmann, Ulf; Squillero, Giovanni
A Data-Driven ANN-Based Model for FeCAP & FeFET: Orienting to SPICE and Circuit Design
2026 Wang, Changhao; Yuan, Sicong; Bellarmino, Nicolò; Chen, Danyang; Kolahimahmoudi, Nima; Wang, Honghao; Xun, Hanzhi; Li, Xiuyan; Wang, Lin; Yin, Chujun; Li, Chaobo; Taouil, Mottaqiallah; Fieback, Moritz; Hamdioui, Said; Squillero, Giovanni; Cantoro, Riccardo
Assessing the Effectiveness of Software-Based Self-Test Programs for Cell-Aware Test
2026 Khoshzaban, Reza; Guglielminetti, Iacopo; Grosso, Michelangelo; Sonza Reorda, Matteo; Cantoro, Riccardo
Automatic Enhancement of Cell Models to Enable Conditional Stuck-at Fault Simulation and Pattern Generation
2026 Khoshzaban, Reza; Deligiannis, Nikolaos I.; Guglielminetti, Iacopo; Grosso, Michelangelo; Cantoro, Riccardo
Early Functional Safety and PPA Evaluation for Faster Digital Design Development
2026 Bartolomucci, Michelangelo; Kingston, David; Cupaiuolo, Teo; Nardi, Alessandra; Cantoro, Riccardo
Late Breaking Results - New Techniques for Software Test Library Compaction
2026 Deligiannis, Nikolaos I.; Bartolomucci, Michelangelo; Sohrabian, Mansour; Cantoro, Riccardo; Reorda, Matteo Sonza
M-EL2N: Data-Efficient Fault Injection Through Sample Difficulty Analysis
2026 Bellarmino, Nicolò; Bosio, Alberto; Al-Kaf, Ahmed; Benabdenbi, Mounir; Leveugle, Régis; Cantoro, Riccardo
OpRA: Optimizing Resiliency Assessment for Deep Neural Networks
2026 Bellarmino, Nicolò; Barone, Salvatore; Pappalardo, Salvatore; Bosio, Alberto; Cantoro, Riccardo
Pre-processing Functional And Physical Defect Equivalences To Accelerate Cell-Aware Model Generation
2026 Khoshzaban, Reza; Mongelli, Gianmarco; Ronga, Dorian; Guglielminetti, Iacopo; Grosso, Michelangelo; Faehn, Eric; Girard, Patrick; Virazel, Arnaud; Cantoro, Riccardo
Software test libraries and real-time operating systems: A system integrator perspective
2026 Angione, Francesco; Bernardi, Paolo; Cantoro, Riccardo
A Reliability Evaluation Flow for Assessing the Impact of Permanent Hardware Faults on Integer Arithmetic Circuits
2025 Deligiannis, Nikolaos; Guerrero-Balaguera, Juan-David; Cantoro, Riccardo; Habib, S. E. D.; Reorda, Matteo Sonza
COSMO: COmpressed Sensing for Models and logging Optimization in MCU Performance Screening
2025 Bellarmino, Nicolò; Cantoro, Riccardo; Fosson, Sophie M.; Huch, Martin; Kilian, Tobias; Schlichtmann, Ulf; Squillero, Giovanni
DEAR-CNN: Data-Efficient Assessment of Resiliency in Convolutional Neural Networks
2025 Bellarmino, Nicolo'; Bosio, Alberto; Cantoro, Riccardo; Ruospo, Annachiara; Sanchez, Ernesto
| Citazione | Data di pubblicazione | Autori | File |
|---|---|---|---|
| Data-Efficient Cross-Generation Adaptation for Microcontroller Performance Screening / Bellarmino, N., Vancini, A., Kilian, T., Cantoro, R.. - (In corso di stampa). (39th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems Rome (ITA) September 30th - October 2nd, 2026). | In corso di stampa | Nicolo BellarminoRiccardo Cantoro + | 2026_DFTS_Transfer_Learning_Alessandro (6).pdf |
| Dynamic Workload Selection for Ranked Fault Injection via Sequential Bernoulli Discovery Modeling / Bellarmino, N., Bosio, A., Cantoro, R.. - (In corso di stampa). (IEEE 35th Asian Test Symposium (ATS 2026) Kaohsiung, Taiwan 1st - 3rd December, 2026). | In corso di stampa | Nicolo, BellarminoAlberto, BosioRiccardo, Cantoro | 2026_ATS_ON_LINE_FI_CONFERNCE.pdf |
| From Synthesis to Kinetics: A Data-Driven Deep Learning Framework for Process-Aware Ferroelectric Dynamics / Wang, C., Yao, X., Chen, D., Li, C., Li, X., Yuan, S., Xun, H., Hamdioui, S., Bellarmino, N., Cantoro, R.. - (In corso di stampa). (The Fourteenth International Conference on Learning Representations (ICLR 2026) Rio de Janeiro, Brazil April 23rd - 27th, 2026). | In corso di stampa | Changhao, WangSaid, HamdiouiNicolò, BellarminoRiccardo, Cantoro + | 7_From_Synthesis_to_Kinetics_A.pdf |
| Implicit Activation Sparsity for Fault-Tolerant CNNs: A Training-Dynamics Perspective / Bellarmino, N., Bosio, A., Ruospo, A., Ernesto, S., Cantoro, R.. - IEEE International Conference on Omni-Layer Intelligent Systems (COINS):(In corso di stampa). (IEEE International Conference on Omni-Layer Intelligent Systems (COINS) Bologna, Italy 7-9 September 2026). | In corso di stampa | Nicolo, BellarminoAlberto, BosioAnnachiara, RuospoErnesto, SanchezRiccardo, Cantoro | 2026_COINS_LOL_TRAINING_DYNAMICS_CNN (7).pdf |
| In-Context Learning for Microcontroller Performance Screening Using Tabular Foundation Models / Bellarmino, N., Cantoro, R., Huch, M., Kilian, T., Squillero, G.. - ELETTRONICO. - (In corso di stampa). (28th Euromicro Conference Series on Digital System Design (DSD) 2025 Salerno (IT) 10-12 September, 2025). | In corso di stampa | Nicolò BellarminoRiccardo CantoroGiovanni Squillero + | 2025_DSD_Foundation_Models (2).pdf |
| Performance-aware reliability optimization for digital designs / Bartolomucci, M., Tran, U., Roland, D., Kingston, D., Nardi, A., Cantoro, R.. - ELETTRONICO. - (In corso di stampa), pp. 1-6. (20th International Conference on Design, Test & Technology of Integrated Systems Athens (GRC) 15 – 17 October 2025). | In corso di stampa | Michelangelo BartolomucciRiccardo Cantoro + | _DTTIS_2025__Performance_aware_reliability_optimization_for_digital_designs.pdf |
| Si-ATLAS: Autonomous Testing via LLM-Agent Synergy for RISC-V SBST Generation / Wang, C., Chen, Y., Bellarmino, N., Rodriguez Condia, J.E., Li, C., Squillero, G., Cantoro, R.. - (In corso di stampa). (International Test Conference 2026 (ITC 2026) San Antonio, Texas, USA October 11–16, 2026). | In corso di stampa | Changhao, WangNicolo, BellarminoJosie Esteban, Rodriguez CondiaGiovanni, SquilleroRiccardo, Cantoro + | - |
| Transfer Learning in MCU Performance Screening / Bellarmino, N., Cantoro, R., Huch, M., Kilian, T., Schlichtmann, U., Squillero, G.. - ELETTRONICO. - (In corso di stampa). (IEEE International Test Conference (ITC 2023) Anaheim, CA 92802, Stati Uniti 8-13 Ottobre 2023). | In corso di stampa | Bellarmino, NicoloCantoro, RiccardoSquillero, Giovanni + | 2023_XXX_Transfer_Learning_POSTER (5).pdf |
| A Data-Driven ANN-Based Model for FeCAP & FeFET: Orienting to SPICE and Circuit Design / Wang, C., Yuan, S., Bellarmino, N., Chen, D., Kolahimahmoudi, N., Wang, H., Xun, H., Li, X., Wang, L., Yin, C., Li, C., Taouil, M., Fieback, M., Hamdioui, S., Squillero, G., Cantoro, R.. - In: IEEE ELECTRON DEVICE LETTERS. - ISSN 0741-3106. - 47:6(2026), pp. 1233-1236. [10.1109/led.2026.3680006] | 1-gen-2026 | Wang, ChanghaoBellarmino, NicolòKolahimahmoudi, NimaHamdioui, SaidSquillero, GiovanniCantoro, Riccardo + | A_Data-Driven_ANN-Based_Model_for_FeCAP_amp_FeFET_Orienting_to_SPICE_and_Circuit_Design.pdf; A_Data-Driven_ANN-Based_Model_for_FeCAP_and_FeFET_Orienting_to_SPICE_and_Circuit_Design.pdf |
| Assessing the Effectiveness of Software-Based Self-Test Programs for Cell-Aware Test / Khoshzaban, R., Guglielminetti, I., Grosso, M., Sonza Reorda, M., Cantoro, R.. - In: IEEE ACCESS. - ISSN 2169-3536. - 14:(2026), pp. 78568-78583. [10.1109/access.2026.3696050] | 1-gen-2026 | Khoshzaban, RezaGrosso, MichelangeloSonza Reorda, MatteoCantoro, Riccardo + | published_version.pdf |
| Automatic Enhancement of Cell Models to Enable Conditional Stuck-at Fault Simulation and Pattern Generation / Khoshzaban, R., Deligiannis, N.I., Guglielminetti, I., Grosso, M., Cantoro, R.. - (2026), pp. 1-6. (2026 IEEE 27th Latin American Test Symposium (LATS) Florianópolis (BRA) 17-20 March 2026) [10.1109/lats70329.2026.11480285]. | 1-gen-2026 | Khoshzaban, RezaGrosso, MichelangeloCantoro, Riccardo + | _LATS2026__Automatic_Enhancement_of_Cell_Models_to_Enable_Conditional_Stuck_At_Fault_Simulation_and_Pattern_Generation.pdf; Automatic_Enhancement_of_Cell_Models_to_Enable_Conditional_Stuck-at_Fault_Simulation_and_Pattern_Generation.pdf |
| Early Functional Safety and PPA Evaluation for Faster Digital Design Development / Bartolomucci, M., Kingston, D., Cupaiuolo, T., Nardi, A., Cantoro, R.. - In: IEEE ACCESS. - ISSN 2169-3536. - 14:(2026), pp. 68920-68933. [10.1109/ACCESS.2026.3690084] | 1-gen-2026 | Michelangelo BartolomucciTeo CupaiuoloRiccardo Cantoro + | Early_Functional_Safety_and_PPA_Evaluation_for_Faster_Digital_Design_Development.pdf |
| Late Breaking Results - New Techniques for Software Test Library Compaction / Deligiannis, N.I., Bartolomucci, M., Sohrabian, M., Cantoro, R., Reorda, M.S.. - (2026), pp. 1-3. (44th VLSI Test Symposium, VTS 2026 Napa, CA (USA) 27-29 April 2026) [10.1109/vts69484.2026.11563360]. | 1-gen-2026 | Bartolomucci, MichelangeloSohrabian, MansourCantoro, RiccardoReorda, Matteo Sonza + | 2026082299-2.pdf; Late_Breaking_Results_-_New_Techniques_for_Software_Test_Library_Compaction.pdf |
| M-EL2N: Data-Efficient Fault Injection Through Sample Difficulty Analysis / Bellarmino, N., Bosio, A., Al-Kaf, A., Benabdenbi, M., Leveugle, R., Cantoro, R.. - (2026), pp. 1-6. (27th Latin American Test Symposium, LATS 2026 Florianópolis (BRA) 17-20 March 2026) [10.1109/lats70329.2026.11480331]. | 1-gen-2026 | Bellarmino, NicolòBosio, AlbertoCantoro, Riccardo + | M-EL2N_Data-Efficient_Fault_Injection_Through_Sample_Difficulty_Analysis.pdf; 2025_LATS_MIRRORED_EL2N (3).pdf |
| OpRA: Optimizing Resiliency Assessment for Deep Neural Networks / Bellarmino, N., Barone, S., Pappalardo, S., Bosio, A., Cantoro, R.. - In: IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS. - ISSN 0278-0070. - 45:4(2026), pp. 1921-1934. [10.1109/TCAD.2025.3610062] | 1-gen-2026 | Nicolò BellarminoAlberto BosioRiccardo Cantoro + | Data_Efficient_Resiliency_Assessment_of_Convolutional_Neural_Networks__IEEE_TCAD_ (3).pdf; OpRA_Optimizing_Resiliency_Assessment_for_Deep_Neural_Networks.pdf |
| Pre-processing Functional And Physical Defect Equivalences To Accelerate Cell-Aware Model Generation / Khoshzaban, R., Mongelli, G., Ronga, D., Guglielminetti, I., Grosso, M., Faehn, E., Girard, P., Virazel, A., Cantoro, R.. - (2026), pp. 1-7. (44th VLSI Test Symposium, VTS 2026 Napa, CA (USA) 27-29 April 2026) [10.1109/vts69484.2026.11563207]. | 1-gen-2026 | Khoshzaban, RezaGrosso, MichelangeloCantoro, Riccardo + | [VTS2026]Pre-processing Functional And Physical Defect Equivalences To Accelerate Cell-Aware Model Generation.pdf; Pre-processing_Functional_And_Physical_Defect_Equivalences_To_Accelerate_Cell-Aware_Model_Generation.pdf |
| Software test libraries and real-time operating systems: A system integrator perspective / Angione, F., Bernardi, P., Cantoro, R.. - In: JOURNAL OF SYSTEMS ARCHITECTURE. - ISSN 1383-7621. - 177:(2026). [10.1016/j.sysarc.2026.103854] | 1-gen-2026 | Angione, FrancescoBernardi, PaoloCantoro, Riccardo | main.pdf |
| A Reliability Evaluation Flow for Assessing the Impact of Permanent Hardware Faults on Integer Arithmetic Circuits / Deligiannis, N., Guerrero-Balaguera, J., Cantoro, R., Habib, S.E.D., Reorda, M.S.. - In: IEEE ACCESS. - ISSN 2169-3536. - 13:(2025), pp. 32177-32196. [10.1109/access.2025.3534274] | 1-gen-2025 | Deligiannis, NikolaosGuerrero-Balaguera, Juan-DavidCantoro, RiccardoReorda, Matteo Sonza + | A_Reliability_Evaluation_Flow_for_Assessing_the_Impact_of_Permanent_Hardware_Faults_on_Integer_Arithmetic_Circuits.pdf |
| COSMO: COmpressed Sensing for Models and logging Optimization in MCU Performance Screening / Bellarmino, N., Cantoro, R., Fosson, S.M., Huch, M., Kilian, T., Schlichtmann, U., Squillero, G.. - In: IEEE TRANSACTIONS ON COMPUTERS. - ISSN 0018-9340. - 74:2(2025), pp. 652-664. [10.1109/tc.2024.3500378] | 1-gen-2025 | Bellarmino, NicolòCantoro, RiccardoFosson, Sophie M.Squillero, Giovanni + | 2023_XXX_Compress_Sensing_Journal_Paper (2).pdf; COSMO_COmpressed_Sensing_for_Models_and_Logging_Optimization_in_MCU_Performance_Screening.pdf |
| DEAR-CNN: Data-Efficient Assessment of Resiliency in Convolutional Neural Networks / Bellarmino, N., Bosio, A., Cantoro, R., Ruospo, A., Sanchez, E.. - ELETTRONICO. - (2025), pp. 13-18. (28th IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS) Lyon (FRA) May 5-7, 2025) [10.1109/DDECS63720.2025.11006797]. | 1-gen-2025 | Nicolo' BellarminoAlberto BosioRiccardo CantoroAnnachiara RuospoErnesto Sanchez | 2025_DDECS_DNN_TEST_COMPACTION_CONFERENCE (1).pdf; DEAR-CNN_Data-Efficient_Assessment_of_Resiliency_in_Convolutional_Neural_Networks.pdf |