Archivio Istituzionale della RicercaCANTORO, RICCARDO
CANTORO, RICCARDO
Dipartimento di Automatica e Informatica
021727
Defects, Fault Modeling, and Test Development Framework for FeFETs
In corso di stampa Wang, Changhao; Yuan, Sicong; Xun, Hanzhi; Li, Chaobo; Taouil, Mottaqiallah; Fieback, Moritz; Chen, Danyang; Li, Xiuyan; Wang, Lin; Cantoro, Riccardo; Yin, Chujun; Hamdioui, Said
Device-Aware Test for Anomalous Charge Trapping in FeFETs
In corso di stampa Yuan, Sicong; Wang, Changhao; Fieback, Moritz; Xun, Hanzhi; Taouil, Mottaqiallah; Li, Xiuyan; Wang, Lin; Chen, Danyang; Bellarmino, Nicolò; Cantoro, Riccardo; Hamdioui, Said
Embedded Feature Selection in MCU Performance Screening
In corso di stampa Bellarmino, Nicolo'; Cantoro, Riccardo; Huch, Martin; Kilian, Tobias; Schlichtmann, Ulf; Squillero, Giovanni
Investigating on Gradient Regularization for Testing Neural Networks
In corso di stampa Bellarmino, Nicolo; Bosio, Alberto; Cantoro, Riccardo; Ruospo, Annachiara; Sanchez, Ernesto; Squillero, Giovanni
Transfer Learning in MCU Performance Screening
In corso di stampa Bellarmino, Nicolo; Cantoro, Riccardo; Huch, Martin; Kilian, Tobias; Schlichtmann, Ulf; Squillero, Giovanni
Assessing the Effectiveness of Software-Based Self-Test Programs for Static Cell-Aware Test
2024 Cantoro, Riccardo; Grosso, Michelangelo; Guglielminetti, Iacopo; Khoshzaban, Reza; Reorda, Matteo Sonza
COVID-19 Detection from Exhaled Breath
2024 Bellarmino, Nicolo'; Cantoro, Riccardo; Castelluzzo, Michele; Correale, Raffaele; Squillero, Giovanni; Bozzini, Giorgio; Castelletti, Francesco; Ciricugno, Carla; Dalla Gasperina, Daniela; Dentali, Francesco; Poggialini, Giovanni; Salerno, Piergiorgio; Stefanotaborelli,
Deep Learning Strategies for Labeling and Accuracy Optimization in Microcontroller Performance Screening
2024 Bellarmino, Nicolò; Cantoro, Riccardo; Huch, Martin; Kilian, Tobias; Schlichtmann, Ulf; Squillero, Giovanni
Evaluating the Reliability of Integer Multipliers With Respect to Permanent Faults
2024 Deligiannis, Nikolaos; Cantoro, Riccardo; SONZA REORDA, Matteo; Habib, S. E. D.
Fault Grading Techniques for Evaluating Software-Based Self-Test with Respect to Small Delay Defects
2024 Bartolomucci, Michelangelo; Deligiannis, Nikolaos; Cantoro, Riccardo; Sonza Reorda, Matteo
U-FLEX: Unsupervised Feature Learning with Evolutionary eXploration
2024 Bellarmino, Nicolo’; Cantoro, Riccardo; Squillero, Giovanni
A Multi-Label Active Learning Framework for Microcontroller Performance Screening
2023 Bellarmino, Nicolo; Cantoro, Riccardo; Huch, Martin; Kilian, Tobias; Martone, Raffaele; Schlichtmann, Ulf; Squillero, Giovanni
A Survey of Recent Developments in Testability, Safety and Security of RISC-V Processors
2023 Anders, Jens; Andreu, Pablo; Becker, Bernd; Becker, Steffen; Cantoro, Riccardo; Deligiannis, Nikolaos; Elhamawy, Nourhan; Faller, Tobias; Hernandez, Carles; Mentens, Nele; Namazi Rizi, Mahnaz; Polian, Ilia; Sajadi, Abolfazl; Sauer, Mathias; Schwachhofer, Denis; SONZA REORDA, Matteo; Stefanov, Todor; Tuzov, Ilya; Wagner, Stefan; Zidaric, Nuša
Automatic Identification of Functionally Untestable Cell-Aware Faults in Microprocessors
2023 Deligiannis, Nikolaos; Faller, Tobias; Iacopo, Guglielminetti; Cantoro, Riccardo; Becker, Bernd; SONZA REORDA, Matteo
Automating the Generation of Functional Stress Inducing Stimuli for Burn-In Testing
2023 Deligiannis, Nikolaos; Faller, Tobias; Chenghan, Zhou; Cantoro, Riccardo; Becker, Bernd; SONZA REORDA, Matteo
Automating the Generation of Programs Maximizing the Repeatable Constant Switching Activity in Microprocessor Units via MaxSAT
2023 Deligiannis, Nikolaos; Faller, Tobias; Cantoro, Riccardo; Paxian, Tobias; Becker, Bernd; SONZA REORDA, Matteo
Automating the Generation of Programs Maximizing the Sustained Switching Activity in Microprocessor units via Evolutionary Techniques
2023 Deligiannis, Nikolaos; Cantoro, Riccardo; SONZA REORDA, Matteo
Enabling Inter-Product Transfer Learning on MCU Performance Screening
2023 Bellarmino, Nicolo; Cantoro, Riccardo; Huch, Martin; Kilian, Tobias; Schlichtmann, Ulf; Squillero, Giovanni
Evaluating the Impact of Aging on Path-Delay Self-Test Libraries
2023 Cantoro, Riccardo; Sartoni, Sandro; Reorda, Matteo Sonza; Anghel, Lorena; Portolan, Michele
Feature Selection for Cost Reduction in MCU Performance Screening
2023 Bellarmino, Nicolo'; Cantoro, Riccardo; Huch, Martin; Kilian, Tobias; Schlichtmann, Ulf; Squillero, Giovanni
| Citazione | Data di pubblicazione | Autori | File |
|---|---|---|---|
| Defects, Fault Modeling, and Test Development Framework for FeFETs / Wang, Changhao; Yuan, Sicong; Xun, Hanzhi; Li, Chaobo; Taouil, Mottaqiallah; Fieback, Moritz; Chen, Danyang; Li, Xiuyan; Wang, Lin; Cantoro, Riccardo; Yin, Chujun; Hamdioui, Said. - (In corso di stampa). (Intervento presentato al convegno International Test Conference (ITC) 2024 tenutosi a San Diego (USA) nel 3-8 Novembre 2024). | In corso di stampa | Riccardo, CantoroSaid, Hamdioui + | 2024_ITC_A_framework_of_defect_oritned_testing_for_FeFETs_2.pdf |
| Device-Aware Test for Anomalous Charge Trapping in FeFETs / Yuan, Sicong; Wang, Changhao; Fieback, Moritz; Xun, Hanzhi; Taouil, Mottaqiallah; Li, Xiuyan; Wang, Lin; Chen, Danyang; Bellarmino, Nicolò; Cantoro, Riccardo; Hamdioui, Said. - 30th Asia and South Pacific Design Automation Conference ASP-DAC 2025:(In corso di stampa). (Intervento presentato al convegno 30th Asia and South Pacific Design Automation Conference ASP-DAC 2025 tenutosi a Tokyo Odaiba Miraikan, Japan nel Jan. 20-23, 2025). | In corso di stampa | Nicolò BellarminoRiccardo CantoroSaid Hamdioui + | Sicong_2024_ASPDAC__Device_Aware_Test_for_Anomalous_Charge_Trapping_in_FeFETs.pdf |
| Embedded Feature Selection in MCU Performance Screening / Bellarmino, Nicolo'; Cantoro, Riccardo; Huch, Martin; Kilian, Tobias; Schlichtmann, Ulf; Squillero, Giovanni. - (In corso di stampa). (Intervento presentato al convegno IEEE 2nd International conference on Design, Test & Technology of Integrated Systems tenutosi a Aix-en-Provence (FRA) nel October 14th -16th 2024). | In corso di stampa | Nicolo' BellarminoRiccardo CantoroGiovanni Squillero + | 2024_DTTIS_EMBEDDED_Feature_Selection (1).pdf |
| Investigating on Gradient Regularization for Testing Neural Networks / Bellarmino, Nicolo; Bosio, Alberto; Cantoro, Riccardo; Ruospo, Annachiara; Sanchez, Ernesto; Squillero, Giovanni. - ELETTRONICO. - (In corso di stampa). (Intervento presentato al convegno 10th International Conference on machine Learning, Optimization and Data science (LOD 2024) tenutosi a Riva del Sole Resort & SPA, Castiglione della Pescaia (Grosseto), Tuscany, Italy nel September 22 – 25, 2024). | In corso di stampa | Bellarmino, NicoloBosio, AlbertoCantoro, RiccardoRuospo, AnnachiaraSanchez, ErnestoSquillero, Giovanni | 2024_LOD_GRADIENT_PENALIZATION.pdf |
| Transfer Learning in MCU Performance Screening / Bellarmino, Nicolo; Cantoro, Riccardo; Huch, Martin; Kilian, Tobias; Schlichtmann, Ulf; Squillero, Giovanni. - ELETTRONICO. - (In corso di stampa). (Intervento presentato al convegno IEEE International Test Conference (ITC 2023) tenutosi a Anaheim, CA 92802, Stati Uniti nel 8-13 Ottobre 2023). | In corso di stampa | Bellarmino, NicoloCantoro, RiccardoSquillero, Giovanni + | 2023_XXX_Transfer_Learning_POSTER (5).pdf |
| Assessing the Effectiveness of Software-Based Self-Test Programs for Static Cell-Aware Test / Cantoro, Riccardo; Grosso, Michelangelo; Guglielminetti, Iacopo; Khoshzaban, Reza; Reorda, Matteo Sonza. - (2024). (Intervento presentato al convegno 2024 IEEE European Test Symposium (ETS) tenutosi a The Hague (NL) nel 20-24 May 2024) [10.1109/ets61313.2024.10567198]. | 1-gen-2024 | Cantoro, RiccardoGrosso, MichelangeloKhoshzaban, RezaReorda, Matteo Sonza + | _ETS_2024__Assessing_the_Effectiveness_of_Software_Based_Self_Test_Programs_for_Static_Cell_Aware_Test-8.pdf; Assessing_the_Effectiveness_of_Software-Based_Self-Test_Programs_for_Static_Cell-Aware_Test.pdf |
| COVID-19 Detection from Exhaled Breath / Bellarmino, Nicolo'; Cantoro, Riccardo; Castelluzzo, Michele; Correale, Raffaele; Squillero, Giovanni; Bozzini, Giorgio; Castelletti, Francesco; Ciricugno, Carla; Dalla Gasperina, Daniela; Dentali, Francesco; Poggialini, Giovanni; Salerno, Piergiorgio; Stefanotaborelli,. - In: SCIENTIFIC REPORTS. - ISSN 2045-2322. - 14:(2024). [10.1038/s41598-024-74104-1] | 1-gen-2024 | Nicolo' BellarminoRiccardo CantoroGiovanni Squillero + | SCIENTIFIC_REPORTS_REVIEW.pdf; Bellarmino_et_al-2024-Scientific_Reports.pdf |
| Deep Learning Strategies for Labeling and Accuracy Optimization in Microcontroller Performance Screening / Bellarmino, Nicolò; Cantoro, Riccardo; Huch, Martin; Kilian, Tobias; Schlichtmann, Ulf; Squillero, Giovanni. - In: IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS. - ISSN 0278-0070. - ELETTRONICO. - (2024), pp. 1-1. [10.1109/tcad.2024.3436542] | 1-gen-2024 | Bellarmino, NicolòCantoro, RiccardoSquillero, Giovanni + | 2024_TCAD_Transfer_Learning_Paper.pdf |
| Evaluating the Reliability of Integer Multipliers With Respect to Permanent Faults / Deligiannis, Nikolaos; Cantoro, Riccardo; SONZA REORDA, Matteo; Habib, S. E. D.. - (2024), pp. 124-129. (Intervento presentato al convegno International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS) tenutosi a Kielce (POL) nel 03-05 April 2024) [10.1109/DDECS60919.2024.10508899]. | 1-gen-2024 | Deligiannis, NikolaosCantoro, RiccardoSonza Reorda Matteo + | DDECS2024__Evaluating_the_Reliability_of_Integer_Multipliers_With_Respect_to_Permanent_Faults.pdf; Evaluating_the_Reliability_of_Integer_Multipliers_With_Respect_to_Permanent_Faults.pdf |
| Fault Grading Techniques for Evaluating Software-Based Self-Test with Respect to Small Delay Defects / Bartolomucci, Michelangelo; Deligiannis, Nikolaos; Cantoro, Riccardo; Sonza Reorda, Matteo. - (2024). (Intervento presentato al convegno International Symposium on On-Line Testing and Robust System Design (IOLTS) tenutosi a Rennes (FRA) nel 03-05 July 2024) [10.1109/IOLTS60994.2024.10616077]. | 1-gen-2024 | Bartolomucci, MichelangeloDeligiannis, NikolaosCantoro, RiccardoSonza Reorda, Matteo | IOLTS-24_CameraReady.pdf; Fault_Grading_Techniques_for_Evaluating_Software-Based_Self-Test_with_Respect_to_Small_Delay_Defects.pdf |
| U-FLEX: Unsupervised Feature Learning with Evolutionary eXploration / Bellarmino, Nicolo’; Cantoro, Riccardo; Squillero, Giovanni. - ELETTRONICO. - 14505:(2024), pp. 364-378. (Intervento presentato al convegno The 9th International Conference on Machine Learning, Optimization, and Data Science (LOD 2023) tenutosi a Grasmere, Lake District, England (UK) nel September 22 – 26, 2023) [10.1007/978-3-031-53969-5_27]. | 1-gen-2024 | Nicolo’ BellarminoRiccardo CantoroGiovanni Squillero | 2023_LOD_Genetic_Feature_Selection (2).pdf; 978-3-031-53969-5_27.pdf |
| A Multi-Label Active Learning Framework for Microcontroller Performance Screening / Bellarmino, Nicolo; Cantoro, Riccardo; Huch, Martin; Kilian, Tobias; Martone, Raffaele; Schlichtmann, Ulf; Squillero, Giovanni. - In: IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS. - ISSN 0278-0070. - 42:10(2023), pp. 3436-3449. [10.1109/TCAD.2023.3245989] | 1-gen-2023 | Bellarmino, NicoloCantoro, RiccardoMartone, RaffaeleSquillero, Giovanni + | post-print.pdf; A_Multilabel_Active_Learning_Framework_for_Microcontroller_Performance_Screening.pdf |
| A Survey of Recent Developments in Testability, Safety and Security of RISC-V Processors / Anders, Jens; Andreu, Pablo; Becker, Bernd; Becker, Steffen; Cantoro, Riccardo; Deligiannis, Nikolaos; Elhamawy, Nourhan; Faller, Tobias; Hernandez, Carles; Mentens, Nele; Namazi Rizi, Mahnaz; Polian, Ilia; Sajadi, Abolfazl; Sauer, Mathias; Schwachhofer, Denis; SONZA REORDA, Matteo; Stefanov, Todor; Tuzov, Ilya; Wagner, Stefan; Zidaric, Nuša. - (2023), pp. 1-10. (Intervento presentato al convegno 2023 IEEE European Test Symposium (ETS) tenutosi a Venice (Italy) nel 22-26 May 2023) [10.1109/ETS56758.2023.10174099]. | 1-gen-2023 | Riccardo CantoroNikolaos DeligiannisMatteo Sonza Reorda + | ETS_RISC_V_testing_safety_security.pdf; A_Survey_of_Recent_Developments_in_Testability_Safety_and_Security_of_RISC-V_Processors.pdf |
| Automatic Identification of Functionally Untestable Cell-Aware Faults in Microprocessors / Deligiannis, Nikolaos; Faller, Tobias; Iacopo, Guglielminetti; Cantoro, Riccardo; Becker, Bernd; SONZA REORDA, Matteo. - (2023), pp. 1-6. (Intervento presentato al convegno Asian Test Symposium (ATS) tenutosi a Beijing (China) nel 14-17 October 2023) [10.1109/ATS59501.2023.10317988]. | 1-gen-2023 | Nikolaos DeligiannisRiccardo CantoroMatteo Sonza Reorda + | _ATS2023__Automatic_Identification_of_Functionally_Untestable_Cell_Aware_Faults_in_Microprocessors.pdf; Automatic_Identification_of_Functionally_Untestable_Cell-Aware_Faults_in_Microprocessors.pdf |
| Automating the Generation of Functional Stress Inducing Stimuli for Burn-In Testing / Deligiannis, Nikolaos; Faller, Tobias; Chenghan, Zhou; Cantoro, Riccardo; Becker, Bernd; SONZA REORDA, Matteo. - (2023), pp. 1-5. (Intervento presentato al convegno 2023 IEEE European Test Symposium (ETS) tenutosi a Venice (Italy) nel 22-26 May 2023) [10.1109/ETS56758.2023.10174232]. | 1-gen-2023 | Nikolaos DeligiannisRiccardo CantoroMatteo Sonza Reorda + | _ETS2023__Automating_the_Generation_of_Functional_Stress_Inducing_Stimuli_for_Burn_In_Testing.pdf; Automating_the_Generation_of_Functional_Stress_Inducing_Stimuli_for_Burn-In_Testing.pdf |
| Automating the Generation of Programs Maximizing the Repeatable Constant Switching Activity in Microprocessor Units via MaxSAT / Deligiannis, Nikolaos; Faller, Tobias; Cantoro, Riccardo; Paxian, Tobias; Becker, Bernd; SONZA REORDA, Matteo. - In: IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS. - ISSN 0278-0070. - 42:11(2023), pp. 4270-4281. [10.1109/TCAD.2023.3252467] | 1-gen-2023 | Nikolaos DeligiannisRiccardo CantoroMatteo Sonza Reorda + | _IEEE_TCAD__Automating_the_Generation_of_Programs_Maximizing_the_Repeatable_Constant_Switching_Activity_in_Microprocessor_Units_via_MaxSAT.pdf; Automating_the_Generation_of_Programs_Maximizing_the_Repeatable_Constant_Switching_Activity_in_Microprocessor_Units_via_MaxSAT.pdf |
| Automating the Generation of Programs Maximizing the Sustained Switching Activity in Microprocessor units via Evolutionary Techniques / Deligiannis, Nikolaos; Cantoro, Riccardo; SONZA REORDA, Matteo. - In: MICROPROCESSORS AND MICROSYSTEMS. - ISSN 0141-9331. - 98:(2023), p. 104775. [10.1016/j.micpro.2023.104775] | 1-gen-2023 | Nikolaos DeligiannisRiccardo CantoroMatteo Sonza Reorda | _MICPRO_SI_DSD21__Automating_the_Generation_of_Programs_Maximizing_the_Switching_Activity_in_Microprocessor_Units_via_Evolutionary_Techniques.pdf; 1-s2.0-S0141933123000212-main.pdf |
| Enabling Inter-Product Transfer Learning on MCU Performance Screening / Bellarmino, Nicolo; Cantoro, Riccardo; Huch, Martin; Kilian, Tobias; Schlichtmann, Ulf; Squillero, Giovanni. - ELETTRONICO. - (2023), pp. 1-6. (Intervento presentato al convegno IEEE 32nd Asian Test Symposium tenutosi a Beijing (China) nel 14-17 October 2023) [10.1109/ATS59501.2023.10317992]. | 1-gen-2023 | Bellarmino, NicoloCantoro, RiccardoSquillero, Giovanni + | 2023_ATS_Transfer_Learning (4) (1).pdf; Enabling_Inter-Product_Transfer_Learning_on_MCU_Performance_Screening.pdf |
| Evaluating the Impact of Aging on Path-Delay Self-Test Libraries / Cantoro, Riccardo; Sartoni, Sandro; Reorda, Matteo Sonza; Anghel, Lorena; Portolan, Michele. - (2023). (Intervento presentato al convegno IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT) 2023 tenutosi a Juan-Les-Pins (FRA) nel 03-05 October 2023) [10.1109/dft59622.2023.10313531]. | 1-gen-2023 | Cantoro, RiccardoSartoni, SandroReorda, Matteo SonzaPortolan, Michele + | _DFTS2023__Evaluating_the_Impact_of_Aging_on_Path_Delay_Self_Test_Libraries-3.pdf; Evaluating_the_Impact_of_Aging_on_Path-Delay_Self-Test_Libraries.pdf |
| Feature Selection for Cost Reduction in MCU Performance Screening / Bellarmino, Nicolo'; Cantoro, Riccardo; Huch, Martin; Kilian, Tobias; Schlichtmann, Ulf; Squillero, Giovanni. - (2023), pp. 1-6. (Intervento presentato al convegno 24th IEEE Latin-American Test Symposium (LATS) tenutosi a Veracruz (MEX) nel 21-24 Marzo 2023) [10.1109/LATS58125.2023.10154495]. | 1-gen-2023 | Bellarmino, Nicolo'Cantoro, RiccardoSquillero, Giovanni + | 2023_LATS_Feature_Selection.pdf; Feature_Selection_for_Cost_Reduction_In_MCU_Performance_Screening.pdf |