The use of semiconductor devices in safety-critical scenarios is increasing in both quantity and complexity. This paper presents a novel approach to support safety requirements from RTL exploration through to implementation, with the aid of a Safety Specification Format (SSF), thereby minimizing costly development iterations and reducing the Time-To-Market. An assessment of the results is given for the CV32E40P open source RISC-V processor.
Early Functional Safety and PPA Evaluation of Digital Designs / Bartolomucci, Michelangelo; Kingston, David; Cupaiuolo, Teo; Nardi, Alessandra; Cantoro, Riccardo. - ELETTRONICO. - (2025), pp. 1-2. (Intervento presentato al convegno 2025 Design, Automation and Test in Europe Conference, DATE 2025 tenutosi a Lyon (FRA) nel 31 March 2025 - 02 April 2025) [10.23919/date64628.2025.10993267].
Early Functional Safety and PPA Evaluation of Digital Designs
Bartolomucci, Michelangelo;Cantoro, Riccardo
2025
Abstract
The use of semiconductor devices in safety-critical scenarios is increasing in both quantity and complexity. This paper presents a novel approach to support safety requirements from RTL exploration through to implementation, with the aid of a Safety Specification Format (SSF), thereby minimizing costly development iterations and reducing the Time-To-Market. An assessment of the results is given for the CV32E40P open source RISC-V processor.File | Dimensione | Formato | |
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https://hdl.handle.net/11583/3003709