Archivio Istituzionale della RicercaCANTORO, RICCARDO
CANTORO, RICCARDO
Dipartimento di Automatica e Informatica
021727
In-Context Learning for Microcontroller Performance Screening Using Tabular Foundation Models
In corso di stampa Bellarmino, Nicolò; Cantoro, Riccardo; Huch, Martin; Kilian, Tobias; Squillero, Giovanni
Performance-aware reliability optimization for digital designs
In corso di stampa Bartolomucci, Michelangelo; Tran, Uyen; Roland, Didier; Kingston, David; Nardi, Alessandra; Cantoro, Riccardo
Transfer Learning in MCU Performance Screening
In corso di stampa Bellarmino, Nicolo; Cantoro, Riccardo; Huch, Martin; Kilian, Tobias; Schlichtmann, Ulf; Squillero, Giovanni
Automatic Enhancement of Cell Models to Enable Conditional Stuck-at Fault Simulation and Pattern Generation
2026 Khoshzaban, Reza; Deligiannis, Nikolaos I.; Guglielminetti, Iacopo; Grosso, Michelangelo; Cantoro, Riccardo
DEAR-CNN: Data-Efficient Assessment of Resiliency in Convolutional Neural Networks
2025 Bellarmino, Nicolo'; Bosio, Alberto; Cantoro, Riccardo; Ruospo, Annachiara; Sanchez, Ernesto
Device-Aware Test for Anomalous Charge Trapping in FeFETs
2025 Yuan, Sicong; Wang, Changhao; Fieback, Moritz; Xun, Hanzhi; Taouil, Mottaqiallah; Li, Xiuyan; Wang, Lin; Chen, Danyang; Bellarmino, Nicolò; Cantoro, Riccardo; Hamdioui, Said
Device-Aware Test for Threshold Voltage Shifting in FeFET
2025 Wang, Changhao; Kolahimahmoudi, Nima; Bellarmino, Nicolo; Cantoro, Riccardo; Yuan, Sicong; Xun, Hanzhi; Chen, Danyang; Yin, Chujun; Taouil, Mottaqiallah; Fieback, Moritz; Li, Xiuyan; Wang, Lin; Li, Chaobo; Hamdioui, Said
DOC: Detection of On-Line Failures in CNNs
2025 Turco, Vittorio; Bellarmino, Nicolò; Ruospo, Annachiara; Cantoro, Riccardo; Sanchez, Ernesto
Early Functional Safety and PPA Evaluation of Digital Designs
2025 Bartolomucci, Michelangelo; Kingston, David; Cupaiuolo, Teo; Nardi, Alessandra; Cantoro, Riccardo
Exploiting the correlation with traditional fault models to speed-up cell-aware fault simulation
2025 Khoshzaban, Reza; Guglielminetti, Iacopo; Grosso, Michelangelo; Sonza Reorda, Matteo; Cantoro, Riccardo
Grouped Feature Selection for SMONs Placement in MCU Performance Screening
2025 Bellarmino, Nicolò; Cantoro, Riccardo; Huch, Martin; Kilian, Tobias; Squillero, Giovanni
Investigating on Gradient Regularization for Testing Neural Networks
2025 Bellarmino, Nicolo; Bosio, Alberto; Cantoro, Riccardo; Ruospo, Annachiara; Sanchez, Ernesto; Squillero, Giovanni
Minimal Supervision, Maximum Accuracy: TabPFN for Microcontroller Performance Prediction
2025 Bellarmino, Nicolò; Cantoro, Riccardo; Huch, Martin; Kilian, Tobias
System-Level Test techniques for Automotive SoCs
2025 Angione, Francesco; Bernardi, Paolo; Cantoro, Riccardo
Assessing the Effectiveness of Software-Based Self-Test Programs for Static Cell-Aware Test
2024 Cantoro, Riccardo; Grosso, Michelangelo; Guglielminetti, Iacopo; Khoshzaban, Reza; Reorda, Matteo Sonza
Defects, Fault Modeling, and Test Development Framework for FeFETs
2024 Wang, Changhao; Yuan, Sicong; Xun, Hanzhi; Li, Chaobo; Taouil, Mottaqiallah; Fieback, Moritz; Chen, Danyang; Li, Xiuyan; Wang, Lin; Cantoro, Riccardo; Yin, Chujun; Hamdioui, Said
Embedded Feature Selection in MCU Performance Screening
2024 Bellarmino, Nicolo'; Cantoro, Riccardo; Huch, Martin; Kilian, Tobias; Schlichtmann, Ulf; Squillero, Giovanni
Evaluating the Reliability of Integer Multipliers With Respect to Permanent Faults
2024 Deligiannis, Nikolaos; Cantoro, Riccardo; SONZA REORDA, Matteo; Habib, S. E. D.
Fault Grading Techniques for Evaluating Software-Based Self-Test with Respect to Small Delay Defects
2024 Bartolomucci, Michelangelo; Deligiannis, Nikolaos; Cantoro, Riccardo; Sonza Reorda, Matteo
U-FLEX: Unsupervised Feature Learning with Evolutionary eXploration
2024 Bellarmino, Nicolo’; Cantoro, Riccardo; Squillero, Giovanni
| Citazione | Data di pubblicazione | Autori | File |
|---|---|---|---|
| In-Context Learning for Microcontroller Performance Screening Using Tabular Foundation Models / Bellarmino, Nicolò; Cantoro, Riccardo; Huch, Martin; Kilian, Tobias; Squillero, Giovanni. - ELETTRONICO. - (In corso di stampa). ( 28th Euromicro Conference Series on Digital System Design (DSD) 2025 Salerno (IT) 10-12 September, 2025). | In corso di stampa | Nicolò BellarminoRiccardo CantoroGiovanni Squillero + | 2025_DSD_Foundation_Models (2).pdf |
| Performance-aware reliability optimization for digital designs / Bartolomucci, M., Tran, U., Roland, D., Kingston, D., Nardi, A., Cantoro, R.. - ELETTRONICO. - (In corso di stampa), pp. 1-6. (20th International Conference on Design, Test & Technology of Integrated Systems Athens (GRC) 15 – 17 October 2025). | In corso di stampa | Michelangelo BartolomucciRiccardo Cantoro + | _DTTIS_2025__Performance_aware_reliability_optimization_for_digital_designs.pdf |
| Transfer Learning in MCU Performance Screening / Bellarmino, Nicolo; Cantoro, Riccardo; Huch, Martin; Kilian, Tobias; Schlichtmann, Ulf; Squillero, Giovanni. - ELETTRONICO. - (In corso di stampa). ( IEEE International Test Conference (ITC 2023) Anaheim, CA 92802, Stati Uniti 8-13 Ottobre 2023). | In corso di stampa | Bellarmino, NicoloCantoro, RiccardoSquillero, Giovanni + | 2023_XXX_Transfer_Learning_POSTER (5).pdf |
| Automatic Enhancement of Cell Models to Enable Conditional Stuck-at Fault Simulation and Pattern Generation / Khoshzaban, Reza; Deligiannis, Nikolaos I.; Guglielminetti, Iacopo; Grosso, Michelangelo; Cantoro, Riccardo. - (2026), pp. 1-6. ( 2026 IEEE 27th Latin American Test Symposium (LATS) Florianópolis (BRA) 17-20 March 2026) [10.1109/lats70329.2026.11480285]. | 1-gen-2026 | Khoshzaban, RezaGrosso, MichelangeloCantoro, Riccardo + | _LATS2026__Automatic_Enhancement_of_Cell_Models_to_Enable_Conditional_Stuck_At_Fault_Simulation_and_Pattern_Generation.pdf; Automatic_Enhancement_of_Cell_Models_to_Enable_Conditional_Stuck-at_Fault_Simulation_and_Pattern_Generation.pdf |
| DEAR-CNN: Data-Efficient Assessment of Resiliency in Convolutional Neural Networks / Bellarmino, Nicolo'; Bosio, Alberto; Cantoro, Riccardo; Ruospo, Annachiara; Sanchez, Ernesto. - ELETTRONICO. - (2025), pp. 13-18. ( 28th IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS) Lyon (FRA) May 5-7, 2025) [10.1109/DDECS63720.2025.11006797]. | 1-gen-2025 | Nicolo' BellarminoAlberto BosioRiccardo CantoroAnnachiara RuospoErnesto Sanchez | 2025_DDECS_DNN_TEST_COMPACTION_CONFERENCE (1).pdf; DEAR-CNN_Data-Efficient_Assessment_of_Resiliency_in_Convolutional_Neural_Networks.pdf |
| Device-Aware Test for Anomalous Charge Trapping in FeFETs / Yuan, S., Wang, C., Fieback, M., Xun, H., Taouil, M., Li, X., Wang, L., Chen, D., Bellarmino, N., Cantoro, R., Hamdioui, S.. - (2025), pp. 635-641. (30th Asia and South Pacific Design Automation Conference ASP-DAC 2025 Tokyo (JPN) Jan. 20-23, 2025) [10.1145/3658617.3697755]. | 1-gen-2025 | Changhao WangNicolò BellarminoRiccardo CantoroSaid Hamdioui + | 3658617.3697755.pdf |
| Device-Aware Test for Threshold Voltage Shifting in FeFET / Wang, C., Kolahimahmoudi, N., Bellarmino, N., Cantoro, R., Yuan, S., Xun, H., Chen, D., Yin, C., Taouil, M., Fieback, M., Li, X., Wang, L., Li, C., Hamdioui, S.. - (2025), pp. 410-413. (IEEE International Test Conference 2025 San Diego (USA) 20-26 September 2025) [10.1109/ITC58126.2025.00052]. | 1-gen-2025 | Wang, ChanghaoKolahimahmoudi, NimaBellarmino, NicoloCantoro, RiccardoHamdioui, Said + | 2025_ITC__Device_Aware_Test_for_voltage_shifting_in_FeFET__4_pages_.pdf; Device-Aware_Test_for_Threshold_Voltage_Shifting_in_FeFET.pdf |
| DOC: Detection of On-Line Failures in CNNs / Turco, V., Bellarmino, N., Ruospo, A., Cantoro, R., Sanchez, E.. - ELETTRONICO. - (2025). (Latin American Test Workshop, LATW San Andrés (COL) 11-14 March 2025) [10.1109/LATS65346.2025.10963935]. | 1-gen-2025 | Turco VittorioNicolò BellarminoAnnachiara RuospoCantoro RiccardoErnesto Sanchez | LATS2025_On_line_detection (3).pdf; DOC_Detection_of_On-Line_Failures_in_CNNs.pdf |
| Early Functional Safety and PPA Evaluation of Digital Designs / Bartolomucci, M., Kingston, D., Cupaiuolo, T., Nardi, A., Cantoro, R.. - ELETTRONICO. - (2025), pp. 1-2. (2025 Design, Automation and Test in Europe Conference, DATE 2025 Lyon (FRA) 31 March 2025 - 02 April 2025) [10.23919/date64628.2025.10993267]. | 1-gen-2025 | Bartolomucci, MichelangeloCantoro, Riccardo + | _DATE25__Early_Functional_Safety_and_PPA_evaluation_for_faster_digital_design_development_.pdf; Early_Functional_Safety_and_PPA_Evaluation_of_Digital_Designs.pdf |
| Exploiting the correlation with traditional fault models to speed-up cell-aware fault simulation / Khoshzaban, R., Guglielminetti, I., Grosso, M., Sonza Reorda, M., Cantoro, R.. - (2025), pp. 418-421. (International Test Conference San Diego, CA (USA) 20-26 September 2025) [10.1109/ITC58126.2025.00054]. | 1-gen-2025 | Reza KhoshzabanMichelangelo GrossoMatteo Sonza ReordaRiccardo Cantoro + | Exploiting_the_correlation_with_traditional_fault_models_to_speed_up_cell_aware_faultsim_poster_ITC.pdf; Exploiting_the_correlation_with_traditional_fault_models_to_speed-up_cell-aware_fault_simulation.pdf |
| Grouped Feature Selection for SMONs Placement in MCU Performance Screening / Bellarmino, Nicolò; Cantoro, Riccardo; Huch, Martin; Kilian, Tobias; Squillero, Giovanni. - (2025), pp. 1-6. ( 2025 IEEE 26th Latin American Test Symposium (LATS) San Andrés (COL) 11-14 March 2025) [10.1109/lats65346.2025.10963942]. | 1-gen-2025 | Bellarmino, NicolòCantoro, RiccardoSquillero, Giovanni + | 2024_LATS_GROUP_LASSO_TPAM_SEL (1).pdf; Grouped_Feature_Selection_for_SMONs_Placement_in_MCU_Performance_Screening.pdf |
| Investigating on Gradient Regularization for Testing Neural Networks / Bellarmino, N., Bosio, A., Cantoro, R., Ruospo, A., Sanchez, E., Squillero, G.. - ELETTRONICO. - 15509:(2025), pp. 67-81. (10th International Conference on machine Learning, Optimization and Data science (LOD 2024) Castiglione della Pescaia (ITA) September 22 – 25, 2024) [10.1007/978-3-031-82484-5_6]. | 1-gen-2025 | Bellarmino, NicoloBosio, AlbertoCantoro, RiccardoRuospo, AnnachiaraSanchez, ErnestoSquillero, Giovanni | 2024_LOD_GRADIENT_PENALIZATION.pdf; 978-3-031-82484-5_6.pdf |
| Minimal Supervision, Maximum Accuracy: TabPFN for Microcontroller Performance Prediction / Bellarmino, N., Cantoro, R., Huch, M., Kilian, T.. - STAMPA. - (2025), pp. 470-473. (International Test Conference (ITC) 2025 San Diego, California (USA) 21-26 September, 2025) [10.1109/ITC58126.2025.00067]. | 1-gen-2025 | Nicolò BellarminoRiccardo Cantoro + | 2025_ITC_FOUNDATION_MODELS_POSTER (3).pdf; Minimal_Supervision_Maximum_Accuracy_TabPFN_for_Microcontroller_Performance_Prediction.pdf |
| System-Level Test techniques for Automotive SoCs / Angione, F., Bernardi, P., Cantoro, R.. - (2025), pp. 568-577. (International Test Conference (ITC) San Diego, CA (USA) 20-26 September 2025) [10.1109/itc58126.2025.00093]. | 1-gen-2025 | Angione, FrancescoBernardi, PaoloCantoro, Riccardo | System-Level_Test_techniques_for_Automotive_SoCs.pdf |
| Assessing the Effectiveness of Software-Based Self-Test Programs for Static Cell-Aware Test / Cantoro, R., Grosso, M., Guglielminetti, I., Khoshzaban, R., Reorda, M.S.. - (2024). (2024 IEEE European Test Symposium (ETS) The Hague (NL) 20-24 May 2024) [10.1109/ets61313.2024.10567198]. | 1-gen-2024 | Cantoro, RiccardoGrosso, MichelangeloKhoshzaban, RezaReorda, Matteo Sonza + | _ETS_2024__Assessing_the_Effectiveness_of_Software_Based_Self_Test_Programs_for_Static_Cell_Aware_Test-8.pdf; Assessing_the_Effectiveness_of_Software-Based_Self-Test_Programs_for_Static_Cell-Aware_Test.pdf |
| Defects, Fault Modeling, and Test Development Framework for FeFETs / Wang, Changhao; Yuan, Sicong; Xun, Hanzhi; Li, Chaobo; Taouil, Mottaqiallah; Fieback, Moritz; Chen, Danyang; Li, Xiuyan; Wang, Lin; Cantoro, Riccardo; Yin, Chujun; Hamdioui, Said. - (2024), pp. 91-95. ( International Test Conference (ITC) 2024 San Diego (USA) 03-08 November 2024) [10.1109/ITC51657.2024.00026]. | 1-gen-2024 | Riccardo, CantoroSaid, Hamdioui + | 2024_ITC_A_framework_of_defect_oritned_testing_for_FeFETs_2.pdf; Defects_Fault_Modeling_and_Test_Development_Framework_for_FeFETs.pdf |
| Embedded Feature Selection in MCU Performance Screening / Bellarmino, N., Cantoro, R., Huch, M., Kilian, T., Schlichtmann, U., Squillero, G.. - (2024), pp. 1-6. (IEEE 2nd International conference on Design, Test & Technology of Integrated Systems Aix-en-Provence (FRA) October 14th -16th 2024) [10.1109/DTTIS62212.2024.10780418]. | 1-gen-2024 | Nicolo' BellarminoRiccardo CantoroGiovanni Squillero + | 2024_DTTIS_EMBEDDED_Feature_Selection (1).pdf; Embedded_Feature_Selection_in_MCU_Performance_Screening.pdf |
| Evaluating the Reliability of Integer Multipliers With Respect to Permanent Faults / Deligiannis, N., Cantoro, R., SONZA REORDA, M., Habib, S.E.D.. - (2024), pp. 124-129. (International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS) Kielce (POL) 03-05 April 2024) [10.1109/DDECS60919.2024.10508899]. | 1-gen-2024 | Deligiannis, NikolaosCantoro, RiccardoSonza Reorda Matteo + | DDECS2024__Evaluating_the_Reliability_of_Integer_Multipliers_With_Respect_to_Permanent_Faults.pdf; Evaluating_the_Reliability_of_Integer_Multipliers_With_Respect_to_Permanent_Faults.pdf |
| Fault Grading Techniques for Evaluating Software-Based Self-Test with Respect to Small Delay Defects / Bartolomucci, M., Deligiannis, N., Cantoro, R., Sonza Reorda, M.. - (2024). (International Symposium on On-Line Testing and Robust System Design (IOLTS) Rennes (FRA) 03-05 July 2024) [10.1109/IOLTS60994.2024.10616077]. | 1-gen-2024 | Bartolomucci, MichelangeloDeligiannis, NikolaosCantoro, RiccardoSonza Reorda, Matteo | IOLTS-24_CameraReady.pdf; Fault_Grading_Techniques_for_Evaluating_Software-Based_Self-Test_with_Respect_to_Small_Delay_Defects.pdf |
| U-FLEX: Unsupervised Feature Learning with Evolutionary eXploration / Bellarmino, N., Cantoro, R., Squillero, G.. - ELETTRONICO. - 14505:(2024), pp. 364-378. (The 9th International Conference on Machine Learning, Optimization, and Data Science (LOD 2023) Grasmere, Lake District, England (UK) September 22 – 26, 2023) [10.1007/978-3-031-53969-5_27]. | 1-gen-2024 | Nicolo’ BellarminoRiccardo CantoroGiovanni Squillero | 2023_LOD_Genetic_Feature_Selection (2).pdf; 978-3-031-53969-5_27.pdf |