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CANTORO, RICCARDO

CANTORO, RICCARDO  

Dipartimento di Automatica e Informatica  

021727  

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In-Context Learning for Microcontroller Performance Screening Using Tabular Foundation Models / Bellarmino, Nicolò; Cantoro, Riccardo; Huch, Martin; Kilian, Tobias; Squillero, Giovanni. - ELETTRONICO. - (In corso di stampa). ( 28th Euromicro Conference Series on Digital System Design (DSD) 2025 Salerno (IT) 10-12 September, 2025). In corso di stampa Nicolò BellarminoRiccardo CantoroGiovanni Squillero + 2025_DSD_Foundation_Models (2).pdf
Minimal Supervision, Maximum Accuracy: TabPFN for Microcontroller Performance Prediction / Bellarmino, Nicolò; Cantoro, Riccardo; Huch, Martin; Kilian, Tobias. - STAMPA. - (In corso di stampa). ( International Test Conference (ITC) 2025 San Diego, California (USA) 21-26 September, 2025). In corso di stampa Nicolò BellarminoRiccardo Cantoro + 2025_ITC_FOUNDATION_MODELS_POSTER (3).pdf
Performance-aware reliability optimization for digital designs / Bartolomucci, Michelangelo; Tran, Uyen; Roland, Didier; Kingston, David; Nardi, Alessandra; Cantoro, Riccardo. - ELETTRONICO. - (In corso di stampa), pp. 1-6. ( 20th International Conference on Design, Test & Technology of Integrated Systems Athens (GRC) 15 – 17 October 2025). In corso di stampa Michelangelo BartolomucciRiccardo Cantoro + _DTTIS_2025__Performance_aware_reliability_optimization_for_digital_designs.pdf
Transfer Learning in MCU Performance Screening / Bellarmino, Nicolo; Cantoro, Riccardo; Huch, Martin; Kilian, Tobias; Schlichtmann, Ulf; Squillero, Giovanni. - ELETTRONICO. - (In corso di stampa). ( IEEE International Test Conference (ITC 2023) Anaheim, CA 92802, Stati Uniti 8-13 Ottobre 2023). In corso di stampa Bellarmino, NicoloCantoro, RiccardoSquillero, Giovanni + 2023_XXX_Transfer_Learning_POSTER (5).pdf
DEAR-CNN: Data-Efficient Assessment of Resiliency in Convolutional Neural Networks / Bellarmino, Nicolo'; Bosio, Alberto; Cantoro, Riccardo; Ruospo, Annachiara; Sanchez, Ernesto. - ELETTRONICO. - (2025), pp. 13-18. ( 28th IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS) Lyon (FRA) May 5-7, 2025) [10.1109/DDECS63720.2025.11006797]. 1-gen-2025 Nicolo' BellarminoAlberto BosioRiccardo CantoroAnnachiara RuospoErnesto Sanchez 2025_DDECS_DNN_TEST_COMPACTION_CONFERENCE (1).pdf; DEAR-CNN_Data-Efficient_Assessment_of_Resiliency_in_Convolutional_Neural_Networks.pdf
Device-Aware Test for Anomalous Charge Trapping in FeFETs / Yuan, Sicong; Wang, Changhao; Fieback, Moritz; Xun, Hanzhi; Taouil, Mottaqiallah; Li, Xiuyan; Wang, Lin; Chen, Danyang; Bellarmino, Nicolò; Cantoro, Riccardo; Hamdioui, Said. - (2025), pp. 635-641. ( 30th Asia and South Pacific Design Automation Conference ASP-DAC 2025 Tokyo (JPN) Jan. 20-23, 2025) [10.1145/3658617.3697755]. 1-gen-2025 Changhao WangNicolò BellarminoRiccardo CantoroSaid Hamdioui + 3658617.3697755.pdf
Device-Aware Test for Threshold Voltage Shifting in FeFET / Wang, Changhao; Kolahimahmoudi, Nima; Bellarmino, Nicolo; Cantoro, Riccardo; Yuan, Sicong; Xun, Hanzhi; Chen, Danyang; Yin, Chujun; Taouil, Mottaqiallah; Fieback, Moritz; Li, Xiuyan; Wang, Lin; Li, Chaobo; Hamdioui, Said. - (2025), pp. 410-413. ( IEEE International Test Conference 2025 San Diego (USA) 20-26 September 2025) [10.1109/ITC58126.2025.00052]. 1-gen-2025 Wang, ChanghaoKolahimahmoudi, NimaBellarmino, NicoloCantoro, RiccardoHamdioui, Said + 2025_ITC__Device_Aware_Test_for_voltage_shifting_in_FeFET__4_pages_.pdf; Device-Aware_Test_for_Threshold_Voltage_Shifting_in_FeFET.pdf
DOC: Detection of On-Line Failures in CNNs / Turco, Vittorio; Bellarmino, Nicolò; Ruospo, Annachiara; Cantoro, Riccardo; Sanchez, Ernesto. - ELETTRONICO. - (2025). ( Latin American Test Workshop, LATW San Andrés (COL) 11-14 March 2025) [10.1109/LATS65346.2025.10963935]. 1-gen-2025 Turco VittorioNicolò BellarminoAnnachiara RuospoCantoro RiccardoErnesto Sanchez LATS2025_On_line_detection (3).pdf; DOC_Detection_of_On-Line_Failures_in_CNNs.pdf
Early Functional Safety and PPA Evaluation of Digital Designs / Bartolomucci, Michelangelo; Kingston, David; Cupaiuolo, Teo; Nardi, Alessandra; Cantoro, Riccardo. - ELETTRONICO. - (2025), pp. 1-2. ( 2025 Design, Automation and Test in Europe Conference, DATE 2025 Lyon (FRA) 31 March 2025 - 02 April 2025) [10.23919/date64628.2025.10993267]. 1-gen-2025 Bartolomucci, MichelangeloCantoro, Riccardo + _DATE25__Early_Functional_Safety_and_PPA_evaluation_for_faster_digital_design_development_.pdf; Early_Functional_Safety_and_PPA_Evaluation_of_Digital_Designs.pdf
Exploiting the correlation with traditional fault models to speed-up cell-aware fault simulation / Khoshzaban, Reza; Guglielminetti, Iacopo; Grosso, Michelangelo; Sonza Reorda, Matteo; Cantoro, Riccardo. - (2025), pp. 418-421. ( International Test Conference San Diego, CA (USA) 20-26 September 2025) [10.1109/ITC58126.2025.00054]. 1-gen-2025 Reza KhoshzabanMichelangelo GrossoMatteo Sonza ReordaRiccardo Cantoro + Exploiting_the_correlation_with_traditional_fault_models_to_speed_up_cell_aware_faultsim_poster_ITC.pdf; Exploiting_the_correlation_with_traditional_fault_models_to_speed-up_cell-aware_fault_simulation.pdf
Grouped Feature Selection for SMONs Placement in MCU Performance Screening / Bellarmino, Nicolò; Cantoro, Riccardo; Huch, Martin; Kilian, Tobias; Squillero, Giovanni. - (2025), pp. 1-6. ( 2025 IEEE 26th Latin American Test Symposium (LATS) San Andrés (COL) 11-14 March 2025) [10.1109/lats65346.2025.10963942]. 1-gen-2025 Bellarmino, NicolòCantoro, RiccardoSquillero, Giovanni + 2024_LATS_GROUP_LASSO_TPAM_SEL (1).pdf; Grouped_Feature_Selection_for_SMONs_Placement_in_MCU_Performance_Screening.pdf
Investigating on Gradient Regularization for Testing Neural Networks / Bellarmino, Nicolo; Bosio, Alberto; Cantoro, Riccardo; Ruospo, Annachiara; Sanchez, Ernesto; Squillero, Giovanni. - ELETTRONICO. - 15509:(2025), pp. 67-81. ( 10th International Conference on machine Learning, Optimization and Data science (LOD 2024) Castiglione della Pescaia (ITA) September 22 – 25, 2024) [10.1007/978-3-031-82484-5_6]. 1-gen-2025 Bellarmino, NicoloBosio, AlbertoCantoro, RiccardoRuospo, AnnachiaraSanchez, ErnestoSquillero, Giovanni 2024_LOD_GRADIENT_PENALIZATION.pdf; 978-3-031-82484-5_6.pdf
System-Level Test techniques for Automotive SoCs / Angione, Francesco; Bernardi, Paolo; Cantoro, Riccardo. - (2025), pp. 568-577. ( International Test Conference (ITC) San Diego, CA (USA) 20-26 September 2025) [10.1109/itc58126.2025.00093]. 1-gen-2025 Angione, FrancescoBernardi, PaoloCantoro, Riccardo System-Level_Test_techniques_for_Automotive_SoCs.pdf
Assessing the Effectiveness of Software-Based Self-Test Programs for Static Cell-Aware Test / Cantoro, Riccardo; Grosso, Michelangelo; Guglielminetti, Iacopo; Khoshzaban, Reza; Reorda, Matteo Sonza. - (2024). ( 2024 IEEE European Test Symposium (ETS) The Hague (NL) 20-24 May 2024) [10.1109/ets61313.2024.10567198]. 1-gen-2024 Cantoro, RiccardoGrosso, MichelangeloKhoshzaban, RezaReorda, Matteo Sonza + _ETS_2024__Assessing_the_Effectiveness_of_Software_Based_Self_Test_Programs_for_Static_Cell_Aware_Test-8.pdf; Assessing_the_Effectiveness_of_Software-Based_Self-Test_Programs_for_Static_Cell-Aware_Test.pdf
Defects, Fault Modeling, and Test Development Framework for FeFETs / Wang, Changhao; Yuan, Sicong; Xun, Hanzhi; Li, Chaobo; Taouil, Mottaqiallah; Fieback, Moritz; Chen, Danyang; Li, Xiuyan; Wang, Lin; Cantoro, Riccardo; Yin, Chujun; Hamdioui, Said. - (2024), pp. 91-95. ( International Test Conference (ITC) 2024 San Diego (USA) 03-08 November 2024) [10.1109/ITC51657.2024.00026]. 1-gen-2024 Riccardo, CantoroSaid, Hamdioui + 2024_ITC_A_framework_of_defect_oritned_testing_for_FeFETs_2.pdf; Defects_Fault_Modeling_and_Test_Development_Framework_for_FeFETs.pdf
Embedded Feature Selection in MCU Performance Screening / Bellarmino, Nicolo'; Cantoro, Riccardo; Huch, Martin; Kilian, Tobias; Schlichtmann, Ulf; Squillero, Giovanni. - (2024), pp. 1-6. ( IEEE 2nd International conference on Design, Test & Technology of Integrated Systems Aix-en-Provence (FRA) October 14th -16th 2024) [10.1109/DTTIS62212.2024.10780418]. 1-gen-2024 Nicolo' BellarminoRiccardo CantoroGiovanni Squillero + 2024_DTTIS_EMBEDDED_Feature_Selection (1).pdf; Embedded_Feature_Selection_in_MCU_Performance_Screening.pdf
Evaluating the Reliability of Integer Multipliers With Respect to Permanent Faults / Deligiannis, Nikolaos; Cantoro, Riccardo; SONZA REORDA, Matteo; Habib, S. E. D.. - (2024), pp. 124-129. ( International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS) Kielce (POL) 03-05 April 2024) [10.1109/DDECS60919.2024.10508899]. 1-gen-2024 Deligiannis, NikolaosCantoro, RiccardoSonza Reorda Matteo + DDECS2024__Evaluating_the_Reliability_of_Integer_Multipliers_With_Respect_to_Permanent_Faults.pdf; Evaluating_the_Reliability_of_Integer_Multipliers_With_Respect_to_Permanent_Faults.pdf
Fault Grading Techniques for Evaluating Software-Based Self-Test with Respect to Small Delay Defects / Bartolomucci, Michelangelo; Deligiannis, Nikolaos; Cantoro, Riccardo; Sonza Reorda, Matteo. - (2024). ( International Symposium on On-Line Testing and Robust System Design (IOLTS) Rennes (FRA) 03-05 July 2024) [10.1109/IOLTS60994.2024.10616077]. 1-gen-2024 Bartolomucci, MichelangeloDeligiannis, NikolaosCantoro, RiccardoSonza Reorda, Matteo IOLTS-24_CameraReady.pdf; Fault_Grading_Techniques_for_Evaluating_Software-Based_Self-Test_with_Respect_to_Small_Delay_Defects.pdf
U-FLEX: Unsupervised Feature Learning with Evolutionary eXploration / Bellarmino, Nicolo’; Cantoro, Riccardo; Squillero, Giovanni. - ELETTRONICO. - 14505:(2024), pp. 364-378. ( The 9th International Conference on Machine Learning, Optimization, and Data Science (LOD 2023) Grasmere, Lake District, England (UK) September 22 – 26, 2023) [10.1007/978-3-031-53969-5_27]. 1-gen-2024 Nicolo’ BellarminoRiccardo CantoroGiovanni Squillero 2023_LOD_Genetic_Feature_Selection (2).pdf; 978-3-031-53969-5_27.pdf
A Survey of Recent Developments in Testability, Safety and Security of RISC-V Processors / Anders, Jens; Andreu, Pablo; Becker, Bernd; Becker, Steffen; Cantoro, Riccardo; Deligiannis, Nikolaos; Elhamawy, Nourhan; Faller, Tobias; Hernandez, Carles; Mentens, Nele; Namazi Rizi, Mahnaz; Polian, Ilia; Sajadi, Abolfazl; Sauer, Mathias; Schwachhofer, Denis; SONZA REORDA, Matteo; Stefanov, Todor; Tuzov, Ilya; Wagner, Stefan; Zidaric, Nuša. - (2023), pp. 1-10. ( 2023 IEEE European Test Symposium (ETS) Venice (Italy) 22-26 May 2023) [10.1109/ETS56758.2023.10174099]. 1-gen-2023 Riccardo CantoroNikolaos DeligiannisMatteo Sonza Reorda + ETS_RISC_V_testing_safety_security.pdf; A_Survey_of_Recent_Developments_in_Testability_Safety_and_Security_of_RISC-V_Processors.pdf