Archivio Istituzionale della RicercaCANTORO, RICCARDO
CANTORO, RICCARDO
Dipartimento di Automatica e Informatica
021727
Exploiting the correlation with traditional fault models to speed-up cell-aware fault simulation
In corso di stampa Khoshzaban, Reza; Guglielminetti, Iacopo; Grosso, Michelangelo; Sonza Reorda, Matteo; Cantoro, Riccardo
In-Context Learning for Microcontroller Performance Screening Using Tabular Foundation Models
In corso di stampa Bellarmino, Nicolò; Cantoro, Riccardo; Huch, Martin; Kilian, Tobias; Squillero, Giovanni
Minimal Supervision, Maximum Accuracy: TabPFN for Microcontroller Performance Prediction
In corso di stampa Bellarmino, Nicolò; Cantoro, Riccardo; Huch, Martin; Kilian, Tobias
Performance-aware reliability optimization for digital designs
In corso di stampa Bartolomucci, Michelangelo; Tran, Uyen; Roland, Didier; Kingston, David; Nardi, Alessandra; Cantoro, Riccardo
Transfer Learning in MCU Performance Screening
In corso di stampa Bellarmino, Nicolo; Cantoro, Riccardo; Huch, Martin; Kilian, Tobias; Schlichtmann, Ulf; Squillero, Giovanni
DEAR-CNN: Data-Efficient Assessment of Resiliency in Convolutional Neural Networks
2025 Bellarmino, Nicolo'; Bosio, Alberto; Cantoro, Riccardo; Ruospo, Annachiara; Sanchez, Ernesto
Device-Aware Test for Anomalous Charge Trapping in FeFETs
2025 Yuan, Sicong; Wang, Changhao; Fieback, Moritz; Xun, Hanzhi; Taouil, Mottaqiallah; Li, Xiuyan; Wang, Lin; Chen, Danyang; Bellarmino, Nicolò; Cantoro, Riccardo; Hamdioui, Said
Device-Aware Test for Threshold Voltage Shifting in FeFET
2025 Wang, Changhao; Kolahimahmoudi, Nima; Bellarmino, Nicolo; Cantoro, Riccardo; Yuan, Sicong; Xun, Hanzhi; Chen, Danyang; Yin, Chujun; Taouil, Mottaqiallah; Fieback, Moritz; Li, Xiuyan; Wang, Lin; Li, Chaobo; Hamdioui, Said
DOC: Detection of On-Line Failures in CNNs
2025 Turco, Vittorio; Bellarmino, Nicolò; Ruospo, Annachiara; Cantoro, Riccardo; Sanchez, Ernesto
Early Functional Safety and PPA Evaluation of Digital Designs
2025 Bartolomucci, Michelangelo; Kingston, David; Cupaiuolo, Teo; Nardi, Alessandra; Cantoro, Riccardo
Grouped Feature Selection for SMONs Placement in MCU Performance Screening
2025 Bellarmino, Nicolò; Cantoro, Riccardo; Huch, Martin; Kilian, Tobias; Squillero, Giovanni
Investigating on Gradient Regularization for Testing Neural Networks
2025 Bellarmino, Nicolo; Bosio, Alberto; Cantoro, Riccardo; Ruospo, Annachiara; Sanchez, Ernesto; Squillero, Giovanni
Assessing the Effectiveness of Software-Based Self-Test Programs for Static Cell-Aware Test
2024 Cantoro, Riccardo; Grosso, Michelangelo; Guglielminetti, Iacopo; Khoshzaban, Reza; Reorda, Matteo Sonza
Defects, Fault Modeling, and Test Development Framework for FeFETs
2024 Wang, Changhao; Yuan, Sicong; Xun, Hanzhi; Li, Chaobo; Taouil, Mottaqiallah; Fieback, Moritz; Chen, Danyang; Li, Xiuyan; Wang, Lin; Cantoro, Riccardo; Yin, Chujun; Hamdioui, Said
Embedded Feature Selection in MCU Performance Screening
2024 Bellarmino, Nicolo'; Cantoro, Riccardo; Huch, Martin; Kilian, Tobias; Schlichtmann, Ulf; Squillero, Giovanni
Evaluating the Reliability of Integer Multipliers With Respect to Permanent Faults
2024 Deligiannis, Nikolaos; Cantoro, Riccardo; SONZA REORDA, Matteo; Habib, S. E. D.
Fault Grading Techniques for Evaluating Software-Based Self-Test with Respect to Small Delay Defects
2024 Bartolomucci, Michelangelo; Deligiannis, Nikolaos; Cantoro, Riccardo; Sonza Reorda, Matteo
U-FLEX: Unsupervised Feature Learning with Evolutionary eXploration
2024 Bellarmino, Nicolo’; Cantoro, Riccardo; Squillero, Giovanni
A Survey of Recent Developments in Testability, Safety and Security of RISC-V Processors
2023 Anders, Jens; Andreu, Pablo; Becker, Bernd; Becker, Steffen; Cantoro, Riccardo; Deligiannis, Nikolaos; Elhamawy, Nourhan; Faller, Tobias; Hernandez, Carles; Mentens, Nele; Namazi Rizi, Mahnaz; Polian, Ilia; Sajadi, Abolfazl; Sauer, Mathias; Schwachhofer, Denis; SONZA REORDA, Matteo; Stefanov, Todor; Tuzov, Ilya; Wagner, Stefan; Zidaric, Nuša
Automatic Identification of Functionally Untestable Cell-Aware Faults in Microprocessors
2023 Deligiannis, Nikolaos; Faller, Tobias; Iacopo, Guglielminetti; Cantoro, Riccardo; Becker, Bernd; SONZA REORDA, Matteo
| Citazione | Data di pubblicazione | Autori | File |
|---|---|---|---|
| Exploiting the correlation with traditional fault models to speed-up cell-aware fault simulation / Khoshzaban, Reza; Guglielminetti, Iacopo; Grosso, Michelangelo; Sonza Reorda, Matteo; Cantoro, Riccardo. - (In corso di stampa). (Intervento presentato al convegno International Test Conference). | In corso di stampa | Reza KhoshzabanMichelangelo GrossoMatteo Sonza ReordaRiccardo Cantoro + | Exploiting_the_correlation_with_traditional_fault_models_to_speed_up_cell_aware_faultsim_poster_ITC.pdf |
| In-Context Learning for Microcontroller Performance Screening Using Tabular Foundation Models / Bellarmino, Nicolò; Cantoro, Riccardo; Huch, Martin; Kilian, Tobias; Squillero, Giovanni. - ELETTRONICO. - (In corso di stampa). (Intervento presentato al convegno 28th Euromicro Conference Series on Digital System Design (DSD) 2025 tenutosi a Salerno (IT) nel 10-12 September, 2025). | In corso di stampa | Nicolò BellarminoRiccardo CantoroGiovanni Squillero + | 2025_DSD_Foundation_Models (2).pdf |
| Minimal Supervision, Maximum Accuracy: TabPFN for Microcontroller Performance Prediction / Bellarmino, Nicolò; Cantoro, Riccardo; Huch, Martin; Kilian, Tobias. - STAMPA. - (In corso di stampa). (Intervento presentato al convegno International Test Conference (ITC) 2025 tenutosi a San Diego, California (USA) nel 21-26 September, 2025). | In corso di stampa | Nicolò BellarminoRiccardo Cantoro + | 2025_ITC_FOUNDATION_MODELS_POSTER (3).pdf |
| Performance-aware reliability optimization for digital designs / Bartolomucci, Michelangelo; Tran, Uyen; Roland, Didier; Kingston, David; Nardi, Alessandra; Cantoro, Riccardo. - ELETTRONICO. - (In corso di stampa), pp. 1-6. (Intervento presentato al convegno 20th International Conference on Design, Test & Technology of Integrated Systems tenutosi a Athens (GRC) nel 15 – 17 October 2025). | In corso di stampa | Michelangelo BartolomucciRiccardo Cantoro + | _DTTIS_2025__Performance_aware_reliability_optimization_for_digital_designs.pdf |
| Transfer Learning in MCU Performance Screening / Bellarmino, Nicolo; Cantoro, Riccardo; Huch, Martin; Kilian, Tobias; Schlichtmann, Ulf; Squillero, Giovanni. - ELETTRONICO. - (In corso di stampa). (Intervento presentato al convegno IEEE International Test Conference (ITC 2023) tenutosi a Anaheim, CA 92802, Stati Uniti nel 8-13 Ottobre 2023). | In corso di stampa | Bellarmino, NicoloCantoro, RiccardoSquillero, Giovanni + | 2023_XXX_Transfer_Learning_POSTER (5).pdf |
| DEAR-CNN: Data-Efficient Assessment of Resiliency in Convolutional Neural Networks / Bellarmino, Nicolo'; Bosio, Alberto; Cantoro, Riccardo; Ruospo, Annachiara; Sanchez, Ernesto. - ELETTRONICO. - (2025), pp. 13-18. (Intervento presentato al convegno 28th IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS) tenutosi a Lyon (FRA) nel May 5-7, 2025) [10.1109/DDECS63720.2025.11006797]. | 1-gen-2025 | Nicolo' BellarminoAlberto BosioRiccardo CantoroAnnachiara RuospoErnesto Sanchez | 2025_DDECS_DNN_TEST_COMPACTION_CONFERENCE (1).pdf; DEAR-CNN_Data-Efficient_Assessment_of_Resiliency_in_Convolutional_Neural_Networks.pdf |
| Device-Aware Test for Anomalous Charge Trapping in FeFETs / Yuan, Sicong; Wang, Changhao; Fieback, Moritz; Xun, Hanzhi; Taouil, Mottaqiallah; Li, Xiuyan; Wang, Lin; Chen, Danyang; Bellarmino, Nicolò; Cantoro, Riccardo; Hamdioui, Said. - (2025), pp. 635-641. (Intervento presentato al convegno 30th Asia and South Pacific Design Automation Conference ASP-DAC 2025 tenutosi a Tokyo (JPN) nel Jan. 20-23, 2025) [10.1145/3658617.3697755]. | 1-gen-2025 | Changhao WangNicolò BellarminoRiccardo CantoroSaid Hamdioui + | 3658617.3697755.pdf |
| Device-Aware Test for Threshold Voltage Shifting in FeFET / Wang, Changhao; Kolahimahmoudi, Nima; Bellarmino, Nicolo; Cantoro, Riccardo; Yuan, Sicong; Xun, Hanzhi; Chen, Danyang; Yin, Chujun; Taouil, Mottaqiallah; Fieback, Moritz; Li, Xiuyan; Wang, Lin; Li, Chaobo; Hamdioui, Said. - (2025). (Intervento presentato al convegno Titolo volume non avvalorato). | 1-gen-2025 | Wang, ChanghaoKolahimahmoudi, NimaBellarmino, NicoloCantoro, RiccardoHamdioui, Said + | 2025_ITC__Device_Aware_Test_for_voltage_shifting_in_FeFET__4_pages_.pdf |
| DOC: Detection of On-Line Failures in CNNs / Turco, Vittorio; Bellarmino, Nicolò; Ruospo, Annachiara; Cantoro, Riccardo; Sanchez, Ernesto. - ELETTRONICO. - (2025). (Intervento presentato al convegno Latin American Test Workshop, LATW tenutosi a San Andrés (COL) nel 11-14 March 2025) [10.1109/LATS65346.2025.10963935]. | 1-gen-2025 | Turco VittorioNicolò BellarminoAnnachiara RuospoCantoro RiccardoErnesto Sanchez | LATS2025_On_line_detection (3).pdf; DOC_Detection_of_On-Line_Failures_in_CNNs.pdf |
| Early Functional Safety and PPA Evaluation of Digital Designs / Bartolomucci, Michelangelo; Kingston, David; Cupaiuolo, Teo; Nardi, Alessandra; Cantoro, Riccardo. - ELETTRONICO. - (2025), pp. 1-2. (Intervento presentato al convegno 2025 Design, Automation and Test in Europe Conference, DATE 2025 tenutosi a Lyon (FRA) nel 31 March 2025 - 02 April 2025) [10.23919/date64628.2025.10993267]. | 1-gen-2025 | Bartolomucci, MichelangeloCantoro, Riccardo + | _DATE25__Early_Functional_Safety_and_PPA_evaluation_for_faster_digital_design_development_.pdf; Early_Functional_Safety_and_PPA_Evaluation_of_Digital_Designs.pdf |
| Grouped Feature Selection for SMONs Placement in MCU Performance Screening / Bellarmino, Nicolò; Cantoro, Riccardo; Huch, Martin; Kilian, Tobias; Squillero, Giovanni. - (2025), pp. 1-6. (Intervento presentato al convegno 2025 IEEE 26th Latin American Test Symposium (LATS) tenutosi a San Andrés (COL) nel 11-14 March 2025) [10.1109/lats65346.2025.10963942]. | 1-gen-2025 | Bellarmino, NicolòCantoro, RiccardoSquillero, Giovanni + | 2024_LATS_GROUP_LASSO_TPAM_SEL (1).pdf; Grouped_Feature_Selection_for_SMONs_Placement_in_MCU_Performance_Screening.pdf |
| Investigating on Gradient Regularization for Testing Neural Networks / Bellarmino, Nicolo; Bosio, Alberto; Cantoro, Riccardo; Ruospo, Annachiara; Sanchez, Ernesto; Squillero, Giovanni. - ELETTRONICO. - 15509:(2025), pp. 67-81. (Intervento presentato al convegno 10th International Conference on machine Learning, Optimization and Data science (LOD 2024) tenutosi a Castiglione della Pescaia (ITA) nel September 22 – 25, 2024) [10.1007/978-3-031-82484-5_6]. | 1-gen-2025 | Bellarmino, NicoloBosio, AlbertoCantoro, RiccardoRuospo, AnnachiaraSanchez, ErnestoSquillero, Giovanni | 2024_LOD_GRADIENT_PENALIZATION.pdf; 978-3-031-82484-5_6.pdf |
| Assessing the Effectiveness of Software-Based Self-Test Programs for Static Cell-Aware Test / Cantoro, Riccardo; Grosso, Michelangelo; Guglielminetti, Iacopo; Khoshzaban, Reza; Reorda, Matteo Sonza. - (2024). (Intervento presentato al convegno 2024 IEEE European Test Symposium (ETS) tenutosi a The Hague (NL) nel 20-24 May 2024) [10.1109/ets61313.2024.10567198]. | 1-gen-2024 | Cantoro, RiccardoGrosso, MichelangeloKhoshzaban, RezaReorda, Matteo Sonza + | _ETS_2024__Assessing_the_Effectiveness_of_Software_Based_Self_Test_Programs_for_Static_Cell_Aware_Test-8.pdf; Assessing_the_Effectiveness_of_Software-Based_Self-Test_Programs_for_Static_Cell-Aware_Test.pdf |
| Defects, Fault Modeling, and Test Development Framework for FeFETs / Wang, Changhao; Yuan, Sicong; Xun, Hanzhi; Li, Chaobo; Taouil, Mottaqiallah; Fieback, Moritz; Chen, Danyang; Li, Xiuyan; Wang, Lin; Cantoro, Riccardo; Yin, Chujun; Hamdioui, Said. - (2024), pp. 91-95. (Intervento presentato al convegno International Test Conference (ITC) 2024 tenutosi a San Diego (USA) nel 03-08 November 2024) [10.1109/ITC51657.2024.00026]. | 1-gen-2024 | Riccardo, CantoroSaid, Hamdioui + | 2024_ITC_A_framework_of_defect_oritned_testing_for_FeFETs_2.pdf; Defects_Fault_Modeling_and_Test_Development_Framework_for_FeFETs.pdf |
| Embedded Feature Selection in MCU Performance Screening / Bellarmino, Nicolo'; Cantoro, Riccardo; Huch, Martin; Kilian, Tobias; Schlichtmann, Ulf; Squillero, Giovanni. - (2024), pp. 1-6. (Intervento presentato al convegno IEEE 2nd International conference on Design, Test & Technology of Integrated Systems tenutosi a Aix-en-Provence (FRA) nel October 14th -16th 2024) [10.1109/DTTIS62212.2024.10780418]. | 1-gen-2024 | Nicolo' BellarminoRiccardo CantoroGiovanni Squillero + | 2024_DTTIS_EMBEDDED_Feature_Selection (1).pdf; Embedded_Feature_Selection_in_MCU_Performance_Screening.pdf |
| Evaluating the Reliability of Integer Multipliers With Respect to Permanent Faults / Deligiannis, Nikolaos; Cantoro, Riccardo; SONZA REORDA, Matteo; Habib, S. E. D.. - (2024), pp. 124-129. (Intervento presentato al convegno International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS) tenutosi a Kielce (POL) nel 03-05 April 2024) [10.1109/DDECS60919.2024.10508899]. | 1-gen-2024 | Deligiannis, NikolaosCantoro, RiccardoSonza Reorda Matteo + | DDECS2024__Evaluating_the_Reliability_of_Integer_Multipliers_With_Respect_to_Permanent_Faults.pdf; Evaluating_the_Reliability_of_Integer_Multipliers_With_Respect_to_Permanent_Faults.pdf |
| Fault Grading Techniques for Evaluating Software-Based Self-Test with Respect to Small Delay Defects / Bartolomucci, Michelangelo; Deligiannis, Nikolaos; Cantoro, Riccardo; Sonza Reorda, Matteo. - (2024). (Intervento presentato al convegno International Symposium on On-Line Testing and Robust System Design (IOLTS) tenutosi a Rennes (FRA) nel 03-05 July 2024) [10.1109/IOLTS60994.2024.10616077]. | 1-gen-2024 | Bartolomucci, MichelangeloDeligiannis, NikolaosCantoro, RiccardoSonza Reorda, Matteo | IOLTS-24_CameraReady.pdf; Fault_Grading_Techniques_for_Evaluating_Software-Based_Self-Test_with_Respect_to_Small_Delay_Defects.pdf |
| U-FLEX: Unsupervised Feature Learning with Evolutionary eXploration / Bellarmino, Nicolo’; Cantoro, Riccardo; Squillero, Giovanni. - ELETTRONICO. - 14505:(2024), pp. 364-378. (Intervento presentato al convegno The 9th International Conference on Machine Learning, Optimization, and Data Science (LOD 2023) tenutosi a Grasmere, Lake District, England (UK) nel September 22 – 26, 2023) [10.1007/978-3-031-53969-5_27]. | 1-gen-2024 | Nicolo’ BellarminoRiccardo CantoroGiovanni Squillero | 2023_LOD_Genetic_Feature_Selection (2).pdf; 978-3-031-53969-5_27.pdf |
| A Survey of Recent Developments in Testability, Safety and Security of RISC-V Processors / Anders, Jens; Andreu, Pablo; Becker, Bernd; Becker, Steffen; Cantoro, Riccardo; Deligiannis, Nikolaos; Elhamawy, Nourhan; Faller, Tobias; Hernandez, Carles; Mentens, Nele; Namazi Rizi, Mahnaz; Polian, Ilia; Sajadi, Abolfazl; Sauer, Mathias; Schwachhofer, Denis; SONZA REORDA, Matteo; Stefanov, Todor; Tuzov, Ilya; Wagner, Stefan; Zidaric, Nuša. - (2023), pp. 1-10. (Intervento presentato al convegno 2023 IEEE European Test Symposium (ETS) tenutosi a Venice (Italy) nel 22-26 May 2023) [10.1109/ETS56758.2023.10174099]. | 1-gen-2023 | Riccardo CantoroNikolaos DeligiannisMatteo Sonza Reorda + | ETS_RISC_V_testing_safety_security.pdf; A_Survey_of_Recent_Developments_in_Testability_Safety_and_Security_of_RISC-V_Processors.pdf |
| Automatic Identification of Functionally Untestable Cell-Aware Faults in Microprocessors / Deligiannis, Nikolaos; Faller, Tobias; Iacopo, Guglielminetti; Cantoro, Riccardo; Becker, Bernd; SONZA REORDA, Matteo. - (2023), pp. 1-6. (Intervento presentato al convegno Asian Test Symposium (ATS) tenutosi a Beijing (China) nel 14-17 October 2023) [10.1109/ATS59501.2023.10317988]. | 1-gen-2023 | Nikolaos DeligiannisRiccardo CantoroMatteo Sonza Reorda + | _ATS2023__Automatic_Identification_of_Functionally_Untestable_Cell_Aware_Faults_in_Microprocessors.pdf; Automatic_Identification_of_Functionally_Untestable_Cell-Aware_Faults_in_Microprocessors.pdf |