Archivio Istituzionale della RicercaCANTORO, RICCARDO
CANTORO, RICCARDO
Dipartimento di Automatica e Informatica
021727
Data-Efficient Cross-Generation Adaptation for Microcontroller Performance Screening
In corso di stampa Bellarmino, Nicolo; Vancini, Alessandro; Kilian, Tobias; Cantoro, Riccardo
Dynamic Workload Selection for Ranked Fault Injection via Sequential Bernoulli Discovery Modeling
In corso di stampa Bellarmino, Nicolo'; Bosio, Alberto; Cantoro, Riccardo
From Synthesis to Kinetics: A Data-Driven Deep Learning Framework for Process-Aware Ferroelectric Dynamics
In corso di stampa Wang, Changhao; Yao, Xinhao; Chen, Danyang; Li, Chaobo; Li, Xiuyan; Yuan, Sicong; Xun, Hanzhi; Hamdioui, Said; Bellarmino, Nicolo'; Cantoro, Riccardo
Implicit Activation Sparsity for Fault-Tolerant CNNs: A Training-Dynamics Perspective
In corso di stampa Bellarmino, Nicolo'; Bosio, Alberto; Ruospo, Annachiara; Ernesto, Sanchez; Cantoro, Riccardo
In-Context Learning for Microcontroller Performance Screening Using Tabular Foundation Models
In corso di stampa Bellarmino, Nicolò; Cantoro, Riccardo; Huch, Martin; Kilian, Tobias; Squillero, Giovanni
Performance-aware reliability optimization for digital designs
In corso di stampa Bartolomucci, Michelangelo; Tran, Uyen; Roland, Didier; Kingston, David; Nardi, Alessandra; Cantoro, Riccardo
Si-ATLAS: Autonomous Testing via LLM-Agent Synergy for RISC-V SBST Generation
In corso di stampa Wang, Changhao; Chen, Yijing; Bellarmino, Nicolo'; Rodriguez Condia, Josie Esteban; Li, Chaobo; Squillero, Giovanni; Cantoro, Riccardo
Transfer Learning in MCU Performance Screening
In corso di stampa Bellarmino, Nicolo; Cantoro, Riccardo; Huch, Martin; Kilian, Tobias; Schlichtmann, Ulf; Squillero, Giovanni
Automatic Enhancement of Cell Models to Enable Conditional Stuck-at Fault Simulation and Pattern Generation
2026 Khoshzaban, Reza; Deligiannis, Nikolaos I.; Guglielminetti, Iacopo; Grosso, Michelangelo; Cantoro, Riccardo
Late Breaking Results - New Techniques for Software Test Library Compaction
2026 Deligiannis, Nikolaos I.; Bartolomucci, Michelangelo; Sohrabian, Mansour; Cantoro, Riccardo; Reorda, Matteo Sonza
M-EL2N: Data-Efficient Fault Injection Through Sample Difficulty Analysis
2026 Bellarmino, Nicolò; Bosio, Alberto; Al-Kaf, Ahmed; Benabdenbi, Mounir; Leveugle, Régis; Cantoro, Riccardo
Pre-processing Functional And Physical Defect Equivalences To Accelerate Cell-Aware Model Generation
2026 Khoshzaban, Reza; Mongelli, Gianmarco; Ronga, Dorian; Guglielminetti, Iacopo; Grosso, Michelangelo; Faehn, Eric; Girard, Patrick; Virazel, Arnaud; Cantoro, Riccardo
DEAR-CNN: Data-Efficient Assessment of Resiliency in Convolutional Neural Networks
2025 Bellarmino, Nicolo'; Bosio, Alberto; Cantoro, Riccardo; Ruospo, Annachiara; Sanchez, Ernesto
Device-Aware Test for Anomalous Charge Trapping in FeFETs
2025 Yuan, Sicong; Wang, Changhao; Fieback, Moritz; Xun, Hanzhi; Taouil, Mottaqiallah; Li, Xiuyan; Wang, Lin; Chen, Danyang; Bellarmino, Nicolò; Cantoro, Riccardo; Hamdioui, Said
Device-Aware Test for Threshold Voltage Shifting in FeFET
2025 Wang, Changhao; Kolahimahmoudi, Nima; Bellarmino, Nicolo; Cantoro, Riccardo; Yuan, Sicong; Xun, Hanzhi; Chen, Danyang; Yin, Chujun; Taouil, Mottaqiallah; Fieback, Moritz; Li, Xiuyan; Wang, Lin; Li, Chaobo; Hamdioui, Said
DOC: Detection of On-Line Failures in CNNs
2025 Turco, Vittorio; Bellarmino, Nicolò; Ruospo, Annachiara; Cantoro, Riccardo; Sanchez, Ernesto
Early Functional Safety and PPA Evaluation of Digital Designs
2025 Bartolomucci, Michelangelo; Kingston, David; Cupaiuolo, Teo; Nardi, Alessandra; Cantoro, Riccardo
Exploiting the correlation with traditional fault models to speed-up cell-aware fault simulation
2025 Khoshzaban, Reza; Guglielminetti, Iacopo; Grosso, Michelangelo; Sonza Reorda, Matteo; Cantoro, Riccardo
Grouped Feature Selection for SMONs Placement in MCU Performance Screening
2025 Bellarmino, Nicolò; Cantoro, Riccardo; Huch, Martin; Kilian, Tobias; Squillero, Giovanni
Investigating on Gradient Regularization for Testing Neural Networks
2025 Bellarmino, Nicolo; Bosio, Alberto; Cantoro, Riccardo; Ruospo, Annachiara; Sanchez, Ernesto; Squillero, Giovanni
| Citazione | Data di pubblicazione | Autori | File |
|---|---|---|---|
| Data-Efficient Cross-Generation Adaptation for Microcontroller Performance Screening / Bellarmino, N., Vancini, A., Kilian, T., Cantoro, R.. - (In corso di stampa). (39th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems Rome (ITA) September 30th - October 2nd, 2026). | In corso di stampa | Nicolo BellarminoRiccardo Cantoro + | 2026_DFTS_Transfer_Learning_Alessandro (6).pdf |
| Dynamic Workload Selection for Ranked Fault Injection via Sequential Bernoulli Discovery Modeling / Bellarmino, N., Bosio, A., Cantoro, R.. - (In corso di stampa). (IEEE 35th Asian Test Symposium (ATS 2026) Kaohsiung, Taiwan 1st - 3rd December, 2026). | In corso di stampa | Nicolo, BellarminoAlberto, BosioRiccardo, Cantoro | 2026_ATS_ON_LINE_FI_CONFERNCE.pdf |
| From Synthesis to Kinetics: A Data-Driven Deep Learning Framework for Process-Aware Ferroelectric Dynamics / Wang, C., Yao, X., Chen, D., Li, C., Li, X., Yuan, S., Xun, H., Hamdioui, S., Bellarmino, N., Cantoro, R.. - (In corso di stampa). (The Fourteenth International Conference on Learning Representations (ICLR 2026) Rio de Janeiro, Brazil April 23rd - 27th, 2026). | In corso di stampa | Changhao, WangSaid, HamdiouiNicolò, BellarminoRiccardo, Cantoro + | 7_From_Synthesis_to_Kinetics_A.pdf |
| Implicit Activation Sparsity for Fault-Tolerant CNNs: A Training-Dynamics Perspective / Bellarmino, N., Bosio, A., Ruospo, A., Ernesto, S., Cantoro, R.. - IEEE International Conference on Omni-Layer Intelligent Systems (COINS):(In corso di stampa). (IEEE International Conference on Omni-Layer Intelligent Systems (COINS) Bologna, Italy 7-9 September 2026). | In corso di stampa | Nicolo, BellarminoAlberto, BosioAnnachiara, RuospoErnesto, SanchezRiccardo, Cantoro | 2026_COINS_LOL_TRAINING_DYNAMICS_CNN (7).pdf |
| In-Context Learning for Microcontroller Performance Screening Using Tabular Foundation Models / Bellarmino, N., Cantoro, R., Huch, M., Kilian, T., Squillero, G.. - ELETTRONICO. - (In corso di stampa). (28th Euromicro Conference Series on Digital System Design (DSD) 2025 Salerno (IT) 10-12 September, 2025). | In corso di stampa | Nicolò BellarminoRiccardo CantoroGiovanni Squillero + | 2025_DSD_Foundation_Models (2).pdf |
| Performance-aware reliability optimization for digital designs / Bartolomucci, M., Tran, U., Roland, D., Kingston, D., Nardi, A., Cantoro, R.. - ELETTRONICO. - (In corso di stampa), pp. 1-6. (20th International Conference on Design, Test & Technology of Integrated Systems Athens (GRC) 15 – 17 October 2025). | In corso di stampa | Michelangelo BartolomucciRiccardo Cantoro + | _DTTIS_2025__Performance_aware_reliability_optimization_for_digital_designs.pdf |
| Si-ATLAS: Autonomous Testing via LLM-Agent Synergy for RISC-V SBST Generation / Wang, C., Chen, Y., Bellarmino, N., Rodriguez Condia, J.E., Li, C., Squillero, G., Cantoro, R.. - (In corso di stampa). (International Test Conference 2026 (ITC 2026) San Antonio, Texas, USA October 11–16, 2026). | In corso di stampa | Changhao, WangNicolo, BellarminoJosie Esteban, Rodriguez CondiaGiovanni, SquilleroRiccardo, Cantoro + | - |
| Transfer Learning in MCU Performance Screening / Bellarmino, N., Cantoro, R., Huch, M., Kilian, T., Schlichtmann, U., Squillero, G.. - ELETTRONICO. - (In corso di stampa). (IEEE International Test Conference (ITC 2023) Anaheim, CA 92802, Stati Uniti 8-13 Ottobre 2023). | In corso di stampa | Bellarmino, NicoloCantoro, RiccardoSquillero, Giovanni + | 2023_XXX_Transfer_Learning_POSTER (5).pdf |
| Automatic Enhancement of Cell Models to Enable Conditional Stuck-at Fault Simulation and Pattern Generation / Khoshzaban, R., Deligiannis, N.I., Guglielminetti, I., Grosso, M., Cantoro, R.. - (2026), pp. 1-6. (2026 IEEE 27th Latin American Test Symposium (LATS) Florianópolis (BRA) 17-20 March 2026) [10.1109/lats70329.2026.11480285]. | 1-gen-2026 | Khoshzaban, RezaGrosso, MichelangeloCantoro, Riccardo + | _LATS2026__Automatic_Enhancement_of_Cell_Models_to_Enable_Conditional_Stuck_At_Fault_Simulation_and_Pattern_Generation.pdf; Automatic_Enhancement_of_Cell_Models_to_Enable_Conditional_Stuck-at_Fault_Simulation_and_Pattern_Generation.pdf |
| Late Breaking Results - New Techniques for Software Test Library Compaction / Deligiannis, N.I., Bartolomucci, M., Sohrabian, M., Cantoro, R., Reorda, M.S.. - (2026), pp. 1-3. (44th VLSI Test Symposium, VTS 2026 Napa, CA (USA) 27-29 April 2026) [10.1109/vts69484.2026.11563360]. | 1-gen-2026 | Bartolomucci, MichelangeloSohrabian, MansourCantoro, RiccardoReorda, Matteo Sonza + | 2026082299-2.pdf; Late_Breaking_Results_-_New_Techniques_for_Software_Test_Library_Compaction.pdf |
| M-EL2N: Data-Efficient Fault Injection Through Sample Difficulty Analysis / Bellarmino, N., Bosio, A., Al-Kaf, A., Benabdenbi, M., Leveugle, R., Cantoro, R.. - (2026), pp. 1-6. (27th Latin American Test Symposium, LATS 2026 Florianópolis (BRA) 17-20 March 2026) [10.1109/lats70329.2026.11480331]. | 1-gen-2026 | Bellarmino, NicolòBosio, AlbertoCantoro, Riccardo + | M-EL2N_Data-Efficient_Fault_Injection_Through_Sample_Difficulty_Analysis.pdf; 2025_LATS_MIRRORED_EL2N (3).pdf |
| Pre-processing Functional And Physical Defect Equivalences To Accelerate Cell-Aware Model Generation / Khoshzaban, R., Mongelli, G., Ronga, D., Guglielminetti, I., Grosso, M., Faehn, E., Girard, P., Virazel, A., Cantoro, R.. - (2026), pp. 1-7. (44th VLSI Test Symposium, VTS 2026 Napa, CA (USA) 27-29 April 2026) [10.1109/vts69484.2026.11563207]. | 1-gen-2026 | Khoshzaban, RezaGrosso, MichelangeloCantoro, Riccardo + | [VTS2026]Pre-processing Functional And Physical Defect Equivalences To Accelerate Cell-Aware Model Generation.pdf; Pre-processing_Functional_And_Physical_Defect_Equivalences_To_Accelerate_Cell-Aware_Model_Generation.pdf |
| DEAR-CNN: Data-Efficient Assessment of Resiliency in Convolutional Neural Networks / Bellarmino, N., Bosio, A., Cantoro, R., Ruospo, A., Sanchez, E.. - ELETTRONICO. - (2025), pp. 13-18. (28th IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS) Lyon (FRA) May 5-7, 2025) [10.1109/DDECS63720.2025.11006797]. | 1-gen-2025 | Nicolo' BellarminoAlberto BosioRiccardo CantoroAnnachiara RuospoErnesto Sanchez | 2025_DDECS_DNN_TEST_COMPACTION_CONFERENCE (1).pdf; DEAR-CNN_Data-Efficient_Assessment_of_Resiliency_in_Convolutional_Neural_Networks.pdf |
| Device-Aware Test for Anomalous Charge Trapping in FeFETs / Yuan, S., Wang, C., Fieback, M., Xun, H., Taouil, M., Li, X., Wang, L., Chen, D., Bellarmino, N., Cantoro, R., Hamdioui, S.. - (2025), pp. 635-641. (30th Asia and South Pacific Design Automation Conference ASP-DAC 2025 Tokyo (JPN) Jan. 20-23, 2025) [10.1145/3658617.3697755]. | 1-gen-2025 | Changhao WangNicolò BellarminoRiccardo CantoroSaid Hamdioui + | 3658617.3697755.pdf |
| Device-Aware Test for Threshold Voltage Shifting in FeFET / Wang, C., Kolahimahmoudi, N., Bellarmino, N., Cantoro, R., Yuan, S., Xun, H., Chen, D., Yin, C., Taouil, M., Fieback, M., Li, X., Wang, L., Li, C., Hamdioui, S.. - (2025), pp. 410-413. (IEEE International Test Conference 2025 San Diego (USA) 20-26 September 2025) [10.1109/ITC58126.2025.00052]. | 1-gen-2025 | Wang, ChanghaoKolahimahmoudi, NimaBellarmino, NicoloCantoro, RiccardoHamdioui, Said + | 2025_ITC__Device_Aware_Test_for_voltage_shifting_in_FeFET__4_pages_.pdf; Device-Aware_Test_for_Threshold_Voltage_Shifting_in_FeFET.pdf |
| DOC: Detection of On-Line Failures in CNNs / Turco, V., Bellarmino, N., Ruospo, A., Cantoro, R., Sanchez, E.. - ELETTRONICO. - (2025). (Latin American Test Workshop, LATW San Andrés (COL) 11-14 March 2025) [10.1109/LATS65346.2025.10963935]. | 1-gen-2025 | Turco VittorioNicolò BellarminoAnnachiara RuospoCantoro RiccardoErnesto Sanchez | LATS2025_On_line_detection (3).pdf; DOC_Detection_of_On-Line_Failures_in_CNNs.pdf |
| Early Functional Safety and PPA Evaluation of Digital Designs / Bartolomucci, M., Kingston, D., Cupaiuolo, T., Nardi, A., Cantoro, R.. - ELETTRONICO. - (2025), pp. 1-2. (2025 Design, Automation and Test in Europe Conference, DATE 2025 Lyon (FRA) 31 March 2025 - 02 April 2025) [10.23919/date64628.2025.10993267]. | 1-gen-2025 | Bartolomucci, MichelangeloCantoro, Riccardo + | _DATE25__Early_Functional_Safety_and_PPA_evaluation_for_faster_digital_design_development_.pdf; Early_Functional_Safety_and_PPA_Evaluation_of_Digital_Designs.pdf |
| Exploiting the correlation with traditional fault models to speed-up cell-aware fault simulation / Khoshzaban, R., Guglielminetti, I., Grosso, M., Sonza Reorda, M., Cantoro, R.. - (2025), pp. 418-421. (International Test Conference San Diego, CA (USA) 20-26 September 2025) [10.1109/ITC58126.2025.00054]. | 1-gen-2025 | Reza KhoshzabanMichelangelo GrossoMatteo Sonza ReordaRiccardo Cantoro + | Exploiting_the_correlation_with_traditional_fault_models_to_speed_up_cell_aware_faultsim_poster_ITC.pdf; Exploiting_the_correlation_with_traditional_fault_models_to_speed-up_cell-aware_fault_simulation.pdf |
| Grouped Feature Selection for SMONs Placement in MCU Performance Screening / Bellarmino, N., Cantoro, R., Huch, M., Kilian, T., Squillero, G.. - (2025), pp. 1-6. (2025 IEEE 26th Latin American Test Symposium (LATS) San Andrés (COL) 11-14 March 2025) [10.1109/lats65346.2025.10963942]. | 1-gen-2025 | Bellarmino, NicolòCantoro, RiccardoSquillero, Giovanni + | 2024_LATS_GROUP_LASSO_TPAM_SEL (1).pdf; Grouped_Feature_Selection_for_SMONs_Placement_in_MCU_Performance_Screening.pdf |
| Investigating on Gradient Regularization for Testing Neural Networks / Bellarmino, N., Bosio, A., Cantoro, R., Ruospo, A., Sanchez, E., Squillero, G.. - ELETTRONICO. - 15509:(2025), pp. 67-81. (10th International Conference on machine Learning, Optimization and Data science (LOD 2024) Castiglione della Pescaia (ITA) September 22 – 25, 2024) [10.1007/978-3-031-82484-5_6]. | 1-gen-2025 | Bellarmino, NicoloBosio, AlbertoCantoro, RiccardoRuospo, AnnachiaraSanchez, ErnestoSquillero, Giovanni | 2024_LOD_GRADIENT_PENALIZATION.pdf; 978-3-031-82484-5_6.pdf |