A widely adopted practice for in-field testing of electronic devices uses Software-Based Self-Test (SBST) in the form of Software Test Libraries (STLs). Typically, STLs target the stuck-at and Transition Delay Fault (TDF) models. However, to face the new defects introduced by the most recent semiconductor technologies, new fault models must be adopted. Small Delay Defects (SDDs) play an increasingly important role in this scenario. Unlike TDFs, SDDs slightly increase the paths’ timing, whose size is not in the same order of magnitude of the clock period. These defects can cause failures during the operational phase if they affect the critical paths. Remarkably, in scan testing the propagation time of a fault is limited, as a fault effect has to reach the scan flip-flops to be detected. However, in functional testing, the fault effect may require several clock cycles before reaching an observable point. Thus, the delay due to the fault cannot be indefinitely long.As there will be the need to move to delay faults when developing STLs, it is important to use the timing information correctly in functional fault simulations. SDDs are the typical choice. In this paper, we implemented a fault grading process for STLs to show how the fault coverage they can achieve changes when the delay defect increases (from SDDs to the extreme case of TDFs). The work uses static timing analysis; although this is known to yield pessimistic results in some cases, it gives a very good indication of the trend in fault coverage as the SDDs approximate TDFs. Differences in fault coverages with respect to the TDF model are highlighted, while an assessment of the effects of multi-cycle delays is also provided.
Fault Grading Techniques for Evaluating Software-Based Self-Test with Respect to Small Delay Defects / Bartolomucci, Michelangelo; Deligiannis, Nikolaos; Cantoro, Riccardo; Sonza Reorda, Matteo. - (2024). (Intervento presentato al convegno International Symposium on On-Line Testing and Robust System Design (IOLTS) tenutosi a Rennes (FRA) nel 03-05 July 2024) [10.1109/IOLTS60994.2024.10616077].
Fault Grading Techniques for Evaluating Software-Based Self-Test with Respect to Small Delay Defects
Bartolomucci, Michelangelo;Deligiannis, Nikolaos;Cantoro, Riccardo;Sonza Reorda, Matteo
2024
Abstract
A widely adopted practice for in-field testing of electronic devices uses Software-Based Self-Test (SBST) in the form of Software Test Libraries (STLs). Typically, STLs target the stuck-at and Transition Delay Fault (TDF) models. However, to face the new defects introduced by the most recent semiconductor technologies, new fault models must be adopted. Small Delay Defects (SDDs) play an increasingly important role in this scenario. Unlike TDFs, SDDs slightly increase the paths’ timing, whose size is not in the same order of magnitude of the clock period. These defects can cause failures during the operational phase if they affect the critical paths. Remarkably, in scan testing the propagation time of a fault is limited, as a fault effect has to reach the scan flip-flops to be detected. However, in functional testing, the fault effect may require several clock cycles before reaching an observable point. Thus, the delay due to the fault cannot be indefinitely long.As there will be the need to move to delay faults when developing STLs, it is important to use the timing information correctly in functional fault simulations. SDDs are the typical choice. In this paper, we implemented a fault grading process for STLs to show how the fault coverage they can achieve changes when the delay defect increases (from SDDs to the extreme case of TDFs). The work uses static timing analysis; although this is known to yield pessimistic results in some cases, it gives a very good indication of the trend in fault coverage as the SDDs approximate TDFs. Differences in fault coverages with respect to the TDF model are highlighted, while an assessment of the effects of multi-cycle delays is also provided.File | Dimensione | Formato | |
---|---|---|---|
IOLTS-24_CameraReady.pdf
accesso aperto
Tipologia:
2. Post-print / Author's Accepted Manuscript
Licenza:
Pubblico - Tutti i diritti riservati
Dimensione
232.42 kB
Formato
Adobe PDF
|
232.42 kB | Adobe PDF | Visualizza/Apri |
Fault_Grading_Techniques_for_Evaluating_Software-Based_Self-Test_with_Respect_to_Small_Delay_Defects.pdf
accesso riservato
Tipologia:
2a Post-print versione editoriale / Version of Record
Licenza:
Non Pubblico - Accesso privato/ristretto
Dimensione
275.29 kB
Formato
Adobe PDF
|
275.29 kB | Adobe PDF | Visualizza/Apri Richiedi una copia |
Pubblicazioni consigliate
I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.
https://hdl.handle.net/11583/2988804