SONZA REORDA, MATTEO

SONZA REORDA, MATTEO  

Dipartimento di Automatica e Informatica  

REORDA M. S; Reorda, Matteo Sonza; Reorda M. Sonza; M. Sonza Reorda; Reorda, M. S.; M.S. Reorda; Matteo Sonza Reorda  

001894  

Mostra records
Risultati 1 - 20 di 471 (tempo di esecuzione: 0.027 secondi).
Citazione Data di pubblicazione Autori File
Targeting different defect-oriented fault models in IC testing: an experimental approach / Mirabella, Nunzio; Floridia, Andrea; Cantoro, Riccardo; Grosso, Michelangelo; Sonza Reorda, Matteo. - ELETTRONICO. - (In corso di stampa), pp. 1-6. (Intervento presentato al convegno 26th Euromicro Conference Series on Digital System Design (DSD) tenutosi a Durres (ALB) nel 6-8 September, 2023). In corso di stampa Mirabella,NunzioFloridia, AndreaCantoro, RiccardoGrosso, MichelangeloSonza Reorda, Matteo DSD_Conference_paper_1.9_submitted.docx2023172914.pdf
A Reliability-aware Environment for Design Exploration for GPU Devices / Limas Sierra, Robert; Guerrero Balaguera, Juan David; Rodriguez Condia, Josie Esteban; Sonza Reorda, Matteo. - (2023), pp. 169-174. (Intervento presentato al convegno 2023 26th International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS) tenutosi a Tallinn (Estonia) nel 03-05 May 2023) [10.1109/DDECS57882.2023.10139643]. 1-gen-2023 Limas Sierra, RobertGuerrero Balaguera, Juan DavidRodriguez Condia, Josie EstebanSonza Reorda, Matteo A_Reliability-aware_Environment_for_Design_Exploration_for_GPU_Devices.pdf
A Survey of Recent Developments in Testability, Safety and Security of RISC-V Processors / Anders, Jens; Andreu, Pablo; Becker, Bernd; Becker, Steffen; Cantoro, Riccardo; Deligiannis, Nikolaos; Elhamawy, Nourhan; Faller, Tobias; Hernandez, Carles; Mentens, Nele; Namazi Rizi, Mahnaz; Polian, Ilia; Sajadi, Abolfazl; Sauer, Mathias; Schwachhofer, Denis; SONZA REORDA, Matteo; Stefanov, Todor; Tuzov, Ilya; Wagner, Stefan; Zidaric, Nuša. - (2023), pp. 1-10. (Intervento presentato al convegno 2023 IEEE European Test Symposium (ETS) tenutosi a Venice (Italy) nel 22-26 May 2023) [10.1109/ETS56758.2023.10174099]. 1-gen-2023 Riccardo CantoroNikolaos DeligiannisMatteo Sonza Reorda + ETS_RISC_V_testing_safety_security.pdfA_Survey_of_Recent_Developments_in_Testability_Safety_and_Security_of_RISC-V_Processors.pdf
Analyzing the Architectural Impact of Transient Fault Effects in SFUs of GPUs / Rodriguez Condia, Josie E.; Guerrero-Balaguera, Juan-David; Patiño Núñez, Edwar J.; Limas, Robert; Reorda, Matteo Sonza. - (2023), pp. 1-6. (Intervento presentato al convegno 2023 IEEE 24th Latin American Test Symposium (LATS) tenutosi a Veracruz (Mexico) nel 21-24 March 2023) [10.1109/LATS58125.2023.10154504]. 1-gen-2023 Rodriguez Condia, Josie E.Guerrero-Balaguera, Juan-DavidLimas, RobertReorda, Matteo Sonza + Analyzing_the_Architectural_Impact_of_Transient_Fault_Effects_in_SFUs_of_GPUs.pdf
Analyzing the Impact of Different Real Number Formats on the Structural Reliability of TCUs in GPUs / Sierra, Robert Limas; Guerrero-Balaguera, Juan-David; Rodriguez Condia, Josie E.; Sonza Reorda, Matteo. - (2023), pp. 1-6. (Intervento presentato al convegno IFIP/IEEE Conference on Very Large Scale Integration (VLSI-SoC 2023) tenutosi a Dubai (United Arab Emirates) nel 16-18 October 2023) [10.1109/VLSI-SoC57769.2023.10321881]. 1-gen-2023 Sierra, Robert LimasGuerrero-Balaguera, Juan-DavidRodriguez Condia, Josie E.Sonza Reorda, Matteo Analyzing_the_Impact_of_Different_Real_Number_Formats_on_the_Structural_Reliability_of_TCUs_in_GPUs.pdf
Assessing Convolutional Neural Networks Reliability through Statistical Fault Injections / Ruospo, Annachiara; Gavarini, Gabriele; De Sio, Corrado; Guerrero Balaguera, Juan David; Sterpone, Luca; Sonza Reorda, Matteo; Sanchez, Ernesto; Mariani, Riccardo; Aribido, Joseph; Athavale, Jyotika. - (2023), pp. 1-6. (Intervento presentato al convegno IEEE Design, Automation and Test in Europe Conference (DATE) tenutosi a Antwerp (Belgium) nel 17 - 19 April 2023) [10.23919/DATE56975.2023.10136998]. 1-gen-2023 Ruospo, AnnachiaraGavarini, GabrieleDe Sio, CorradoGuerrero Balaguera, Juan DavidSterpone, LucaSonza Reorda, MatteoSanchez, Ernesto + date_2023_acceptedVersion.pdfAssessing_Convolutional_Neural_Networks_Reliability_through_Statistical_Fault_Injections.pdf
Automatic Identification of Functionally Untestable Cell-Aware Faults in Microprocessors / Deligiannis, Nikolaos; Faller, Tobias; Iacopo, Guglielminetti; Cantoro, Riccardo; Becker, Bernd; SONZA REORDA, Matteo. - (2023), pp. 1-6. (Intervento presentato al convegno Asian Test Symposium (ATS) tenutosi a Beijing (China) nel 14-17 October 2023) [10.1109/ATS59501.2023.10317988]. 1-gen-2023 Nikolaos DeligiannisRiccardo CantoroMatteo Sonza Reorda + _ATS2023__Automatic_Identification_of_Functionally_Untestable_Cell_Aware_Faults_in_Microprocessors.pdfAutomatic_Identification_of_Functionally_Untestable_Cell-Aware_Faults_in_Microprocessors.pdf
Automating the Generation of Functional Stress Inducing Stimuli for Burn-In Testing / Deligiannis, Nikolaos; Faller, Tobias; Chenghan, Zhou; Cantoro, Riccardo; Becker, Bernd; SONZA REORDA, Matteo. - (2023), pp. 1-5. (Intervento presentato al convegno 2023 IEEE European Test Symposium (ETS) tenutosi a Venice (Italy) nel 22-26 May 2023) [10.1109/ETS56758.2023.10174232]. 1-gen-2023 Nikolaos DeligiannisRiccardo CantoroMatteo Sonza Reorda + _ETS2023__Automating_the_Generation_of_Functional_Stress_Inducing_Stimuli_for_Burn_In_Testing.pdfAutomating_the_Generation_of_Functional_Stress_Inducing_Stimuli_for_Burn-In_Testing.pdf
Collecting diagnostic information through dichotomic search from Logic BIST of failing in-field automotive SoCs with delay faults / Bernardi, Paolo; Filipponi, Gabriele; Reorda, Matteo Sonza; Appello, Davide; Bertani, Claudia; Tancorre, Vincenzo. - ELETTRONICO. - (2023), pp. 21-26. (Intervento presentato al convegno International Symposium on Design and Diagnostics of Electronic Circuits and Systems tenutosi a Tallinn (Estonia) nel 03-05 May 2023) [10.1109/DDECS57882.2023.10139670]. 1-gen-2023 Bernardi, PaoloFilipponi, GabrieleReorda, Matteo Sonza + 2023058710.pdfCollecting_diagnostic_information_through_dichotomic_search_from_Logic_BIST_of_failing_in-field_automotive_SoCs_with_delay_faults.pdf
Constraint-Based Automatic SBST Generation for RISC-V Processor Families / Faller, Tobias; Deligiannis, Nikolaos; Schwörer, Markus; SONZA REORDA, Matteo; Becker, Bernd. - (2023), pp. 1-6. (Intervento presentato al convegno 2023 IEEE European Test Symposium (ETS) tenutosi a Venice (Italy) nel 22-26 May 2023) [10.1109/ETS56758.2023.10174156]. 1-gen-2023 Nikolaos DeligiannisMatteo Sonza Reorda + _ETS2023__Constraint_Based_Automatic_SBST_Generation_for_RISC_V_Processor_Families.pdfConstraint-Based_Automatic_SBST_Generation_for_RISC-V_Processor_Families.pdf
Evaluating the Impact of Transition Delay Faults in GPUs / Rodriguez Condia, Josie E.; Reorda, Matteo Sonza. - (2023), pp. 353-358. (Intervento presentato al convegno International Conference on VLSI Design and 2023 22nd International Conference on Embedded Systems (VLSID) tenutosi a Hyderabad (India) nel 08-12 January 2023) [10.1109/VLSID57277.2023.00077]. 1-gen-2023 Rodriguez Condia, Josie E.Reorda, Matteo Sonza Camera_Ready_last_mod.pdfEvaluating_the_Impact_of_Transition_Delay_Faults_in_GPUs.pdf
Evaluating the Prevalence of SFUs in the Reliability of GPUs / Rodriguez Condia, Josie E.; Guerrero-Balaguera, Juan-David; Patiño Núñez, Edwar J.; Limas, Robert; Reorda, Matteo Sonza. - (2023), pp. 1-6. (Intervento presentato al convegno 2023 IEEE European Test Symposium (ETS) tenutosi a Venice (Italy) nel 22-26 May 2023) [10.1109/ETS56758.2023.10174110]. 1-gen-2023 Rodriguez Condia, Josie E.Guerrero-Balaguera, Juan-DavidLimas, RobertReorda, Matteo Sonza + Evaluating_the_Prevalence_of_SFUs_in_the_Reliability_of_GPUs.pdf
Evaluating the Prevalence of SFUs in the Reliability of GPUs / Rodriguez Condia, Je; Guerrero-Balaguera, Jd; Nunez, Ejp; Limas, Robert; Reorda, Ms. - (2023), pp. 1-6. (Intervento presentato al convegno 2023 IEEE European Test Symposium (ETS) tenutosi a Venice (IT) nel 22-26 May 2023) [10.1109/ETS56758.2023.10174110]. 1-gen-2023 Rodriguez Condia, JEGuerrero-Balaguera, JDLimas, RobertReorda, MS + Evaluating_the_Prevalence_of_SFUs_in_the_Reliability_of_GPUs.pdf
Functional Testing with STLs: A Step Towards Reliable RISC-V-based HPC Commodity Clusters / Rodriguez, Esteban; Deligiannis, Nikolaos; Sini, Jacopo; Cantoro, Riccardo; SONZA REORDA, Matteo. - 13999:(2023), pp. 444-457. (Intervento presentato al convegno ISC High Performance 2023 International Workshops tenutosi a Hamburg (DEU) nel May 21–25, 2023) [10.1007/978-3-031-40843-4_33]. 1-gen-2023 Esteban RodriguezNikolaos DeligiannisJacopo SiniRiccardo CantoroMatteo Sonza Reorda _RV_HPC2023__FULL_FORMAT__Functional_Testing_with_SLTs__A_step_towards_reliable_RISC_V_Based_HPC_commodity_clusters.pdf978-3-031-40843-4_33.pdf
Functional Testing with STLs: A Step Towards Reliable RISC-V-based HPC Commodity Clusters / Rodriguez Condia, Josie E.; Deligiannis, Nikolaos; Sini, Jacopo; Cantoro, Riccardo; SONZA REORDA, Matteo. - 13999:(2023), pp. 444-457. (Intervento presentato al convegno ISC High Performance 2023 International Workshops tenutosi a Hamburg (DEU) nel May 21–25, 2023) [10.1007/978-3-031-40843-4_33]. 1-gen-2023 Josie E. Rodriguez CondiaNikolaos DeligiannisJacopo SiniRiccardo CantoroMatteo Sonza Reorda _RV_HPC2023__FULL_FORMAT__Functional_Testing_with_SLTs__A_step_towards_reliable_RISC_V_Based_HPC_commodity_clusters.pdf978-3-031-40843-4_33.pdf
Image Test Libraries for the on-line self-test of functional units in GPUs running CNNs / Ruospo, Annachiara; Gavarini, Gabriele; Porsia, Antonio; Sonza Reorda, Matteo; Sanchez, Ernesto; Mariani, Riccardo; Aribido, Joseph; Athavale, Jyotika. - (2023), pp. 1-6. (Intervento presentato al convegno 28th IEEE European Test Symposium 2023 tenutosi a Venice (Italy) nel May 22 - 26, 2023) [10.1109/ETS56758.2023.10174176]. 1-gen-2023 Ruospo, AnnachiaraGavarini, GabrielePorsia, AntonioSonza Reorda, MatteoSanchez, Ernesto + OnlineTestImages_ETS23.pdfImage_Test_Libraries_for_the_on-line_self-test_of_functional_units_in_GPUs_running_CNNs.pdf
On the integration and hardening of Software Test Libraries in Real-Time Operating Systems / Angione, Francesco; Bernardi, Paolo; Cantoro, Riccardo; Di Gruttola Giardino, Nicola; Piumatti, Davide; Reorda, Matteo Sonza; Appello, Davide; Tancorre, Vincenzo. - (2023), pp. 1-6. (Intervento presentato al convegno Latin American Test Symposium tenutosi a Veracruz (Mexico) nel 21-24 March 2023) [10.1109/LATS58125.2023.10154492]. 1-gen-2023 Angione, FrancescoBernardi, PaoloCantoro, RiccardoDi Gruttola Giardino, NicolaPiumatti, DavideReorda, Matteo Sonza + On_the_integration_and_hardening_of_Software_Test_Libraries_in_Real-Time_Operating_Systems.pdf
Reliability Estimation of Split DNN Models for Distributed Computing in IoT Systems / Guerrero-Balaguera, Juan-David; Harshbarger, Ian A.; Rodriguez Condia, Josie E.; Levorato, Marco; Sonza Reorda, Matteo. - (2023), pp. 1-4. (Intervento presentato al convegno 2023 IEEE 32nd International Symposium on Industrial Electronics (ISIE) tenutosi a Helsinki (FIN) nel 19-21 June 2023) [10.1109/ISIE51358.2023.10227928]. 1-gen-2023 Guerrero-Balaguera, Juan-DavidRodriguez Condia, Josie E.Levorato, MarcoSonza Reorda, Matteo + Reliability_Estimation_of_Split_DNN_Models_for_Distributed_Computing_in_IoT_Systems.pdf
Uncovering hidden vulnerabilities in CNNs through evolutionary-based Image Test Libraries / Turco, V.; Ruospo, A.; Gavarini, G.; Sanchez, E.; Sonza Reorda, M.. - (2023). (Intervento presentato al convegno International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems tenutosi a Juan-Les-Pins (FR) nel 03-05 October 2023) [10.1109/DFT59622.2023.10313530]. 1-gen-2023 V. TurcoA. RuospoG. GavariniE. SanchezM. Sonza Reorda Uncovering_hidden_vulnerabilities_in_CNNs_through_evolutionary-based_Image_Test_Libraries.pdf
Understanding the Effects of Permanent Faults in GPU's Parallelism Management and Control Units / Guerrero-Balaguera, Juan-David; Rodriguez Condia, Josie E.; dos Santos, Fernando F.; Sonza, Matteo; Rech, Paolo. - ELETTRONICO. - (2023), pp. 1-14. (Intervento presentato al convegno SC23: International Conference for High Performance Computing, Networking, Storage and Analysis tenutosi a Denver CO (USA) nel November 12 - 17, 2023) [10.1145/3581784.3607086]. 1-gen-2023 Juan-David Guerrero-BalagueraJosie E. Rodriguez CondiaMatteo SonzaPaolo Rech + sc_2023_nvbitpermfi.pdf3581784.3607086.pdf