SONZA REORDA, MATTEO

SONZA REORDA, MATTEO  

Dipartimento di Automatica e Informatica  

REORDA M. S; Reorda, Matteo Sonza; Reorda M. Sonza; M. Sonza Reorda; Reorda, M. S.; M.S. Reorda; Matteo Sonza Reorda  

001894  

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Risultati 1 - 20 di 503 (tempo di esecuzione: 0.05 secondi).
Citazione Data di pubblicazione Autori File
An Edge AI Industrial Environment Supporting Reliability Assessment and Enhancement / Vilar De Farias, G., Celik, A., Rodriguez Condia, J.E., Pau, D., Sonza Reorda, M.. - (In corso di stampa). (IEEE International Conference on Omni-Layer Intelligent Systems (COINS) ). In corso di stampa Gustavo Vilar de FariasCelik AbdullahJosie E. Rodriguez CondiaMatteo Sonza Reorda + -
JASPER: Special Session on Joint Reliability And Security Assessment of SPlit Computing for Edge Robustness / Magliano, E., Esposito, G., Shahdadian, A., Mounika Kodamanchili, R., Guerrero Balaguera, J.D., Rodriguez Condia, J.E., Ruospo, A., Siciliano, R., Di Carlo, S., Jenihhin, M., Levorato, M., Savino, A., Sonza Reorda, M., Herglotz, C., H¨ubner, M., Taheri, M.. - (In corso di stampa). (International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems Rome (ITA) 30/09/2026). In corso di stampa E. MaglianoG. EspositoJ. D. Guerrero BalagueraJ. E. Rodriguez CondiaA. RuospoStefano Di CarloM. LevoratoA. SavinoM. Sonza ReordaM. Taheri + DFTS_2026_Special_session_on_Split_Computing_Robustness.pdf
Towards ISO 26262-compliant Vector Processors: Combining STLs and LBIST / Vilar De Farias, G., Kurada, D., Abed, S., Guerrero-Balaguera, J., Rodriguez Condia, J.E., Bagbaba, A.C., Da Silva, F.A., Sonza Reorda, M.. - ELETTRONICO. - (In corso di stampa). (34th IFIP/IEEE International Conference on Very Large Scale Integration SoC Limassol, Cyprus 11-14 October 2026). In corso di stampa Vilar de Farias,GustavoAbed,Sergiu-MohamedGuerrero-Balaguera,Juan-DavidRodriguez Condia, Josie EstebanSonza Reorda,Matteo + VLSI_SoC_2026_SS__reliability_and_functional_safety_in_vector_processors.pdf
A Flexible Framework for Vector Accelerators In-field Testing / Vilar De Farias, G., Rodriguez Condia, J.E., Sonza Reorda, M.. - (2026). (44th IEEE VLSI Test Symposium Napa, CA (USA) 27-29 April 2026) [10.1109/VTS69484.2026.11563325]. 1-gen-2026 Gustavo, Vilar de FariasJosie Esteban, Rodriguez CondiaMatteo, Sonza Reorda A_Flexible_Framework_for_Vector_Accelerators_In-field_Testing.pdf
Algorithm-based Fault Tolerance for RISC-V Vector Processors in Safety-critical AI Applications / Abed, S., Bagbaba, A.C., O'Shea, C., Rodriguez Condia, J.E., Sonza Reorda, M.. - (2026), pp. 1-7. (2026 IEEE 32nd International Symposium on On-Line Testing and Robust System Design (IOLTS) Polignano a Mare (ITA) 01-03 July 2026) [10.1109/iolts69666.2026.11633611]. 1-gen-2026 Abed, Sergiu-MohamedRodriguez Condia, Josie E.Sonza Reorda, Matteo + _IOLTS_2026__ABFT_in_Vector_Processors.pdf; Algorithm-based_Fault_Tolerance_for_RISC-V_Vector_Processors_in_Safety-critical_AI_Applications.pdf
From Prompts to Pressure: Evaluating LLM-driven Agents for GPU Stress-code Generation / Gensale, A., Esposito, G., Guerrero-Balaguera, J., Condia, J.E.R., Cagliero, L., Reorda, M.S.. - (2026), pp. 1-7. (32nd International Symposium on On-Line Testing and Robust System Design, IOLTS 2026 Polignano a Mare (ITA) 01-03 July 2026) [10.1109/iolts69666.2026.11633814]. 1-gen-2026 Gensale, AuroraEsposito, GiuseppeGuerrero-Balaguera, Juan-DavidCagliero, LucaReorda, Matteo Sonza + From_Prompts_to_Pressure_Evaluating_LLM-driven_Agents_for_GPU_Stress-code_Generation.pdf; _IOLTS2026_GPU_COMA-1.pdf
FT-Sparse: Algorithm-Based Fault Tolerance for Sparse CNNs Using Structured Sparsity in GPUs / Rodriguez Condia, J.E., Ahmadilivani, M.H., Raik, J., Jenihhin, M., Reorda, M.S.. - ELETTRONICO. - (2026), pp. 1-7. (44th VLSI Test Symposium (VTS) Napa, CA (USA) 27-29 April 2026) [10.1109/vts69484.2026.11563359]. 1-gen-2026 Rodriguez Condia, Josie EstebanReorda, Matteo Sonza + _VTS_26__checksum_for_sparsity_in_DNNs_old.pdf; FT-Sparse_Algorithm-Based_Fault_Tolerance_for_Sparse_CNNs_Using_Structured_Sparsity_in_GPUs.pdf
Late Breaking Results - New Techniques for Software Test Library Compaction / Deligiannis, N.I., Bartolomucci, M., Sohrabian, M., Cantoro, R., Reorda, M.S.. - (2026), pp. 1-3. (44th VLSI Test Symposium, VTS 2026 Napa, CA (USA) 27-29 April 2026) [10.1109/vts69484.2026.11563360]. 1-gen-2026 Bartolomucci, MichelangeloSohrabian, MansourCantoro, RiccardoReorda, Matteo Sonza + 2026082299-2.pdf; Late_Breaking_Results_-_New_Techniques_for_Software_Test_Library_Compaction.pdf
Reliability Assessment of Deep Neural Networks and Accelerators Across Design Stages / Ahmadilivani, M.H., Cherezova, N., Glaß, M., Guerrero-Balaguera, J., Jenihhin, M., Kritikakou, A., Sierra, R.L., Poelhs, L.B., Raik, J., Roquet, L., Santos, F.F.D., Da Silva, F.A., Reorda, M.S., Veronesi, A., Castillo, E.C.V., Rodriguez Condia, J.E.. - ELETTRONICO. - (2026), pp. 1-10. (27th Latin American Test Symposium, LATS 2026 Florianópolis (BRA) 17-20 March 2026) [10.1109/lats70329.2026.11480274]. 1-gen-2026 Guerrero-Balaguera, Juan-DavidSierra, Robert LimasReorda, Matteo SonzaRodriguez Condia, Josie Esteban + LATS_2026___Special_Session.pdf; Reliability_Assessment_of_Deep_Neural_Networks_and_Accelerators_Across_Design_Stages.pdf
A New Online Fault Detection Mechanism for Neural Network Applications / De Paola, L., Esposito, G., Guerrero-Balaguera, J., Reorda, M.S.. - (2025), pp. 1-4. (2025 32nd IEEE International Conference on Electronics, Circuits and Systems (ICECS) Marrakesh (MAR) 17-19 November 2025) [10.1109/icecs66544.2025.11270797]. 1-gen-2025 De Paola, LucaEsposito, GiuseppeGuerrero-Balaguera, Juan-DavidReorda, Matteo Sonza A_New_Online_Fault_Detection_Mechanism_for_Neural_Network_Applications.pdf
About the Functional In-Field Self-Testing of AI Accelerators / Guerrero-Balaguera, J., Rodriguez condia, J.E., Sierra, R.L., Reorda, M.S.. - ELETTRONICO. - (2025), pp. 1-6. (2025 IEEE 26th Latin American Test Symposium (LATS) San Andres Island (COL) 11-14 March 2025) [10.1109/lats65346.2025.10963960]. 1-gen-2025 Guerrero-Balaguera, Juan-DavidRodriguez condia, Josie EstebanSierra, Robert LimasReorda, Matteo Sonza About_the_Functional_In-Field_Self-Testing_of_AI_Accelerators.pdf
AI-based Classification of Intentional vs. Unintentional Corruptions in the Split Computing context / Esposito, G., Magliano, E., Scarano, N., Ahmed-Eltaras, T., Guerrero-Balaguera, J., Mannella, L., Rodriguez-Condia, J., Ruospo, A., Di Carlo, S., Levorato, M., Savino, A., Sonza Reorda, M.. - (2025), pp. 1-7. (2025 IEEE 31st International Symposium on On-Line Testing and Robust System Design (IOLTS) Ischia, Naples, Italy 7-9 July 2025) [10.1109/IOLTS65288.2025.11116959]. 1-gen-2025 Esposito, GiuseppeMagliano, EnricoScarano, NicolaAhmed-Eltaras,TamerGuerrero-Balaguera, Juan-DavidMannella, LucaRodriguez-Condia, Josie-EstebanRuospo, AnnachiaraDi Carlo, StefanoLevorato, MarcoSavino, AlessandroSonza Reorda, Matteo _IOLTS_2025__Split_Reliabiliy_and_Security-6.pdf; AI-Based_Classification_of_Adversarial_Attacks_vs._Hardware_Fault_Corruptions_in_the_Split_Computing_Context.pdf
Analysis and Mitigation of Soft-errors in GPU-accelerated Hyperspectral Image Classifiers / Abed, S., Guerrero-Balaguera, J., Condia, J.E.R., De Lucia, G., Lapegna, M., Reorda, M.S.. - ELETTRONICO. - (2025), pp. 131-134. (28th International Symposium on Design and Diagnostics of Electronic Circuits and Systems, DDECS 2025 Lyon (FRA) 05-07 May 2025) [10.1109/ddecs63720.2025.11006812]. 1-gen-2025 Abed, Sergiu-MohamedGuerrero-Balaguera, Juan-DavidReorda, Matteo Sonza + Analysis_and_Mitigation_of_Soft-errors_in_GPU-accelerated_Hyperspectral_Image_Classifiers.pdf; _DDECS_25__Analysis_and_Mitigation_of_Soft_errors_in_GPU_accelerated_Hyperspectral_Image_Classifiers___4_pages_free.pdf
APSS Metrics for Fault Detection: Area, Position, Symmetry, and Shape in Image Segmentation / Turco, V., Fezza, L., Ruospo, A., Sanchez, E., Sonza Reorda, M.. - ELETTRONICO. - (2025). (DFT 2025 38th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems Barcellona (ESP) 21-23 October 2025) [10.1109/DFT66274.2025.11257474]. 1-gen-2025 Turco, VittorioFezza, LorenzoRuospo, AnnachiaraSanchez, ErnestoSonza Reorda, Matteo DFT25___Segmentation_metrics.pdf; APSS_Metrics_for_Fault_Detection_Area_Position_Symmetry_and_Shape_in_Image_Segmentation.pdf
Estimating the Impact of Soft Errors on AI-Based Perception in Automotive / Hegde, S.S., Selvaraj, D.C., Rodriguez Condia, J.E., Amati, N., Chiasserini, C.F., Deflorio, F.P., Reorda, M.S.. - ELETTRONICO. - (2025), pp. 1-6. (2025 IEEE 26th Latin American Test Symposium (LATS) San Andres Island (COL) 11-14 March 2025) [10.1109/lats65346.2025.10963959]. 1-gen-2025 Hegde, Shailesh SudhakaraSelvaraj, Dinesh CyrilRodriguez Condia, Josie EstebanAmati, NicolaChiasserini, Carla FabianaDeflorio, Francesco PaoloReorda, Matteo Sonza Estimating_the_Impact_of_Soft_Errors_on_AI-Based_Perception_in_Automotive.pdf; SCANeR_Software_Reliability_submitted .pdf
European Test Symposium Teams: an Anniversary Snapshot / Jenihhin, M., Raik, J., Jutman, A., Cherezova, N., Ubar, R., Miclea, L., Enyedi, S., Ştefan, I., Stan, O., Corcheş, C., Peng, Z., Eles, P., Drechsler, R., Eggersglüß, S., Fey, G., Glowatz, A., Tille, D., Gielen, G., Coyette, A., Dobbelaere, W., et al.. - ELETTRONICO. - (2025), pp. 1-48. (2025 IEEE European Test Symposium, ETS 2025 Tallinn, Estonia 26-30 May 2025) [10.1109/ets63895.2025.11049652]. 1-gen-2025 Bernardi, P.Di Carlo, S.Prinetto, P.Reorda, M. SonzaViolante, M. + European_Test_Symposium_Teams_an_Anniversary_Snapshot.pdf; ETSteams_2025_Draft1.pdf
Exploiting the correlation with traditional fault models to speed-up cell-aware fault simulation / Khoshzaban, R., Guglielminetti, I., Grosso, M., Sonza Reorda, M., Cantoro, R.. - (2025), pp. 418-421. (International Test Conference San Diego, CA (USA) 20-26 September 2025) [10.1109/ITC58126.2025.00054]. 1-gen-2025 Reza KhoshzabanMichelangelo GrossoMatteo Sonza ReordaRiccardo Cantoro + Exploiting_the_correlation_with_traditional_fault_models_to_speed_up_cell_aware_faultsim_poster_ITC.pdf; Exploiting_the_correlation_with_traditional_fault_models_to_speed-up_cell-aware_fault_simulation.pdf
GPD: Predictive Control Flow Error Detection Leveraging Data Flow Error Detection Methods / Raghunandana K, K., Yogesh Prasad, K.R., Sonza Reorda, M., Virendra, S.. - (2025), pp. 1-5. (31st IEEE International Symposium on On-Line Testing and Robust System Design, IOLTS 2025 Ischia (ITA) 07-09 July 2025) [10.1109/iolts65288.2025.11116971]. 1-gen-2025 M. Sonza Reorda + GPD_Predictive_Control_Flow_Error_Detection_Leveraging_Data_Flow_Error_Detection_Methods.pdf
Improving CNN Runtime Robustness Against Soft Errors by Dropout Layer Optimization / Sierra, R.L., Esposito, G., Guerrero-Balaguera, J., Rodriguez Condia, J.E., Reorda, M.S.. - (2025), pp. 1-6. (2025 IEEE 26th Latin American Test Symposium (LATS) San Andres Islas (COL) 11-14 March 2025) [10.1109/lats65346.2025.10963963]. 1-gen-2025 Sierra, Robert LimasEsposito, GiuseppeGuerrero-Balaguera, Juan-DavidRodriguez Condia, Josie E.Reorda, Matteo Sonza Improving_CNN_Runtime_Robustness_Against_Soft_Errors_by_Dropout_Layer_Optimization.pdf
Non-Functional Properties in HPC Systems: Design Exploration of Energy, Power, and Reliability / Agosta, G., Bini, E., Baroffio, D., Brandolese, C., Castrovilli, M., Cattaneo, D., Cesarini, D., Fornaciari, W., Galimberti, A., Garfagnini, A., Gavrikov, A., Iannone, F., Lapegna, M., Lopez, T.A., Magnani, G., Mencagli, G., Metra, C., Omana, M.E., Palombi, F., Reghenzani, F., et al.. - ELETTRONICO. - (2025), pp. 242-251. (28th Euromicro Conference on Digital System Design (DSD) Salerno, Italy 10-12 September 2025) [10.1109/dsd67783.2025.00043]. 1-gen-2025 Cattaneo, D.Fornaciari, W.Magnani, G.Metra, C.Rodriguez Condia, Josie E.Serafini, AndreaSonza Reorda, M. + Non-Functional_Properties_in_HPC_Systems_Design_Exploration_of_Energy_Power_and_Reliability.pdf