SONZA REORDA, MATTEO
SONZA REORDA, MATTEO
Dipartimento di Automatica e Informatica
REORDA M. S; Reorda, Matteo Sonza; Reorda M. Sonza; M. Sonza Reorda; Reorda, M. S.; M.S. Reorda; Matteo Sonza Reorda
001894
Analyzing the Reliability of TCUs Through Micro-architecture and Structural Evaluations for Two Real Number Formats
In corso di stampa LIMAS SIERRA, ROBERT ALEXANDER; Guerrero-Balaguera, Juan-David; Rodriguez Condia, Josie E.; SONZA REORDA, Matteo
Modular Functional Testing: Targeting the Small Embedded Memories in GPUs
2021 Rodriguez Condia, Josie E.; Sonza Reorda, M.
Design techniques to improve the resilience of computing systems: software layer
2020 Bosio, Alberto; Di Carlo, Stefano; Di Natale, Giorgio; Sonza Reorda, Matteo; Rodriguez Condia, Josie E.
Correction to: Improved Test Solutions for COTS-Based Systems in Space Applications
2019 Cantoro, Riccardo; Carbonara, Sara; Floridia, Andrea; Sanchez, Ernesto; Sonza Reorda, Matteo; Mess, Jan-Gerd
Nanotechnologies Testing
2017 SANCHEZ SANCHEZ, EDGAR ERNESTO; SONZA REORDA, Matteo
Welcome note from the technical program chairs
2017 Maniatakos, M.; Reorda, M. S.
Fault-tolerance techniques for soft-core processors using the trace interface
2015 Entrena, Luis; Lindoso, Almudena; Portela Garcia, Marta; Parra, Luis; Du, Boyang; SONZA REORDA, Matteo; Sterpone, Luca
Partition-Based Faults Diagnosis of a VLIW Processor
2015 Sabena, Davide; SONZA REORDA, Matteo; Sterpone, Luca
E-Learning at Politecnico di Torino: Moving to a Sustainable Large-Scale Multi-Channel System of Services
2012 Barbagallo, Salvatore; Bertonasco, Roberto; Corno, Fulvio; Farinetti, Laura; Mezzalama, Marco; SONZA REORDA, Matteo; Venuto, Enrico
Advanced technologies for transient faults detection and compensation
2011 SONZA REORDA, Matteo; Sterpone, Luca; Violante, Massimo
Software-based self-test of embedded microprocessors
2011 Bernardi, Paolo; Grosso, Michelangelo; SANCHEZ SANCHEZ, EDGAR ERNESTO; SONZA REORDA, Matteo
SOFTWARE-LEVEL SOFT-ERROR MITIGATION TECHNIQUES
2011 Rebaudengo, Maurizio; SONZA REORDA, Matteo; Violante, Massimo
Test generation and coverage metrics
2009 SANCHEZ SANCHEZ, EDGAR ERNESTO; SONZA REORDA, Matteo; Squillero, Giovanni
An Effective Technique for Minimizing the Cost of Processor Software-Based Diagnosis in SoCs
2008 Bernardi, Paolo; SANCHEZ SANCHEZ, EDGAR ERNESTO; M., Schillaci; Squillero, Giovanni; SONZA REORDA, Matteo
Multi-level Fault Effects Evaluation
2007 Anghel, L; Rebaudengo, Maurizio; SONZA REORDA, Matteo; Violante, Massimo
Test Generation: A Heuristic Approach
2005 O., Golubeva; SONZA REORDA, Matteo; Violante, Massimo
Test Program Generation from High-level Microprocessor Descriptions
2005 SANCHEZ SANCHEZ, EDGAR ERNESTO; SONZA REORDA, Matteo; Squillero, Giovanni
Software Techniques for Dependable Computer-based Systems
2004 O., Goloubeva; Rebaudengo, Maurizio; SONZA REORDA, Matteo; Violante, Massimo
New Acceleration Techniques for Simulation-Based Fault-Injection
2003 Corno, Fulvio; L., Entrena; C., Lopez; SONZA REORDA, Matteo; Squillero, Giovanni
New Acceleration Techniques for Simulation-Based Fault-Injection
2003 Corno, Fulvio; Entrena, L.; Lopez, C.; SONZA REORDA, Matteo; Squillero, Giovanni
Citazione | Data di pubblicazione | Autori | File |
---|---|---|---|
Analyzing the Reliability of TCUs Through Micro-architecture and Structural Evaluations for Two Real Number Formats / LIMAS SIERRA, ROBERT ALEXANDER; Guerrero-Balaguera, Juan-David; Rodriguez Condia, Josie E.; SONZA REORDA, Matteo - In: VLSI-SoC 2023: Silicon Innovations for Trustworthy Artificial Intelligence[s.l] : Springer, In corso di stampa. | In corso di stampa | Robert Limas SierraJuan-David Guerrero-BalagueraJosie E. Rodriguez CondiaMatteo Sonza Reorda | VLSI_Soc2023_Book_Chapter.pdf |
Modular Functional Testing: Targeting the Small Embedded Memories in GPUs / Rodriguez Condia, Josie E.; Sonza Reorda, M. (IFIP ADVANCES IN INFORMATION AND COMMUNICATION TECHNOLOGY). - In: VLSI-SoC: Design Trends. VLSI-SoC 2020 / Calimera, A., Gaillardon, PE., Korgaonkar, K., Kvatinsky, S., Reis, R. (eds). - ELETTRONICO. - [s.l] : Springer, 2021. - ISBN 978-3-030-81640-7. - pp. 205-233 [10.1007/978-3-030-81641-4_10] | 1-gen-2021 | Josie E. Rodriguez CondiaSonza Reorda M. | Modular Functional Testing Targeting the Small Embedded Memories in GPUs 2021.pdf |
Design techniques to improve the resilience of computing systems: software layer / Bosio, Alberto; Di Carlo, Stefano; Di Natale, Giorgio; Sonza Reorda, Matteo; Rodriguez Condia, Josie E. - In: Cross-Layer Reliability of Computing Systems / Di Natale G., Gizopoulos D., Di Carlo S., Bosio A. and Canal R.. - ELETTRONICO. - [s.l] : IET - the institution of engineering and technology, 2020. - ISBN 9781785617980. - pp. 95-112 [10.1049/PBCS057E_ch4] | 1-gen-2020 | Di Carlo, StefanoSonza Reorda, MatteoRodriguez Condia, Josie E. + | PBCS0570_DiNatale_Chapter04_Proof.pdf; I.4 - Software Layer.pdf |
Correction to: Improved Test Solutions for COTS-Based Systems in Space Applications / Cantoro, Riccardo; Carbonara, Sara; Floridia, Andrea; Sanchez, Ernesto; Sonza Reorda, Matteo; Mess, Jan-Gerd (IFIP ADVANCES IN INFORMATION AND COMMUNICATION TECHNOLOGY). - In: VLSI-SoC: Design and Engineering of Electronics Systems Based on New Computing ParadigmsELETTRONICO. - [s.l] : Springer, Cham, 2019. - ISBN 978-3-030-23424-9. - pp. 187-206 [10.1007/978-3-030-23425-6_14] | 1-gen-2019 | Cantoro, RiccardoCarbonara, SaraFloridia, AndreaSanchez, ErnestoSonza Reorda, Matteo + | - |
Nanotechnologies Testing / SANCHEZ SANCHEZ, EDGAR ERNESTO; SONZA REORDA, Matteo - In: Nanoelectronics: Materials, Devices, ApplicationsSTAMPA. - [s.l] : Wiley, 2017. - ISBN 9783527800728. - pp. 427-446 [10.1002/9783527800728.ch17] | 1-gen-2017 | SANCHEZ SANCHEZ, EDGAR ERNESTOSONZA REORDA, MATTEO | - |
Welcome note from the technical program chairs / Maniatakos, M.; Reorda, M. S.. - STAMPA. - (2017), pp. 1-2. [10.1109/VLSI-SoC.2017.8203445] | 1-gen-2017 | Reorda M. S. + | - |
Fault-tolerance techniques for soft-core processors using the trace interface / Entrena, Luis; Lindoso, Almudena; Portela Garcia, Marta; Parra, Luis; Du, Boyang; SONZA REORDA, Matteo; Sterpone, Luca - In: FPGAs and Parallel Architectures for Aerospace Applications: Soft Errors and Fault-Tolerant Design[s.l] : Springer International Publishing, 2015. - ISBN 9783319143521. - pp. 293-306 [10.1007/978-3-319-14352-1_19] | 1-gen-2015 | DU, BOYANGSONZA REORDA, MATTEOSTERPONE, LUCA + | - |
Partition-Based Faults Diagnosis of a VLIW Processor / Sabena, Davide; SONZA REORDA, Matteo; Sterpone, Luca - In: VLSI-SoC: At the Crossroads of Emerging Trends / Alex Orailoglu, H. Fatih Ugurdag, Luís Miguel Silveira, Martin Margala, Ricardo Reis. - STAMPA. - Berlino : Springer, 2015. - ISBN 978-3-319-23798-5. - pp. 208-226 [10.1007/978-3-319-23799-2] | 1-gen-2015 | SABENA, DAVIDESONZA REORDA, MatteoSTERPONE, LUCA | - |
E-Learning at Politecnico di Torino: Moving to a Sustainable Large-Scale Multi-Channel System of Services / Barbagallo, Salvatore; Bertonasco, Roberto; Corno, Fulvio; Farinetti, Laura; Mezzalama, Marco; SONZA REORDA, Matteo; Venuto, Enrico - In: Handbook of Research on Didactic Strategies and Technologies for Education: Incorporating Advancements / Paolo M. Pumilia-Gnarini, Elena Favaron, Elena Pacetti, Jonathan Bishop, Luigi Guerra. - STAMPA. - Hershey PA : Information Science Reference (an imprint of IGI Global), 2012. - ISBN 9781466621220. - pp. 690-702 [10.4018/978-1-4666-2122-0.ch060] | 1-gen-2012 | BARBAGALLO, SALVATOREBERTONASCO, RobertoCORNO, FulvioFARINETTI, LAURAMEZZALAMA, MarcoSONZA REORDA, MatteoVENUTO, Enrico | - |
Advanced technologies for transient faults detection and compensation / SONZA REORDA, Matteo; Sterpone, Luca; Violante, Massimo - In: Design and test technology for dependable Systems-on-Chip / R. Ubar, J. Raik, H.T. Vierhaus (ed.). - STAMPA. - [s.l] : IGI Global, 2011. - ISBN 9781609602123. - pp. 132-154 [10.4018/978-1-60960-212-3.ch006] | 1-gen-2011 | SONZA REORDA, MatteoSTERPONE, LucaVIOLANTE, MASSIMO | - |
Software-based self-test of embedded microprocessors / Bernardi, Paolo; Grosso, Michelangelo; SANCHEZ SANCHEZ, EDGAR ERNESTO; SONZA REORDA, Matteo - In: Design and test technology for dependable Systems-on-Chip / R. Ubar, J. Raik, H.T. Vierhaus (ed.). - Hershey, PA : IGI Global, 2011. - ISBN 9781609602123. - pp. 338-359 [10.4018/978-1-60960-212-3.ch015] | 1-gen-2011 | BERNARDI, PAOLOGROSSO, MICHELANGELOSANCHEZ SANCHEZ, EDGAR ERNESTOSONZA REORDA, Matteo | - |
SOFTWARE-LEVEL SOFT-ERROR MITIGATION TECHNIQUES / Rebaudengo, Maurizio; SONZA REORDA, Matteo; Violante, Massimo - In: Soft Errors in Modern Electronic Systems / M. Nicolaidis. - STAMPA. - [s.l] : Springer, 2011. - ISBN 9781441969927. - pp. 253-285 [10.1007/978-1-4419-6993-4_9] | 1-gen-2011 | REBAUDENGO, MaurizioSONZA REORDA, MatteoVIOLANTE, MASSIMO | - |
Test generation and coverage metrics / SANCHEZ SANCHEZ, EDGAR ERNESTO; SONZA REORDA, Matteo; Squillero, Giovanni - In: Practical Design Verification / DHIRAJ K. PRADHAN; IAN G. HARRIS EDS. - [s.l] : Cambridge University Press, 2009. - ISBN 9780521859721. - pp. 122-153 | 1-gen-2009 | SANCHEZ SANCHEZ, EDGAR ERNESTOSONZA REORDA, MatteoSQUILLERO, Giovanni | - |
An Effective Technique for Minimizing the Cost of Processor Software-Based Diagnosis in SoCs / Bernardi, Paolo; SANCHEZ SANCHEZ, EDGAR ERNESTO; M., Schillaci; Squillero, Giovanni; SONZA REORDA, Matteo - In: Design, Automation, and Test in Europe - The Most Influential Papers of 10 Years DATE / LAUWEREINS R. EDITOR; MADSEN J. EDITOR.. - [s.l] : Springer, 2008. - ISBN 9781402064876. - pp. 497-509 [10.1007/978-1-4020-6488-3_36] | 1-gen-2008 | BERNARDI, PAOLOSANCHEZ SANCHEZ, EDGAR ERNESTOSQUILLERO, GiovanniSONZA REORDA, Matteo + | - |
Multi-level Fault Effects Evaluation / Anghel, L; Rebaudengo, Maurizio; SONZA REORDA, Matteo; Violante, Massimo - In: Radiation Effects on Embedded Systems / R. VELAZCO; P. FOUILLAT; R. REIS. - [s.l] : Springer, 2007. - ISBN 9781402056451. - pp. 69-88 | 1-gen-2007 | REBAUDENGO, MaurizioSONZA REORDA, MatteoVIOLANTE, MASSIMO + | - |
Test Generation: A Heuristic Approach / O., Golubeva; SONZA REORDA, Matteo; Violante, Massimo - In: System-level test and Validation of Hardware/Software Systems / M SONZA REORDA; Z. PENG; M. VIOLANTE. - LONDON : Springer, 2005. - ISBN 9781852338992. - pp. 47-65 | 1-gen-2005 | SONZA REORDA, MatteoVIOLANTE, MASSIMO + | - |
Test Program Generation from High-level Microprocessor Descriptions / SANCHEZ SANCHEZ, EDGAR ERNESTO; SONZA REORDA, Matteo; Squillero, Giovanni - In: System-level Test and Validation of Hardware/Software Systems / AA.VV.. - STAMPA. - BERLIN : Springer, 2005. - ISBN 9781852338992. - pp. 83-106 [10.1007/1-84628-145-8_6] | 1-gen-2005 | SANCHEZ SANCHEZ, EDGAR ERNESTOSONZA REORDA, MatteoSQUILLERO, Giovanni | - |
Software Techniques for Dependable Computer-based Systems / O., Goloubeva; Rebaudengo, Maurizio; SONZA REORDA, Matteo; Violante, Massimo - In: Space radiation environment and its effects on spacecraft components and systems / R. ECOFFET. - TOULOUSE : Cépaduès, 2004. - ISBN 9782854286540. - pp. 461-480 | 1-gen-2004 | REBAUDENGO, MaurizioSONZA REORDA, MatteoVIOLANTE, MASSIMO + | - |
New Acceleration Techniques for Simulation-Based Fault-Injection / Corno, Fulvio; L., Entrena; C., Lopez; SONZA REORDA, Matteo; Squillero, Giovanni - In: Fault Injection Techniques and Tools for Embedded Systems Reliability Evaluation / A. BENSO; P. PRINETTO. - [s.l] : Kluwer, 2003. - ISBN 9781402075896. - pp. 217-230 | 1-gen-2003 | CORNO, FulvioSONZA REORDA, MatteoSQUILLERO, Giovanni + | - |
New Acceleration Techniques for Simulation-Based Fault-Injection / Corno, Fulvio; Entrena, L.; Lopez, C.; SONZA REORDA, Matteo; Squillero, Giovanni - In: Frontiers in Electronic Testing / Benso A., Prinetto P.. - STAMPA. - [s.l] : Springer, 2003. - ISBN 9781402075896. - pp. 217-230 [10.1007/0-306-48711-X_13] | 1-gen-2003 | CORNO, FulvioSONZA REORDA, MatteoSQUILLERO, Giovanni + | - |