Archivio Istituzionale della RicercaSONZA REORDA, MATTEO
SONZA REORDA, MATTEO
Dipartimento di Automatica e Informatica
REORDA M. S; Reorda, Matteo Sonza; Reorda M. Sonza; M. Sonza Reorda; Reorda, M. S.; M.S. Reorda; Matteo Sonza Reorda
001894
Mostra
records
Risultati 1 - 20 di 479 (tempo di esecuzione: 0.061 secondi).
Targeting different defect-oriented fault models in IC testing: an experimental approach
In corso di stampa Mirabella, Nunzio; Floridia, Andrea; Cantoro, Riccardo; Grosso, Michelangelo; Sonza Reorda, Matteo
Analyzing the Impact of Scheduling Policies on the Reliability of GPUs Running CNN Operations
2024 Limas Sierra, Robert; Guerrero-Balaguera, Juan-David; Pessia, Francesco; Rodriguez Condia, Josie E.; Reorda, Matteo Sonza
Assessing the Effectiveness of Software-Based Self-Test Programs for Static Cell-Aware Test
2024 Cantoro, Riccardo; Grosso, Michelangelo; Guglielminetti, Iacopo; Khoshzaban, Reza; Reorda, Matteo Sonza
Assessing the Reliability of Different Split Computing Neural Network Applications
2024 Esposito, Giuseppe; Guerrero-Balaguera, Juan-David; Rodriguez Condia, Josie E.; Levorato, Marco; Reorda, Matteo Sonza
Early Detection of Permanent Faults in DNNs Through the Application of Tensor-Related Metrics
2024 Turco, V.; Ruospo, A.; Sanchez, E.; Sonza Reorda, M.
Effective Application-level Error Modeling of Permanent Faults on AI Accelerators
2024 Pessia, Francesco; Guerrero-Balaguera, Juan-David; Limas Sierra, Robert; Rodriguez Condia, Josie E.; Levorato, Marco; Sonza Reorda, Matteo
Evaluating the Reliability of Integer Multipliers With Respect to Permanent Faults
2024 Deligiannis, Nikolaos; Cantoro, Riccardo; SONZA REORDA, Matteo; Habib, S. E. D.
Evaluating the Reliability of Supervised Compression for Split Computing
2024 Guerrero-Balaguera, Juan-David; Rodriguez Condia, Josie E.; Levorato, Marco; Sonza Reorda, Matteo
Fault Grading Techniques for Evaluating Software-Based Self-Test with Respect to Small Delay Defects
2024 Bartolomucci, Michelangelo; Deligiannis, Nikolaos; Cantoro, Riccardo; Sonza Reorda, Matteo
Special Session: Reliability Assessment Recipes for DNN Accelerators
2024 Ahmadilivani, Mohammad Hasan; Bosio, Alberto; Deveautour, Bastien; Santos, Fernando Fernandes Dos; Guerrero-Balaguera, Juan-David; Jenihhin, Maksim; Kritikakou, Angeliki; Limas Sierra, Robert; Pappalardo, Salvatore; Raik, Jaan; Rodriguez Condia, Josie E.; Sonza Reorda, Matteo; Taheri, Mahdi; Traiola, Marcello
A Reliability-aware Environment for Design Exploration for GPU Devices
2023 Limas Sierra, Robert; Guerrero Balaguera, Juan David; Rodriguez Condia, Josie Esteban; Sonza Reorda, Matteo
A Survey of Recent Developments in Testability, Safety and Security of RISC-V Processors
2023 Anders, Jens; Andreu, Pablo; Becker, Bernd; Becker, Steffen; Cantoro, Riccardo; Deligiannis, Nikolaos; Elhamawy, Nourhan; Faller, Tobias; Hernandez, Carles; Mentens, Nele; Namazi Rizi, Mahnaz; Polian, Ilia; Sajadi, Abolfazl; Sauer, Mathias; Schwachhofer, Denis; SONZA REORDA, Matteo; Stefanov, Todor; Tuzov, Ilya; Wagner, Stefan; Zidaric, Nuša
Analyzing the Architectural Impact of Transient Fault Effects in SFUs of GPUs
2023 Rodriguez Condia, Josie E.; Guerrero-Balaguera, Juan-David; Patiño Núñez, Edwar J.; Limas, Robert; Reorda, Matteo Sonza
Analyzing the Impact of Different Real Number Formats on the Structural Reliability of TCUs in GPUs
2023 Sierra, Robert Limas; Guerrero-Balaguera, Juan-David; Rodriguez Condia, Josie E.; Sonza Reorda, Matteo
Assessing Convolutional Neural Networks Reliability through Statistical Fault Injections
2023 Ruospo, Annachiara; Gavarini, Gabriele; De Sio, Corrado; Guerrero Balaguera, Juan David; Sterpone, Luca; Sonza Reorda, Matteo; Sanchez, Ernesto; Mariani, Riccardo; Aribido, Joseph; Athavale, Jyotika
Automatic Identification of Functionally Untestable Cell-Aware Faults in Microprocessors
2023 Deligiannis, Nikolaos; Faller, Tobias; Iacopo, Guglielminetti; Cantoro, Riccardo; Becker, Bernd; SONZA REORDA, Matteo
Automating the Generation of Functional Stress Inducing Stimuli for Burn-In Testing
2023 Deligiannis, Nikolaos; Faller, Tobias; Chenghan, Zhou; Cantoro, Riccardo; Becker, Bernd; SONZA REORDA, Matteo
Collecting diagnostic information through dichotomic search from Logic BIST of failing in-field automotive SoCs with delay faults
2023 Bernardi, Paolo; Filipponi, Gabriele; Reorda, Matteo Sonza; Appello, Davide; Bertani, Claudia; Tancorre, Vincenzo
Constraint-Based Automatic SBST Generation for RISC-V Processor Families
2023 Faller, Tobias; Deligiannis, Nikolaos; Schwörer, Markus; SONZA REORDA, Matteo; Becker, Bernd
Evaluating the Impact of Aging on Path-Delay Self-Test Libraries
2023 Cantoro, Riccardo; Sartoni, Sandro; Reorda, Matteo Sonza; Anghel, Lorena; Portolan, Michele
| Citazione | Data di pubblicazione | Autori | File |
|---|---|---|---|
| Targeting different defect-oriented fault models in IC testing: an experimental approach / Mirabella, Nunzio; Floridia, Andrea; Cantoro, Riccardo; Grosso, Michelangelo; Sonza Reorda, Matteo. - ELETTRONICO. - (In corso di stampa), pp. 1-6. (Intervento presentato al convegno 26th Euromicro Conference Series on Digital System Design (DSD) tenutosi a Durres (ALB) nel 6-8 September, 2023). | In corso di stampa | Mirabella,NunzioFloridia, AndreaCantoro, RiccardoGrosso, MichelangeloSonza Reorda, Matteo | DSD_Conference_paper_1.9_submitted.docx; 2023172914.pdf |
| Analyzing the Impact of Scheduling Policies on the Reliability of GPUs Running CNN Operations / Limas Sierra, Robert; Guerrero-Balaguera, Juan-David; Pessia, Francesco; Rodriguez Condia, Josie E.; Reorda, Matteo Sonza. - (2024). (Intervento presentato al convegno 2024 IEEE 42nd VLSI Test Symposium (VTS) tenutosi a Tempe, AZ (USA) nel 22-24 April 2024) [10.1109/vts60656.2024.10538940]. | 1-gen-2024 | Limas Sierra, RobertGuerrero-Balaguera, Juan-DavidRodriguez Condia, Josie E.Reorda, Matteo Sonza + | Analyzing_the_Impact_of_Scheduling_Policies_on_the_Reliability_of_GPUs_Running_CNN_Operations.pdf |
| Assessing the Effectiveness of Software-Based Self-Test Programs for Static Cell-Aware Test / Cantoro, Riccardo; Grosso, Michelangelo; Guglielminetti, Iacopo; Khoshzaban, Reza; Reorda, Matteo Sonza. - (2024). (Intervento presentato al convegno 2024 IEEE European Test Symposium (ETS) tenutosi a The Hague (NL) nel 20-24 May 2024) [10.1109/ets61313.2024.10567198]. | 1-gen-2024 | Cantoro, RiccardoGrosso, MichelangeloKhoshzaban, RezaReorda, Matteo Sonza + | _ETS_2024__Assessing_the_Effectiveness_of_Software_Based_Self_Test_Programs_for_Static_Cell_Aware_Test-8.pdf; Assessing_the_Effectiveness_of_Software-Based_Self-Test_Programs_for_Static_Cell-Aware_Test.pdf |
| Assessing the Reliability of Different Split Computing Neural Network Applications / Esposito, Giuseppe; Guerrero-Balaguera, Juan-David; Rodriguez Condia, Josie E.; Levorato, Marco; Reorda, Matteo Sonza. - (2024). (Intervento presentato al convegno 2024 IEEE 25th Latin American Test Symposium (LATS) tenutosi a Maceio (BRA) nel 09-12 April 2024) [10.1109/lats62223.2024.10534618]. | 1-gen-2024 | Esposito, GiuseppeGuerrero-Balaguera, Juan-DavidRodriguez Condia, Josie E.Levorato, MarcoReorda, Matteo Sonza | Assessing_the_Reliability_of_Different_Split_Computing_Neural_Network_Applications.pdf |
| Early Detection of Permanent Faults in DNNs Through the Application of Tensor-Related Metrics / Turco, V.; Ruospo, A.; Sanchez, E.; Sonza Reorda, M.. - ELETTRONICO. - (2024), pp. 13-18. (Intervento presentato al convegno 2024 27th International Symposium on Design & Diagnostics of Electronic Circuits & Systems (DDECS) tenutosi a Kielce (POL) nel 03-05 April 2024) [10.1109/DDECS60919.2024.10508918]. | 1-gen-2024 | Turco V.Ruospo A.Sanchez E.Sonza Reorda M. | Early_Detection_of_Permanent_Faults_in_DNNs_Through_the_Application_of_Tensor-Related_Metrics.pdf |
| Effective Application-level Error Modeling of Permanent Faults on AI Accelerators / Pessia, Francesco; Guerrero-Balaguera, Juan-David; Limas Sierra, Robert; Rodriguez Condia, Josie E.; Levorato, Marco; Sonza Reorda, Matteo. - ELETTRONICO. - (2024), pp. 1-7. (Intervento presentato al convegno International Symposium on On-Line Testing and Robust System Design (IOLTS) tenutosi a Rennes (FRA) nel 03-05 July 2024) [10.1109/iolts60994.2024.10616087]. | 1-gen-2024 | Guerrero-Balaguera, Juan-DavidLimas Sierra, RobertRodriguez Condia, Josie E.Levorato, MarcoSonza Reorda, Matteo + | Effective_Application-level_Error_Modeling_of_Permanent_Faults_on_AI_Accelerators.pdf |
| Evaluating the Reliability of Integer Multipliers With Respect to Permanent Faults / Deligiannis, Nikolaos; Cantoro, Riccardo; SONZA REORDA, Matteo; Habib, S. E. D.. - (2024), pp. 124-129. (Intervento presentato al convegno International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS) tenutosi a Kielce (POL) nel 03-05 April 2024) [10.1109/DDECS60919.2024.10508899]. | 1-gen-2024 | Deligiannis, NikolaosCantoro, RiccardoSonza Reorda Matteo + | DDECS2024__Evaluating_the_Reliability_of_Integer_Multipliers_With_Respect_to_Permanent_Faults.pdf; Evaluating_the_Reliability_of_Integer_Multipliers_With_Respect_to_Permanent_Faults.pdf |
| Evaluating the Reliability of Supervised Compression for Split Computing / Guerrero-Balaguera, Juan-David; Rodriguez Condia, Josie E.; Levorato, Marco; Sonza Reorda, Matteo. - ELETTRONICO. - (2024), pp. 1-6. (Intervento presentato al convegno 2024 IEEE 42nd VLSI Test Symposium (VTS) tenutosi a Tempe (USA) nel 22-24 April 2024) [10.1109/vts60656.2024.10538938]. | 1-gen-2024 | Guerrero-Balaguera, Juan-DavidRodriguez Condia, Josie E.Levorato, MarcoSonza Reorda, Matteo | Evaluating_the_Reliability_of_Supervised_Compression_for_Split_Computing.pdf |
| Fault Grading Techniques for Evaluating Software-Based Self-Test with Respect to Small Delay Defects / Bartolomucci, Michelangelo; Deligiannis, Nikolaos; Cantoro, Riccardo; Sonza Reorda, Matteo. - (2024). (Intervento presentato al convegno International Symposium on On-Line Testing and Robust System Design (IOLTS) tenutosi a Rennes (FRA) nel 03-05 July 2024) [10.1109/IOLTS60994.2024.10616077]. | 1-gen-2024 | Bartolomucci, MichelangeloDeligiannis, NikolaosCantoro, RiccardoSonza Reorda, Matteo | IOLTS-24_CameraReady.pdf; Fault_Grading_Techniques_for_Evaluating_Software-Based_Self-Test_with_Respect_to_Small_Delay_Defects.pdf |
| Special Session: Reliability Assessment Recipes for DNN Accelerators / Ahmadilivani, Mohammad Hasan; Bosio, Alberto; Deveautour, Bastien; Santos, Fernando Fernandes Dos; Guerrero-Balaguera, Juan-David; Jenihhin, Maksim; Kritikakou, Angeliki; Limas Sierra, Robert; Pappalardo, Salvatore; Raik, Jaan; Rodriguez Condia, Josie E.; Sonza Reorda, Matteo; Taheri, Mahdi; Traiola, Marcello. - ELETTRONICO. - (2024). (Intervento presentato al convegno 2024 IEEE 42nd VLSI Test Symposium (VTS) tenutosi a Tempe (USA) nel 22-24 April 2024) [10.1109/vts60656.2024.10538707]. | 1-gen-2024 | Bosio, AlbertoGuerrero-Balaguera, Juan-DavidLimas Sierra, RobertRodriguez Condia, Josie E.Sonza Reorda, Matteo + | Special_Session_Reliability_Assessment_Recipes_for_DNN_Accelerators.pdf |
| A Reliability-aware Environment for Design Exploration for GPU Devices / Limas Sierra, Robert; Guerrero Balaguera, Juan David; Rodriguez Condia, Josie Esteban; Sonza Reorda, Matteo. - (2023), pp. 169-174. (Intervento presentato al convegno 2023 26th International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS) tenutosi a Tallinn (Estonia) nel 03-05 May 2023) [10.1109/DDECS57882.2023.10139643]. | 1-gen-2023 | Limas Sierra, RobertGuerrero Balaguera, Juan DavidRodriguez Condia, Josie EstebanSonza Reorda, Matteo | A_Reliability-aware_Environment_for_Design_Exploration_for_GPU_Devices.pdf |
| A Survey of Recent Developments in Testability, Safety and Security of RISC-V Processors / Anders, Jens; Andreu, Pablo; Becker, Bernd; Becker, Steffen; Cantoro, Riccardo; Deligiannis, Nikolaos; Elhamawy, Nourhan; Faller, Tobias; Hernandez, Carles; Mentens, Nele; Namazi Rizi, Mahnaz; Polian, Ilia; Sajadi, Abolfazl; Sauer, Mathias; Schwachhofer, Denis; SONZA REORDA, Matteo; Stefanov, Todor; Tuzov, Ilya; Wagner, Stefan; Zidaric, Nuša. - (2023), pp. 1-10. (Intervento presentato al convegno 2023 IEEE European Test Symposium (ETS) tenutosi a Venice (Italy) nel 22-26 May 2023) [10.1109/ETS56758.2023.10174099]. | 1-gen-2023 | Riccardo CantoroNikolaos DeligiannisMatteo Sonza Reorda + | ETS_RISC_V_testing_safety_security.pdf; A_Survey_of_Recent_Developments_in_Testability_Safety_and_Security_of_RISC-V_Processors.pdf |
| Analyzing the Architectural Impact of Transient Fault Effects in SFUs of GPUs / Rodriguez Condia, Josie E.; Guerrero-Balaguera, Juan-David; Patiño Núñez, Edwar J.; Limas, Robert; Reorda, Matteo Sonza. - (2023), pp. 1-6. (Intervento presentato al convegno 2023 IEEE 24th Latin American Test Symposium (LATS) tenutosi a Veracruz (Mexico) nel 21-24 March 2023) [10.1109/LATS58125.2023.10154504]. | 1-gen-2023 | Rodriguez Condia, Josie E.Guerrero-Balaguera, Juan-DavidLimas, RobertReorda, Matteo Sonza + | Analyzing_the_Architectural_Impact_of_Transient_Fault_Effects_in_SFUs_of_GPUs.pdf |
| Analyzing the Impact of Different Real Number Formats on the Structural Reliability of TCUs in GPUs / Sierra, Robert Limas; Guerrero-Balaguera, Juan-David; Rodriguez Condia, Josie E.; Sonza Reorda, Matteo. - (2023), pp. 1-6. (Intervento presentato al convegno IFIP/IEEE Conference on Very Large Scale Integration (VLSI-SoC 2023) tenutosi a Dubai (United Arab Emirates) nel 16-18 October 2023) [10.1109/VLSI-SoC57769.2023.10321881]. | 1-gen-2023 | Sierra, Robert LimasGuerrero-Balaguera, Juan-DavidRodriguez Condia, Josie E.Sonza Reorda, Matteo | Analyzing_the_Impact_of_Different_Real_Number_Formats_on_the_Structural_Reliability_of_TCUs_in_GPUs.pdf |
| Assessing Convolutional Neural Networks Reliability through Statistical Fault Injections / Ruospo, Annachiara; Gavarini, Gabriele; De Sio, Corrado; Guerrero Balaguera, Juan David; Sterpone, Luca; Sonza Reorda, Matteo; Sanchez, Ernesto; Mariani, Riccardo; Aribido, Joseph; Athavale, Jyotika. - (2023), pp. 1-6. (Intervento presentato al convegno IEEE Design, Automation and Test in Europe Conference (DATE) tenutosi a Antwerp (Belgium) nel 17 - 19 April 2023) [10.23919/DATE56975.2023.10136998]. | 1-gen-2023 | Ruospo, AnnachiaraGavarini, GabrieleDe Sio, CorradoGuerrero Balaguera, Juan DavidSterpone, LucaSonza Reorda, MatteoSanchez, Ernesto + | date_2023_acceptedVersion.pdf; Assessing_Convolutional_Neural_Networks_Reliability_through_Statistical_Fault_Injections.pdf |
| Automatic Identification of Functionally Untestable Cell-Aware Faults in Microprocessors / Deligiannis, Nikolaos; Faller, Tobias; Iacopo, Guglielminetti; Cantoro, Riccardo; Becker, Bernd; SONZA REORDA, Matteo. - (2023), pp. 1-6. (Intervento presentato al convegno Asian Test Symposium (ATS) tenutosi a Beijing (China) nel 14-17 October 2023) [10.1109/ATS59501.2023.10317988]. | 1-gen-2023 | Nikolaos DeligiannisRiccardo CantoroMatteo Sonza Reorda + | _ATS2023__Automatic_Identification_of_Functionally_Untestable_Cell_Aware_Faults_in_Microprocessors.pdf; Automatic_Identification_of_Functionally_Untestable_Cell-Aware_Faults_in_Microprocessors.pdf |
| Automating the Generation of Functional Stress Inducing Stimuli for Burn-In Testing / Deligiannis, Nikolaos; Faller, Tobias; Chenghan, Zhou; Cantoro, Riccardo; Becker, Bernd; SONZA REORDA, Matteo. - (2023), pp. 1-5. (Intervento presentato al convegno 2023 IEEE European Test Symposium (ETS) tenutosi a Venice (Italy) nel 22-26 May 2023) [10.1109/ETS56758.2023.10174232]. | 1-gen-2023 | Nikolaos DeligiannisRiccardo CantoroMatteo Sonza Reorda + | _ETS2023__Automating_the_Generation_of_Functional_Stress_Inducing_Stimuli_for_Burn_In_Testing.pdf; Automating_the_Generation_of_Functional_Stress_Inducing_Stimuli_for_Burn-In_Testing.pdf |
| Collecting diagnostic information through dichotomic search from Logic BIST of failing in-field automotive SoCs with delay faults / Bernardi, Paolo; Filipponi, Gabriele; Reorda, Matteo Sonza; Appello, Davide; Bertani, Claudia; Tancorre, Vincenzo. - ELETTRONICO. - (2023), pp. 21-26. (Intervento presentato al convegno International Symposium on Design and Diagnostics of Electronic Circuits and Systems tenutosi a Tallinn (Estonia) nel 03-05 May 2023) [10.1109/DDECS57882.2023.10139670]. | 1-gen-2023 | Bernardi, PaoloFilipponi, GabrieleReorda, Matteo Sonza + | 2023058710.pdf; Collecting_diagnostic_information_through_dichotomic_search_from_Logic_BIST_of_failing_in-field_automotive_SoCs_with_delay_faults.pdf |
| Constraint-Based Automatic SBST Generation for RISC-V Processor Families / Faller, Tobias; Deligiannis, Nikolaos; Schwörer, Markus; SONZA REORDA, Matteo; Becker, Bernd. - (2023), pp. 1-6. (Intervento presentato al convegno 2023 IEEE European Test Symposium (ETS) tenutosi a Venice (Italy) nel 22-26 May 2023) [10.1109/ETS56758.2023.10174156]. | 1-gen-2023 | Nikolaos DeligiannisMatteo Sonza Reorda + | _ETS2023__Constraint_Based_Automatic_SBST_Generation_for_RISC_V_Processor_Families.pdf; Constraint-Based_Automatic_SBST_Generation_for_RISC-V_Processor_Families.pdf |
| Evaluating the Impact of Aging on Path-Delay Self-Test Libraries / Cantoro, Riccardo; Sartoni, Sandro; Reorda, Matteo Sonza; Anghel, Lorena; Portolan, Michele. - (2023). (Intervento presentato al convegno IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT) 2023 tenutosi a Juan-Les-Pins (FRA) nel 03-05 October 2023) [10.1109/dft59622.2023.10313531]. | 1-gen-2023 | Cantoro, RiccardoSartoni, SandroReorda, Matteo SonzaPortolan, Michele + | _DFTS2023__Evaluating_the_Impact_of_Aging_on_Path_Delay_Self_Test_Libraries-3.pdf; Evaluating_the_Impact_of_Aging_on_Path-Delay_Self-Test_Libraries.pdf |