PORTO @ Archivio Istituzionale della Ricerca

GROSSO, MICHELANGELO
 Distribuzione geografica
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Continente #
EU - Europa 11.316
NA - Nord America 11.025
AS - Asia 5.744
SA - Sud America 358
AF - Africa 83
Continente sconosciuto - Info sul continente non disponibili 9
OC - Oceania 5
Totale 28.540
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Nazione #
US - Stati Uniti d'America 10.852
IT - Italia 2.419
GB - Regno Unito 2.353
FR - Francia 2.019
SG - Singapore 1.919
DE - Germania 1.718
CN - Cina 1.377
VN - Vietnam 1.041
RU - Federazione Russa 964
UA - Ucraina 536
BR - Brasile 290
KR - Corea 283
NL - Olanda 267
TR - Turchia 229
HK - Hong Kong 199
CH - Svizzera 186
IE - Irlanda 174
IN - India 172
CA - Canada 141
SE - Svezia 137
AT - Austria 133
FI - Finlandia 108
IL - Israele 104
JP - Giappone 86
BE - Belgio 69
JO - Giordania 50
PH - Filippine 47
EU - Europa 38
ES - Italia 35
TW - Taiwan 35
ID - Indonesia 32
TH - Thailandia 31
IQ - Iraq 29
BD - Bangladesh 24
RO - Romania 24
PL - Polonia 22
SN - Senegal 21
PT - Portogallo 20
ZA - Sudafrica 19
AR - Argentina 16
IR - Iran 16
MX - Messico 16
MY - Malesia 16
EE - Estonia 14
AP - ???statistics.table.value.countryCode.AP??? 12
CO - Colombia 12
PK - Pakistan 12
CL - Cile 11
EC - Ecuador 10
VE - Venezuela 10
GR - Grecia 9
UZ - Uzbekistan 9
MA - Marocco 8
OM - Oman 8
BG - Bulgaria 7
EG - Egitto 7
NP - Nepal 7
SA - Arabia Saudita 7
CZ - Repubblica Ceca 6
KE - Kenya 6
AU - Australia 5
DK - Danimarca 5
SK - Slovacchia (Repubblica Slovacca) 5
UY - Uruguay 5
DZ - Algeria 4
KW - Kuwait 4
LK - Sri Lanka 4
NG - Nigeria 4
TN - Tunisia 4
AL - Albania 3
AZ - Azerbaigian 3
BY - Bielorussia 3
CY - Cipro 3
ET - Etiopia 3
HU - Ungheria 3
JM - Giamaica 3
KZ - Kazakistan 3
LT - Lituania 3
LU - Lussemburgo 3
AE - Emirati Arabi Uniti 2
AM - Armenia 2
BN - Brunei Darussalam 2
DO - Repubblica Dominicana 2
HN - Honduras 2
HR - Croazia 2
LB - Libano 2
NI - Nicaragua 2
NO - Norvegia 2
PY - Paraguay 2
SI - Slovenia 2
XK - ???statistics.table.value.countryCode.XK??? 2
BO - Bolivia 1
BZ - Belize 1
CG - Congo 1
CI - Costa d'Avorio 1
CR - Costa Rica 1
GD - Grenada 1
GE - Georgia 1
GH - Ghana 1
GT - Guatemala 1
Totale 28.525
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Città #
Ashburn 2.712
Southend 2.151
Singapore 1.114
Seattle 1.007
Fairfield 749
Turin 638
Chandler 444
San Jose 437
Woodbridge 391
Houston 319
Beijing 281
Ann Arbor 272
Cambridge 270
Boardman 268
Jacksonville 268
Princeton 264
Ho Chi Minh City 252
Hanoi 243
Torino 243
Wilmington 232
Santa Clara 195
Hangzhou 175
Dublin 165
Berlin 160
Hong Kong 160
Milan 156
Dallas 152
Saint Petersburg 152
Bern 129
Chicago 127
Izmir 127
Bologna 115
San Ramon 115
San Donato Milanese 112
Hefei 109
Vienna 104
Los Angeles 97
Seoul 96
Council Bluffs 95
Shanghai 93
Lauterbourg 90
Helsinki 87
Aubervilliers 83
Zhengzhou 74
Zaporozhye 70
Moscow 69
Buffalo 67
Rotterdam 67
Des Moines 65
San Francisco 65
Brussels 63
Istanbul 63
Baltimore 60
Pennsylvania Furnace 57
Frankfurt am Main 55
Tongling 55
Nuremberg 53
Monopoli 52
Overberg 52
Tel Aviv 52
Da Nang 50
Haiphong 46
Bremen 44
Mountain View 44
New York 42
Jerusalem 41
Amsterdam 40
San Diego 40
Toronto 40
Padua 39
Waterloo 39
Frankfurt 38
Guangzhou 36
Penza 36
Fremont 34
Ottawa 34
São Paulo 33
Tokyo 33
Duncan 31
North Bergen 30
Rome 29
Redwood City 28
Malatya 27
Jakarta 26
Herkenbosch 24
Shenzhen 24
Zurich 24
Munich 23
Dearborn 22
Gerlafingen 22
Las Vegas 22
Melun 22
Paris 22
The Dalles 22
London 21
Bangkok 18
Norwalk 17
Columbus 16
Atlanta 15
Madrid 14
Totale 17.696
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Nome #
The energy efficiency management at urban scale by means of integrated modelling 833
DIMCloud – a distributed infrastructure for district energy management 650
Distributed software infrastructure for evaluating the integration of photovoltaic systems in urban districts 631
Functional Verification of DMA Controllers 590
Exploiting MOEA to Automatically Generate Test Programs for Path-delay Faults in Microprocessors 588
On the Functional Test of the Register Forwarding and Pipeline Interlocking Unit in Pipelined Processors 572
A new distributed framework for integration of district energy data from heterogeneous devices 569
An FPGA-emulation-based platform for characterization of digital baseband communication systems 540
A SBST strategy to test microprocessors' branch target buffer 527
A Top-down Constraint-driven Methodology for Smart System Design 495
A Low-cost Emulation System for Fast Co-verification and Debug 492
An Effective Approach for the Diagnosis of Transition-Delay Faults in SoCs, based on SBST and Scan Chains 461
On-Line Software-Based Self-Test of the Address Calculation Unit in RISC Processors 446
Towards Multi-Domain and Multi-Physical Electronic Design 440
Software-based self-test of embedded microprocessors 434
A Functional Test Algorithm for the Register Forwarding and Pipeline Interlocking unit in Pipelined Microprocessors 433
Software-Based Testing for System Peripherals 421
A blocking probability study for the Aethereal network-on-chip 413
A Hybrid Approach for Detection and Correction of Transient Faults in SoCs 411
Integrating BIST techniques for on-line SoC testing 391
A Deterministic Methodology for Identifying Functionally Untestable Path-Delay Faults in Microprocessor Cores 389
Addressing the Smart Systems Design Challenge: The SMAC Platform 383
A Software-based self-test methodology for system peripherals 382
A Programmable BIST for DRAM Testing and Diagnosis 376
Evaluating the Impact of DFM Library Optimizations on Alpha-induced SEU Sensitivity in a Microprocessor Core 376
Embedded Memory Diagnosis: An Industrial Workflow 368
Energy-efficient battery charging in electric vehicles with solar panels 357
Fault grading of software-based self-test procedures for dependable automotive applications 357
System-in-package testing: problems and solutions 350
Hardware-Accelerated Path-Delay Fault Grading of Functional Test Programs for Processor-based Systems 344
Smart Electronic Systems: An Overview 344
A Novel Scalable and Reconfigurable Emulation Platform for Embedded Systems Verification 343
A fault grading methodology for software-based self-test programs in systems-on-chip 340
Exploiting an infrastructure-intellectual property for systems-on-chip test, diagnosis and silicon debug 336
Exploiting Embedded FPGA in On-line Software-based Test Strategies for Microprocessor Cores 335
On the use of embedded debug features for permanent and transient fault resilience in microprocessors 332
On the Automatic Generation of Test Programs for Path-Delay Faults in Microprocessor Cores 331
A System-layer Infrastructure for SoC Diagnosis 329
DfT Reuse for Low-Cost Radiation Testing of SoCs: A Case Study 327
An Investigation on Pervasive Technologies for IoT-based Thermal Monitoring 327
Automatic Functional Stress Pattern Generation for SoC Reliability Characterization 323
A compact IGBT electro-thermal model in Verilog-A for fast system-level simulation 322
A preliminary test on the feasibility of locating an iron restoration pin in a statue by measuring the TMF anomaly with a triaxial MEMS magnetometer 319
A novel SBST generation technique for path-delay faults in microprocessors based on BDD analysis and evolutionary algorithm 318
An adaptive tester architecture for volume diagnosis 318
On the automation of the test flow of complex SoCs 317
An Innovative and Low-Cost Industrial Flow for Reliability Characterization of SoCs 316
Analysis of Root Causes of Alpha Sensitivity Variations on Microprocessors Manufactured using Different Cell Layouts 316
A pattern ordering algorithm for reducing the size of fault dictionaries 315
Evaluating Alpha-induced Soft Errors in Embedded Microprocessors 308
Evaluating the impact of DFM library optimizations on alpha-induced SEU sensitivity in a microprocessor core 306
Functional Test Generation for DMA Controllers 305
Test Considerations about the Structured ASIC Paradigm 292
Exploiting an I-IP for both test and silicon debug of microprocessor cores 292
Multi-Domain Simulation as a Foundation for the Engineering of Smart Systems: Challenges and the SMAC Vision 291
Exploiting Fault Model Correlations to Accelerate SEU Sensitivity Assessment 289
An Automatic Functional Stress Pattern Generation Technique Suitable for SoC Reliability Characterization 285
Safety Evaluation of NanoFabrics 282
Effective Diagnostic Pattern Generation Strategy forTransition-Delay Faults in Full-Scan SOCs 279
A Tool for Supporting and Automating the Test of Complex System-on-Chips 278
Exploiting an Infrastructure-IP to reduce memory diagnosis costs in SoCs 278
A new DFM-proactive technique 273
Enabling Smart System design with the SMAC Platform 272
Smart System Case Studies 271
Enhanced Observability in Microprocessor-based Systems for Permanent and Transient Fault Resiliency 270
Control flow checking through embedded debug interface 262
An On-line Fault Detection Technique based on Embedded Debug Features 259
On the diagnosis of SoCs including multiple memory cores 249
Targeting different defect-oriented fault models in IC testing: an experimental approach 247
Advanced Speeding-up Techniques for SEU Sensitivity Assessment 235
An I-IP for the Debug of Microprocessor Cores 226
Assessing the Effectiveness of Software-Based Self-Test Programs for Static Cell-Aware Test 220
An Energy-autonomous Wireless Sensor Network Development Platform 208
Comparing different solutions for testing resistive defects in low-power SRAMs 207
Recent Trends and Perspectives on Defect-Oriented Testing 196
An Experimental Evaluation of Resistive Defects and Different Testing Solutions in Low-Power Back-Biased SRAM Cells 190
A comparative overview of ATPG flows targeting traditional and cell-aware fault models 180
AMBEATion: Analog Mixed-Signal Back-End Design Automation with Machine Learning and Artificial Intelligence Techniques 167
Testing single via related defectsin digital VLSI designs 165
On the test of single via related defects in digital VLSI designs 157
Software-Based Self-Test for Transition Faults: A Case Study 153
Training a classifier for activity recognition using body motion simulation 153
Exploiting the correlation with traditional fault models to speed-up cell-aware fault simulation 148
Machine Learning-based feasibility estimation of digital blocks in BCD technology 123
AMBEATion: New Algorithm for Generation IC Matched Structures with Respecting Linear and Non-linear Gradient Parameter Effects 122
Totale 28.665
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Categoria #
all - tutte 73.325
article - articoli 16.195
book - libri 0
conference - conferenze 54.733
curatela - curatele 0
other - altro 0
patent - brevetti 0
selected - selezionate 0
volume - volumi 2.397
Totale 146.650
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Totale Lug Ago Sett Ott Nov Dic Gen Feb Mar Apr Mag Giu
2020/2021193 0 0 0 0 0 0 0 0 0 0 129 64
2021/20221.051 75 79 75 47 47 82 40 36 44 135 176 215
2022/20231.659 125 266 46 155 176 211 135 77 181 17 88 182
2023/2024478 24 39 16 35 60 61 24 34 7 19 53 106
2024/20252.814 48 401 99 326 154 146 148 343 367 152 264 366
2025/20265.518 267 321 349 426 343 418 827 535 1.217 744 71 0
Totale 28.665