PORTO @ Archivio Istituzionale della Ricerca

GROSSO, MICHELANGELO
 Distribuzione geografica
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Continente #
EU - Europa 9.948
NA - Nord America 9.149
AS - Asia 1.623
AF - Africa 42
SA - Sud America 27
Continente sconosciuto - Info sul continente non disponibili 7
OC - Oceania 3
Totale 20.799
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Nazione #
US - Stati Uniti d'America 9.025
GB - Regno Unito 2.293
IT - Italia 2.172
FR - Francia 1.797
DE - Germania 1.565
CN - Cina 707
UA - Ucraina 530
RU - Federazione Russa 477
SG - Singapore 299
NL - Olanda 246
TR - Turchia 211
CH - Svizzera 177
IE - Irlanda 166
KR - Corea 137
SE - Svezia 128
CA - Canada 124
AT - Austria 87
FI - Finlandia 80
IN - India 68
BE - Belgio 54
JP - Giappone 48
JO - Giordania 44
EU - Europa 38
ID - Indonesia 24
RO - Romania 24
ES - Italia 20
HK - Hong Kong 20
SN - Senegal 20
IL - Israele 17
IR - Iran 15
MY - Malesia 14
EE - Estonia 13
PT - Portogallo 13
AP - ???statistics.table.value.countryCode.AP??? 12
BR - Brasile 11
PL - Polonia 11
TW - Taiwan 11
CL - Cile 9
TH - Thailandia 9
BG - Bulgaria 6
GR - Grecia 6
ZA - Sudafrica 6
DK - Danimarca 4
DZ - Algeria 4
NG - Nigeria 4
SK - Slovacchia (Repubblica Slovacca) 4
VN - Vietnam 4
AU - Australia 3
CO - Colombia 3
LU - Lussemburgo 3
PH - Filippine 3
UY - Uruguay 3
BY - Bielorussia 2
CY - Cipro 2
CZ - Repubblica Ceca 2
EG - Egitto 2
HU - Ungheria 2
LK - Sri Lanka 2
NO - Norvegia 2
AZ - Azerbaigian 1
GH - Ghana 1
HR - Croazia 1
KZ - Kazakistan 1
LT - Lituania 1
LV - Lettonia 1
MD - Moldavia 1
MM - Myanmar 1
MU - Mauritius 1
PK - Pakistan 1
SA - Arabia Saudita 1
SC - Seychelles 1
SD - Sudan 1
TN - Tunisia 1
VE - Venezuela 1
ZW - Zimbabwe 1
Totale 20.799
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Città #
Ashburn 2.457
Southend 2.110
Seattle 986
Fairfield 721
Turin 486
Chandler 434
Woodbridge 384
Houston 305
Ann Arbor 268
Jacksonville 263
Boardman 262
Cambridge 259
Princeton 256
Wilmington 229
Torino 220
Singapore 195
Beijing 185
Hangzhou 170
Santa Clara 164
Dublin 157
Berlin 155
Saint Petersburg 152
Milan 137
Bern 127
Chicago 123
Izmir 122
Bologna 115
San Ramon 111
San Donato Milanese 110
Vienna 84
Aubervilliers 83
Helsinki 77
Shanghai 74
Zaporozhye 68
Zhengzhou 68
Rotterdam 67
Council Bluffs 64
Des Moines 63
San Francisco 62
Baltimore 60
Pennsylvania Furnace 57
Istanbul 54
Overberg 52
Monopoli 51
Brussels 48
Bremen 42
Mountain View 41
Buffalo 40
Padua 39
San Diego 39
Waterloo 39
Frankfurt 38
Toronto 37
Penza 36
Fremont 34
Ottawa 34
Amsterdam 32
Duncan 30
Rome 27
Malatya 25
Redwood City 25
Guangzhou 24
Herkenbosch 24
Jakarta 24
Gerlafingen 22
Melun 22
New York 22
Las Vegas 21
Shenzhen 21
Dearborn 20
London 20
Zurich 20
Paris 18
Norwalk 17
Dallas 16
Moscow 15
Washington 14
Andover 13
Frankfurt am Main 13
San Jose 12
Seoul 12
Tallinn 12
Cupertino 11
Newark 11
Antibes 10
Delhi 10
Stuttgart 10
University Park 10
Zhitomir 10
Atlanta 9
Greenville 9
Madrid 9
St Petersburg 9
Verona 9
Bucharest 8
Frankfurt Am Main 8
Iasi 8
Kraków 8
Lecce 8
Podenzano 8
Totale 13.800
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Nome #
The energy efficiency management at urban scale by means of integrated modelling 707
DIMCloud – a distributed infrastructure for district energy management 542
Exploiting MOEA to Automatically Generate Test Programs for Path-delay Faults in Microprocessors 500
Distributed software infrastructure for evaluating the integration of photovoltaic systems in urban districts 491
Functional Verification of DMA Controllers 454
A new distributed framework for integration of district energy data from heterogeneous devices 451
An FPGA-emulation-based platform for characterization of digital baseband communication systems 441
On the Functional Test of the Register Forwarding and Pipeline Interlocking Unit in Pipelined Processors 435
A SBST strategy to test microprocessors' branch target buffer 435
A Top-down Constraint-driven Methodology for Smart System Design 397
A Low-cost Emulation System for Fast Co-verification and Debug 388
An Effective Approach for the Diagnosis of Transition-Delay Faults in SoCs, based on SBST and Scan Chains 364
Towards Multi-Domain and Multi-Physical Electronic Design 352
On-Line Software-Based Self-Test of the Address Calculation Unit in RISC Processors 346
Software-based self-test of embedded microprocessors 330
A Hybrid Approach for Detection and Correction of Transient Faults in SoCs 328
A Deterministic Methodology for Identifying Functionally Untestable Path-Delay Faults in Microprocessor Cores 327
A Functional Test Algorithm for the Register Forwarding and Pipeline Interlocking unit in Pipelined Microprocessors 327
Integrating BIST techniques for on-line SoC testing 322
Software-Based Testing for System Peripherals 315
A blocking probability study for the Aethereal network-on-chip 308
A Software-based self-test methodology for system peripherals 299
Hardware-Accelerated Path-Delay Fault Grading of Functional Test Programs for Processor-based Systems 294
Addressing the Smart Systems Design Challenge: The SMAC Platform 289
Embedded Memory Diagnosis: An Industrial Workflow 287
A Novel Scalable and Reconfigurable Emulation Platform for Embedded Systems Verification 284
System-in-package testing: problems and solutions 283
Evaluating the Impact of DFM Library Optimizations on Alpha-induced SEU Sensitivity in a Microprocessor Core 279
A Programmable BIST for DRAM Testing and Diagnosis 278
On the automation of the test flow of complex SoCs 276
On the Automatic Generation of Test Programs for Path-Delay Faults in Microprocessor Cores 273
A System-layer Infrastructure for SoC Diagnosis 272
A fault grading methodology for software-based self-test programs in systems-on-chip 268
Exploiting an infrastructure-intellectual property for systems-on-chip test, diagnosis and silicon debug 264
A preliminary test on the feasibility of locating an iron restoration pin in a statue by measuring the TMF anomaly with a triaxial MEMS magnetometer 263
Exploiting Embedded FPGA in On-line Software-based Test Strategies for Microprocessor Cores 262
A pattern ordering algorithm for reducing the size of fault dictionaries 258
A novel SBST generation technique for path-delay faults in microprocessors based on BDD analysis and evolutionary algorithm 256
Smart Electronic Systems: An Overview 255
Fault grading of software-based self-test procedures for dependable automotive applications 253
DfT Reuse for Low-Cost Radiation Testing of SoCs: A Case Study 252
Automatic Functional Stress Pattern Generation for SoC Reliability Characterization 250
An Innovative and Low-Cost Industrial Flow for Reliability Characterization of SoCs 249
Safety Evaluation of NanoFabrics 248
On the use of embedded debug features for permanent and transient fault resilience in microprocessors 246
Exploiting an I-IP for both test and silicon debug of microprocessor cores 245
Analysis of Root Causes of Alpha Sensitivity Variations on Microprocessors Manufactured using Different Cell Layouts 243
Test Considerations about the Structured ASIC Paradigm 242
Evaluating the impact of DFM library optimizations on alpha-induced SEU sensitivity in a microprocessor core 240
Exploiting Fault Model Correlations to Accelerate SEU Sensitivity Assessment 239
Evaluating Alpha-induced Soft Errors in Embedded Microprocessors 239
Functional Test Generation for DMA Controllers 237
An adaptive tester architecture for volume diagnosis 233
Multi-Domain Simulation as a Foundation for the Engineering of Smart Systems: Challenges and the SMAC Vision 227
A new DFM-proactive technique 221
A Tool for Supporting and Automating the Test of Complex System-on-Chips 218
Exploiting an Infrastructure-IP to reduce memory diagnosis costs in SoCs 218
Smart System Case Studies 217
An Automatic Functional Stress Pattern Generation Technique Suitable for SoC Reliability Characterization 216
Enabling Smart System design with the SMAC Platform 215
Effective Diagnostic Pattern Generation Strategy forTransition-Delay Faults in Full-Scan SOCs 208
On the diagnosis of SoCs including multiple memory cores 204
Advanced Speeding-up Techniques for SEU Sensitivity Assessment 202
An I-IP for the Debug of Microprocessor Cores 197
Enhanced Observability in Microprocessor-based Systems for Permanent and Transient Fault Resiliency 195
An On-line Fault Detection Technique based on Embedded Debug Features 194
Control flow checking through embedded debug interface 189
An Investigation on Pervasive Technologies for IoT-based Thermal Monitoring 182
An Energy-autonomous Wireless Sensor Network Development Platform 120
Comparing different solutions for testing resistive defects in low-power SRAMs 106
Targeting different defect-oriented fault models in IC testing: an experimental approach 99
Testing single via related defectsin digital VLSI designs 89
An Experimental Evaluation of Resistive Defects and Different Testing Solutions in Low-Power Back-Biased SRAM Cells 82
Training a classifier for activity recognition using body motion simulation 77
Recent Trends and Perspectives on Defect-Oriented Testing 71
Software-Based Self-Test for Transition Faults: A Case Study 68
A comparative overview of ATPG flows targeting traditional and cell-aware fault models 66
On the test of single via related defects in digital VLSI designs 66
Assessing the Effectiveness of Software-Based Self-Test Programs for Static Cell-Aware Test 39
Totale 20.902
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Categoria #
all - tutte 54.312
article - articoli 12.307
book - libri 0
conference - conferenze 40.184
curatela - curatele 0
other - altro 0
patent - brevetti 0
selected - selezionate 0
volume - volumi 1.821
Totale 108.624
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Totale Lug Ago Sett Ott Nov Dic Gen Feb Mar Apr Mag Giu
2019/20201.248 0 0 0 0 0 230 199 295 245 121 84 74
2020/20211.706 194 259 80 158 48 128 133 172 123 222 129 60
2021/20221.033 74 78 75 47 47 80 39 35 44 131 175 208
2022/20231.611 122 258 46 152 174 206 131 75 174 13 84 176
2023/2024471 24 39 15 35 59 60 24 34 6 19 52 104
2024/20251.049 48 369 93 304 145 90 0 0 0 0 0 0
Totale 20.902