PORTO @ Archivio Istituzionale della Ricerca

GROSSO, MICHELANGELO
 Distribuzione geografica
Salva come PNG Salva come JPEG
Continente #
NA - Nord America 11.973
EU - Europa 11.561
AS - Asia 5.859
SA - Sud America 381
Continente sconosciuto - Info sul continente non disponibili 146
AF - Africa 84
OC - Oceania 6
Totale 30.010
Salva come PNG Salva come JPEG
Nazione #
US - Stati Uniti d'America 11.741
IT - Italia 2.631
GB - Regno Unito 2.355
FR - Francia 2.022
SG - Singapore 1.938
DE - Germania 1.722
CN - Cina 1.380
VN - Vietnam 1.043
RU - Federazione Russa 964
UA - Ucraina 538
BR - Brasile 303
KR - Corea 283
NL - Olanda 269
TR - Turchia 229
HK - Hong Kong 203
CH - Svizzera 188
IE - Irlanda 175
IN - India 175
CA - Canada 163
SE - Svezia 147
AT - Austria 133
FI - Finlandia 109
IL - Israele 104
JP - Giappone 94
BD - Bangladesh 93
BE - Belgio 69
JO - Giordania 50
PH - Filippine 48
EU - Europa 38
TW - Taiwan 36
ES - Italia 35
ID - Indonesia 33
TH - Thailandia 32
IQ - Iraq 29
RO - Romania 24
PL - Polonia 23
PT - Portogallo 21
SN - Senegal 21
AR - Argentina 19
ZA - Sudafrica 19
MX - Messico 18
IR - Iran 16
MY - Malesia 16
EE - Estonia 15
CO - Colombia 14
EC - Ecuador 13
AP - ???statistics.table.value.countryCode.AP??? 12
PK - Pakistan 12
CL - Cile 11
JM - Giamaica 11
VE - Venezuela 11
HN - Honduras 10
GR - Grecia 9
UZ - Uzbekistan 9
CZ - Repubblica Ceca 8
EG - Egitto 8
MA - Marocco 8
OM - Oman 8
BG - Bulgaria 7
NP - Nepal 7
SA - Arabia Saudita 7
CR - Costa Rica 6
DK - Danimarca 6
KE - Kenya 6
NI - Nicaragua 6
AU - Australia 5
LK - Sri Lanka 5
SK - Slovacchia (Repubblica Slovacca) 5
UY - Uruguay 5
DZ - Algeria 4
KW - Kuwait 4
NG - Nigeria 4
PR - Porto Rico 4
TN - Tunisia 4
AE - Emirati Arabi Uniti 3
AL - Albania 3
AZ - Azerbaigian 3
BY - Bielorussia 3
CY - Cipro 3
ET - Etiopia 3
HU - Ungheria 3
KZ - Kazakistan 3
LT - Lituania 3
LU - Lussemburgo 3
SV - El Salvador 3
AM - Armenia 2
BN - Brunei Darussalam 2
DO - Repubblica Dominicana 2
GD - Grenada 2
HR - Croazia 2
KH - Cambogia 2
LB - Libano 2
NO - Norvegia 2
PY - Paraguay 2
SI - Slovenia 2
TT - Trinidad e Tobago 2
XK - ???statistics.table.value.countryCode.XK??? 2
BB - Barbados 1
BO - Bolivia 1
BQ - ???statistics.table.value.countryCode.BQ??? 1
Totale 29.853
Salva come PNG Salva come JPEG
Città #
Ashburn 2.865
Southend 2.151
Singapore 1.117
Seattle 1.009
Fairfield 749
Turin 646
San Jose 586
Chandler 444
Woodbridge 391
Houston 321
Beijing 283
Ann Arbor 272
Jacksonville 271
Cambridge 270
Boardman 269
Princeton 265
Ho Chi Minh City 253
Milan 248
Hanoi 243
Torino 243
Wilmington 232
Santa Clara 214
Chicago 175
Hangzhou 175
Dallas 169
Council Bluffs 168
Dublin 167
Hong Kong 162
Berlin 160
Saint Petersburg 152
Bern 129
Izmir 127
Bologna 118
San Ramon 115
San Donato Milanese 112
Hefei 109
Vienna 104
Los Angeles 103
Seoul 96
Shanghai 93
Lauterbourg 90
Helsinki 87
Aubervilliers 83
Zhengzhou 74
Buffalo 71
Zaporozhye 70
Moscow 69
San Francisco 69
Rotterdam 67
Des Moines 65
Brussels 63
Istanbul 63
Baltimore 62
New York 57
Pennsylvania Furnace 57
Frankfurt am Main 55
Tongling 55
Nuremberg 53
Monopoli 52
Overberg 52
Tel Aviv 52
Rome 51
Da Nang 50
Haiphong 46
Bremen 44
Mountain View 44
Toronto 44
San Diego 43
Jerusalem 41
Amsterdam 40
Padua 40
Waterloo 39
Frankfurt 38
Tokyo 37
Guangzhou 36
Penza 36
Fremont 34
Ottawa 34
São Paulo 34
The Dalles 34
Duncan 31
North Bergen 31
Phoenix 30
Redwood City 28
Malatya 27
Jakarta 26
Zurich 25
Herkenbosch 24
Las Vegas 24
Shenzhen 24
Dearborn 23
Munich 23
Paris 23
Atlanta 22
Gerlafingen 22
Melun 22
London 21
Bangkok 18
Norwalk 18
Columbus 16
Totale 18.385
Salva come PNG Salva come JPEG
Nome #
The energy efficiency management at urban scale by means of integrated modelling 852
Distributed software infrastructure for evaluating the integration of photovoltaic systems in urban districts 692
DIMCloud – a distributed infrastructure for district energy management 664
Functional Verification of DMA Controllers 625
Exploiting MOEA to Automatically Generate Test Programs for Path-delay Faults in Microprocessors 600
A new distributed framework for integration of district energy data from heterogeneous devices 600
On the Functional Test of the Register Forwarding and Pipeline Interlocking Unit in Pipelined Processors 580
An FPGA-emulation-based platform for characterization of digital baseband communication systems 570
A SBST strategy to test microprocessors' branch target buffer 548
A Low-cost Emulation System for Fast Co-verification and Debug 520
A Top-down Constraint-driven Methodology for Smart System Design 504
An Effective Approach for the Diagnosis of Transition-Delay Faults in SoCs, based on SBST and Scan Chains 470
Towards Multi-Domain and Multi-Physical Electronic Design 455
On-Line Software-Based Self-Test of the Address Calculation Unit in RISC Processors 453
Software-based self-test of embedded microprocessors 445
Software-Based Testing for System Peripherals 444
A Functional Test Algorithm for the Register Forwarding and Pipeline Interlocking unit in Pipelined Microprocessors 444
A blocking probability study for the Aethereal network-on-chip 439
A Hybrid Approach for Detection and Correction of Transient Faults in SoCs 423
A Deterministic Methodology for Identifying Functionally Untestable Path-Delay Faults in Microprocessor Cores 398
Integrating BIST techniques for on-line SoC testing 397
Addressing the Smart Systems Design Challenge: The SMAC Platform 394
Energy-efficient battery charging in electric vehicles with solar panels 393
A Software-based self-test methodology for system peripherals 390
Evaluating the Impact of DFM Library Optimizations on Alpha-induced SEU Sensitivity in a Microprocessor Core 389
A fault grading methodology for software-based self-test programs in systems-on-chip 384
A Programmable BIST for DRAM Testing and Diagnosis 383
Embedded Memory Diagnosis: An Industrial Workflow 372
Fault grading of software-based self-test procedures for dependable automotive applications 365
On the use of embedded debug features for permanent and transient fault resilience in microprocessors 358
System-in-package testing: problems and solutions 357
Hardware-Accelerated Path-Delay Fault Grading of Functional Test Programs for Processor-based Systems 354
Smart Electronic Systems: An Overview 352
A Novel Scalable and Reconfigurable Emulation Platform for Embedded Systems Verification 349
Exploiting an infrastructure-intellectual property for systems-on-chip test, diagnosis and silicon debug 342
An Investigation on Pervasive Technologies for IoT-based Thermal Monitoring 341
Exploiting Embedded FPGA in On-line Software-based Test Strategies for Microprocessor Cores 339
On the Automatic Generation of Test Programs for Path-Delay Faults in Microprocessor Cores 339
A System-layer Infrastructure for SoC Diagnosis 339
DfT Reuse for Low-Cost Radiation Testing of SoCs: A Case Study 335
A compact IGBT electro-thermal model in Verilog-A for fast system-level simulation 334
A preliminary test on the feasibility of locating an iron restoration pin in a statue by measuring the TMF anomaly with a triaxial MEMS magnetometer 333
Automatic Functional Stress Pattern Generation for SoC Reliability Characterization 328
A novel SBST generation technique for path-delay faults in microprocessors based on BDD analysis and evolutionary algorithm 327
An Innovative and Low-Cost Industrial Flow for Reliability Characterization of SoCs 325
On the automation of the test flow of complex SoCs 324
An adaptive tester architecture for volume diagnosis 323
Analysis of Root Causes of Alpha Sensitivity Variations on Microprocessors Manufactured using Different Cell Layouts 322
A pattern ordering algorithm for reducing the size of fault dictionaries 319
Evaluating Alpha-induced Soft Errors in Embedded Microprocessors 318
Evaluating the impact of DFM library optimizations on alpha-induced SEU sensitivity in a microprocessor core 312
Functional Test Generation for DMA Controllers 311
Test Considerations about the Structured ASIC Paradigm 300
An Automatic Functional Stress Pattern Generation Technique Suitable for SoC Reliability Characterization 299
Multi-Domain Simulation as a Foundation for the Engineering of Smart Systems: Challenges and the SMAC Vision 299
Exploiting Fault Model Correlations to Accelerate SEU Sensitivity Assessment 298
Exploiting an I-IP for both test and silicon debug of microprocessor cores 297
Assessing the Effectiveness of Software-Based Self-Test Programs for Static Cell-Aware Test 295
Exploiting an Infrastructure-IP to reduce memory diagnosis costs in SoCs 291
Effective Diagnostic Pattern Generation Strategy forTransition-Delay Faults in Full-Scan SOCs 290
Safety Evaluation of NanoFabrics 287
Enhanced Observability in Microprocessor-based Systems for Permanent and Transient Fault Resiliency 285
A Tool for Supporting and Automating the Test of Complex System-on-Chips 283
A new DFM-proactive technique 282
Enabling Smart System design with the SMAC Platform 281
Smart System Case Studies 280
Control flow checking through embedded debug interface 267
Targeting different defect-oriented fault models in IC testing: an experimental approach 263
An On-line Fault Detection Technique based on Embedded Debug Features 263
On the diagnosis of SoCs including multiple memory cores 256
Advanced Speeding-up Techniques for SEU Sensitivity Assessment 240
An I-IP for the Debug of Microprocessor Cores 232
Comparing different solutions for testing resistive defects in low-power SRAMs 220
An Energy-autonomous Wireless Sensor Network Development Platform 215
Recent Trends and Perspectives on Defect-Oriented Testing 213
An Experimental Evaluation of Resistive Defects and Different Testing Solutions in Low-Power Back-Biased SRAM Cells 211
A comparative overview of ATPG flows targeting traditional and cell-aware fault models 199
Exploiting the correlation with traditional fault models to speed-up cell-aware fault simulation 186
AMBEATion: Analog Mixed-Signal Back-End Design Automation with Machine Learning and Artificial Intelligence Techniques 184
Testing single via related defectsin digital VLSI designs 175
Machine Learning-based feasibility estimation of digital blocks in BCD technology 168
On the test of single via related defects in digital VLSI designs 164
Training a classifier for activity recognition using body motion simulation 161
Software-Based Self-Test for Transition Faults: A Case Study 159
AMBEATion: New Algorithm for Generation IC Matched Structures with Respecting Linear and Non-linear Gradient Parameter Effects 155
Automatic Enhancement of Cell Models to Enable Conditional Stuck-at Fault Simulation and Pattern Generation 53
Assessing the Effectiveness of Software-Based Self-Test Programs for Cell-Aware Test 53
Pre-processing Functional And Physical Defect Equivalences To Accelerate Cell-Aware Model Generation 32
Totale 30.010
Salva come PNG Salva come JPEG
Categoria #
all - tutte 79.119
article - articoli 17.498
book - libri 0
conference - conferenze 59.054
curatela - curatele 0
other - altro 0
patent - brevetti 0
selected - selezionate 0
volume - volumi 2.567
Totale 158.238
Salva come PNG Salva come JPEG


Totale Lug Ago Sett Ott Nov Dic Gen Feb Mar Apr Mag Giu
2021/2022822 0 0 0 47 47 82 40 36 44 135 176 215
2022/20231.659 125 266 46 155 176 211 135 77 181 17 88 182
2023/2024478 24 39 16 35 60 61 24 34 7 19 53 106
2024/20252.814 48 401 99 326 154 146 148 343 367 152 264 366
2025/20266.006 267 321 349 426 343 418 827 535 1.217 744 184 375
2026/2027857 175 175 345 162 0 0 0 0 0 0 0 0
Totale 30.010