This paper presents an innovative approach for the generation of test programs detecting path-delay faults in microprocessors. The proposed method takes advantage of the multiobjective implementation of a previously devised evolutionary algorithm and exploits both gate- and RT-level descriptions of the processor: the former is used to build Binary Decision Diagrams (BDDs) for deriving fault excitation conditions; the latter is used for the automatic generation of test programs able to excite and propagate fault effects, based on a fast RTL simulation. Experiments on an 8-bit microcontroller show that the proposed method is able to generate suitable test programs more efficiently compared to existing approaches.

Exploiting MOEA to Automatically Generate Test Programs for Path-delay Faults in Microprocessors / Bernardi, Paolo; Christou, K; Grosso, Michelangelo; Michael, M; SANCHEZ SANCHEZ, EDGAR ERNESTO; SONZA REORDA, Matteo. - 4974:(2008), pp. 224-234. (Intervento presentato al convegno European Workshops on the Theory and Applications of Evolutionary Computation, EvoWorkshops 2008: EvoCOMNET, EvoFIN, EvoHOT, EvoIASP, EvoMUSART, EvoNUM, EvoSTOC, and EvoTransLog tenutosi a Naples (IT) nel March 26-28, 2008) [10.1007/978-3-540-78761-7_23].

Exploiting MOEA to Automatically Generate Test Programs for Path-delay Faults in Microprocessors

BERNARDI, PAOLO;GROSSO, MICHELANGELO;SANCHEZ SANCHEZ, EDGAR ERNESTO;SONZA REORDA, Matteo
2008

Abstract

This paper presents an innovative approach for the generation of test programs detecting path-delay faults in microprocessors. The proposed method takes advantage of the multiobjective implementation of a previously devised evolutionary algorithm and exploits both gate- and RT-level descriptions of the processor: the former is used to build Binary Decision Diagrams (BDDs) for deriving fault excitation conditions; the latter is used for the automatic generation of test programs able to excite and propagate fault effects, based on a fast RTL simulation. Experiments on an 8-bit microcontroller show that the proposed method is able to generate suitable test programs more efficiently compared to existing approaches.
2008
9783540787600
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11583/1877353
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