Nowadays, integrated circuit technologies are increasingly being more susceptible to ionizing radiation effects. In order to assess the reliability of a digital system performing a specific application and to identify the most critical failure effects, radiation experiments and fault injection campaigns are usually performed, which may be costly and time-expensive. This paper proposes a fully automated, practical methodology for accelerating Single-Event-Upset (SEU) fault injection campaigns in digital circuits. The main underlying principle is based on the correlation between the effects of the SEU fault model with the Stuck-At (SA) one. Circuital and functional analysis and experimental case studies confirm the effectiveness of the proposed solutions.
Exploiting Fault Model Correlations to Accelerate SEU Sensitivity Assessment / Grosso M.; Guzman-Miranda H.; Aguirre M.A.. - In: IEEE TRANSACTIONS ON INDUSTRIAL INFORMATICS. - ISSN 1551-3203. - STAMPA. - 9:1(2013), pp. 142-148. [10.1109/TII.2012.2226096]
|Titolo:||Exploiting Fault Model Correlations to Accelerate SEU Sensitivity Assessment|
|Data di pubblicazione:||2013|
|Digital Object Identifier (DOI):||http://dx.doi.org/10.1109/TII.2012.2226096|
|Appare nelle tipologie:||1.1 Articolo in rivista|