SQUILLERO, GIOVANNI

SQUILLERO, GIOVANNI  

Dipartimento di Automatica e Informatica  

003584  

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Transfer Learning in MCU Performance Screening / Bellarmino, Nicolo; Cantoro, Riccardo; Huch, Martin; Kilian, Tobias; Schlichtmann, Ulf; Squillero, Giovanni. - ELETTRONICO. - (In corso di stampa). (Intervento presentato al convegno IEEE International Test Conference (ITC 2023) tenutosi a Anaheim, CA 92802, Stati Uniti nel 8-13 Ottobre 2023). In corso di stampa Bellarmino, NicoloCantoro, RiccardoSquillero, Giovanni + 2023_XXX_Transfer_Learning_POSTER (5).pdf
Enabling Inter-Product Transfer Learning on MCU Performance Screening / Bellarmino, Nicolo; Cantoro, Riccardo; Huch, Martin; Kilian, Tobias; Schlichtmann, Ulf; Squillero, Giovanni. - ELETTRONICO. - (2023), pp. 1-6. (Intervento presentato al convegno IEEE 32nd Asian Test Symposium tenutosi a Beijing (China) nel 14-17 October 2023). 1-gen-2023 Bellarmino, NicoloCantoro, RiccardoSquillero, Giovanni + 2023_ATS_Transfer_Learning (4) (1).pdfEnabling_Inter-Product_Transfer_Learning_on_MCU_Performance_Screening.pdf
Feature Selection for Cost Reduction in MCU Performance Screening / Bellarmino, Nicolo'; Cantoro, Riccardo; Huch, Martin; Kilian, Tobias; Schlichtmann, Ulf; Squillero, Giovanni. - (2023), pp. 1-6. (Intervento presentato al convegno 24th IEEE Latin-American Test Symposium (LATS) tenutosi a Veracruz (MEX) nel 21-24 Marzo 2023) [10.1109/LATS58125.2023.10154495]. 1-gen-2023 Bellarmino, Nicolo'Cantoro, RiccardoSquillero, Giovanni + 2023_LATS_Feature_Selection.pdfFeature_Selection_for_Cost_Reduction_In_MCU_Performance_Screening.pdf
Semi-Supervised Deep Learning for Microcontroller Performance Screening / Bellarmino, Nicolo; Cantoro, Riccardo; Huch, Martin; Kilian, Tobias; Schlichtmann, Ulf; Squillero, Giovanni. - (2023), pp. 1-6. (Intervento presentato al convegno 2023 IEEE European Test Symposium (ETS) tenutosi a Venezia (IT) nel 22-26 May 2023) [10.1109/ETS56758.2023.10174083]. 1-gen-2023 Bellarmino, NicoloCantoro, RiccardoSquillero, Giovanni + 2023_ETS_Semi_Supersived_Learning (2).pdfSemi-Supervised_Deep_Learning_for_Microcontroller_Performance_Screening.pdf
Towards Evolutionary Control Laws for Viability Problems / Tonda, Alberto; Alvarez, Isabelle; Martin, Sophie; Squillero, Giovanni; Lutton, Evelyne. - (2023), pp. 1464-1472. (Intervento presentato al convegno GECCO'23 tenutosi a Lisbon (Portugal) nel July 15 - 19, 2023) [10.1145/3583131.3590415]. 1-gen-2023 Tonda, AlbertoSquillero, Giovanni + gecco_compressed.pdf
U-FLEX: Unsupervised Feature Learning with Evolutionary eXploration / Bellarmino, Nicolo’; Cantoro, Riccardo; Squillero, Giovanni. - ELETTRONICO. - (2023). (Intervento presentato al convegno The 9th International Conference on Machine Learning, Optimization, and Data Science (LOD 2023) tenutosi a Grasmere, Lake District, England – UK nel September 22 – 26, 2023). 1-gen-2023 Nicolo’ BellarminoRiccardo CantoroGiovanni Squillero 2023_LOD_Genetic_Feature_Selection (2).pdf
Microcontroller Performance Screening: Optimizing the Characterization in the Presence of Anomalous and Noisy Data / Bellarmino, Nicolo'; Cantoro, Riccardo; Huch, Martin; Kilian, Tobias; Schlichtmann, Ulf; Squillero, Giovanni. - (2022). (Intervento presentato al convegno IEEE International Symposium on On-Line Testing and Robust System 2022 tenutosi a Torino nel 12-14 September 2022) [10.1109/IOLTS56730.2022.9897769]. 1-gen-2022 Bellarmino,Nicolo'Cantoro,RiccardoSquillero,Giovanni + Microcontroller_Performance_Screening_Optimizing_the_Characterization_in_the_Presence_of_Anomalous_and_Noisy_Data.pdf2022_IOLTS_Outlier_Detection_.pdf
Predictable Features Elimination: An Unsupervised Approach to Feature Selection / Barbiero, Pietro; Squillero, Giovanni; Tonda, Alberto. - STAMPA. - 13163:(2022), pp. 399-412. (Intervento presentato al convegno LOD 2021: Machine Learning, Optimization, and Data Science) [10.1007/978-3-030-95467-3_29]. 1-gen-2022 Squillero, Giovanni + 2021_LOD___Predictable_Feature_Elimination__take_3_.pdf2022 lod.pdf
Public-Private Partnership: Evolutionary Algorithms as a Solution to Information Asymmetry / Pellegrino, Simone; Rebuglio, Massimo; Squillero, Giovanni. - STAMPA. - 13224:(2022), pp. 110-123. (Intervento presentato al convegno EvoApplications 2022: Applications of Evolutionary Computation) [10.1007/978-3-031-02462-7_8]. 1-gen-2022 Rebuglio, MassimoSquillero, Giovanni + Pellegrino2022_Chapter_Public-PrivatePartnershipEvolu.pdf
Social Influence Analysis (SIA) in Online Social Networks / Leszkiewicz, Agata; Bucur, Doina; Grimme, Christian; Michalski, Radoslaw; Clever, Lena; Pohl, Janina; Rook, Jeroen; Bossek, Jakob; Preuss, Mike; Squillero, Giovanni; Quer, Stefano; Calabrese, Andrea; Iacca, Giovanni; Kizgin, Hatice; Trautmann, Heike. - ELETTRONICO. - (2022), pp. 1-2. (Intervento presentato al convegno MISDOOM 2022 tenutosi a Boise, Idaho (USA) nel 11-12 October 2022). 1-gen-2022 Giovanni SquilleroStefano QuerAndrea Calabrese + Extended_Abstract_Social_Influence_Analysis.pdf
Test, Reliability and Functional Safety trends for Automotive System-on-Chip / Angione, F.; Appello, D.; Aribido, J.; Bellarmino, N.; Bernardi, P.; Cantoro, R.; de Sio, C.; Foscale, T.; Gavarini, G.; Huch, M.; Kilian, T; Mariani, R.; Martone, R.; Ruospo, A.; Sanchez, E.; Schlichtmann, U.; Squillero, G.; Sonza Reorda, M.; Sterpone, L.; Tancorre, V.; Ugioli, R.. - (2022). (Intervento presentato al convegno IEEE European Test Symposium). 1-gen-2022 F. AngioneN. BellarminoP. BernardiR. CantoroC. de SioT. FoscaleG. GavariniA. RuospoE. SanchezG. SquilleroM. Sonza ReordaL. Sterpone + 01_ETS_special_session_ABSTRACT.pdf
Test, Reliability and Functional Safety Trends for Automotive System-on-Chip / Angione, F.; Appello, D.; Aribido, J.; Athavale, J.; Bellarmino, N.; Bernardi, P.; Cantoro, R.; De Sio, C.; Foscale, T.; Gavarini, G.; Guerrero, J.; Huch, M.; Iaria, G.; Kilian, T.; Mariani, R.; Martone, R.; Ruospo, A.; Sanchez, E.; Schlichtmann, U.; Squillero, G.; Sonza Reorda, M.; Sterpone, L.; Tancorre, V.; Ugioli, R.. - (2022), pp. 1-10. (Intervento presentato al convegno 2022 IEEE European Test Symposium (ETS) tenutosi a Barcelona (Spain) nel 23-27 May 2022) [10.1109/ETS54262.2022.9810388]. 1-gen-2022 F. AngioneN. BellarminoP. BernardiR. CantoroC. De SioT. FoscaleG. GavariniJ. GuerreroG. IariaR. MarianiA. RuospoG. SquilleroM. Sonza ReordaL. Sterpone + 2022_ETS_SpecialSession.pdfTest_Reliability_and_Functional_Safety_Trends_for_Automotive_System-on-Chip.pdf
A Benchmark Suite of RT-level Hardware Trojansfor Pipelined Microprocessor Cores / Damljanovic, Aleksa; Ruospo, Annachiara; Sanchez Sanchez, Ernesto; Squillero, Giovanni. - ELETTRONICO. - (2021). (Intervento presentato al convegno 24th IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS) tenutosi a Vienna, Austria nel April 7-9). 1-gen-2021 Damljanovic, AleksaRuospo, AnnachiaraSanchez Sanchez, ErnestoSquillero, Giovanni Trojan2021_DDECS_.pdf
Exploiting Active Learning for Microcontroller Performance Prediction / Bellarmino, Nicolo; Cantoro, Riccardo; Huch, Martin; Kilian, Tobias; Martone, Raffaele; Schlichtmann, Ulf; Squillero, Giovanni. - ELETTRONICO. - (2021), pp. 1-4. (Intervento presentato al convegno 2021 IEEE European Test Symposium nel 24-28 May 2021) [10.1109/ETS50041.2021.9465472]. 1-gen-2021 Bellarmino, NicoloCantoro, RiccardoSquillero, Giovanni + ETS21___Speed_Monitors__Camera_ready.pdfExploiting_Active_Learning_for_Microcontroller_Performance_Prediction.pdf
Exploiting Artificial Swarms for the Virtual Measurement of Backlash in Industrial Robots / Squillero, Giovanni; Giovannitti, Eliana; Tonda, Alberto; Nabavi, Sayyidshahab. - ELETTRONICO. - (2021), pp. 1743-1750. (Intervento presentato al convegno IEEE Congress on Evolutionary Computation 2021 tenutosi a Kraków, Poland nel 28 June 2021 - 01 July 2021) [10.1109/CEC45853.2021.9504962]. 1-gen-2021 Squillero, GiovanniGiovannitti, ElianaTonda,Alberto + 2021078038.pdfExploiting_Artificial_Swarms_for_the_Virtual_Measurement_of_Backlash_in_Industrial_Robots.pdf
Smart techniques for flying-probe testing / Calabrese, A.; Quer, S.; Squillero, G.. - ELETTRONICO. - (2021), pp. 285-293. (Intervento presentato al convegno 16th International Conference on Software Technologies, ICSOFT 2021 nel 2021) [10.5220/0010582302850293]. 1-gen-2021 Calabrese A.Quer S.Squillero G. icsoft2021.pdf
Evolutionary algorithms and machine learning: Synergies, Challenges and Opportunities / Squillero, G.; Tonda, A.. - STAMPA. - (2020), pp. 1190-1205. (Intervento presentato al convegno 2020 Genetic and Evolutionary Computation Conference, GECCO 2020 tenutosi a mex nel 2020) [10.1145/3377929.3389863]. 1-gen-2020 Squillero G. + 3377929.3389863.pdf
Generating Neural Archetypes to Instruct Fast and Interpretable Decisions / Barbiero, Pietro; Ciravegna, Gabriele; Cirrincione, Giansalvo; Tonda, Alberto; Squillero, Giovanni. - STAMPA. - 1009:(2020), pp. 45-52. (Intervento presentato al convegno The International Conference on Decision Economics) [10.1007/978-3-030-38227-8_6]. 1-gen-2020 Ciravegna, GabrieleSquillero, Giovanni + 2019 decon.pdfGenerating_Neural_Archetypes_to_Instruct_Fast_and_Interpretable_Decisions.pdf
Machine Learning based Performance Prediction of Microcontrollers using Speed Monitors / Cantoro, Riccardo; Huch, Martin; Kilian, Tobias; Martone, Raffaele; Schlichtmann, Ulf; Squillero, Giovanni. - ELETTRONICO. - (2020), pp. 1-5. (Intervento presentato al convegno IEEE International Test Conference tenutosi a Washington, DC, USA nel 1-6 Nov. 2020) [10.1109/ITC44778.2020.9325253]. 1-gen-2020 Cantoro, RiccardoSquillero, Giovanni + ITC2020_paper_81.pdf
Theory and practice of population diversity in evolutionary computation / Sudholt, D.; Squillero, G.. - (2020), pp. 975-992. (Intervento presentato al convegno 2020 Genetic and Evolutionary Computation Conference, GECCO 2020 tenutosi a mex nel 2020) [10.1145/3377929.3389892]. 1-gen-2020 Squillero G. + 3377929.3389892.pdf