Archivio Istituzionale della RicercaSQUILLERO, GIOVANNI
SQUILLERO, GIOVANNI
Dipartimento di Automatica e Informatica
003584
In-Context Learning for Microcontroller Performance Screening Using Tabular Foundation Models
In corso di stampa Bellarmino, Nicolò; Cantoro, Riccardo; Huch, Martin; Kilian, Tobias; Squillero, Giovanni
Transfer Learning in MCU Performance Screening
In corso di stampa Bellarmino, Nicolo; Cantoro, Riccardo; Huch, Martin; Kilian, Tobias; Schlichtmann, Ulf; Squillero, Giovanni
Deconvolution of Mass Spectra Through Particle Swarm Optimization: An Industrial Experience
2026 Correale, Raffaele; Lutton, Evelyne; Mongardi, Giorgio; Squillero, Giovanni; Todino, Raffaella; Tonda, Alberto
Grouped Feature Selection for SMONs Placement in MCU Performance Screening
2025 Bellarmino, Nicolò; Cantoro, Riccardo; Huch, Martin; Kilian, Tobias; Squillero, Giovanni
Investigating on Gradient Regularization for Testing Neural Networks
2025 Bellarmino, Nicolo; Bosio, Alberto; Cantoro, Riccardo; Ruospo, Annachiara; Sanchez, Ernesto; Squillero, Giovanni
Byron: A Fuzzer for Turing-complete Test Programs
2024 Squillero, Giovanni; Tonda, Alberto; Masetta, Dimitri; Sacchet, Marco
Embedded Feature Selection in MCU Performance Screening
2024 Bellarmino, Nicolo'; Cantoro, Riccardo; Huch, Martin; Kilian, Tobias; Schlichtmann, Ulf; Squillero, Giovanni
Towards an Evolutionary Approach for Exploting Core Knowledge in Artificial Intelligence
2024 Calabrese, Andrea; Quer, Stefano; Squillero, Giovanni; Tonda, Alberto
U-FLEX: Unsupervised Feature Learning with Evolutionary eXploration
2024 Bellarmino, Nicolo’; Cantoro, Riccardo; Squillero, Giovanni
Enabling Inter-Product Transfer Learning on MCU Performance Screening
2023 Bellarmino, Nicolo; Cantoro, Riccardo; Huch, Martin; Kilian, Tobias; Schlichtmann, Ulf; Squillero, Giovanni
Feature Selection for Cost Reduction in MCU Performance Screening
2023 Bellarmino, Nicolo'; Cantoro, Riccardo; Huch, Martin; Kilian, Tobias; Schlichtmann, Ulf; Squillero, Giovanni
Semi-Supervised Deep Learning for Microcontroller Performance Screening
2023 Bellarmino, Nicolo; Cantoro, Riccardo; Huch, Martin; Kilian, Tobias; Schlichtmann, Ulf; Squillero, Giovanni
Towards Evolutionary Control Laws for Viability Problems
2023 Tonda, Alberto; Alvarez, Isabelle; Martin, Sophie; Squillero, Giovanni; Lutton, Evelyne
Microcontroller Performance Screening: Optimizing the Characterization in the Presence of Anomalous and Noisy Data
2022 Bellarmino, Nicolo'; Cantoro, Riccardo; Huch, Martin; Kilian, Tobias; Schlichtmann, Ulf; Squillero, Giovanni
Predictable Features Elimination: An Unsupervised Approach to Feature Selection
2022 Barbiero, Pietro; Squillero, Giovanni; Tonda, Alberto
Public-Private Partnership: Evolutionary Algorithms as a Solution to Information Asymmetry
2022 Pellegrino, Simone; Rebuglio, Massimo; Squillero, Giovanni
Social Influence Analysis (SIA) in Online Social Networks
2022 Leszkiewicz, Agata; Bucur, Doina; Grimme, Christian; Michalski, Radoslaw; Clever, Lena; Pohl, Janina; Rook, Jeroen; Bossek, Jakob; Preuss, Mike; Squillero, Giovanni; Quer, Stefano; Calabrese, Andrea; Iacca, Giovanni; Kizgin, Hatice; Trautmann, Heike
Test, Reliability and Functional Safety trends for Automotive System-on-Chip
2022 Angione, F.; Appello, D.; Aribido, J.; Bellarmino, N.; Bernardi, P.; Cantoro, R.; De Sio, C.; Foscale, T.; Gavarini, G.; Huch, M.; Kilian, T; Mariani, R.; Martone, R.; Ruospo, A.; Sanchez, E.; Schlichtmann, U.; Squillero, G.; Sonza Reorda, M.; Sterpone, L.; Tancorre, V.; Ugioli, R.
Test, Reliability and Functional Safety Trends for Automotive System-on-Chip
2022 Angione, F.; Appello, D.; Aribido, J.; Athavale, J.; Bellarmino, N.; Bernardi, P.; Cantoro, R.; De Sio, C.; Foscale, T.; Gavarini, G.; Guerrero, J.; Huch, M.; Iaria, G.; Kilian, T.; Mariani, R.; Martone, R.; Ruospo, A.; Sanchez, E.; Schlichtmann, U.; Squillero, G.; Sonza Reorda, M.; Sterpone, L.; Tancorre, V.; Ugioli, R.
A Benchmark Suite of RT-level Hardware Trojansfor Pipelined Microprocessor Cores
2021 Damljanovic, Aleksa; Ruospo, Annachiara; Sanchez Sanchez, Ernesto; Squillero, Giovanni
| Citazione | Data di pubblicazione | Autori | File |
|---|---|---|---|
| In-Context Learning for Microcontroller Performance Screening Using Tabular Foundation Models / Bellarmino, Nicolò; Cantoro, Riccardo; Huch, Martin; Kilian, Tobias; Squillero, Giovanni. - ELETTRONICO. - (In corso di stampa). ( 28th Euromicro Conference Series on Digital System Design (DSD) 2025 Salerno (IT) 10-12 September, 2025). | In corso di stampa | Nicolò BellarminoRiccardo CantoroGiovanni Squillero + | 2025_DSD_Foundation_Models (2).pdf |
| Transfer Learning in MCU Performance Screening / Bellarmino, N., Cantoro, R., Huch, M., Kilian, T., Schlichtmann, U., Squillero, G.. - ELETTRONICO. - (In corso di stampa). (IEEE International Test Conference (ITC 2023) Anaheim, CA 92802, Stati Uniti 8-13 Ottobre 2023). | In corso di stampa | Bellarmino, NicoloCantoro, RiccardoSquillero, Giovanni + | 2023_XXX_Transfer_Learning_POSTER (5).pdf |
| Deconvolution of Mass Spectra Through Particle Swarm Optimization: An Industrial Experience / Correale, R., Lutton, E., Mongardi, G., Squillero, G., Todino, R., Tonda, A.. - 16525:(2026), pp. 422-437. (29th European Conference, Evo Applications, EvoStar 2026 Toulouse (FR) April 8–10, 2026) [10.1007/978-3-032-23607-4_26]. | 1-gen-2026 | Mongardi, GiorgioSquillero, GiovanniTonda, Alberto + | _EvoSTAR_2026__Deconvolution_camera_ready.pdf; 978-3-032-23607-4_26.pdf |
| Grouped Feature Selection for SMONs Placement in MCU Performance Screening / Bellarmino, N., Cantoro, R., Huch, M., Kilian, T., Squillero, G.. - (2025), pp. 1-6. (2025 IEEE 26th Latin American Test Symposium (LATS) San Andrés (COL) 11-14 March 2025) [10.1109/lats65346.2025.10963942]. | 1-gen-2025 | Bellarmino, NicolòCantoro, RiccardoSquillero, Giovanni + | 2024_LATS_GROUP_LASSO_TPAM_SEL (1).pdf; Grouped_Feature_Selection_for_SMONs_Placement_in_MCU_Performance_Screening.pdf |
| Investigating on Gradient Regularization for Testing Neural Networks / Bellarmino, N., Bosio, A., Cantoro, R., Ruospo, A., Sanchez, E., Squillero, G.. - ELETTRONICO. - 15509:(2025), pp. 67-81. (10th International Conference on machine Learning, Optimization and Data science (LOD 2024) Castiglione della Pescaia (ITA) September 22 – 25, 2024) [10.1007/978-3-031-82484-5_6]. | 1-gen-2025 | Bellarmino, NicoloBosio, AlbertoCantoro, RiccardoRuospo, AnnachiaraSanchez, ErnestoSquillero, Giovanni | 2024_LOD_GRADIENT_PENALIZATION.pdf; 978-3-031-82484-5_6.pdf |
| Byron: A Fuzzer for Turing-complete Test Programs / Squillero, G., Tonda, A., Masetta, D., Sacchet, M.. - STAMPA. - (2024), pp. 1691-1694. (GECCO '24 Companion: Genetic and Evolutionary Computation Conference Companion Melbourne, VIC (AUS) July 14 - 18, 2024) [10.1145/3638530.3664136]. | 1-gen-2024 | Squillero, GiovanniTonda, AlbertoSacchet, Marco + | 3638530.3664136.pdf |
| Embedded Feature Selection in MCU Performance Screening / Bellarmino, N., Cantoro, R., Huch, M., Kilian, T., Schlichtmann, U., Squillero, G.. - (2024), pp. 1-6. (IEEE 2nd International conference on Design, Test & Technology of Integrated Systems Aix-en-Provence (FRA) October 14th -16th 2024) [10.1109/DTTIS62212.2024.10780418]. | 1-gen-2024 | Nicolo' BellarminoRiccardo CantoroGiovanni Squillero + | 2024_DTTIS_EMBEDDED_Feature_Selection (1).pdf; Embedded_Feature_Selection_in_MCU_Performance_Screening.pdf |
| Towards an Evolutionary Approach for Exploting Core Knowledge in Artificial Intelligence / Calabrese, A., Quer, S., Squillero, G., Tonda, A.. - ELETTRONICO. - (2024), pp. 259-262. (GECCO 2024: The Genetic and Evolutionary Computation Conference Melbourne, VIC (AUS) July 14 - 18, 2024) [10.1145/3638530.3654230]. | 1-gen-2024 | Calabrese, AndreaQuer, StefanoSquillero, GiovanniTonda, Alberto | gecco_main.pdf; 3638530.3654230.pdf |
| U-FLEX: Unsupervised Feature Learning with Evolutionary eXploration / Bellarmino, N., Cantoro, R., Squillero, G.. - ELETTRONICO. - 14505:(2024), pp. 364-378. (The 9th International Conference on Machine Learning, Optimization, and Data Science (LOD 2023) Grasmere, Lake District, England (UK) September 22 – 26, 2023) [10.1007/978-3-031-53969-5_27]. | 1-gen-2024 | Nicolo’ BellarminoRiccardo CantoroGiovanni Squillero | 2023_LOD_Genetic_Feature_Selection (2).pdf; 978-3-031-53969-5_27.pdf |
| Enabling Inter-Product Transfer Learning on MCU Performance Screening / Bellarmino, N., Cantoro, R., Huch, M., Kilian, T., Schlichtmann, U., Squillero, G.. - ELETTRONICO. - (2023), pp. 1-6. (IEEE 32nd Asian Test Symposium Beijing (China) 14-17 October 2023) [10.1109/ATS59501.2023.10317992]. | 1-gen-2023 | Bellarmino, NicoloCantoro, RiccardoSquillero, Giovanni + | 2023_ATS_Transfer_Learning (4) (1).pdf; Enabling_Inter-Product_Transfer_Learning_on_MCU_Performance_Screening.pdf |
| Feature Selection for Cost Reduction in MCU Performance Screening / Bellarmino, N., Cantoro, R., Huch, M., Kilian, T., Schlichtmann, U., Squillero, G.. - (2023), pp. 1-6. (24th IEEE Latin-American Test Symposium (LATS) Veracruz (MEX) 21-24 Marzo 2023) [10.1109/LATS58125.2023.10154495]. | 1-gen-2023 | Bellarmino, Nicolo'Cantoro, RiccardoSquillero, Giovanni + | 2023_LATS_Feature_Selection.pdf; Feature_Selection_for_Cost_Reduction_In_MCU_Performance_Screening.pdf |
| Semi-Supervised Deep Learning for Microcontroller Performance Screening / Bellarmino, N., Cantoro, R., Huch, M., Kilian, T., Schlichtmann, U., Squillero, G.. - (2023), pp. 1-6. (2023 IEEE European Test Symposium (ETS) Venezia (IT) 22-26 May 2023) [10.1109/ETS56758.2023.10174083]. | 1-gen-2023 | Bellarmino, NicoloCantoro, RiccardoSquillero, Giovanni + | 2023_ETS_Semi_Supersived_Learning (2).pdf; Semi-Supervised_Deep_Learning_for_Microcontroller_Performance_Screening.pdf |
| Towards Evolutionary Control Laws for Viability Problems / Tonda, A., Alvarez, I., Martin, S., Squillero, G., Lutton, E.. - (2023), pp. 1464-1472. (GECCO'23 Lisbon (Portugal) July 15 - 19, 2023) [10.1145/3583131.3590415]. | 1-gen-2023 | Tonda, AlbertoSquillero, Giovanni + | gecco_compressed.pdf |
| Microcontroller Performance Screening: Optimizing the Characterization in the Presence of Anomalous and Noisy Data / Bellarmino, N., Cantoro, R., Huch, M., Kilian, T., Schlichtmann, U., Squillero, G.. - (2022). (IEEE International Symposium on On-Line Testing and Robust System 2022 Torino 12-14 September 2022) [10.1109/IOLTS56730.2022.9897769]. | 1-gen-2022 | Bellarmino,Nicolo'Cantoro,RiccardoSquillero,Giovanni + | Microcontroller_Performance_Screening_Optimizing_the_Characterization_in_the_Presence_of_Anomalous_and_Noisy_Data.pdf; 2022_IOLTS_Outlier_Detection_.pdf |
| Predictable Features Elimination: An Unsupervised Approach to Feature Selection / Barbiero, P., Squillero, G., Tonda, A.. - STAMPA. - 13163:(2022), pp. 399-412. (LOD 2021: Machine Learning, Optimization, and Data Science ) [10.1007/978-3-030-95467-3_29]. | 1-gen-2022 | Squillero, Giovanni + | 2021_LOD___Predictable_Feature_Elimination__take_3_.pdf; 2022 lod.pdf |
| Public-Private Partnership: Evolutionary Algorithms as a Solution to Information Asymmetry / Pellegrino, S., Rebuglio, M., Squillero, G.. - STAMPA. - 13224:(2022), pp. 110-123. (EvoApplications 2022: Applications of Evolutionary Computation ) [10.1007/978-3-031-02462-7_8]. | 1-gen-2022 | Rebuglio, MassimoSquillero, Giovanni + | Pellegrino2022_Chapter_Public-PrivatePartnershipEvolu.pdf |
| Social Influence Analysis (SIA) in Online Social Networks / Leszkiewicz, A., Bucur, D., Grimme, C., Michalski, R., Clever, L., Pohl, J., Rook, J., Bossek, J., Preuss, M., Squillero, G., Quer, S., Calabrese, A., Iacca, G., Kizgin, H., Trautmann, H.. - ELETTRONICO. - (2022), pp. 1-2. (MISDOOM 2022 Boise, Idaho (USA) 11-12 October 2022). | 1-gen-2022 | Giovanni SquilleroStefano QuerAndrea Calabrese + | Extended_Abstract_Social_Influence_Analysis.pdf |
| Test, Reliability and Functional Safety trends for Automotive System-on-Chip / Angione, F.; Appello, D.; Aribido, J.; Bellarmino, N.; Bernardi, P.; Cantoro, R.; De Sio, C.; Foscale, T.; Gavarini, G.; Huch, M.; Kilian, T; Mariani, R.; Martone, R.; Ruospo, A.; Sanchez, E.; Schlichtmann, U.; Squillero, G.; Sonza Reorda, M.; Sterpone, L.; Tancorre, V.; Ugioli, R.. - ELETTRONICO. - (2022). (Intervento presentato al convegno 2022 IEEE European Test Symposium (ETS) tenutosi a Barcelona (ESP) nel 23-27 May 2022) [10.1109/ETS54262.2022.9810388]. | 1-gen-2022 | F. AngioneN. BellarminoP. BernardiR. CantoroC. de SioT. FoscaleG. GavariniA. RuospoE. SanchezG. SquilleroM. Sonza ReordaL. Sterpone + | 01_ETS_special_session_ABSTRACT.pdf; Test_Reliability_and_Functional_Safety_Trends_for_Automotive_System-on-Chip.pdf |
| Test, Reliability and Functional Safety Trends for Automotive System-on-Chip / Angione, F., Appello, D., Aribido, J., Athavale, J., Bellarmino, N., Bernardi, P., Cantoro, R., De Sio, C., Foscale, T., Gavarini, G., Guerrero, J., Huch, M., Iaria, G., Kilian, T., Mariani, R., Martone, R., Ruospo, A., Sanchez, E., Schlichtmann, U., Squillero, G., et al.. - (2022), pp. 1-10. (2022 IEEE European Test Symposium (ETS) Barcelona (Spain) 23-27 May 2022) [10.1109/ETS54262.2022.9810388]. | 1-gen-2022 | F. AngioneN. BellarminoP. BernardiR. CantoroC. De SioT. FoscaleG. GavariniJ. GuerreroG. IariaR. MarianiA. RuospoG. SquilleroM. Sonza ReordaL. Sterpone + | 2022_ETS_SpecialSession.pdf; Test_Reliability_and_Functional_Safety_Trends_for_Automotive_System-on-Chip.pdf |
| A Benchmark Suite of RT-level Hardware Trojansfor Pipelined Microprocessor Cores / Damljanovic, A., Ruospo, A., Sanchez Sanchez, E., Squillero, G.. - ELETTRONICO. - (2021). (24th IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS) Vienna, Austria April 7-9). | 1-gen-2021 | Damljanovic, AleksaRuospo, AnnachiaraSanchez Sanchez, ErnestoSquillero, Giovanni | Trojan2021_DDECS_.pdf |