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SQUILLERO, GIOVANNI

SQUILLERO, GIOVANNI  

Dipartimento di Automatica e Informatica  

003584  

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Transfer Learning in MCU Performance Screening / Bellarmino, Nicolo; Cantoro, Riccardo; Huch, Martin; Kilian, Tobias; Schlichtmann, Ulf; Squillero, Giovanni. - ELETTRONICO. - (In corso di stampa). (Intervento presentato al convegno IEEE International Test Conference (ITC 2023) tenutosi a Anaheim, CA 92802, Stati Uniti nel 8-13 Ottobre 2023). In corso di stampa Bellarmino, NicoloCantoro, RiccardoSquillero, Giovanni + 2023_XXX_Transfer_Learning_POSTER (5).pdf
COSMO: COmpressed Sensing for Models and logging Optimization in MCU Performance Screening / Bellarmino, Nicolò; Cantoro, Riccardo; Fosson, Sophie M.; Huch, Martin; Kilian, Tobias; Schlichtmann, Ulf; Squillero, Giovanni. - In: IEEE TRANSACTIONS ON COMPUTERS. - ISSN 0018-9340. - 74:2(2025), pp. 652-664. [10.1109/tc.2024.3500378] 1-gen-2025 Bellarmino, NicolòCantoro, RiccardoFosson, Sophie M.Squillero, Giovanni + 2023_XXX_Compress_Sensing_Journal_Paper (2).pdf; COSMO_COmpressed_Sensing_for_Models_and_Logging_Optimization_in_MCU_Performance_Screening.pdf
Deep Learning Strategies for Labeling and Accuracy Optimization in Microcontroller Performance Screening / Bellarmino, Nicolò; Cantoro, Riccardo; Huch, Martin; Kilian, Tobias; Schlichtmann, Ulf; Squillero, Giovanni. - In: IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS. - ISSN 0278-0070. - ELETTRONICO. - 44:2(2025), pp. 641-654. [10.1109/tcad.2024.3436542] 1-gen-2025 Bellarmino, NicolòCantoro, RiccardoSquillero, Giovanni + 2024_TCAD_Transfer_Learning_Paper.pdf; Deep_Learning_Strategies_for_Labeling_and_Accuracy_Optimization_in_Microcontroller_Performance_Screening.pdf
Flying-Probe Testing: A Trajectory Planner and a Benchmark Suite / Calabrese, Andrea; Quer, Stefano; Squillero, Giovanni. - In: IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS. - ISSN 0278-0070. - STAMPA. - (2025), pp. 1-11. [10.1109/tcad.2025.3567012] 1-gen-2025 Calabrese, AndreaQuer, StefanoSquillero, Giovanni TCAD2025pp.pdf
Grouped Feature Selection for SMONs Placement in MCU Performance Screening / Bellarmino, Nicolò; Cantoro, Riccardo; Huch, Martin; Kilian, Tobias; Squillero, Giovanni. - (2025), pp. 1-6. (Intervento presentato al convegno 2025 IEEE 26th Latin American Test Symposium (LATS) tenutosi a San Andrés (COL) nel 11-14 March 2025) [10.1109/lats65346.2025.10963942]. 1-gen-2025 Bellarmino, NicolòCantoro, RiccardoSquillero, Giovanni + 2024_LATS_GROUP_LASSO_TPAM_SEL (1).pdf; Grouped_Feature_Selection_for_SMONs_Placement_in_MCU_Performance_Screening.pdf
Investigating on Gradient Regularization for Testing Neural Networks / Bellarmino, Nicolo; Bosio, Alberto; Cantoro, Riccardo; Ruospo, Annachiara; Sanchez, Ernesto; Squillero, Giovanni. - ELETTRONICO. - 15509:(2025), pp. 67-81. (Intervento presentato al convegno 10th International Conference on machine Learning, Optimization and Data science (LOD 2024) tenutosi a Castiglione della Pescaia (ITA) nel September 22 – 25, 2024) [10.1007/978-3-031-82484-5_6]. 1-gen-2025 Bellarmino, NicoloBosio, AlbertoCantoro, RiccardoRuospo, AnnachiaraSanchez, ErnestoSquillero, Giovanni 2024_LOD_GRADIENT_PENALIZATION.pdf; 978-3-031-82484-5_6.pdf
Byron: A Fuzzer for Turing-complete Test Programs / Squillero, Giovanni; Tonda, Alberto; Masetta, Dimitri; Sacchet, Marco. - STAMPA. - (2024), pp. 1691-1694. (Intervento presentato al convegno GECCO '24 Companion: Genetic and Evolutionary Computation Conference Companion tenutosi a Melbourne, VIC (AUS) nel July 14 - 18, 2024) [10.1145/3638530.3664136]. 1-gen-2024 Squillero, GiovanniTonda, AlbertoSacchet, Marco + 3638530.3664136.pdf
COVID-19 Detection from Exhaled Breath / Bellarmino, Nicolo'; Cantoro, Riccardo; Castelluzzo, Michele; Correale, Raffaele; Squillero, Giovanni; Bozzini, Giorgio; Castelletti, Francesco; Ciricugno, Carla; Dalla Gasperina, Daniela; Dentali, Francesco; Poggialini, Giovanni; Salerno, Piergiorgio; Stefanotaborelli,. - In: SCIENTIFIC REPORTS. - ISSN 2045-2322. - 14:(2024). [10.1038/s41598-024-74104-1] 1-gen-2024 Nicolo' BellarminoRiccardo CantoroGiovanni Squillero + SCIENTIFIC_REPORTS_REVIEW.pdf; Bellarmino_et_al-2024-Scientific_Reports.pdf
Embedded Feature Selection in MCU Performance Screening / Bellarmino, Nicolo'; Cantoro, Riccardo; Huch, Martin; Kilian, Tobias; Schlichtmann, Ulf; Squillero, Giovanni. - (2024), pp. 1-6. (Intervento presentato al convegno IEEE 2nd International conference on Design, Test & Technology of Integrated Systems tenutosi a Aix-en-Provence (FRA) nel October 14th -16th 2024) [10.1109/DTTIS62212.2024.10780418]. 1-gen-2024 Nicolo' BellarminoRiccardo CantoroGiovanni Squillero + 2024_DTTIS_EMBEDDED_Feature_Selection (1).pdf; Embedded_Feature_Selection_in_MCU_Performance_Screening.pdf
Towards an Evolutionary Approach for Exploting Core Knowledge in Artificial Intelligence / Calabrese, Andrea; Quer, Stefano; Squillero, Giovanni; Tonda, Alberto. - ELETTRONICO. - (2024), pp. 259-262. (Intervento presentato al convegno GECCO 2024: The Genetic and Evolutionary Computation Conference tenutosi a Melbourne, VIC (AUS) nel July 14 - 18, 2024) [10.1145/3638530.3654230]. 1-gen-2024 Calabrese, AndreaQuer, StefanoSquillero, GiovanniTonda, Alberto gecco_main.pdf; 3638530.3654230.pdf
U-FLEX: Unsupervised Feature Learning with Evolutionary eXploration / Bellarmino, Nicolo’; Cantoro, Riccardo; Squillero, Giovanni. - ELETTRONICO. - 14505:(2024), pp. 364-378. (Intervento presentato al convegno The 9th International Conference on Machine Learning, Optimization, and Data Science (LOD 2023) tenutosi a Grasmere, Lake District, England (UK) nel September 22 – 26, 2023) [10.1007/978-3-031-53969-5_27]. 1-gen-2024 Nicolo’ BellarminoRiccardo CantoroGiovanni Squillero 2023_LOD_Genetic_Feature_Selection (2).pdf; 978-3-031-53969-5_27.pdf
A Multi-Label Active Learning Framework for Microcontroller Performance Screening / Bellarmino, Nicolo; Cantoro, Riccardo; Huch, Martin; Kilian, Tobias; Martone, Raffaele; Schlichtmann, Ulf; Squillero, Giovanni. - In: IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS. - ISSN 0278-0070. - 42:10(2023), pp. 3436-3449. [10.1109/TCAD.2023.3245989] 1-gen-2023 Bellarmino, NicoloCantoro, RiccardoMartone, RaffaeleSquillero, Giovanni + post-print.pdf; A_Multilabel_Active_Learning_Framework_for_Microcontroller_Performance_Screening.pdf
A Real-Time Novelty Recognition Framework Based on Machine Learning for Fault Detection / Albertin, Umberto; Pedone, Giuseppe; Brossa, Matilde; Squillero, Giovanni; Chiaberge, Marcello. - In: ALGORITHMS. - ISSN 1999-4893. - STAMPA. - 16:61(2023), pp. 1-26. [10.3390/a16020061] 1-gen-2023 Albertin, UmbertoPedone, GiuseppeBrossa, MatildeSquillero, GiovanniChiaberge, Marcello -
Enabling Inter-Product Transfer Learning on MCU Performance Screening / Bellarmino, Nicolo; Cantoro, Riccardo; Huch, Martin; Kilian, Tobias; Schlichtmann, Ulf; Squillero, Giovanni. - ELETTRONICO. - (2023), pp. 1-6. (Intervento presentato al convegno IEEE 32nd Asian Test Symposium tenutosi a Beijing (China) nel 14-17 October 2023) [10.1109/ATS59501.2023.10317992]. 1-gen-2023 Bellarmino, NicoloCantoro, RiccardoSquillero, Giovanni + 2023_ATS_Transfer_Learning (4) (1).pdf; Enabling_Inter-Product_Transfer_Learning_on_MCU_Performance_Screening.pdf
Feature Selection for Cost Reduction in MCU Performance Screening / Bellarmino, Nicolo'; Cantoro, Riccardo; Huch, Martin; Kilian, Tobias; Schlichtmann, Ulf; Squillero, Giovanni. - (2023), pp. 1-6. (Intervento presentato al convegno 24th IEEE Latin-American Test Symposium (LATS) tenutosi a Veracruz (MEX) nel 21-24 Marzo 2023) [10.1109/LATS58125.2023.10154495]. 1-gen-2023 Bellarmino, Nicolo'Cantoro, RiccardoSquillero, Giovanni + 2023_LATS_Feature_Selection.pdf; Feature_Selection_for_Cost_Reduction_In_MCU_Performance_Screening.pdf
Semi-Supervised Deep Learning for Microcontroller Performance Screening / Bellarmino, Nicolo; Cantoro, Riccardo; Huch, Martin; Kilian, Tobias; Schlichtmann, Ulf; Squillero, Giovanni. - (2023), pp. 1-6. (Intervento presentato al convegno 2023 IEEE European Test Symposium (ETS) tenutosi a Venezia (IT) nel 22-26 May 2023) [10.1109/ETS56758.2023.10174083]. 1-gen-2023 Bellarmino, NicoloCantoro, RiccardoSquillero, Giovanni + 2023_ETS_Semi_Supersived_Learning (2).pdf; Semi-Supervised_Deep_Learning_for_Microcontroller_Performance_Screening.pdf
Towards Evolutionary Control Laws for Viability Problems / Tonda, Alberto; Alvarez, Isabelle; Martin, Sophie; Squillero, Giovanni; Lutton, Evelyne. - (2023), pp. 1464-1472. (Intervento presentato al convegno GECCO'23 tenutosi a Lisbon (Portugal) nel July 15 - 19, 2023) [10.1145/3583131.3590415]. 1-gen-2023 Tonda, AlbertoSquillero, Giovanni + gecco_compressed.pdf
Veni, Vidi, Evolvi (commentary on W. B. Langdon’s "Jaws 30") / Squillero, Giovanni; Tonda, Alberto. - In: GENETIC PROGRAMMING AND EVOLVABLE MACHINES. - ISSN 1389-2576. - 24:(2023), pp. 1-4. [10.1007/s10710-023-09472-0] 1-gen-2023 Giovanni SquilleroAlberto Tonda s10710-023-09472-0.pdf
A Virtual Sensor for Backlash in Robotic Manipulators / Giovannitti, Eliana; Nabavi, Sayyidshahab; Squillero, Giovanni; Tonda, Alberto. - In: JOURNAL OF INTELLIGENT MANUFACTURING. - ISSN 0956-5515. - STAMPA. - 33:(2022), pp. 1921-1937. [10.1007/s10845-022-01934-z] 1-gen-2022 Eliana GiovannittiGiovanni Squillero + Giovannitti_et_al-2022-Journal_of_Intelligent_Manufacturing.pdf
Machine Learning for Hardware Security: Classifier-based Identification of Trojans in Pipelined Microprocessors / Damljanovic, Aleksa; Ruospo, Annachiara; Sanchez, Ernesto; Squillero, Giovanni. - In: APPLIED SOFT COMPUTING. - ISSN 1568-4946. - ELETTRONICO. - 116:(2022), pp. 1-16. [10.1016/j.asoc.2021.108068] 1-gen-2022 Aleksa DamljanovicAnnachiara RuospoErnesto SanchezGiovanni Squillero HT_ML_Elsevier.pdf; 1-s2.0-S1568494621009753-main.pdf