Archivio Istituzionale della RicercaANGIONE, FRANCESCO
ANGIONE, FRANCESCO
Dipartimento di Automatica e Informatica
F. Angione
048119
Netlist-Independent Functional Stress Pattern generation strategy for AI HW Accelerators embedded into SoCs
2026 Filipponi, Gabriele; Schwachhofer, Denis; Angione, Francesco; Bertani, Claudia; Corbellini, Simone; Di Gruttola Giardino, Nicola; Garozzo, Giuseppe; Insinga, Giorgio; Tancorre, Vincenzo; Bernardi, Paolo
Software test libraries and real-time operating systems: A system integrator perspective
2026 Angione, Francesco; Bernardi, Paolo; Cantoro, Riccardo
A Novel Indirect Methodology based on Execution Traces for Grading Functional Test Programs
2025 Angione, Francesco; Bernardi, Paolo; Calabrese, Andrea; Cardone, Lorenzo; Quer, Stefano; Bertani, Claudia; Tancorre, Vincenzo
A System-Level Test Methodology for Communication Peripherals in System-on-Chips
2025 Angione, Francesco; Bernardi, Paolo; Di Gruttola Giardino, Nicola; Filipponi, Gabriele; Bertani, Claudia; Tancorre, Vincenzo
Automatic Generation of System-Level Test for Un-Core Logic of Large Automotive SoC
2025 Angione, Francesco; Bernardi, Paolo; Iaria, Giusy; Bertani, Claudia; Tancorre, Vincenzo
From Structural Test Escapes to Silent Data Errors: A preliminary analysis
2025 Angione, Francesco; Bernardi, Paolo; Sinha, Arani
Leveraging ATE to optimize System-Level-Test for Multicore Automotive SoCs
2025 Angione, Francesco; Bernardi, Paolo; Bertani, Claudia; Bertetto, Lorenzo; Cardone, Lorenzo; DI GRUTTOLA GIARDINO, Nicola; Quer, Stefano; Tancorre, Vincenzo
Special Session: Trustworthy Hardware-AI at the Cloud
2025 Angione, Francesco; Bernardi, Paolo; Bosio, Alberto; Dattatraya Dixit, Harish; Pappalardo, Salvatore; Ruospo, Annachiara; Sanchez, Ernesto; Sinha, Arani; Turco, Vittorio
System-Level Test techniques for Automotive SoCs
2025 Angione, Francesco
System-Level Test techniques for Automotive SoCs
2025 Angione, Francesco; Bernardi, Paolo; Cantoro, Riccardo
A Flexible FPGA-based Test Equipment for Enabling Out-of-Production Manufacturing Test Flow of Digital Systems
2024 Di Gruttola Giardino, Nicola; Angione, Francesco; Bernardi, Paolo; Foscale, Tommaso; Bertani And Vincenzo Tancorre, Claudia
Optimizing System-Level Test Program Generation via Genetic Programming
2024 Schwachhofer, D.; Angione, F.; Becker, S.; Wagner, S.; Sauer, M.; Bernardi, P.; Polian, I.
A guided debugger-based fault injection methodology for assessing functional test programs
2023 Angione, Francesco; Bernardi, Paolo; Di Gruttola Giardino, Nicola; Appello, Davide; Bertani, Claudia; Tancorre, Vincenzo
A Low-Cost Burn-In Tester Architecture to supply Effective Electrical Stress
2023 Angione, F.; Appello, D.; Bernardi, P.; Bertani, C.; Gallo, G.; Littardi, S.; Pollaccia, G.; Ruggeri, W.; Reorda, M. S.; Tancorre, V.; Ugioli, R.
A Toolchain to Quantify Burn-In Stress Effectiveness on large Automotive System-on-Chips
2023 Angione, Francesco; Appello, Davide; Bernardi, Paolo; Calabrese, Andrea; Quer, Stefano; SONZA REORDA, Matteo; Tancorre, Vincenzo; Ugioli, Roberto
On the integration and hardening of Software Test Libraries in Real-Time Operating Systems
2023 Angione, Francesco; Bernardi, Paolo; Cantoro, Riccardo; Di Gruttola Giardino, Nicola; Piumatti, Davide; Reorda, Matteo Sonza; Appello, Davide; Tancorre, Vincenzo
A novel Pattern Selection Algorithm to reduce the Test Cost of large Automotive Systems-on-Chip
2022 Iaria, Giusy; Angione, Francesco; Bernardi, Paolo; SONZA REORDA, Matteo; Davide, Appello; Giuseppe, Garozzo; Vincenzo, Tancorre
An innovative Strategy to Quickly Grade Functional Test Programs
2022 Angione, Francesco; Bernardi, Paolo; Calabrese, Andrea; Cardone, Lorenzo; Niccoletti, Alessandro; Piumatti, Davide; Quer, Stefano; Appello, Davide; Tancorre, Vincenzo; Ugioli, Roberto
An Optimized Burn-In Stress Flow targeting Interconnections logic to Embedded Memories in Automotive Systems-on-Chip
2022 Angione, Francesco; Bernardi, Paolo; Filipponi, Gabriele; SONZA REORDA, Matteo; Appello, Davide; Tancorre, Vincenzo; Ugioli, Roberto
Online scheduling of concurrent Memory BISTs execution at Real-Time Operating-System level
2022 Angione, Francesco; Bernardi, Paolo; Filipponi, Gabriele; Tempesta, Claudia; SONZA REORDA, Matteo; Appello, Davide; Ugioli, Roberto; Tancorre, Vincenzo
| Citazione | Data di pubblicazione | Autori | File |
|---|---|---|---|
| Netlist-Independent Functional Stress Pattern generation strategy for AI HW Accelerators embedded into SoCs / Filipponi, Gabriele; Schwachhofer, Denis; Angione, Francesco; Bertani, Claudia; Corbellini, Simone; Di Gruttola Giardino, Nicola; Garozzo, Giuseppe; Insinga, Giorgio; Tancorre, Vincenzo; Bernardi, Paolo. - In: IEEE TRANSACTIONS ON COMPUTERS. - ISSN 1557-9956. - 75:2(2026), pp. 554-566. | 1-gen-2026 | Gabriele FilipponiFrancesco AngioneSimone CorbelliniNicola di Gruttola GiardinoGiorgio InsingaPaolo Bernardi + | Netlist-Independent_Functional_Stress_Pattern_Generation_Strategy_for_AI_HW_Accelerators_Embedded_into_SoCs.pdf |
| Software test libraries and real-time operating systems: A system integrator perspective / Angione, F., Bernardi, P., Cantoro, R.. - In: JOURNAL OF SYSTEMS ARCHITECTURE. - ISSN 1383-7621. - 177:(2026). [10.1016/j.sysarc.2026.103854] | 1-gen-2026 | Angione, FrancescoBernardi, PaoloCantoro, Riccardo | main.pdf |
| A Novel Indirect Methodology based on Execution Traces for Grading Functional Test Programs / Angione, Francesco; Bernardi, Paolo; Calabrese, Andrea; Cardone, Lorenzo; Quer, Stefano; Bertani, Claudia; Tancorre, Vincenzo. - In: IEEE TRANSACTIONS ON COMPUTERS. - ISSN 0018-9340. - 74:11(2025), pp. 3582-3595. [10.1109/tc.2025.3600005] | 1-gen-2025 | Angione, FrancescoBernardi, PaoloCalabrese, AndreaCardone, LorenzoQuer, Stefano + | A_Novel_Indirect_Methodology_based_on_Execution_Traces_for_Grading_Functional_Test_Programs.pdf; A_Novel_Indirect_Methodology_Based_on_Execution_Traces_for_Grading_Functional_Test_Programs.pdf |
| A System-Level Test Methodology for Communication Peripherals in System-on-Chips / Angione, Francesco; Bernardi, Paolo; Di Gruttola Giardino, Nicola; Filipponi, Gabriele; Bertani, Claudia; Tancorre, Vincenzo. - In: IEEE TRANSACTIONS ON COMPUTERS. - ISSN 0018-9340. - 74:2(2025), pp. 731-739. [10.1109/TC.2024.3500375] | 1-gen-2025 | Francesco AngionePaolo BernardiNicola di Gruttola GiardinoGabriele Filipponi + | A_System-Level_Test_Methodology_for_Communication_Peripherals_in_System-on-Chips.pdf |
| Automatic Generation of System-Level Test for Un-Core Logic of Large Automotive SoC / Angione, Francesco; Bernardi, Paolo; Iaria, Giusy; Bertani, Claudia; Tancorre, Vincenzo. - In: IEEE TRANSACTIONS ON COMPUTERS. - ISSN 0018-9340. - 74:9(2025), pp. 3195-3209. [10.1109/tc.2025.3587515] | 1-gen-2025 | Angione, FrancescoBernardi, PaoloIaria, Giusy + | Automatic_Generation_of_System-Level_Test_for_Un-Core_Logic_of_Large_Automotive_SoC.pdf |
| From Structural Test Escapes to Silent Data Errors: A preliminary analysis / Angione, Francesco; Bernardi, Paolo; Sinha, Arani. - ELETTRONICO. - (2025). ( 2025 IEEE 9th International Test Conference India (ITC India) Bangalore (IND) 20-22 July 2025) [10.1109/ITCIndia66078.2025.11141623]. | 1-gen-2025 | Francesco AngionePaolo Bernardi + | From_Structural_Test_Escapes_to_Silent_Data_Errors_A_Preliminary_Analysis.pdf |
| Leveraging ATE to optimize System-Level-Test for Multicore Automotive SoCs / Angione, F., Bernardi, P., Bertani, C., Bertetto, L., Cardone, L., DI GRUTTOLA GIARDINO, N., Quer, S., Tancorre, V.. - (2025), pp. 1-6. (Latin American Test Symposium San Andres Islas, Colombia 11-14 March 2025) [10.1109/LATS65346.2025.10963947]. | 1-gen-2025 | Francesco AngionePaolo BernardiLorenzo BertettoLorenzo CardoneNicola Di Gruttola GiardinoStefano Quer + | Leveraging_ATE_to_Optimize_System-Level-Test_for_Multicore_Automotive_SoCs.pdf |
| Special Session: Trustworthy Hardware-AI at the Cloud / Angione, F., Bernardi, P., Bosio, A., Dattatraya Dixit, H., Pappalardo, S., Ruospo, A., Sanchez, E., Sinha, A., Turco, V.. - ELETTRONICO. - (2025). (IEEE VLSI Test Symposium 2025 Tempe, Arizona (USA) 28-30 April 2025) [10.1109/VTS65138.2025.11022869]. | 1-gen-2025 | Francesco AngionePaolo BernardiAnnachiara RuospoErnesto SanchezVittorio Turco + | VTS25___Special_Session.pdf; Special_Session_Trustworthy_Hardware-AI_at_the_Cloud.pdf |
| System-Level Test techniques for Automotive SoCs / Angione, Francesco. - (2025 Mar 21), pp. 1-222. [10.13121/polito/porto/2998587] | 21-mar-2025 | ANGIONE, FRANCESCO | conv_angione_tesi.pdf; conv_angione_summary.pdf |
| System-Level Test techniques for Automotive SoCs / Angione, F., Bernardi, P., Cantoro, R.. - (2025), pp. 568-577. (International Test Conference (ITC) San Diego, CA (USA) 20-26 September 2025) [10.1109/itc58126.2025.00093]. | 1-gen-2025 | Angione, FrancescoBernardi, PaoloCantoro, Riccardo | System-Level_Test_techniques_for_Automotive_SoCs.pdf |
| A Flexible FPGA-based Test Equipment for Enabling Out-of-Production Manufacturing Test Flow of Digital Systems / Di Gruttola Giardino, N., Angione, F., Bernardi, P., Foscale, T., Bertani And Vincenzo Tancorre, C.. - (2024). (International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFTS) Didcot (UK) 08-10 October 2024) [10.1109/DFT63277.2024.10753536]. | 1-gen-2024 | Nicola di Gruttola GiardinoFrancesco AngionePaolo BernardiTommaso Foscale + | A_Flexible_FPGA-Based_Test_Equipment_for_Enabling_Out-of-Production_Manufacturing_Test_Flow_of_Digital_Systems.pdf |
| Optimizing System-Level Test Program Generation via Genetic Programming / Schwachhofer, D., Angione, F., Becker, S., Wagner, S., Sauer, M., Bernardi, P., Polian, I.. - (2024). (2024 IEEE European Test Symposium (ETS) The Hague (NL) 20-24 May 2024) [10.1109/ETS61313.2024.10567817]. | 1-gen-2024 | Angione F.Bernardi P. + | Optimizing_System-Level_Test_Program_Generation_via_Genetic_Programming.pdf |
| A guided debugger-based fault injection methodology for assessing functional test programs / Angione, F., Bernardi, P., Di Gruttola Giardino, N., Appello, D., Bertani, C., Tancorre, V.. - (2023), pp. 1-7. (VLSI Test Symposium San Diego (USA) 24-26 April 2023) [10.1109/VTS56346.2023.10140099]. | 1-gen-2023 | Angione, FrancescoBernardi, PaoloDi Gruttola Giardino, Nicola + | A_guided_debugger-based_fault_injection_methodology_for_assessing_functional_test_programs.pdf |
| A Low-Cost Burn-In Tester Architecture to supply Effective Electrical Stress / Angione, F., Appello, D., Bernardi, P., Bertani, C., Gallo, G., Littardi, S., Pollaccia, G., Ruggeri, W., Reorda, M.S., Tancorre, V., Ugioli, R.. - In: IEEE TRANSACTIONS ON COMPUTERS. - ISSN 0018-9340. - (2023), pp. 1447-1459. [10.1109/TC.2022.3199994] | 1-gen-2023 | Angione F.Bernardi P.Littardi S.Ruggeri W.Reorda M. S. + | A_Low-Cost_Burn-In_Tester_Architecture_to_Supply_Effective_Electrical_Stress.pdf |
| A Toolchain to Quantify Burn-In Stress Effectiveness on large Automotive System-on-Chips / Angione, Francesco; Appello, Davide; Bernardi, Paolo; Calabrese, Andrea; Quer, Stefano; SONZA REORDA, Matteo; Tancorre, Vincenzo; Ugioli, Roberto. - In: IEEE ACCESS. - ISSN 2169-3536. - 11:(2023), pp. 105655-105676. [10.1109/ACCESS.2023.3316511] | 1-gen-2023 | Francesco AngionePaolo BernardiAndrea CalabreseStefano QuerMatteo Sonza Reorda + | A_Toolchain_to_Quantify_Burn-In_Stress_Effectiveness_on_Large_Automotive_System-on-Chips.pdf |
| On the integration and hardening of Software Test Libraries in Real-Time Operating Systems / Angione, F., Bernardi, P., Cantoro, R., Di Gruttola Giardino, N., Piumatti, D., Reorda, M.S., Appello, D., Tancorre, V.. - (2023), pp. 1-6. (Latin American Test Symposium Veracruz (Mexico) 21-24 March 2023) [10.1109/LATS58125.2023.10154492]. | 1-gen-2023 | Angione, FrancescoBernardi, PaoloCantoro, RiccardoDi Gruttola Giardino, NicolaPiumatti, DavideReorda, Matteo Sonza + | On_the_integration_and_hardening_of_Software_Test_Libraries_in_Real-Time_Operating_Systems.pdf |
| A novel Pattern Selection Algorithm to reduce the Test Cost of large Automotive Systems-on-Chip / Iaria, Giusy; Angione, Francesco; Bernardi, Paolo; SONZA REORDA, Matteo; Davide, Appello; Giuseppe, Garozzo; Vincenzo, Tancorre. - (2022). ( Latin American Test Symposium Montevideo (Uruguay) 05-08 September 2022) [10.1109/LATS57337.2022.9936975]. | 1-gen-2022 | Iaria GiusyFrancesco AngionePaolo BernardiMatteo Sonza Reorda + | A_novel_Pattern_Selection_Algorithm_to_reduce_the_Test_Cost_of_large_Automotive_Systems-on-Chip.pdf |
| An innovative Strategy to Quickly Grade Functional Test Programs / Angione, F., Bernardi, P., Calabrese, A., Cardone, L., Niccoletti, A., Piumatti, D., Quer, S., Appello, D., Tancorre, V., Ugioli, R.. - (2022), pp. 355-364. (International Test Conference Anaheim, CA (USA) 23-30 September 2022) [10.1109/ITC50671.2022.00044]. | 1-gen-2022 | Francesco AngionePaolo BernardiAndrea CalabreseLorenzo CardoneDavide PiumattiStefano Quer + | An_innovative_Strategy_to_Quickly_Grade_Functional_Test_Programs.pdf |
| An Optimized Burn-In Stress Flow targeting Interconnections logic to Embedded Memories in Automotive Systems-on-Chip / Angione, Francesco; Bernardi, Paolo; Filipponi, Gabriele; SONZA REORDA, Matteo; Appello, Davide; Tancorre, Vincenzo; Ugioli, Roberto. - (2022), pp. 1-6. ( IEEE European Test Symposium Barcelona (Spain) 23-27 May 2022) [10.1109/ETS54262.2022.9810396]. | 1-gen-2022 | Francesco ANGIONEPaolo BERNARDIGabriele FILIPPONIMatteo SONZA REORDA + | An_Optimized_Burn-In_Stress_Flow_targeting_Interconnections_logic_to_Embedded_Memories_in_Automotive_Systems-on-Chip.pdf |
| Online scheduling of concurrent Memory BISTs execution at Real-Time Operating-System level / Angione, F., Bernardi, P., Filipponi, G., Tempesta, C., SONZA REORDA, M., Appello, D., Ugioli, R., Tancorre, V.. - (2022). (International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems Austin (USA) 19-21 October 2022) [10.1109/DFT56152.2022.9962338]. | 1-gen-2022 | Francesco AngionePaolo BernardiGabriele FilipponiClaudia TempestaMatteo Sonza Reorda + | Online_scheduling_of_concurrent_Memory_BISTs_execution_at_Real-Time_Operating-System_level.pdf |