Archivio Istituzionale della RicercaANGIONE, FRANCESCO
ANGIONE, FRANCESCO
Dipartimento di Automatica e Informatica
F. Angione
048119
Netlist-Independent Functional Stress Pattern generation strategy for AI HW Accelerators embedded into SoCs
In corso di stampa Filipponi, Gabriele; Schwachhofer, Denis; Angione, Francesco; Bertani, Claudia; Corbellini, Simone; Di Gruttola Giardino, Nicola; Garozzo, Giuseppe; Insinga, Giorgio; Tancorre, Vincenzo; Bernardi, Paolo
A Novel Indirect Methodology based on Execution Traces for Grading Functional Test Programs
2025 Angione, Francesco; Bernardi, Paolo; Calabrese, Andrea; Cardone, Lorenzo; Quer, Stefano; Bertani, Claudia; Tancorre, Vincenzo
A System-Level Test Methodology for Communication Peripherals in System-on-Chips
2025 Angione, Francesco; Bernardi, Paolo; Di Gruttola Giardino, Nicola; Filipponi, Gabriele; Bertani, Claudia; Tancorre, Vincenzo
Automatic Generation of System-Level Test for Un-Core Logic of Large Automotive SoC
2025 Angione, Francesco; Bernardi, Paolo; Iaria, Giusy; Bertani, Claudia; Tancorre, Vincenzo
A Low-Cost Burn-In Tester Architecture to supply Effective Electrical Stress
2023 Angione, F.; Appello, D.; Bernardi, P.; Bertani, C.; Gallo, G.; Littardi, S.; Pollaccia, G.; Ruggeri, W.; Reorda, M. S.; Tancorre, V.; Ugioli, R.
A Toolchain to Quantify Burn-In Stress Effectiveness on large Automotive System-on-Chips
2023 Angione, Francesco; Appello, Davide; Bernardi, Paolo; Calabrese, Andrea; Quer, Stefano; SONZA REORDA, Matteo; Tancorre, Vincenzo; Ugioli, Roberto
| Citazione | Data di pubblicazione | Autori | File |
|---|---|---|---|
| Netlist-Independent Functional Stress Pattern generation strategy for AI HW Accelerators embedded into SoCs / Filipponi, Gabriele; Schwachhofer, Denis; Angione, Francesco; Bertani, Claudia; Corbellini, Simone; Di Gruttola Giardino, Nicola; Garozzo, Giuseppe; Insinga, Giorgio; Tancorre, Vincenzo; Bernardi, Paolo. - In: IEEE TRANSACTIONS ON COMPUTERS. - ISSN 1557-9956. - (In corso di stampa). | In corso di stampa | Gabriele FilipponiFrancesco AngioneSimone CorbelliniNicola di Gruttola GiardinoGiorgio InsingaPaolo Bernardi + | ToC_AMU_accept.pdf |
| A Novel Indirect Methodology based on Execution Traces for Grading Functional Test Programs / Angione, Francesco; Bernardi, Paolo; Calabrese, Andrea; Cardone, Lorenzo; Quer, Stefano; Bertani, Claudia; Tancorre, Vincenzo. - In: IEEE TRANSACTIONS ON COMPUTERS. - ISSN 0018-9340. - 74:11(2025), pp. 3582-3595. [10.1109/tc.2025.3600005] | 1-gen-2025 | Angione, FrancescoBernardi, PaoloCalabrese, AndreaCardone, LorenzoQuer, Stefano + | A_Novel_Indirect_Methodology_based_on_Execution_Traces_for_Grading_Functional_Test_Programs.pdf; A_Novel_Indirect_Methodology_Based_on_Execution_Traces_for_Grading_Functional_Test_Programs.pdf |
| A System-Level Test Methodology for Communication Peripherals in System-on-Chips / Angione, Francesco; Bernardi, Paolo; Di Gruttola Giardino, Nicola; Filipponi, Gabriele; Bertani, Claudia; Tancorre, Vincenzo. - In: IEEE TRANSACTIONS ON COMPUTERS. - ISSN 0018-9340. - 74:2(2025), pp. 731-739. [10.1109/TC.2024.3500375] | 1-gen-2025 | Francesco AngionePaolo BernardiNicola di Gruttola GiardinoGabriele Filipponi + | A_System-Level_Test_Methodology_for_Communication_Peripherals_in_System-on-Chips.pdf |
| Automatic Generation of System-Level Test for Un-Core Logic of Large Automotive SoC / Angione, Francesco; Bernardi, Paolo; Iaria, Giusy; Bertani, Claudia; Tancorre, Vincenzo. - In: IEEE TRANSACTIONS ON COMPUTERS. - ISSN 0018-9340. - 74:9(2025), pp. 3195-3209. [10.1109/tc.2025.3587515] | 1-gen-2025 | Angione, FrancescoBernardi, PaoloIaria, Giusy + | Automatic_Generation_of_System-Level_Test_for_Un-Core_Logic_of_Large_Automotive_SoC.pdf |
| A Low-Cost Burn-In Tester Architecture to supply Effective Electrical Stress / Angione, F.; Appello, D.; Bernardi, P.; Bertani, C.; Gallo, G.; Littardi, S.; Pollaccia, G.; Ruggeri, W.; Reorda, M. S.; Tancorre, V.; Ugioli, R.. - In: IEEE TRANSACTIONS ON COMPUTERS. - ISSN 0018-9340. - (2023), pp. 1447-1459. [10.1109/TC.2022.3199994] | 1-gen-2023 | Angione F.Bernardi P.Littardi S.Ruggeri W.Reorda M. S. + | A_Low-Cost_Burn-In_Tester_Architecture_to_Supply_Effective_Electrical_Stress.pdf |
| A Toolchain to Quantify Burn-In Stress Effectiveness on large Automotive System-on-Chips / Angione, Francesco; Appello, Davide; Bernardi, Paolo; Calabrese, Andrea; Quer, Stefano; SONZA REORDA, Matteo; Tancorre, Vincenzo; Ugioli, Roberto. - In: IEEE ACCESS. - ISSN 2169-3536. - 11:(2023), pp. 105655-105676. [10.1109/ACCESS.2023.3316511] | 1-gen-2023 | Francesco AngionePaolo BernardiAndrea CalabreseStefano QuerMatteo Sonza Reorda + | A_Toolchain_to_Quantify_Burn-In_Stress_Effectiveness_on_Large_Automotive_System-on-Chips.pdf |