GROSSO, MICHELANGELO

GROSSO, MICHELANGELO  

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Citazione Data di pubblicazione Autori File
Automatic Enhancement of Cell Models to Enable Conditional Stuck-at Fault Simulation and Pattern Generation / Khoshzaban, Reza; Deligiannis, Nikolaos I.; Guglielminetti, Iacopo; Grosso, Michelangelo; Cantoro, Riccardo. - (2026), pp. 1-6. ( 2026 IEEE 27th Latin American Test Symposium (LATS) Florianópolis (BRA) 17-20 March 2026) [10.1109/lats70329.2026.11480285]. 1-gen-2026 Khoshzaban, RezaGrosso, MichelangeloCantoro, Riccardo + _LATS2026__Automatic_Enhancement_of_Cell_Models_to_Enable_Conditional_Stuck_At_Fault_Simulation_and_Pattern_Generation.pdfAutomatic_Enhancement_of_Cell_Models_to_Enable_Conditional_Stuck-at_Fault_Simulation_and_Pattern_Generation.pdf
Exploiting the correlation with traditional fault models to speed-up cell-aware fault simulation / Khoshzaban, R., Guglielminetti, I., Grosso, M., Sonza Reorda, M., Cantoro, R.. - (2025), pp. 418-421. (International Test Conference San Diego, CA (USA) 20-26 September 2025) [10.1109/ITC58126.2025.00054]. 1-gen-2025 Reza KhoshzabanMichelangelo GrossoMatteo Sonza ReordaRiccardo Cantoro + Exploiting_the_correlation_with_traditional_fault_models_to_speed_up_cell_aware_faultsim_poster_ITC.pdfExploiting_the_correlation_with_traditional_fault_models_to_speed-up_cell-aware_fault_simulation.pdf
AMBEATion: Analog Mixed-Signal Back-End Design Automation with Machine Learning and Artificial Intelligence Techniques / Aliffi, G.E., Baixinho, J., Barri, D., Daghero, F., Di Carolo, N., Faraone, G., Grosso, M., Jahier Pagliari, D., Jakovenko, J., Janicek, V., Licastro, D., Melikyan, V., Risso, M., Romano, V., Serianni, E., Stastny, M., Vacula, P., Vitanza, G., Xie, C.. - ELETTRONICO. - (2024), pp. 1-6. (Design, Automation and Test in Europe Conference and Exhibition, DATE 2024 Valencia (ESP) 25-27 March 2024). 1-gen-2024 Daghero F.Grosso M.Jahier Pagliari D.Risso M.Xie C. + AMBEATion_Analog_Mixed-Signal_Back-End_Design_Automation_with_Machine_Learning_and_Artificial_Intelligence_Techniques.pdfAMBEATion___DATE_MPP.pdf
AMBEATion: New Algorithm for Generation IC Matched Structures with Respecting Linear and Non-linear Gradient Parameter Effects / Barri, D., Vacula, P., Kotě, V., Nemazal, J., Vacula, M., Jahier Pagliari, D., Daghero, F., Risso, M., Xie, C., Grosso, M.. - ELETTRONICO. - (2024), pp. 1-4. (International Conference on Applied Electronics Pilsen (CZ) 4-5 October 2024) [10.1109/ae61743.2024.10710229]. 1-gen-2024 Jahier Pagliari, DanieleDaghero, FrancescoRisso, MatteoGrosso, Michelangelo + AMBEATion_New_Algorithm_for_Generation_IC_Matched_Structures_with_Respecting_Linear_and_Non-linear_Gradient_Parameter_Effects.pdfAMBEATion_New_Algorithm_for_Generation_IC_Matched_Structures_with_Respecting_Linear_and_Non-linear_Gradient_Parameter_Effects_PostPrint.pdf
Assessing the Effectiveness of Software-Based Self-Test Programs for Static Cell-Aware Test / Cantoro, R., Grosso, M., Guglielminetti, I., Khoshzaban, R., Reorda, M.S.. - (2024). (2024 IEEE European Test Symposium (ETS) The Hague (NL) 20-24 May 2024) [10.1109/ets61313.2024.10567198]. 1-gen-2024 Cantoro, RiccardoGrosso, MichelangeloKhoshzaban, RezaReorda, Matteo Sonza + _ETS_2024__Assessing_the_Effectiveness_of_Software_Based_Self_Test_Programs_for_Static_Cell_Aware_Test-8.pdfAssessing_the_Effectiveness_of_Software-Based_Self-Test_Programs_for_Static_Cell-Aware_Test.pdf
Machine Learning-based feasibility estimation of digital blocks in BCD technology / Daghero, F., Faraone, G., Grosso, M., Pagliari, D.J., Di Carolo, N., Franchino, G.A., Licastro, D., Serianni, E.. - ELETTRONICO. - (2024), pp. 1-6. (2024 IEEE International Conference on Design, Test and Technology of Integrated Systems, DTTIS 2024 Aix-En-Provence, France 14-16 October 2024) [10.1109/dttis62212.2024.10780062]. 1-gen-2024 Daghero, FrancescoGrosso, MichelangeloPagliari, Daniele Jahier + Machine_Learning-based_feasibility_estimation_of_digital_blocks_in_BCD_technology.pdf2410.07989v1.pdf
Targeting different defect-oriented fault models in IC testing: an experimental approach / Mirabella, N., Floridia, A., Cantoro, R., Grosso, M., Sonza Reorda, M.. - ELETTRONICO. - (2023), pp. 214-219. (26th Euromicro Conference Series on Digital System Design (DSD) Golem (ALB) 6-8 September, 2023) [10.1109/DSD60849.2023.00039]. 1-gen-2023 Mirabella, NunzioFloridia, AndreaCantoro, RiccardoGrosso, MichelangeloSonza Reorda, Matteo DSD_Conference_paper_1.9_submitted.docx2023172914.pdfTargeting_different_defect-oriented_fault_models_in_IC_testing_an_experimental_approach.pdf
A comparative overview of ATPG flows targeting traditional and cell-aware fault models / Mirabella, N., Floridia, A., Cantoro, R., Grosso, M., Sonza Reorda, M.. - ELETTRONICO. - (2022), pp. 1-4. (29th IEEE International Conference on Electronics Circuits and Systems (ICECS) Glasgow 24th - 26th October 2022) [10.1109/ICECS202256217.2022.9971003]. 1-gen-2022 Mirabella, NunzioFloridia, AndreaCantoro, RiccardoGrosso, MichelangeloSonza Reorda, Matteo ICECS_2022_1.2.pdfConference_paper_1.2_submitted.docxA_comparative_overview_of_ATPG_flows_targeting_traditional_and_cell-aware_fault_models.pdf
Recent Trends and Perspectives on Defect-Oriented Testing / Bernardi, P., Cantoro, R., Coyette, A., Dobbeleare, W., Fieback, M., Floridia, A., Gielen, G., Gomez, J., Grosso, M., Guerriero, A.M., Guglielminetti, I., Hamdioui, S., Insinga, G., Mautone, N., Mirabella, N., Sartoni, S., Sonza Reorda, M., Ullmann, R., Vanhooren, R., Xama, N., et al.. - (2022). (The 28th IEEE International Symposium on On-Line Testing and Robust System Design (IOLTS) Torino (Italy) 12-14 September 2022) [10.1109/IOLTS56730.2022.9897647]. 1-gen-2022 P. BernardiR. CantoroA. FloridiaM. GrossoS. HamdiouiG. InsingaN. MirabellaS. SartoniM. Sonza ReordaL. Wu + _IOLTS2022__Special_Session__Recent_Trends_and_Perspectives_on_Defect_Oriented_Testing.pdfRecent_Trends_and_Perspectives_on_Defect-Oriented_Testing.pdf
Comparing different solutions for testing resistive defects in low-power SRAMs / Mirabella, N., Grosso, M., Franchino, G., Rinaudo, S., Deretzis, I., La Magna, A., Sonza Reorda, M.. - ELETTRONICO. - (2021), pp. 1-6. (22nd IEEE Latin-American Test Symposium 2021 Porto Alegre (Brazil) 27th - 29th October 2021) [10.1109/lats53581.2021.9651760]. 1-gen-2021 Mirabella, NunzioGrosso, MichelangeloSonza Reorda, Matteo + 2021170336.pdfLATS_PAPER-submitted.pdf
On the test of single via related defects in digital VLSI designs / Mirabella, N., Ricci, M., Grosso, M.. - ELETTRONICO. - (2020), pp. 1-6. (23rd International Symposium on Design and Diagnostics of Electronic Circuits and Systems, DDECS 2020 Serbia 2020) [10.1109/DDECS50862.2020.9095717]. 1-gen-2020 Mirabella N.Grosso M. + PID6429081.pdfDDECS-SingleVia.pdf
Software-Based Self-Test for Transition Faults: A Case Study / Grosso, M., Rinaudo, S., Casalino, A., Reorda, M.S.. - STAMPA. - 2019-:(2019), pp. 76-81. (27th IFIP/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2019 Peru 2019) [10.1109/VLSI-SoC.2019.8920306]. 1-gen-2019 Grosso M.Reorda M. S. + preprint VLSISOC2019.pdf08920306.pdf
An Energy-autonomous Wireless Sensor Network Development Platform / Grosso, M., Rinaudo, S., Patti, E., Acquaviva, A.. - (2018), pp. 1-6. (13th IEEE International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS) Taormina, Italy 10-12 April 2018) [10.1109/DTIS.2018.8368569]. 1-gen-2018 Michelangelo GrossoEdoardo PattiAndrea Acquaviva + DTIS2018_pap__CR.pdf
Training a classifier for activity recognition using body motion simulation / Grosso, M., Lena, D., Rinaudo, S., Guzman, D.A.F., Demarchi, D.. - 2018:(2018), pp. 1-4. (2017 IEEE Biomedical Circuits and Systems Conference, BioCAS 2017 Politecnico di Torino, ita 2017) [10.1109/BIOCAS.2017.8325117]. 1-gen-2018 Grosso M.Guzman D. A. F.Demarchi D. + 08325117.pdf
A blocking probability study for the Aethereal network-on-chip / Marchetto, G., Tahir, S., Grosso, M.. - STAMPA. - (2016), pp. 104-109. (IEEE International Design & Test Symposium (IDT) Hammamet, Tunisia December 2016) [10.1109/IDT.2016.7843023]. 1-gen-2016 MARCHETTO, GUIDOTAHIR, SAROSHGROSSO, MICHELANGELO -
A compact IGBT electro-thermal model in Verilog-A for fast system-level simulation / Lena, D., Grosso, M., Bocca, A., Macii, A., Rinaudo, S.. - STAMPA. - (2016), pp. 3793-3798. (IECON 2016 - 42nd Annual Conference of the IEEE Industrial Electronics Society Florence, Italy 24-27 October 2016) [10.1109/IECON.2016.7793376]. 1-gen-2016 Grosso, MichelangeloBOCCA, ALBERTOMACII, Alberto + -
Distributed software infrastructure for evaluating the integration of photovoltaic systems in urban districts / Bottaccioli, L., Patti, E., Grosso, M., Gaetano, R., Angelo, M., Salvatore, R., Acquaviva, A., Macii, E.. - (2016), pp. 357-362. (5th International Conference on Smart Cities and Green ICT Systems (SMARTGREENS 2016) Rome, Italy 23-25 April, 2016) [10.5220/0005879403570362]. 1-gen-2016 BOTTACCIOLI, LORENZOPATTI, EDOARDOGROSSO, MICHELANGELOACQUAVIVA, ANDREAMACII, Enrico + Smartgreen_16.pdf
Energy-efficient battery charging in electric vehicles with solar panels / Grosso, M., Lena, D., Bocca, A., Macii, A., Rinaudo, S.. - CD-ROM. - (2016), pp. 67-71. (2016 IEEE 2nd International Forum on Research and Technologies for Society and Industry Leveraging a better tomorrow (RTSI) Bologna, Italy September 7-9, 2016) [10.1109/RTSI.2016.7740569]. 1-gen-2016 Grosso, MichelangeloBOCCA, ALBERTOMACII, Alberto + -
A new distributed framework for integration of district energy data from heterogeneous devices / Brundu, F.G., Patti, E., Acquaviva, A., Grosso, M., Gaetano, R., Salvatore, R., Macii, E.. - (2015), pp. 992-993. (Design, Automation & Test in Europe Conference & Exhibition (DATE) Grenoble, France 9-13 March 2015). 1-gen-2015 BRUNDU, FRANCESCO GAVINOPATTI, EDOARDOACQUAVIVA, ANDREAGROSSO, MICHELANGELOMACII, Enrico + date_2015_CR.pdf
Enabling Smart System design with the SMAC Platform / Grosso, M., Gangemi, G., Rinaudo, S., Cenni, F., Crepaldi, M., Sanginario, A., Demarchi, D.. - ELETTRONICO. - (2015), pp. 1-6. (17th Symposium on Design, Test, Integration and Packaging of MEMS/MOEMS, DTIP 2015 Montpellier, France 27-30 April 2015) [10.1109/DTIP.2015.7160988]. 1-gen-2015 GROSSO, MICHELANGELOSanginario, AlessandroDEMARCHI, DANILO + 07160988.pdf