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An Experimental Evaluation of Resistive Defects and Different Testing Solutions in Low-Power Back-Biased SRAM Cells
2022 Mirabella, N.; Grosso, M.; Franchino, G.; Rinaudo, S.; Deretzis, I.; La Magna, A.; Reorda, M. S.
Testing single via related defectsin digital VLSI designs
2021 Mirabella, Nunzio; Ricci, Maurizio; Calà, Ignazio; Lanza, Roberto; Grosso, Michelangelo
An Investigation on Pervasive Technologies for IoT-based Thermal Monitoring
2019 Giusto, Edoardo; Gandino, Filippo; Greco, MICHELE LUIGI; Grosso, Michelangelo; Montrucchio, Bartolomeo; Salvatore, Rinaudo
Addressing the Smart Systems Design Challenge: The SMAC Platform
2015 Bombieri, N.; Drogoudis, D.; Gangemi, G.; Gillon, R.; Grosso, Michelangelo; Macii, Enrico; Poncino, Massimo; Rinaudo, S.
The energy efficiency management at urban scale by means of integrated modelling
2015 Ronzino, Amos; Osello, Anna; Patti, Edoardo; Bottaccioli, Lorenzo; Danna, Chiara; Lingua, Andrea Maria; Acquaviva, Andrea; Macii, Enrico; Grosso, Michelangelo; Gianluca, Messina; Gaetano, Rasconà
Towards Multi-Domain and Multi-Physical Electronic Design
2015 Crepaldi, M.; Sanginario, Alessandro; Motto Ros, P.; Grosso, Michelangelo; Sassone, Alessandro; Poncino, Massimo; Macii, Enrico; Rinaudo, S.; Gangemi, G.; Demarchi, Danilo
A Top-down Constraint-driven Methodology for Smart System Design
2014 Crepaldi, M.; Grosso, Michelangelo; Sassone, Alessandro; Gallinaro, S.; Rinaudo, S.; Poncino, Massimo; Macii, Enrico; Demarchi, Danilo
Exploiting Fault Model Correlations to Accelerate SEU Sensitivity Assessment
2013 Grosso, Michelangelo; Guzman Miranda, H.; Aguirre, M. A.
On the use of embedded debug features for permanent and transient fault resilience in microprocessors
2012 Portela Garcia, M.; Grosso, Michelangelo; Gallardo Campos, M.; SONZA REORDA, Matteo; Enterna, L.; Garcia Valderas, M.; Lopez Ongil, C.
Software-Based Testing for System Peripherals
2012 Grosso, Michelangelo; Perez Holguin, W. J.; SANCHEZ SANCHEZ, EDGAR ERNESTO; SONZA REORDA, Matteo; Tonda, ALBERTO PAOLO; Velasco Medina, J.
Functional Verification of DMA Controllers
2011 Grosso, Michelangelo; Perez, H. W. J.; Ravotto, Danilo; SANCHEZ SANCHEZ, EDGAR ERNESTO; SONZA REORDA, Matteo; Tonda, ALBERTO PAOLO; Velasco Medina, J.
A Hybrid Approach for Detection and Correction of Transient Faults in SoCs
2010 Bernardi, Paolo; Grosso, Michelangelo; Bolzani Poehls, L.; SONZA REORDA, Matteo
Evaluating the Impact of DFM Library Optimizations on Alpha-induced SEU Sensitivity in a Microprocessor Core
2010 Appello, D.; Grosso, Michelangelo; Loparco, D.; Melchiori, F.; Paccagnella, A.; Rech, P.; SONZA REORDA, Matteo
Exploiting an infrastructure-intellectual property for systems-on-chip test, diagnosis and silicon debug
2010 Bernardi, Paolo; Grosso, Michelangelo; Rebaudengo, Maurizio; SONZA REORDA, Matteo
Effective Diagnostic Pattern Generation Strategy forTransition-Delay Faults in Full-Scan SOCs
2009 Appello, D; Bernardi, Paolo; Grosso, Michelangelo; SANCHEZ SANCHEZ, EDGAR ERNESTO; SONZA REORDA, Matteo
A System-layer Infrastructure for SoC Diagnosis
2007 Bernardi, Paolo; Grosso, Michelangelo; Rebaudengo, Maurizio; SONZA REORDA, Matteo
System-in-package testing: problems and solutions
2006 Appello, D; Bernardi, Paolo; Grosso, Michelangelo; SONZA REORDA, Matteo
| Citazione | Data di pubblicazione | Autori | File |
|---|---|---|---|
| An Experimental Evaluation of Resistive Defects and Different Testing Solutions in Low-Power Back-Biased SRAM Cells / Mirabella, N.; Grosso, M.; Franchino, G.; Rinaudo, S.; Deretzis, I.; La Magna, A.; Reorda, M. S.. - In: ELECTRONICS. - ISSN 2079-9292. - ELETTRONICO. - 11:2(2022), p. 203. [10.3390/electronics11020203] | 1-gen-2022 | Mirabella N.Grosso M.Reorda M. S. + | electronics-11-00203.pdf; MDPI_Paper.pdf |
| Testing single via related defectsin digital VLSI designs / Mirabella, Nunzio; Ricci, Maurizio; Calà, Ignazio; Lanza, Roberto; Grosso, Michelangelo. - In: MICROELECTRONICS RELIABILITY. - ISSN 0026-2714. - ELETTRONICO. - 120 (114100):(2021). [10.1016/j.microrel.2021.114100] | 1-gen-2021 | Mirabella, NunzioGrosso, Michelangelo + | singlevia_microrel_v04.pdf; 1-s2.0-S0026271421000664-main (1).pdf |
| An Investigation on Pervasive Technologies for IoT-based Thermal Monitoring / Giusto, Edoardo; Gandino, Filippo; Greco, MICHELE LUIGI; Grosso, Michelangelo; Montrucchio, Bartolomeo; Salvatore, Rinaudo. - In: SENSORS. - ISSN 1424-8220. - ELETTRONICO. - 19:3(2019), p. 663. [10.3390/s19030663] | 1-gen-2019 | Edoardo GiustoFilippo GandinoGRECO, MICHELE LUIGIMichelangelo GrossoBartolomeo Montrucchio + | sensors-19-00663-v2.pdf |
| Addressing the Smart Systems Design Challenge: The SMAC Platform / Bombieri, N.; Drogoudis, D.; Gangemi, G.; Gillon, R.; Grosso, Michelangelo; Macii, Enrico; Poncino, Massimo; Rinaudo, S.. - In: MICROPROCESSORS AND MICROSYSTEMS. - ISSN 0141-9331. - 39:8(2015), pp. 1158-1173. [10.1016/j.micpro.2015.05.013] | 1-gen-2015 | GROSSO, MICHELANGELOMACII, EnricoPONCINO, MASSIMO + | MICPRO-S-14-00324.pdf; MICPRO-S-14-00324.pdf |
| The energy efficiency management at urban scale by means of integrated modelling / Ronzino, Amos; Osello, Anna; Patti, Edoardo; Bottaccioli, Lorenzo; Danna, Chiara; Lingua, Andrea Maria; Acquaviva, Andrea; Macii, Enrico; Grosso, Michelangelo; Gianluca, Messina; Gaetano, Rasconà. - In: ENERGY PROCEDIA. - ISSN 1876-6102. - 83:(2015), pp. 258-268. [10.1016/j.egypro.2015.12.180] | 1-gen-2015 | RONZINO, AMOSOSELLO, AnnaPATTI, EDOARDOBOTTACCIOLI, LORENZODANNA, CHIARALINGUA, Andrea MariaACQUAVIVA, ANDREAMACII, EnricoGROSSO, MICHELANGELO + | 2015 The energy 1-s2.0-S1876610215028453-main (2).pdf |
| Towards Multi-Domain and Multi-Physical Electronic Design / Crepaldi, M.; Sanginario, Alessandro; Motto Ros, P.; Grosso, Michelangelo; Sassone, Alessandro; Poncino, Massimo; Macii, Enrico; Rinaudo, S.; Gangemi, G.; Demarchi, Danilo. - In: IEEE CIRCUITS AND SYSTEMS MAGAZINE. - ISSN 1531-636X. - 15:3(2015), pp. 18-43. [10.1109/MCAS.2015.2450635] | 1-gen-2015 | SANGINARIO, ALESSANDROMotto Ros, P.GROSSO, MICHELANGELOSASSONE, ALESSANDROPONCINO, MASSIMOMACII, EnricoDEMARCHI, DANILO + | IEEE Circuits Syst. Mag. 2015 Crepaldi.pdf |
| A Top-down Constraint-driven Methodology for Smart System Design / Crepaldi, M.; Grosso, Michelangelo; Sassone, Alessandro; Gallinaro, S.; Rinaudo, S.; Poncino, Massimo; Macii, Enrico; Demarchi, Danilo. - In: IEEE CIRCUITS AND SYSTEMS MAGAZINE. - ISSN 1531-636X. - 14:1(2014), pp. 37-57. [10.1109/MCAS.2013.2296415] | 1-gen-2014 | GROSSO, MICHELANGELOSASSONE, ALESSANDROPONCINO, MASSIMOMACII, EnricoDEMARCHI, DANILO + | - |
| Exploiting Fault Model Correlations to Accelerate SEU Sensitivity Assessment / Grosso, Michelangelo; Guzman Miranda, H.; Aguirre, M. A.. - In: IEEE TRANSACTIONS ON INDUSTRIAL INFORMATICS. - ISSN 1551-3203. - STAMPA. - 9:1(2013), pp. 142-148. [10.1109/TII.2012.2226096] | 1-gen-2013 | GROSSO, MICHELANGELO + | - |
| On the use of embedded debug features for permanent and transient fault resilience in microprocessors / Portela Garcia, M.; Grosso, Michelangelo; Gallardo Campos, M.; SONZA REORDA, Matteo; Enterna, L.; Garcia Valderas, M.; Lopez Ongil, C.. - In: MICROPROCESSORS AND MICROSYSTEMS. - ISSN 0141-9331. - STAMPA. - 36:5(2012), pp. 334-343. [10.1016/j.micpro.2012.02.013] | 1-gen-2012 | GROSSO, MICHELANGELOSONZA REORDA, Matteo + | - |
| Software-Based Testing for System Peripherals / Grosso, Michelangelo; Perez Holguin, W. J.; SANCHEZ SANCHEZ, EDGAR ERNESTO; SONZA REORDA, Matteo; Tonda, ALBERTO PAOLO; Velasco Medina, J.. - In: JOURNAL OF ELECTRONIC TESTING. - ISSN 0923-8174. - STAMPA. - 28:2(2012), pp. 189-200. [10.1007/s10836-012-5287-2] | 1-gen-2012 | GROSSO, MICHELANGELOSANCHEZ SANCHEZ, EDGAR ERNESTOSONZA REORDA, MatteoTONDA, ALBERTO PAOLO + | - |
| Functional Verification of DMA Controllers / Grosso, Michelangelo; Perez, H. W. J.; Ravotto, Danilo; SANCHEZ SANCHEZ, EDGAR ERNESTO; SONZA REORDA, Matteo; Tonda, ALBERTO PAOLO; Velasco Medina, J.. - In: JOURNAL OF ELECTRONIC TESTING. - ISSN 0923-8174. - STAMPA. - 27:4(2011), pp. 505-516. [10.1007/s10836-011-5219-6] | 1-gen-2011 | GROSSO, MICHELANGELORAVOTTO, DANILOSANCHEZ SANCHEZ, EDGAR ERNESTOSONZA REORDA, MatteoTONDA, ALBERTO PAOLO + | 2413924.pdf |
| A Hybrid Approach for Detection and Correction of Transient Faults in SoCs / Bernardi, Paolo; Grosso, Michelangelo; Bolzani Poehls, L.; SONZA REORDA, Matteo. - In: IEEE TRANSACTIONS ON DEPENDABLE AND SECURE COMPUTING. - ISSN 1545-5971. - STAMPA. - Volume: 7 , Issue: 4:(2010), pp. 439-445. [10.1109/TDSC.2010.33] | 1-gen-2010 | BERNARDI, PAOLOGROSSO, MICHELANGELOSONZA REORDA, Matteo + | - |
| Evaluating the Impact of DFM Library Optimizations on Alpha-induced SEU Sensitivity in a Microprocessor Core / Appello, D.; Grosso, Michelangelo; Loparco, D.; Melchiori, F.; Paccagnella, A.; Rech, P.; SONZA REORDA, Matteo. - In: IEEE TRANSACTIONS ON NUCLEAR SCIENCE. - ISSN 0018-9499. - STAMPA. - 57:4(2010), pp. 2098-2105. [10.1109/TNS.2010.2049119] | 1-gen-2010 | GROSSO, MICHELANGELORECH P.SONZA REORDA, Matteo + | - |
| Exploiting an infrastructure-intellectual property for systems-on-chip test, diagnosis and silicon debug / Bernardi, Paolo; Grosso, Michelangelo; Rebaudengo, Maurizio; SONZA REORDA, Matteo. - In: IET COMPUTERS & DIGITAL TECHNIQUES. - ISSN 1751-8601. - 4(2):(2010), pp. 104-113. [10.1049/iet-cdt.2008.0122] | 1-gen-2010 | BERNARDI, PAOLOGROSSO, MICHELANGELOREBAUDENGO, MaurizioSONZA REORDA, Matteo | - |
| Effective Diagnostic Pattern Generation Strategy forTransition-Delay Faults in Full-Scan SOCs / Appello, D; Bernardi, Paolo; Grosso, Michelangelo; SANCHEZ SANCHEZ, EDGAR ERNESTO; SONZA REORDA, Matteo. - In: IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS. - ISSN 1063-8210. - 17 (11):(2009), pp. 1654-1659. [10.1109/TVLSI.2008.2006177] | 1-gen-2009 | BERNARDI, PAOLOGROSSO, MICHELANGELOSANCHEZ SANCHEZ, EDGAR ERNESTOSONZA REORDA, Matteo + | - |
| A System-layer Infrastructure for SoC Diagnosis / Bernardi, Paolo; Grosso, Michelangelo; Rebaudengo, Maurizio; SONZA REORDA, Matteo. - In: JOURNAL OF ELECTRONIC TESTING. - ISSN 0923-8174. - 23:(2007), pp. 389-404. | 1-gen-2007 | BERNARDI, PAOLOGROSSO, MICHELANGELOREBAUDENGO, MaurizioSONZA REORDA, Matteo | - |
| System-in-package testing: problems and solutions / Appello, D; Bernardi, Paolo; Grosso, Michelangelo; SONZA REORDA, Matteo. - In: IEEE DESIGN & TEST OF COMPUTERS. - ISSN 0740-7475. - Volume: 23 , Issue: 3:(2006), pp. 203-211. [10.1109/MDT.2006.79] | 1-gen-2006 | BERNARDI, PAOLOGROSSO, MICHELANGELOSONZA REORDA, Matteo + | - |