Archivio Istituzionale della RicercaSANCHEZ SANCHEZ, EDGAR ERNESTO
SANCHEZ SANCHEZ, EDGAR ERNESTO
Dipartimento di Automatica e Informatica
Sanchez, Ernesto; E. Sanchez; Sanchez E.; Ernesto Sanchez; SANCHEZ EDGAR; SANCHEZ E.; SANCHEZ SANCHEZ EDGAR ERNESTO; SANCHEZ SANCHEZ E.
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Risultati 1 - 20 di 213 (tempo di esecuzione: 0.032 secondi).
Investigating on Gradient Regularization for Testing Neural Networks
In corso di stampa Bellarmino, Nicolo; Bosio, Alberto; Cantoro, Riccardo; Ruospo, Annachiara; Sanchez, Ernesto; Squillero, Giovanni
An Integrated Environment for the Reliability Assessment of CNNs Accelerators Implemented in FPGAs
2024 Mesa, Luis Ariel; Guerrero-Balaguera, Juan-David; Castañeda, Erika D.; Sanchez, Ernesto; Pérez-Holguín, Wilson-Javier
Approximate Fault-Tolerant Neural Network Systems
2024 Traiola, Marcello; Pappalardo, Salvatore; Piri, Ali; Ruospo, Annachiara; Deveautour, Bastien; Sanchez, Ernesto; Bosio, Alberto; Saeedi, Sepide; Carpegna, Alessio; Göğebakan, Anıl Bayram; Magliano, Enrico; Savino, Alessandro
Early Detection of Permanent Faults in DNNs Through the Application of Tensor-Related Metrics
2024 Turco, V.; Ruospo, A.; Sanchez, E.; Sonza Reorda, M.
Model theft attack against a tinyML application running on an Ultra-Low-Power Open-Source SoC
2024 Porsia, Antonio; Ruospo, Annachiara; Sanchez, Ernesto
Resiliency approaches in Convolutional, Photonic, and Spiking Neural Networks
2024 Bosio, Alberto; Gomes, Mauricio; Pavanello, Fabio; Porsia, Antonio; Ruospo, Annachiara; Sanchez, Ernesto; Vatajelu, Elena Ioana
A Fast Reliability Analysis of Image Segmentation Neural Networks Exploiting Statistical Fault Injections
2023 Gavarini, G; Ruospo, A; Sanchez, E
A Fault Injection Framework for AI Hardware Accelerators
2023 Pappalardo, S; Ruospo, A; O'Connor, I; Deveautour, B; Sanchez, E; Bosio, A
A Survey on Deep Learning Resilience Assessment Methodologies
2023 Ruospo, Annachiara; Sanchez, Ernesto; Matana Luza, Lucas; Dilillo, Luigi; Traiola, Marcello; Bosio, Alberto
Assessing Convolutional Neural Networks Reliability through Statistical Fault Injections
2023 Ruospo, Annachiara; Gavarini, Gabriele; De Sio, Corrado; Guerrero Balaguera, Juan David; Sterpone, Luca; Sonza Reorda, Matteo; Sanchez, Ernesto; Mariani, Riccardo; Aribido, Joseph; Athavale, Jyotika
Evaluation and mitigation of faults affecting Swin Transformers
2023 Gavarini, Gabriele; Ruospo, Annachiara; Sanchez, Ernesto
Image Test Libraries for the on-line self-test of functional units in GPUs running CNNs
2023 Ruospo, Annachiara; Gavarini, Gabriele; Porsia, Antonio; Sonza Reorda, Matteo; Sanchez, Ernesto; Mariani, Riccardo; Aribido, Joseph; Athavale, Jyotika
On the resilience of representative and novel data formats in CNNs
2023 Gavarini, G.; Ruospo, A.; Sanchez, E.
PSP Framework: A novel risk assessment method in compliance with ISO/SAE-21434
2023 Oberti, Franco; Sanchez, Ernesto; Savino, Alessandro; Parisi, Filippo; Di Carlo, Stefano
Resilience-Performance Tradeoff Analysis of a Deep Neural Network Accelerator
2023 Pappalardo, S; Ruospo, A; O'Connor, I; Deveautour, B; Sanchez, E; Bosio, A
SCI-FI: a Smart, aCcurate and unIntrusive Fault-Injector for Deep Neural Networks
2023 Gavarini, G; Ruospo, A; Sanchez, E
Special Session: Approximation and Fault Resiliency of DNN Accelerators
2023 Ahmadilivani, Mh; Barbareschi, M; Barone, S; Bosio, A; Daneshtalab, M; Della Torca, S; Gavarini, G; Jenihhin, M; Raik, J; Ruospo, A; Sanchez, E; Taheri, M
Uncovering hidden vulnerabilities in CNNs through evolutionary-based Image Test Libraries
2023 Turco, V.; Ruospo, A.; Gavarini, G.; Sanchez, E.; Sonza Reorda, M.
Design, Verification, Test, and In-Field Implications of Approximate Digital Integrated Circuits
2022 Bosio, Alberto; Di Carlo, Stefano; Girard, Patrick; Ruospo, Annachiara; Sanchez, Ernesto; Savino, Alessandro; Sekanina, Lukas; Traiola, Marcello; Vasicek, Zdenek; Virazel, Arnaud
Emulating the Effects of Radiation-Induced Soft-Errors for the Reliability Assessment of Neural Networks
2022 Matana Luza, Lucas; Ruospo, Annachiara; Soderstrom, Daniel; Cazzaniga, Carlo; Kastriotou, Maria; Sanchez, Ernesto; Bosio, Alberto; Dilillo, Luigi
| Citazione | Data di pubblicazione | Autori | File |
|---|---|---|---|
| Investigating on Gradient Regularization for Testing Neural Networks / Bellarmino, Nicolo; Bosio, Alberto; Cantoro, Riccardo; Ruospo, Annachiara; Sanchez, Ernesto; Squillero, Giovanni. - ELETTRONICO. - (In corso di stampa). (Intervento presentato al convegno 10th International Conference on machine Learning, Optimization and Data science (LOD 2024) tenutosi a Riva del Sole Resort & SPA, Castiglione della Pescaia (Grosseto), Tuscany, Italy nel September 22 – 25, 2024). | In corso di stampa | Bellarmino, NicoloBosio, AlbertoCantoro, RiccardoRuospo, AnnachiaraSanchez, ErnestoSquillero, Giovanni | 2024_LOD_GRADIENT_PENALIZATION.pdf |
| An Integrated Environment for the Reliability Assessment of CNNs Accelerators Implemented in FPGAs / Mesa, Luis Ariel; Guerrero-Balaguera, Juan-David; Castañeda, Erika D.; Sanchez, Ernesto; Pérez-Holguín, Wilson-Javier. - ELETTRONICO. - (2024). (Intervento presentato al convegno 2024 IEEE 25th Latin American Test Symposium (LATS) tenutosi a Maceio (BRA) nel 09-12 April 2024) [10.1109/lats62223.2024.10534609]. | 1-gen-2024 | Guerrero-Balaguera, Juan-DavidSanchez, Ernesto + | An_Integrated_Environment_for_the_Reliability_Assessment_of_CNNs_Accelerators_Implemented_in_FPGAs.pdf |
| Approximate Fault-Tolerant Neural Network Systems / Traiola, Marcello; Pappalardo, Salvatore; Piri, Ali; Ruospo, Annachiara; Deveautour, Bastien; Sanchez, Ernesto; Bosio, Alberto; Saeedi, Sepide; Carpegna, Alessio; Göğebakan, Anıl Bayram; Magliano, Enrico; Savino, Alessandro. - ELETTRONICO. - (2024), pp. 1-10. (Intervento presentato al convegno IEEE European Test Symposium (ETS) 2024 tenutosi a Der Haag (NL) nel 20-24 May 2024) [10.1109/ets61313.2024.10567290]. | 1-gen-2024 | Ruospo, AnnachiaraSanchez, ErnestoSaeedi, SepideCarpegna, AlessioMagliano, EnricoSavino, Alessandro + | Paper___ETS24___Embedded_Tutorial.pdf; Approximate_Fault-Tolerant_Neural_Network_Systems.pdf |
| Early Detection of Permanent Faults in DNNs Through the Application of Tensor-Related Metrics / Turco, V.; Ruospo, A.; Sanchez, E.; Sonza Reorda, M.. - ELETTRONICO. - (2024), pp. 13-18. (Intervento presentato al convegno 2024 27th International Symposium on Design & Diagnostics of Electronic Circuits & Systems (DDECS) tenutosi a Kielce (POL) nel 03-05 April 2024) [10.1109/DDECS60919.2024.10508918]. | 1-gen-2024 | Turco V.Ruospo A.Sanchez E.Sonza Reorda M. | Early_Detection_of_Permanent_Faults_in_DNNs_Through_the_Application_of_Tensor-Related_Metrics.pdf |
| Model theft attack against a tinyML application running on an Ultra-Low-Power Open-Source SoC / Porsia, Antonio; Ruospo, Annachiara; Sanchez, Ernesto. - ELETTRONICO. - (2024), pp. 63-66. (Intervento presentato al convegno 21st ACM International Conference on Computing Frontiers Workshops and Special Sessions (CF '24 Companion) tenutosi a Ischia (IT) nel 07-09/05/2024) [10.1145/3637543.3652877]. | 1-gen-2024 | Porsia, AntonioRuospo, AnnachiaraSanchez, Ernesto | OSHW24.pdf; 3637543.3652877.pdf |
| Resiliency approaches in Convolutional, Photonic, and Spiking Neural Networks / Bosio, Alberto; Gomes, Mauricio; Pavanello, Fabio; Porsia, Antonio; Ruospo, Annachiara; Sanchez, Ernesto; Vatajelu, Elena Ioana. - ELETTRONICO. - (2024), pp. 1-10. (Intervento presentato al convegno 2024 IEEE 25th Latin American Test Symposium (LATS) tenutosi a Maceió (BRA) nel 09-12 April 2024) [10.1109/LATS62223.2024.10534615]. | 1-gen-2024 | Bosio, AlbertoPavanello, FabioPorsia, AntonioRuospo, AnnachiaraSanchez, ErnestoVatajelu, Elena Ioana + | LATS24_SpecialSession.pdf; Resiliency_Approaches_in_Convolutional_Photonic_and_Spiking_Neural_Networks.pdf |
| A Fast Reliability Analysis of Image Segmentation Neural Networks Exploiting Statistical Fault Injections / Gavarini, G; Ruospo, A; Sanchez, E. - (2023), pp. 1-6. (Intervento presentato al convegno 2023 IEEE 24th Latin American Test Symposium (LATS) tenutosi a Veracruz (Mexico) nel 21-24 March 2023) [10.1109/LATS58125.2023.10154488]. | 1-gen-2023 | Gavarini, GRuospo, ASanchez, E | A_Fast_Reliability_Analysis_of_Image_Segmentation_Neural_Networks_Exploiting_Statistical_Fault_Injections.pdf |
| A Fault Injection Framework for AI Hardware Accelerators / Pappalardo, S; Ruospo, A; O'Connor, I; Deveautour, B; Sanchez, E; Bosio, A. - ELETTRONICO. - (2023), pp. 1-6. (Intervento presentato al convegno 2023 IEEE 24th Latin American Test Symposium (LATS) tenutosi a Veracruz, Mexico nel 21-24 March 2023) [10.1109/LATS58125.2023.10154505]. | 1-gen-2023 | Ruospo, ASanchez, E + | _LATS23__A_Fault_Injection_Framework_for_AI_Hardware_Accelerators.pdf; A_Fault_Injection_Framework_for_AI_Hardware_Accelerators.pdf |
| A Survey on Deep Learning Resilience Assessment Methodologies / Ruospo, Annachiara; Sanchez, Ernesto; Matana Luza, Lucas; Dilillo, Luigi; Traiola, Marcello; Bosio, Alberto. - In: COMPUTER. - ISSN 0018-9162. - ELETTRONICO. - 56:2(2023), pp. 57-66. [10.1109/MC.2022.3217841] | 1-gen-2023 | Ruospo, AnnachiaraSanchez, Ernesto + | A_Survey_on_Deep_Learning_Resilience_Assessment_Methodologies_CR.pdf; A_Survey_on_Deep_Learning_Resilience_Assessment_Methodologies.pdf |
| Assessing Convolutional Neural Networks Reliability through Statistical Fault Injections / Ruospo, Annachiara; Gavarini, Gabriele; De Sio, Corrado; Guerrero Balaguera, Juan David; Sterpone, Luca; Sonza Reorda, Matteo; Sanchez, Ernesto; Mariani, Riccardo; Aribido, Joseph; Athavale, Jyotika. - (2023), pp. 1-6. (Intervento presentato al convegno IEEE Design, Automation and Test in Europe Conference (DATE) tenutosi a Antwerp (Belgium) nel 17 - 19 April 2023) [10.23919/DATE56975.2023.10136998]. | 1-gen-2023 | Ruospo, AnnachiaraGavarini, GabrieleDe Sio, CorradoGuerrero Balaguera, Juan DavidSterpone, LucaSonza Reorda, MatteoSanchez, Ernesto + | date_2023_acceptedVersion.pdf; Assessing_Convolutional_Neural_Networks_Reliability_through_Statistical_Fault_Injections.pdf |
| Evaluation and mitigation of faults affecting Swin Transformers / Gavarini, Gabriele; Ruospo, Annachiara; Sanchez, Ernesto. - ELETTRONICO. - (2023), pp. 1-7. (Intervento presentato al convegno 29th IEEE International Symposium on On-Line Testing and Robust System Design (IOLTS 2023) tenutosi a Chania,Crete (Greece) nel July 3rd - 5th, 2023) [10.1109/IOLTS59296.2023.10224882]. | 1-gen-2023 | Gabriele GavariniAnnachiara RuospoErnesto Sanchez | IOLTS23_TransformerCaseStudy.pdf; Evaluation_and_Mitigation_of_Faults_Affecting_Swin_Transformers.pdf |
| Image Test Libraries for the on-line self-test of functional units in GPUs running CNNs / Ruospo, Annachiara; Gavarini, Gabriele; Porsia, Antonio; Sonza Reorda, Matteo; Sanchez, Ernesto; Mariani, Riccardo; Aribido, Joseph; Athavale, Jyotika. - (2023), pp. 1-6. (Intervento presentato al convegno 28th IEEE European Test Symposium 2023 tenutosi a Venice (Italy) nel May 22 - 26, 2023) [10.1109/ETS56758.2023.10174176]. | 1-gen-2023 | Ruospo, AnnachiaraGavarini, GabrielePorsia, AntonioSonza Reorda, MatteoSanchez, Ernesto + | OnlineTestImages_ETS23.pdf; Image_Test_Libraries_for_the_on-line_self-test_of_functional_units_in_GPUs_running_CNNs.pdf |
| On the resilience of representative and novel data formats in CNNs / Gavarini, G.; Ruospo, A.; Sanchez, E.. - (2023). (Intervento presentato al convegno International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems tenutosi a Juan-Les-Pins (FR) nel 03-05 October 2023) [10.1109/DFT59622.2023.10313551]. | 1-gen-2023 | Gavarini G.Ruospo A.Sanchez E. | On_the_resilience_of_representative_and_novel_data_formats_in_CNNs.pdf |
| PSP Framework: A novel risk assessment method in compliance with ISO/SAE-21434 / Oberti, Franco; Sanchez, Ernesto; Savino, Alessandro; Parisi, Filippo; Di Carlo, Stefano. - ELETTRONICO. - (2023), pp. 60-67. (Intervento presentato al convegno 2023 53rd Annual IEEE/IFIP International Conference on Dependable Systems and Networks Workshops (DSN-W) tenutosi a Porto (PRT) nel 27-30 June 2023) [10.1109/DSN-W58399.2023.00031]. | 1-gen-2023 | Oberti, FrancoSanchez, ErnestoSavino, AlessandroDi Carlo, Stefano + | PSP_Framework_A_novel_risk_assessment_method_in_compliance_with_ISO_SAE-21434.pdf; A novel methodology for threat analysis and risk assessment according to ISO-SAE 21434.tex.pdf |
| Resilience-Performance Tradeoff Analysis of a Deep Neural Network Accelerator / Pappalardo, S; Ruospo, A; O'Connor, I; Deveautour, B; Sanchez, E; Bosio, A. - (2023), pp. 181-186. (Intervento presentato al convegno 2023 26th International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS) tenutosi a Tallin, Estonia nel 03-05 May 2023) [10.1109/DDECS57882.2023.10139704]. | 1-gen-2023 | Ruospo, ASanchez, E + | _DDECS__Resilence_Performance_Tradeoff_Analisys_of_Deep_Neural_Network_Accelerator.pdf; Resilience-Performance_Tradeoff_Analysis_of_a_Deep_Neural_Network_Accelerator.pdf |
| SCI-FI: a Smart, aCcurate and unIntrusive Fault-Injector for Deep Neural Networks / Gavarini, G; Ruospo, A; Sanchez, E. - (2023), pp. 1-6. (Intervento presentato al convegno 2023 IEEE European Test Symposium (ETS) tenutosi a Venice (Italy) nel 22-26 May 2023) [10.1109/ETS56758.2023.10173957]. | 1-gen-2023 | Gavarini, GRuospo, ASanchez, E | SCI-FI_a_Smart_aCcurate_and_unIntrusive_Fault-Injector_for_Deep_Neural_Networks.pdf |
| Special Session: Approximation and Fault Resiliency of DNN Accelerators / Ahmadilivani, Mh; Barbareschi, M; Barone, S; Bosio, A; Daneshtalab, M; Della Torca, S; Gavarini, G; Jenihhin, M; Raik, J; Ruospo, A; Sanchez, E; Taheri, M. - (2023), pp. 1-10. (Intervento presentato al convegno 2023 IEEE 41st VLSI Test Symposium (VTS) tenutosi a San Diego (USA) nel 24-26 April 2023) [10.1109/VTS56346.2023.10140043]. | 1-gen-2023 | Barone, SBosio, AGavarini, GRuospo, ASanchez, E + | Special_Session_Approximation_and_Fault_Resiliency_of_DNN_Accelerators.pdf |
| Uncovering hidden vulnerabilities in CNNs through evolutionary-based Image Test Libraries / Turco, V.; Ruospo, A.; Gavarini, G.; Sanchez, E.; Sonza Reorda, M.. - (2023). (Intervento presentato al convegno International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems tenutosi a Juan-Les-Pins (FR) nel 03-05 October 2023) [10.1109/DFT59622.2023.10313530]. | 1-gen-2023 | V. TurcoA. RuospoG. GavariniE. SanchezM. Sonza Reorda | Uncovering_hidden_vulnerabilities_in_CNNs_through_evolutionary-based_Image_Test_Libraries.pdf |
| Design, Verification, Test, and In-Field Implications of Approximate Digital Integrated Circuits / Bosio, Alberto; Di Carlo, Stefano; Girard, Patrick; Ruospo, Annachiara; Sanchez, Ernesto; Savino, Alessandro; Sekanina, Lukas; Traiola, Marcello; Vasicek, Zdenek; Virazel, Arnaud - In: Approximate Computing Techniques From Component- to Application-Level / Bosio A., Ménard D., Sentieys O.. - STAMPA. - [s.l] : Springer Nature, 2022. - ISBN 978-3-030-94704-0. - pp. 349-385 [10.1007/978-3-030-94705-7_12] | 1-gen-2022 | Bosio, AlbertoDi Carlo, StefanoRuospo, AnnachiaraSanchez, ErnestoSavino, Alessandro + | chapter12.pdf; printed-chapter.pdf |
| Emulating the Effects of Radiation-Induced Soft-Errors for the Reliability Assessment of Neural Networks / Matana Luza, Lucas; Ruospo, Annachiara; Soderstrom, Daniel; Cazzaniga, Carlo; Kastriotou, Maria; Sanchez, Ernesto; Bosio, Alberto; Dilillo, Luigi. - In: IEEE TRANSACTIONS ON EMERGING TOPICS IN COMPUTING. - ISSN 2168-6750. - ELETTRONICO. - 10:4(2022), pp. 1867-1882. [10.1109/TETC.2021.3116999] | 1-gen-2022 | Ruospo, AnnachiaraSanchez, Ernesto + | 2021_TETC___Emulating_the_Effects_of_Radiation_Induced_Soft_Errors_for_the_Reliability_Assessment_of_Neural_Networks.pdf; PUBLISHED_Emulating_the_Effects_of_Radiation-Induced_Soft-Errors_for_the_Reliability_Assessment_of_Neural_Networks.pdf |