PORTO @ Archivio Istituzionale della Ricerca

DU, BOYANG

DU, BOYANG  

Dipartimento di Automatica e Informatica  

Boyang, D.  

031122  

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Risultati 1 - 16 di 16 (tempo di esecuzione: 0.052 secondi).
Citazione Data di pubblicazione Autori File
An Automated Continuous Integration Multitest Platform for Automotive Systems / Du, Boyang; Azimi, Sarah; Moramarco, Annarita; Sabena, Davide; Parisi, Filippo; Sterpone, Luca. - In: IEEE SYSTEMS JOURNAL. - ISSN 1932-8184. - ELETTRONICO. - 16:2(2022), pp. 2495-2506. [10.1109/JSYST.2021.3069548] 1-gen-2022 Du, BoyangAzimi, SarahMoramarco, AnnaritaSabena, DavideSterpone, Luca + IEEESystem_2021.pdf; An_Automated_Continuous_Integration_Multitest_Platform_for_Automotive_Systems.pdf
Reliability assessment on 16 nm ultrascale+ MPSoC using fault injection and fault tree analysis / Yang, Weitao; Du, Boyang; He, Chaohui; Sterpone, Luca. - In: MICROELECTRONICS RELIABILITY. - ISSN 0026-2714. - 120 (114122):(2021). [10.1016/j.microrel.2021.114122] 1-gen-2021 Yang, WeitaoDu, BoyangSterpone, Luca + 1-s2.0-S0026271421000883-main.pdf
A 3D Simulation-based Approach to Analyze Heavy Ions-induced SET on Digital Circuits / Sterpone, L.; Luoni, F.; Azimi, S.; Du, B.. - In: IEEE TRANSACTIONS ON NUCLEAR SCIENCE. - ISSN 0018-9499. - (2020). [10.1109/TNS.2020.3006997] 1-gen-2020 L. SterponeS. AzimiB. Du + FINAL_VERSION.pdf; 09133159.pdf
Electron inducing soft errors in 28 nm system-on-Chip / Yang, W.; Li, Y.; Zhang, W.; Guo, Y.; Zhao, H.; Wei, J.; Li, Y.; He, C.; Chen, K.; Guo, G.; Du, B.; Sterpone, L.. - In: RADIATION EFFECTS AND DEFECTS IN SOLIDS. - ISSN 1042-0150. - 175:7-8(2020), pp. 745-754. [10.1080/10420150.2020.1759067] 1-gen-2020 Yang W.Du B.Sterpone L. + Electron inducing soft errors in 28 nm system on Chip.pdf
FlexGripPlus: An improved GPGPU model to support reliability analysis / Rodriguez Condia, Josie E.; Du, Boyang; Sonza Reorda, Matteo; Sterpone, Luca. - In: MICROELECTRONICS RELIABILITY. - ISSN 0026-2714. - 109:(2020), pp. 1-14. [10.1016/j.microrel.2020.113660] 1-gen-2020 Rodriguez Condia, Josie E.Du, BoyangSonza Reorda, MatteoSterpone, Luca journal-version-V20.pdf; 1-s2.0-S0026271419307978-main.pdf
A new CAD tool for Single Event Transient Analysis and Mitigation on Flash-based FPGAs / Azimi, Sarah; Du, Boyang; Sterpone, Luca; Merodio Codinachs, David; Grimoldi, Raoul; Cattaneo, Luca. - In: INTEGRATION. - ISSN 0167-9260. - 67:(2019), pp. 73-81. [10.1016/j.vlsi.2019.02.001] 1-gen-2019 Sarah AzimiBoyang DuLuca Sterpone + 1-s2.0-S0167926018305753-main.pdf
Analyzing Radiation-induced Transient Errors on SRAM-based FPGAs by Propagation of Broadening Effect / DE SIO, Corrado; Azimi, Sarah; Sterpone, Luca; Du, Boyang. - In: IEEE ACCESS. - ISSN 2169-3536. - 7:(2019), pp. 140182-140189. [10.1109/ACCESS.2019.2915136] 1-gen-2019 Corrado De SioSarah AzimiLuca SterponeBoyang Du 08708270.pdf
Radiation-induced Single Event Transient effects during the reconfiguration process of SRAM-based FPGAs / De Sio, C.; Azimi, S.; Bozzoli, L.; Du, B.; Sterpone, L.. - In: MICROELECTRONICS RELIABILITY. - ISSN 0026-2714. - ELETTRONICO. - (2019). [10.1016/j.microrel.2019.06.034] 1-gen-2019 De Sio, C.Azimi, S.Bozzoli, L.Du, B.Sterpone, L. -
Ultra High Energy Heavy Ion Test Beam on Xilinx Kintex-7 SRAM-based FPGA / Du, Boyang; Sterpone, Luca; Azimi, Sarah; Merodio Codinachs, David; Ferlet-Cavrois, Véronique; Boatella Polo, Cesar; García Alía, Rubén; Kastriotou, Maria; Fernández-Martínez, Pablo. - In: IEEE TRANSACTIONS ON NUCLEAR SCIENCE. - ISSN 0018-9499. - ELETTRONICO. - 66:7(2019), pp. 1813-1819. [10.1109/TNS.2019.2915207] 1-gen-2019 Boyang DuLuca SterponeSarah Azimi + 08708253.pdf
On the analysis of radiation-induced Single Event Transients on SRAM-based FPGAs / Azimi, S.; Sterpone, L.; Du, B.; Boragno, L.. - In: MICROELECTRONICS RELIABILITY. - ISSN 0026-2714. - 88-90:(2018), pp. 936-940. [10.1016/j.microrel.2018.07.135] 1-gen-2018 Azimi, S.Sterpone, L.Du, B. + -
A new approach for Total Ionizing Dose effect analysis on Flash-based FPGA / Zhang, Qiutao; Azimi, Sarah; LA VACCARA, Germano; Sterpone, Luca; Du, Boyang. - In: MICROELECTRONICS RELIABILITY. - ISSN 0026-2714. - 76-77:(2017), pp. 58-63. [10.1016/j.microrel.2017.07.066] 1-gen-2017 AZIMI, SARAHLA VACCARA, GERMANOSTERPONE, LUCADU, BOYANG + 1-s2.0-S0026271417303505-main.pdf
Evaluation of transient errors in GPGPUs for safety critical applications: An effective simulation-based fault injection environment / Azimi, Sarah; Du, Boyang; Sterpone, Luca. - In: JOURNAL OF SYSTEMS ARCHITECTURE. - ISSN 1383-7621. - ELETTRONICO. - 75:(2017), pp. 95-106. [10.1016/j.sysarc.2017.01.009] 1-gen-2017 AZIMI, SARAHDU, BOYANGSTERPONE, LUCA 1-s2.0-S1383762117300528-main.pdf
On the prediction of Radiation-induced SETs in Flash-based FPGAs / Azimi, Sarah; Du, Boyang; Sterpone, Luca. - In: MICROELECTRONICS RELIABILITY. - ISSN 0026-2714. - ELETTRONICO. - 64:(2016), pp. 230-234. [10.1016/j.microrel.2016.07.106] 1-gen-2016 AZIMI, SARAHDU, BOYANGSTERPONE, LUCA -
Online Test of Control Flow Errors: A New Debug Interface-Based Approach / Du, Boyang; SONZA REORDA, Matteo; Sterpone, Luca; Luis, Parra; Marta Portela, García; Almudena, Lindoso; Luis, Entrena. - In: IEEE TRANSACTIONS ON COMPUTERS. - ISSN 0018-9340. - ELETTRONICO. - 65:6(2016), pp. 1846-1855. [10.1109/TC.2015.2456014] 1-gen-2016 DU, BOYANGSONZA REORDA, MatteoSTERPONE, LUCA + 07155525.pdf
Radiation-induced single event transients modeling and testing on nanometric flash-based technologies / Sterpone, Luca; Du, Boyang; Azimi, Sarah. - In: MICROELECTRONICS RELIABILITY. - ISSN 0026-2714. - ELETTRONICO. - 55:9-10(2015), pp. 2087-2091. [10.1016/j.microrel.2015.07.035] 1-gen-2015 STERPONE, LUCADU, BOYANGAZIMI, SARAH -
A New Hybrid Nonintrusive Error-Detection Technique Using Dual Control-Flow Monitoring / L., Parra; A., Lindoso; M., Portela Garcia; L., Entrena; Du, Boyang; SONZA REORDA, Matteo; Sterpone, Luca. - In: IEEE TRANSACTIONS ON NUCLEAR SCIENCE. - ISSN 0018-9499. - 61:(2014), pp. 3236-3243. [10.1109/TNS.2014.2361953] 1-gen-2014 DU, BOYANGSONZA REORDA, MatteoSTERPONE, Luca + -