Reliability assessment on 16 nm ultrascale+ MPSoC using fault injection and fault tree analysis

A methodology is proposed to emulate and assess the single event effect in configuration memory on 16 nm Ultrascale+ MPSoC. The solution depends on fault injection and fault tree analysis. Three image processing applications, including histogram computation, image stretch and sobel edge detection, are used as the benchmarks. The results demonstrate 38.1% to 40.5% system errors cannot be recovered, although the SEM sub-system is adopted to recover the corresponding upset in the configuration memory.