FIORI, FRANCO
 Distribuzione geografica
Continente #
EU - Europa 17.525
NA - Nord America 16.185
AS - Asia 4.245
SA - Sud America 523
AF - Africa 230
OC - Oceania 16
Continente sconosciuto - Info sul continente non disponibili 6
AN - Antartide 1
Totale 38.731
Nazione #
US - Stati Uniti d'America 16.076
IT - Italia 4.306
GB - Regno Unito 3.381
DE - Germania 3.155
FR - Francia 2.536
CN - Cina 1.496
SG - Singapore 1.252
UA - Ucraina 1.214
RU - Federazione Russa 460
TR - Turchia 436
BR - Brasile 432
SE - Svezia 416
IE - Irlanda 392
CH - Svizzera 384
KR - Corea 383
NL - Olanda 257
BE - Belgio 236
FI - Finlandia 229
AT - Austria 180
JP - Giappone 141
HK - Hong Kong 105
IN - India 87
CA - Canada 82
CI - Costa d'Avorio 69
AP - ???statistics.table.value.countryCode.AP??? 67
SN - Senegal 67
MY - Malesia 53
BG - Bulgaria 51
EU - Europa 50
ID - Indonesia 49
EG - Egitto 47
IL - Israele 45
RO - Romania 38
VN - Vietnam 35
AR - Argentina 34
TW - Taiwan 34
CZ - Repubblica Ceca 33
IR - Iran 29
NO - Norvegia 28
MX - Messico 21
ZA - Sudafrica 20
AE - Emirati Arabi Uniti 19
PL - Polonia 19
EC - Ecuador 16
ES - Italia 16
JO - Giordania 16
CO - Colombia 14
CL - Cile 13
AU - Australia 12
BD - Bangladesh 11
IQ - Iraq 10
LT - Lituania 9
LU - Lussemburgo 9
PK - Pakistan 9
AL - Albania 8
GR - Grecia 8
NG - Nigeria 8
TH - Thailandia 8
AZ - Azerbaigian 7
HR - Croazia 7
EE - Estonia 5
KZ - Kazakistan 5
MA - Marocco 5
UZ - Uzbekistan 5
DK - Danimarca 4
HU - Ungheria 4
JM - Giamaica 4
KE - Kenya 4
MD - Moldavia 4
NZ - Nuova Zelanda 4
PT - Portogallo 4
SA - Arabia Saudita 4
SK - Slovacchia (Repubblica Slovacca) 4
TN - Tunisia 4
UY - Uruguay 4
VE - Venezuela 4
BO - Bolivia 3
BY - Bielorussia 3
GE - Georgia 3
GH - Ghana 3
KG - Kirghizistan 3
PE - Perù 3
A2 - ???statistics.table.value.countryCode.A2??? 2
DZ - Algeria 2
LV - Lettonia 2
NP - Nepal 2
PH - Filippine 2
AQ - Antartide 1
BH - Bahrain 1
BZ - Belize 1
CY - Cipro 1
GA - Gabon 1
GT - Guatemala 1
KW - Kuwait 1
LA - Repubblica Popolare Democratica del Laos 1
LK - Sri Lanka 1
MN - Mongolia 1
Totale 38.731
Città #
Ashburn 4.264
Southend 3.082
Seattle 1.938
Turin 959
Fairfield 942
Chandler 714
Princeton 666
Jacksonville 634
Singapore 548
Ann Arbor 528
Woodbridge 506
Torino 458
San Ramon 439
Houston 427
Cambridge 414
Berlin 395
Beijing 385
Dublin 382
Santa Clara 379
Wilmington 363
Bern 346
Boardman 321
Milan 318
Izmir 285
Frankfurt 219
Brussels 213
San Donato Milanese 207
Helsinki 186
Shanghai 178
Katy 172
Bologna 159
Fujian 153
Council Bluffs 152
Zaporozhye 149
Pennsylvania Furnace 145
Overberg 138
Zhengzhou 136
Baltimore 129
Monopoli 111
Padua 101
Chicago 100
Saint Petersburg 91
Vienna 81
Hefei 74
Abidjan 69
Mountain View 69
Seoul 68
Redwood City 63
Des Moines 62
Duncan 60
Istanbul 53
Hangzhou 52
Malatya 52
Guangzhou 51
Yubileyny 51
Frankfurt am Main 49
Fremont 48
Cairo 47
San Diego 47
Jakarta 46
Neubiberg 45
Rome 45
Washington 45
Sofia 42
Toronto 40
Atlanta 39
Hong Kong 39
Norwalk 39
Shenzhen 39
Amsterdam 37
San Francisco 36
São Paulo 35
Melun 34
Tokyo 34
London 33
Nuremberg 33
New York 31
Hanover 28
Lappeenranta 28
Redmond 27
Brno 26
Falls Church 26
Buffalo 24
Stavanger 24
Andover 22
Galati 22
Verona 22
Ningbo 21
Graz 20
Modena 20
San Jose 20
Moscow 19
Piscataway 19
Cangzhou 18
Belo Horizonte 17
Bremen 17
Las Vegas 17
Los Angeles 17
Munich 17
Podenzano 17
Totale 24.608
Nome #
A New Mirroring Circuit for Power MOS Current Sensing Highly Immune to EMI 470
A critical assessment of the closed-loop bulk current injection immunity test performed in compliance with ISO 11452-4 345
DISPOSITIVO E SISTEMA PER LA TRASMISSIONE DI DATI DI INFORMAZIONE TRAMITE UN SEGNALE DI TIPO ULTRASONICO, E RELATIVO METODO 337
EMI-inducted failures in MOS power transistors 332
Modeling the IEC 61000-4-4 EFT Injection Clamp 323
On the Susceptibility of Embedded Thermal Shutdown Circuit to Radio Frequency Interference 321
A New Current Sensor Based on the Miller Effect Highly Immune to EMI 314
A Wideband Ultrasound Connector Immune to EMI 313
A New Filtering Technique for Increasing the Immunity of Power Transistors to RFI 306
Introduction to CMOS Analog Circuits 302
Reduction of the EMI in BLDC Motor Drives Based on Delay Compensation 299
Modified Gummel Poon Model for Susceptibility Prediction 294
A new MagFET-based integrated current sensor highly immune to EMI 292
A New Current Sensor Based on MagFET Highly Immune to EMI 290
Investigation on the Susceptibility of Hall-Effect Current Sensors to EMI 289
Investigation on the Susceptibility of Integrated Current Sensors to EMI 280
Ultrasound CAN Bus Transceiver Highly Immune to EMI 280
A New Filtering Technique That Makes Power Transistors Immune to EMI 280
Reliability of Integrated Over-temperature Sensors in EM polluted environment 279
MOS Power Transistor Model for Electromagnetic Susceptibility Analysis 274
Electrical Model of Microcontrollers for the Prediction of Electromagnetic Emissions 272
Chip-Level Design Constraints to Comply With Conducted Electromagnetic Emission Specifications 268
Distributed Conversion of Common Mode into Differential Mode Interference 267
Worst-Case Induced Disturbances in Digital and Analog Interchip Interconnects by an External Electromagnetic Plane Wave - Part I: Modeling and Algorithm 263
Susceptibility of Smart Power ICs to Radio Frequency Interference 262
Electrical Model of a Microcontroller for EMC Analysis 262
A New Integrated Current Sensor Immune to RFI 260
A New Front-End for Binary Data Recovery in EM Polluted Environment 259
Worst Case-Induced Disturbances in Microstrip Interchip Interconnects by an External Electromagnetic Plane Wave - Part II: Analysis and Validation 255
A New Power MOS Current Sensor Highly Immune to EMI 254
A Simulation-based black-box microcontroller model for EME Prediction 254
A Linear Voltage Regulator Model for EMC Analysis 253
On the effectiveness of EMIRR to qualify OpAmps 251
Investigations on the susceptibility of ICs to power-switching transients 251
Nonlinear effects of radio-frequency interference in operational amplifiers 250
A New Compact Temperature-Compensated CMOS Current Reference 249
Design of an Operational Amplifier Input Stage Immune to EMI 248
Current Sensing Circuit for DC-DC Converters Based on the Miller Effect 248
Software based control of the EMI generated in BLDC motor drives 241
Compact temperature-compensated CMOS current reference 240
IC Digital Input Highly Immune to EMI 239
Prediction of high-power EMI effects in CMOS operational amplifiers 238
A critical assessment of the closed-loop bulk current injection immunity test performed in compliance with ISO 11452-4 238
Operational amplifier input stage robust to EMI 237
Prediction of RF interference in operational amplifier by a new analytical model 237
A new grounding scheme to reduce the electromagnetic emission of smart-power system-on-chips 235
Design of a CMOS opamp input stage immune to EMI 233
Investigation on VLSIs' input ports susceptibility to conducted RF interference 228
Susceptibility to EMI of a Battery Management System IC for electric vehicles 226
Complementary differential pair with a high immunity to RFI 225
Susceptibility of CMOS Voltage Comparators to Radio Frequency Interference 222
Linear voltage regulator susceptibility to conducted EMI 221
Investigation on the Susceptibility of BLE Receivers to Power Switching Noise 220
A Binary Front-End Robust to EMI-Induced Errors 220
Finite Common-Mode Rejection in Fully Differential Operational Amplifiers 219
On the Susceptibility of Chopper Operational Amplifiers to EMI 219
Comparison of IC conducted emission measurement methods 218
Efficient BEM-based substrate network extraction in silicon SoCs 218
Nonlinear effects of RF interference in MOS operational amplifiers 218
Compact, Very Low Voltage, Temperature-Independent Reference Circuit 218
Susceptibility of chopper OpAmps to EMI 217
Efficient Substrate Coupling Analysis in Smart Power Integrated Circuits 215
RFI-induced failures in switched capacitor circuits 214
On the use of High-Impedance Power Supplies to Reduce the Substrate Switching Noise in System-on-Chips 214
An analog front end based on chopped signals highly immune to RFI 213
An Effective Way of Testing the Susceptibility to EMI of Custom ICs 211
RFI-Induced Distortion in Switched-Capacitor Circuits 209
Comparison of IC conducted measurement methods 208
Weakness of the TEM cell method in evaluating IC radiated emissions 205
A New Grounding Scheme to Reduce the Electromagnetic Emission of Smart Power SoCs 205
Comparison of the susceptibility to EMI of MOS and BJT operational amplifiers 203
Development and Metrological Characterization of a Multi-sensor Device for Indoor Environmental Quality (IEQ) monitoring 202
Investigation on RFI effects in bandgap voltage references 202
A CMOS Opamp Immune to EMIwith no Penalty in Baseband Operation 201
MODIFIED GUMMEL POON MODEL FOR ELECTROMAGNETIC SUSCEPTIBILITY PREDICTION 200
Prediction of EMI effects in operational amplifiers by a two input Volterra series model 200
A new Single-ended I/O with Reduced Electromagnetic Emissions 200
Assessment of Digital Integrated- Circuit Electromagnetic Emission Bases on Radiated Power Evaluation 199
Analysis of Opamp Operation Under High Power EMI 199
Smart power IC macromodeling for DPI analysis 198
Low Power single-ended I/O circuit for binary interchip communications 198
Investigation on the effectiveness of the IC susceptibility TEM cell method 196
A New Approach to Characterize Complex ICs in Terms of Scattering Parameters 195
A new nonlinear model of EMI-induced distortion phenomena in feedback CMOS operational amplifier 194
Nonlinear effects of RF interference in SC circuits 194
On the Use of the IC Stripline to Evaluate the Susceptibility to EMI of Small Integrated Circuits 194
Multi-Sensor Device for Traceable Monitoring of Indoor Environmental Quality 194
Test Solution for Heatsinks in Power Electronics Applications 192
Behavioural Model of Integrated Circuits for EMC Prediction 191
A Sensor Signal Amplifier Resilient to EMI 191
A high immunity complementary differential pair 190
Susceptibility to EMI of high side current sensors based on chopper OpAmps 190
Computer Aided Analysis of RF Effects in BJT Circuits 190
Riferimento di tensione e di corrente 189
A critical assessment of the TEM cell IC susceptibility test method 188
EMI susceptibility: The achilles' heel of smart power ICs 188
Identification of integrated circuits conducted emission limits for automotive applications 187
Correlation between building block power supply currents and conducted emission of digital ICs 186
Investigation on the Susceptibility to EMI of sigma-delta converters 186
Demodulation of Radio-Frequency Interference in CMOS Operational Amplifiers 185
Totale 23.789
Categoria #
all - tutte 116.459
article - articoli 42.135
book - libri 707
conference - conferenze 69.188
curatela - curatele 0
other - altro 655
patent - brevetti 2.229
selected - selezionate 0
volume - volumi 1.545
Totale 232.918


Totale Lug Ago Sett Ott Nov Dic Gen Feb Mar Apr Mag Giu
2019/202087 0 0 0 0 0 0 0 0 0 0 0 87
2020/20212.669 386 377 79 316 127 263 105 200 171 295 215 135
2021/20222.732 107 190 108 103 246 204 151 99 213 239 522 550
2022/20233.422 306 587 155 235 307 464 293 188 282 32 179 394
2023/20241.576 65 174 88 100 154 153 90 118 78 75 228 253
2024/20254.599 97 533 220 536 327 293 303 299 766 360 372 493
Totale 39.016