PORTO @ Archivio Istituzionale della Ricerca

FIORI, FRANCO
 Distribuzione geografica
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Continente #
EU - Europa 17.956
NA - Nord America 17.658
AS - Asia 6.770
SA - Sud America 840
AF - Africa 260
OC - Oceania 20
Continente sconosciuto - Info sul continente non disponibili 6
AN - Antartide 1
Totale 43.511
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Nazione #
US - Stati Uniti d'America 17.505
IT - Italia 4.524
GB - Regno Unito 3.405
DE - Germania 3.216
FR - Francia 2.568
SG - Singapore 2.456
CN - Cina 2.255
UA - Ucraina 1.216
BR - Brasile 677
KR - Corea 597
RU - Federazione Russa 467
TR - Turchia 447
SE - Svezia 423
IE - Irlanda 393
CH - Svizzera 384
NL - Olanda 266
FI - Finlandia 249
BE - Belgio 236
AT - Austria 188
HK - Hong Kong 183
VN - Vietnam 167
JP - Giappone 163
IN - India 111
CA - Canada 103
CI - Costa d'Avorio 71
SN - Senegal 68
AP - ???statistics.table.value.countryCode.AP??? 67
AR - Argentina 62
ID - Indonesia 59
MY - Malesia 55
BG - Bulgaria 52
EU - Europa 50
EG - Egitto 47
IL - Israele 47
RO - Romania 38
CZ - Repubblica Ceca 36
MX - Messico 36
PL - Polonia 34
TW - Taiwan 34
ZA - Sudafrica 33
IQ - Iraq 29
IR - Iran 29
NO - Norvegia 28
EC - Ecuador 27
BD - Bangladesh 26
CO - Colombia 23
ES - Italia 23
JO - Giordania 21
AE - Emirati Arabi Uniti 19
CL - Cile 18
AU - Australia 16
LT - Lituania 13
PK - Pakistan 11
SA - Arabia Saudita 11
VE - Venezuela 11
LU - Lussemburgo 9
MA - Marocco 9
PT - Portogallo 9
TH - Thailandia 9
AL - Albania 8
AZ - Azerbaigian 8
GR - Grecia 8
NG - Nigeria 8
PE - Perù 8
UZ - Uzbekistan 8
HR - Croazia 7
KZ - Kazakistan 7
TN - Tunisia 7
UY - Uruguay 7
KE - Kenya 6
DK - Danimarca 5
DZ - Algeria 5
EE - Estonia 5
HU - Ungheria 5
MM - Myanmar 5
BO - Bolivia 4
GE - Georgia 4
JM - Giamaica 4
MD - Moldavia 4
NZ - Nuova Zelanda 4
SK - Slovacchia (Repubblica Slovacca) 4
BY - Bielorussia 3
GH - Ghana 3
GT - Guatemala 3
KG - Kirghizistan 3
NP - Nepal 3
PY - Paraguay 3
A2 - ???statistics.table.value.countryCode.A2??? 2
BA - Bosnia-Erzegovina 2
DO - Repubblica Dominicana 2
GA - Gabon 2
LV - Lettonia 2
PH - Filippine 2
RS - Serbia 2
AQ - Antartide 1
BH - Bahrain 1
BN - Brunei Darussalam 1
BZ - Belize 1
CR - Costa Rica 1
CY - Cipro 1
Totale 43.498
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Città #
Ashburn 4.474
Southend 3.082
Seattle 1.940
Singapore 1.345
Turin 1.064
Fairfield 942
Chandler 714
Dallas 688
Princeton 666
Jacksonville 635
Ann Arbor 528
Woodbridge 506
Beijing 478
Torino 458
San Ramon 439
Houston 430
Cambridge 414
Berlin 395
Santa Clara 391
Dublin 383
Milan 364
Wilmington 363
Bern 346
Boardman 321
Izmir 285
Frankfurt 219
Brussels 213
San Donato Milanese 207
Seoul 204
Hefei 190
Helsinki 187
Shanghai 187
Katy 172
Bologna 159
Fujian 153
Council Bluffs 152
Zaporozhye 149
Pennsylvania Furnace 145
Zhengzhou 145
Overberg 138
Baltimore 129
Hong Kong 116
Monopoli 111
Chicago 108
Padua 107
Buffalo 96
Saint Petersburg 91
Vienna 87
Los Angeles 85
Frankfurt am Main 79
North Bergen 78
Abidjan 70
Mountain View 69
Guangzhou 67
Des Moines 65
Redwood City 63
São Paulo 61
Duncan 60
Ho Chi Minh City 59
Hangzhou 57
Tokyo 55
Istanbul 54
Malatya 52
Yubileyny 51
Rome 49
Fremont 48
San Diego 48
Cairo 47
Jakarta 46
New York 46
Hanoi 45
Neubiberg 45
Toronto 45
Washington 45
Amsterdam 44
Munich 43
Shenzhen 43
Atlanta 42
Sofia 42
Lappeenranta 40
Norwalk 39
San Francisco 39
London 38
Nuremberg 35
Melun 34
The Dalles 34
Redondo Beach 33
Hanover 28
Redmond 27
Brno 26
Falls Church 26
Columbus 24
Stavanger 24
Andover 22
Galati 22
Ningbo 22
Verona 22
San Jose 21
Belo Horizonte 20
Changsha 20
Totale 27.415
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Nome #
A New Mirroring Circuit for Power MOS Current Sensing Highly Immune to EMI 485
A critical assessment of the closed-loop bulk current injection immunity test performed in compliance with ISO 11452-4 356
EMI-inducted failures in MOS power transistors 349
DISPOSITIVO E SISTEMA PER LA TRASMISSIONE DI DATI DI INFORMAZIONE TRAMITE UN SEGNALE DI TIPO ULTRASONICO, E RELATIVO METODO 349
Modeling the IEC 61000-4-4 EFT Injection Clamp 340
On the Susceptibility of Embedded Thermal Shutdown Circuit to Radio Frequency Interference 339
Reduction of the EMI in BLDC Motor Drives Based on Delay Compensation 337
A New Current Sensor Based on the Miller Effect Highly Immune to EMI 330
Modified Gummel Poon Model for Susceptibility Prediction 326
A Wideband Ultrasound Connector Immune to EMI 325
A New Filtering Technique for Increasing the Immunity of Power Transistors to RFI 325
Introduction to CMOS Analog Circuits 315
A new MagFET-based integrated current sensor highly immune to EMI 311
Investigation on the Susceptibility of Hall-Effect Current Sensors to EMI 306
A New Current Sensor Based on MagFET Highly Immune to EMI 305
Investigation on the Susceptibility of Integrated Current Sensors to EMI 298
Reliability of Integrated Over-temperature Sensors in EM polluted environment 295
Ultrasound CAN Bus Transceiver Highly Immune to EMI 295
Multi-Sensor Device for Traceable Monitoring of Indoor Environmental Quality 294
Electrical Model of Microcontrollers for the Prediction of Electromagnetic Emissions 291
MOS Power Transistor Model for Electromagnetic Susceptibility Analysis 291
A New Filtering Technique That Makes Power Transistors Immune to EMI 289
Electrical Model of a Microcontroller for EMC Analysis 280
Chip-Level Design Constraints to Comply With Conducted Electromagnetic Emission Specifications 279
Development and Metrological Characterization of a Multi-sensor Device for Indoor Environmental Quality (IEQ) monitoring 277
A New Front-End for Binary Data Recovery in EM Polluted Environment 277
Susceptibility of Smart Power ICs to Radio Frequency Interference 274
Nonlinear effects of radio-frequency interference in operational amplifiers 274
Worst-Case Induced Disturbances in Digital and Analog Interchip Interconnects by an External Electromagnetic Plane Wave - Part I: Modeling and Algorithm 273
A New Integrated Current Sensor Immune to RFI 273
Distributed Conversion of Common Mode into Differential Mode Interference 272
Worst Case-Induced Disturbances in Microstrip Interchip Interconnects by an External Electromagnetic Plane Wave - Part II: Analysis and Validation 269
A New Power MOS Current Sensor Highly Immune to EMI 269
Current Sensing Circuit for DC-DC Converters Based on the Miller Effect 269
A Linear Voltage Regulator Model for EMC Analysis 266
A New Compact Temperature-Compensated CMOS Current Reference 265
Investigations on the susceptibility of ICs to power-switching transients 265
A Simulation-based black-box microcontroller model for EME Prediction 264
On the effectiveness of EMIRR to qualify OpAmps 261
Prediction of RF interference in operational amplifier by a new analytical model 257
Design of an Operational Amplifier Input Stage Immune to EMI 255
Software based control of the EMI generated in BLDC motor drives 255
A critical assessment of the closed-loop bulk current injection immunity test performed in compliance with ISO 11452-4 255
Compact temperature-compensated CMOS current reference 254
Operational amplifier input stage robust to EMI 253
Investigation on VLSIs' input ports susceptibility to conducted RF interference 252
IC Digital Input Highly Immune to EMI 249
Prediction of high-power EMI effects in CMOS operational amplifiers 247
A new grounding scheme to reduce the electromagnetic emission of smart-power system-on-chips 246
Design of a CMOS opamp input stage immune to EMI 245
Compact, Very Low Voltage, Temperature-Independent Reference Circuit 245
Susceptibility to EMI of a Battery Management System IC for electric vehicles 241
Development of a multi-sensor device for indoor environmental quality assessment 240
Susceptibility of CMOS Voltage Comparators to Radio Frequency Interference 236
Linear voltage regulator susceptibility to conducted EMI 234
Data Acquisition, Processing, and Aggregation in a Low-Cost IoT System for Indoor Environmental Quality Monitoring 233
A Binary Front-End Robust to EMI-Induced Errors 233
Complementary differential pair with a high immunity to RFI 233
Nonlinear effects of RF interference in MOS operational amplifiers 232
Investigation on the Susceptibility of BLE Receivers to Power Switching Noise 232
On the Susceptibility of Chopper Operational Amplifiers to EMI 231
Weakness of the TEM cell method in evaluating IC radiated emissions 230
Comparison of IC conducted emission measurement methods 230
On the use of High-Impedance Power Supplies to Reduce the Substrate Switching Noise in System-on-Chips 230
Finite Common-Mode Rejection in Fully Differential Operational Amplifiers 230
Susceptibility of chopper OpAmps to EMI 230
RFI-induced failures in switched capacitor circuits 228
Efficient BEM-based substrate network extraction in silicon SoCs 227
An Effective Way of Testing the Susceptibility to EMI of Custom ICs 227
MODIFIED GUMMEL POON MODEL FOR ELECTROMAGNETIC SUSCEPTIBILITY PREDICTION 225
An analog front end based on chopped signals highly immune to RFI 225
Efficient Substrate Coupling Analysis in Smart Power Integrated Circuits 224
Test Solution for Heatsinks in Power Electronics Applications 224
Comparison of IC conducted measurement methods 223
RFI-Induced Distortion in Switched-Capacitor Circuits 223
Assessment of Digital Integrated- Circuit Electromagnetic Emission Bases on Radiated Power Evaluation 221
A New Grounding Scheme to Reduce the Electromagnetic Emission of Smart Power SoCs 221
Comparison of the susceptibility to EMI of MOS and BJT operational amplifiers 215
Prediction of EMI effects in operational amplifiers by a two input Volterra series model 215
Behavioural Model of Integrated Circuits for EMC Prediction 213
A New Approach to Characterize Complex ICs in Terms of Scattering Parameters 213
Analysis of Opamp Operation Under High Power EMI 212
Investigation on RFI effects in bandgap voltage references 212
On the Use of the IC Stripline to Evaluate the Susceptibility to EMI of Small Integrated Circuits 212
A new Single-ended I/O with Reduced Electromagnetic Emissions 211
Computer Aided Analysis of RF Effects in BJT Circuits 209
EMI susceptibility: The achilles' heel of smart power ICs 208
A new nonlinear model of EMI-induced distortion phenomena in feedback CMOS operational amplifier 208
A CMOS Opamp Immune to EMIwith no Penalty in Baseband Operation 208
Smart power IC macromodeling for DPI analysis 207
Investigation on the effectiveness of the IC susceptibility TEM cell method 206
A critical assessment of the TEM cell IC susceptibility test method 205
Faults Detection in the Heatsinks Mounted on Power Electronic Transistors 205
On the effects of RF interference in voltage regulator integrated circuits 204
Riferimento di tensione e di corrente 204
EMI-Induced Distortion of Baseband Signals in Current Feedback Instrumentation Amplifiers 203
Nonlinear effects of RF interference in SC circuits 203
Low Power single-ended I/O circuit for binary interchip communications 203
A Sensor Signal Amplifier Resilient to EMI 202
New Challenges on the Electromagnetic Compatibility of Electric Vehicles 200
Totale 25.512
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Categoria #
all - tutte 131.121
article - articoli 47.189
book - libri 758
conference - conferenze 78.263
curatela - curatele 0
other - altro 712
patent - brevetti 2.503
selected - selezionate 0
volume - volumi 1.696
Totale 262.242
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Totale Lug Ago Sett Ott Nov Dic Gen Feb Mar Apr Mag Giu
2020/20211.384 0 0 0 0 0 263 105 200 171 295 215 135
2021/20222.732 107 190 108 103 246 204 151 99 213 239 522 550
2022/20233.422 306 587 155 235 307 464 293 188 282 32 179 394
2023/20241.576 65 174 88 100 154 153 90 118 78 75 228 253
2024/20254.682 97 533 220 536 327 293 303 299 766 360 372 576
2025/20264.710 651 642 1.343 1.217 763 94 0 0 0 0 0 0
Totale 43.809