PORTO @ Archivio Istituzionale della Ricerca

FIORI, FRANCO
 Distribuzione geografica
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Continente #
EU - Europa 17.091
NA - Nord America 15.751
AS - Asia 3.057
AF - Africa 210
SA - Sud America 59
OC - Oceania 16
Continente sconosciuto - Info sul continente non disponibili 6
Totale 36.190
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Nazione #
US - Stati Uniti d'America 15.663
IT - Italia 4.097
GB - Regno Unito 3.362
DE - Germania 3.115
FR - Francia 2.525
CN - Cina 1.233
UA - Ucraina 1.208
SG - Singapore 514
RU - Federazione Russa 445
TR - Turchia 418
SE - Svezia 415
IE - Irlanda 388
CH - Svizzera 384
KR - Corea 338
NL - Olanda 244
BE - Belgio 235
FI - Finlandia 212
JP - Giappone 128
AT - Austria 112
HK - Hong Kong 81
CA - Canada 76
IN - India 75
CI - Costa d'Avorio 69
AP - ???statistics.table.value.countryCode.AP??? 67
SN - Senegal 66
MY - Malesia 53
BG - Bulgaria 50
EU - Europa 50
ID - Indonesia 49
EG - Egitto 47
RO - Romania 38
TW - Taiwan 33
CZ - Repubblica Ceca 30
IR - Iran 29
VN - Vietnam 29
IL - Israele 28
NO - Norvegia 28
AE - Emirati Arabi Uniti 18
BR - Brasile 16
JO - Giordania 15
AR - Argentina 14
AU - Australia 12
CL - Cile 12
PL - Polonia 12
ES - Italia 11
MX - Messico 11
ZA - Sudafrica 10
EC - Ecuador 8
LU - Lussemburgo 8
NG - Nigeria 8
TH - Thailandia 8
CO - Colombia 7
GR - Grecia 7
HR - Croazia 7
LT - Lituania 7
AL - Albania 6
EE - Estonia 5
DK - Danimarca 4
KZ - Kazakistan 4
NZ - Nuova Zelanda 4
PK - Pakistan 4
SK - Slovacchia (Repubblica Slovacca) 4
GH - Ghana 3
HU - Ungheria 3
IQ - Iraq 3
A2 - ???statistics.table.value.countryCode.A2??? 2
AZ - Azerbaigian 2
BY - Bielorussia 2
DZ - Algeria 2
GE - Georgia 2
KE - Kenya 2
MD - Moldavia 2
TN - Tunisia 2
BD - Bangladesh 1
BZ - Belize 1
LV - Lettonia 1
MA - Marocco 1
PE - Perù 1
PH - Filippine 1
PT - Portogallo 1
UZ - Uzbekistan 1
VE - Venezuela 1
Totale 36.190
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Città #
Ashburn 4.236
Southend 3.082
Seattle 1.932
Fairfield 942
Turin 874
Chandler 714
Princeton 666
Jacksonville 634
Ann Arbor 528
Woodbridge 506
Torino 458
San Ramon 439
Houston 423
Cambridge 414
Berlin 395
Dublin 378
Santa Clara 375
Beijing 373
Wilmington 363
Singapore 348
Bern 346
Boardman 320
Izmir 285
Milan 261
Frankfurt 219
Brussels 213
San Donato Milanese 207
Helsinki 186
Katy 172
Shanghai 170
Bologna 157
Fujian 153
Zaporozhye 149
Pennsylvania Furnace 145
Overberg 138
Zhengzhou 136
Baltimore 129
Council Bluffs 123
Monopoli 111
Padua 101
Chicago 97
Saint Petersburg 91
Abidjan 69
Mountain View 69
Seoul 68
Vienna 65
Redwood City 63
Des Moines 62
Duncan 60
Hangzhou 52
Istanbul 52
Malatya 52
Guangzhou 51
Yubileyny 51
Frankfurt am Main 49
Fremont 48
Cairo 47
Jakarta 46
San Diego 46
Neubiberg 45
Washington 45
Sofia 41
Norwalk 39
Rome 39
Shenzhen 39
Atlanta 38
Toronto 38
Melun 34
Amsterdam 33
London 30
Hanover 28
Redmond 27
San Francisco 27
Brno 26
Falls Church 26
Tokyo 26
Buffalo 24
Lappeenranta 24
Stavanger 24
Galati 22
Verona 22
Andover 21
New York 21
Ningbo 21
Graz 20
Modena 20
Moscow 19
Piscataway 19
San Jose 19
Hong Kong 18
Bremen 17
Las Vegas 17
Podenzano 17
San Mauro Torinese 17
Cadoneghe 16
Central District 16
Dong Ket 16
Salassa 16
Tel Aviv 16
Taipei 15
Totale 23.977
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Nome #
A New Mirroring Circuit for Power MOS Current Sensing Highly Immune to EMI 454
A critical assessment of the closed-loop bulk current injection immunity test performed in compliance with ISO 11452-4 339
DISPOSITIVO E SISTEMA PER LA TRASMISSIONE DI DATI DI INFORMAZIONE TRAMITE UN SEGNALE DI TIPO ULTRASONICO, E RELATIVO METODO 325
EMI-inducted failures in MOS power transistors 323
On the Susceptibility of Embedded Thermal Shutdown Circuit to Radio Frequency Interference 312
Modeling the IEC 61000-4-4 EFT Injection Clamp 310
A New Current Sensor Based on the Miller Effect Highly Immune to EMI 308
A Wideband Ultrasound Connector Immune to EMI 307
A New Filtering Technique for Increasing the Immunity of Power Transistors to RFI 290
Introduction to CMOS Analog Circuits 286
A New Current Sensor Based on MagFET Highly Immune to EMI 284
Investigation on the Susceptibility of Hall-Effect Current Sensors to EMI 282
A new MagFET-based integrated current sensor highly immune to EMI 280
Reduction of the EMI in BLDC Motor Drives Based on Delay Compensation 277
Ultrasound CAN Bus Transceiver Highly Immune to EMI 276
A New Filtering Technique That Makes Power Transistors Immune to EMI 274
Modified Gummel Poon Model for Susceptibility Prediction 271
Reliability of Integrated Over-temperature Sensors in EM polluted environment 268
Electrical Model of Microcontrollers for the Prediction of Electromagnetic Emissions 266
Investigation on the Susceptibility of Integrated Current Sensors to EMI 265
MOS Power Transistor Model for Electromagnetic Susceptibility Analysis 264
Chip-Level Design Constraints to Comply With Conducted Electromagnetic Emission Specifications 261
Distributed Conversion of Common Mode into Differential Mode Interference 258
Worst-Case Induced Disturbances in Digital and Analog Interchip Interconnects by an External Electromagnetic Plane Wave - Part I: Modeling and Algorithm 256
Susceptibility of Smart Power ICs to Radio Frequency Interference 253
A New Integrated Current Sensor Immune to RFI 253
Worst Case-Induced Disturbances in Microstrip Interchip Interconnects by an External Electromagnetic Plane Wave - Part II: Analysis and Validation 248
A Linear Voltage Regulator Model for EMC Analysis 247
On the effectiveness of EMIRR to qualify OpAmps 247
A Simulation-based black-box microcontroller model for EME Prediction 246
Electrical Model of a Microcontroller for EMC Analysis 245
A New Power MOS Current Sensor Highly Immune to EMI 244
A New Compact Temperature-Compensated CMOS Current Reference 244
Investigations on the susceptibility of ICs to power-switching transients 242
Nonlinear effects of radio-frequency interference in operational amplifiers 242
Current Sensing Circuit for DC-DC Converters Based on the Miller Effect 240
Design of an Operational Amplifier Input Stage Immune to EMI 238
A New Front-End for Binary Data Recovery in EM Polluted Environment 238
Prediction of high-power EMI effects in CMOS operational amplifiers 234
Compact temperature-compensated CMOS current reference 231
Operational amplifier input stage robust to EMI 230
IC Digital Input Highly Immune to EMI 230
A critical assessment of the closed-loop bulk current injection immunity test performed in compliance with ISO 11452-4 230
A new grounding scheme to reduce the electromagnetic emission of smart-power system-on-chips 229
Software based control of the EMI generated in BLDC motor drives 226
Design of a CMOS opamp input stage immune to EMI 224
Susceptibility to EMI of a Battery Management System IC for electric vehicles 223
Complementary differential pair with a high immunity to RFI 221
Prediction of RF interference in operational amplifier by a new analytical model 217
Susceptibility of CMOS Voltage Comparators to Radio Frequency Interference 216
Linear voltage regulator susceptibility to conducted EMI 215
Susceptibility of chopper OpAmps to EMI 214
Comparison of IC conducted emission measurement methods 212
A Binary Front-End Robust to EMI-Induced Errors 212
Finite Common-Mode Rejection in Fully Differential Operational Amplifiers 211
On the Susceptibility of Chopper Operational Amplifiers to EMI 210
Efficient Substrate Coupling Analysis in Smart Power Integrated Circuits 209
Investigation on the Susceptibility of BLE Receivers to Power Switching Noise 208
RFI-induced failures in switched capacitor circuits 207
Nonlinear effects of RF interference in MOS operational amplifiers 207
Efficient BEM-based substrate network extraction in silicon SoCs 206
An analog front end based on chopped signals highly immune to RFI 206
Investigation on VLSIs' input ports susceptibility to conducted RF interference 206
On the use of High-Impedance Power Supplies to Reduce the Substrate Switching Noise in System-on-Chips 204
Compact, Very Low Voltage, Temperature-Independent Reference Circuit 204
Comparison of IC conducted measurement methods 201
An Effective Way of Testing the Susceptibility to EMI of Custom ICs 200
RFI-Induced Distortion in Switched-Capacitor Circuits 198
Comparison of the susceptibility to EMI of MOS and BJT operational amplifiers 197
A New Grounding Scheme to Reduce the Electromagnetic Emission of Smart Power SoCs 195
Analysis of Opamp Operation Under High Power EMI 193
Investigation on RFI effects in bandgap voltage references 193
Prediction of EMI effects in operational amplifiers by a two input Volterra series model 193
A new Single-ended I/O with Reduced Electromagnetic Emissions 193
A CMOS Opamp Immune to EMIwith no Penalty in Baseband Operation 193
Weakness of the TEM cell method in evaluating IC radiated emissions 192
Smart power IC macromodeling for DPI analysis 191
Low Power single-ended I/O circuit for binary interchip communications 191
Investigation on the effectiveness of the IC susceptibility TEM cell method 189
A New Approach to Characterize Complex ICs in Terms of Scattering Parameters 187
Nonlinear effects of RF interference in SC circuits 187
Assessment of Digital Integrated- Circuit Electromagnetic Emission Bases on Radiated Power Evaluation 186
A high immunity complementary differential pair 185
A critical assessment of the TEM cell IC susceptibility test method 184
Riferimento di tensione e di corrente 184
A new nonlinear model of EMI-induced distortion phenomena in feedback CMOS operational amplifier 184
Identification of integrated circuits conducted emission limits for automotive applications 183
On the Use of the IC Stripline to Evaluate the Susceptibility to EMI of Small Integrated Circuits 183
Behavioural Model of Integrated Circuits for EMC Prediction 182
Susceptibility to EMI of high side current sensors based on chopper OpAmps 182
A Sensor Signal Amplifier Resilient to EMI 182
MODIFIED GUMMEL POON MODEL FOR ELECTROMAGNETIC SUSCEPTIBILITY PREDICTION 181
Correlation between building block power supply currents and conducted emission of digital ICs 181
Investigation on the Susceptibility to EMI of sigma-delta converters 180
EMI susceptibility: The achilles' heel of smart power ICs 178
Analysis of EME produced by a microcontroller operation 178
Investigations on the effectiveness of the IC susceptibility TEM cell method 177
Investigation on the susceptibility of microcontrollers to EFT interference 176
Investigations on the correlations between IC conducted emission and chip-level power supply current 176
Computer Aided Analysis of RF Effects in BJT Circuits 175
Totale 22.835
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Categoria #
all - tutte 106.643
article - articoli 38.504
book - libri 661
conference - conferenze 63.379
curatela - curatele 0
other - altro 606
patent - brevetti 2.044
selected - selezionate 0
volume - volumi 1.449
Totale 213.286
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Totale Lug Ago Sett Ott Nov Dic Gen Feb Mar Apr Mag Giu
2019/20201.743 0 0 0 0 0 0 317 477 415 286 161 87
2020/20212.669 386 377 79 316 127 263 105 200 171 295 215 135
2021/20222.732 107 190 108 103 246 204 151 99 213 239 522 550
2022/20233.422 306 587 155 235 307 464 293 188 282 32 179 394
2023/20241.576 65 174 88 100 154 153 90 118 78 75 228 253
2024/20252.038 97 533 220 536 327 293 32 0 0 0 0 0
Totale 36.455