PORTO @ Archivio Istituzionale della Ricerca

FIORI, FRANCO
 Distribuzione geografica
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Continente #
EU - Europa 16.609
NA - Nord America 15.256
AS - Asia 2.644
AF - Africa 210
SA - Sud America 56
OC - Oceania 16
Continente sconosciuto - Info sul continente non disponibili 6
Totale 34.797
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Nazione #
US - Stati Uniti d'America 15.177
IT - Italia 3.950
GB - Regno Unito 3.348
DE - Germania 3.063
FR - Francia 2.519
UA - Ucraina 1.208
CN - Cina 1.186
SE - Svezia 415
IE - Irlanda 388
CH - Svizzera 382
TR - Turchia 376
SG - Singapore 368
RU - Federazione Russa 259
NL - Olanda 241
KR - Corea 239
FI - Finlandia 198
BE - Belgio 193
JP - Giappone 125
AT - Austria 105
IN - India 71
HK - Hong Kong 70
CI - Costa d'Avorio 69
AP - ???statistics.table.value.countryCode.AP??? 67
CA - Canada 67
SN - Senegal 66
MY - Malesia 53
BG - Bulgaria 50
EU - Europa 50
EG - Egitto 47
RO - Romania 36
TW - Taiwan 32
CZ - Repubblica Ceca 30
IR - Iran 29
NO - Norvegia 28
VN - Vietnam 28
AE - Emirati Arabi Uniti 18
IL - Israele 17
BR - Brasile 16
JO - Giordania 15
AR - Argentina 12
AU - Australia 12
CL - Cile 12
PL - Polonia 12
ES - Italia 11
MX - Messico 11
ZA - Sudafrica 10
EC - Ecuador 8
LU - Lussemburgo 8
NG - Nigeria 8
TH - Thailandia 8
CO - Colombia 7
GR - Grecia 7
AL - Albania 6
HR - Croazia 6
EE - Estonia 5
ID - Indonesia 4
KZ - Kazakistan 4
NZ - Nuova Zelanda 4
SK - Slovacchia (Repubblica Slovacca) 4
GH - Ghana 3
HU - Ungheria 3
IQ - Iraq 3
LT - Lituania 3
A2 - ???statistics.table.value.countryCode.A2??? 2
AZ - Azerbaigian 2
BY - Bielorussia 2
DK - Danimarca 2
DZ - Algeria 2
GE - Georgia 2
KE - Kenya 2
MD - Moldavia 2
TN - Tunisia 2
BD - Bangladesh 1
BZ - Belize 1
LV - Lettonia 1
MA - Marocco 1
PH - Filippine 1
PK - Pakistan 1
PT - Portogallo 1
UZ - Uzbekistan 1
VE - Venezuela 1
Totale 34.797
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Città #
Ashburn 4.196
Southend 3.082
Seattle 1.932
Fairfield 942
Turin 798
Chandler 714
Princeton 666
Jacksonville 634
Ann Arbor 528
Woodbridge 506
Torino 458
San Ramon 439
Houston 423
Cambridge 414
Berlin 395
Dublin 378
Beijing 370
Wilmington 363
Bern 346
Boardman 320
Izmir 285
Milan 250
Singapore 227
Frankfurt 219
San Donato Milanese 207
Helsinki 180
Brussels 172
Katy 172
Shanghai 169
Fujian 153
Zaporozhye 149
Bologna 147
Pennsylvania Furnace 145
Overberg 138
Zhengzhou 135
Baltimore 129
Council Bluffs 123
Monopoli 111
Padua 101
Chicago 97
Saint Petersburg 91
Abidjan 69
Mountain View 69
Seoul 68
Redwood City 63
Des Moines 62
Vienna 62
Duncan 60
Hangzhou 52
Malatya 52
Guangzhou 50
Fremont 48
Cairo 47
San Diego 46
Neubiberg 45
Washington 45
Sofia 41
Norwalk 39
Atlanta 38
Shenzhen 38
Melun 34
Rome 34
Toronto 32
Amsterdam 31
Santa Clara 31
Hanover 28
Redmond 27
San Francisco 27
Brno 26
Falls Church 26
Tokyo 25
Buffalo 24
Stavanger 24
London 23
Galati 22
Verona 22
Andover 21
New York 21
Ningbo 21
Modena 20
Piscataway 19
San Jose 19
Moscow 18
Bremen 17
Graz 17
Las Vegas 17
Podenzano 17
San Mauro Torinese 17
Cadoneghe 16
Central District 16
Dong Ket 16
Lappeenranta 16
Salassa 16
Taipei 15
Menlo Park 14
Indiana 13
San Mateo 13
Schneisingen 13
Frankfurt Am Main 12
Nanjing 12
Totale 23.130
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Nome #
A New Mirroring Circuit for Power MOS Current Sensing Highly Immune to EMI 438
A critical assessment of the closed-loop bulk current injection immunity test performed in compliance with ISO 11452-4 337
EMI-inducted failures in MOS power transistors 318
DISPOSITIVO E SISTEMA PER LA TRASMISSIONE DI DATI DI INFORMAZIONE TRAMITE UN SEGNALE DI TIPO ULTRASONICO, E RELATIVO METODO 317
Modeling the IEC 61000-4-4 EFT Injection Clamp 305
On the Susceptibility of Embedded Thermal Shutdown Circuit to Radio Frequency Interference 304
A Wideband Ultrasound Connector Immune to EMI 303
A New Current Sensor Based on the Miller Effect Highly Immune to EMI 300
A New Filtering Technique for Increasing the Immunity of Power Transistors to RFI 285
Introduction to CMOS Analog Circuits 284
A New Current Sensor Based on MagFET Highly Immune to EMI 278
Investigation on the Susceptibility of Hall-Effect Current Sensors to EMI 274
Ultrasound CAN Bus Transceiver Highly Immune to EMI 273
A New Filtering Technique That Makes Power Transistors Immune to EMI 270
A new MagFET-based integrated current sensor highly immune to EMI 270
Electrical Model of Microcontrollers for the Prediction of Electromagnetic Emissions 263
Reduction of the EMI in BLDC Motor Drives Based on Delay Compensation 261
Reliability of Integrated Over-temperature Sensors in EM polluted environment 259
Chip-Level Design Constraints to Comply With Conducted Electromagnetic Emission Specifications 259
MOS Power Transistor Model for Electromagnetic Susceptibility Analysis 259
Modified Gummel Poon Model for Susceptibility Prediction 258
Investigation on the Susceptibility of Integrated Current Sensors to EMI 254
Distributed Conversion of Common Mode into Differential Mode Interference 253
Worst-Case Induced Disturbances in Digital and Analog Interchip Interconnects by an External Electromagnetic Plane Wave - Part I: Modeling and Algorithm 250
Susceptibility of Smart Power ICs to Radio Frequency Interference 249
A Linear Voltage Regulator Model for EMC Analysis 245
A New Integrated Current Sensor Immune to RFI 243
Worst Case-Induced Disturbances in Microstrip Interchip Interconnects by an External Electromagnetic Plane Wave - Part II: Analysis and Validation 242
A Simulation-based black-box microcontroller model for EME Prediction 241
On the effectiveness of EMIRR to qualify OpAmps 240
A New Compact Temperature-Compensated CMOS Current Reference 239
Electrical Model of a Microcontroller for EMC Analysis 238
A New Front-End for Binary Data Recovery in EM Polluted Environment 237
A New Power MOS Current Sensor Highly Immune to EMI 237
Investigations on the susceptibility of ICs to power-switching transients 237
Nonlinear effects of radio-frequency interference in operational amplifiers 237
Design of an Operational Amplifier Input Stage Immune to EMI 234
Prediction of high-power EMI effects in CMOS operational amplifiers 231
Current Sensing Circuit for DC-DC Converters Based on the Miller Effect 231
IC Digital Input Highly Immune to EMI 228
Operational amplifier input stage robust to EMI 227
A critical assessment of the closed-loop bulk current injection immunity test performed in compliance with ISO 11452-4 226
Compact temperature-compensated CMOS current reference 225
A new grounding scheme to reduce the electromagnetic emission of smart-power system-on-chips 225
Design of a CMOS opamp input stage immune to EMI 220
Software based control of the EMI generated in BLDC motor drives 219
Susceptibility to EMI of a Battery Management System IC for electric vehicles 219
Complementary differential pair with a high immunity to RFI 218
Susceptibility of CMOS Voltage Comparators to Radio Frequency Interference 212
Linear voltage regulator susceptibility to conducted EMI 210
Susceptibility of chopper OpAmps to EMI 209
A Binary Front-End Robust to EMI-Induced Errors 209
Comparison of IC conducted emission measurement methods 208
Prediction of RF interference in operational amplifier by a new analytical model 207
Finite Common-Mode Rejection in Fully Differential Operational Amplifiers 207
On the Susceptibility of Chopper Operational Amplifiers to EMI 207
RFI-induced failures in switched capacitor circuits 205
Efficient Substrate Coupling Analysis in Smart Power Integrated Circuits 205
An analog front end based on chopped signals highly immune to RFI 203
Investigation on the Susceptibility of BLE Receivers to Power Switching Noise 203
Nonlinear effects of RF interference in MOS operational amplifiers 202
Compact, Very Low Voltage, Temperature-Independent Reference Circuit 202
Efficient BEM-based substrate network extraction in silicon SoCs 201
On the use of High-Impedance Power Supplies to Reduce the Substrate Switching Noise in System-on-Chips 201
Investigation on VLSIs' input ports susceptibility to conducted RF interference 200
Comparison of IC conducted measurement methods 197
An Effective Way of Testing the Susceptibility to EMI of Custom ICs 197
RFI-Induced Distortion in Switched-Capacitor Circuits 193
Comparison of the susceptibility to EMI of MOS and BJT operational amplifiers 192
Analysis of Opamp Operation Under High Power EMI 190
Investigation on RFI effects in bandgap voltage references 190
Prediction of EMI effects in operational amplifiers by a two input Volterra series model 189
A New Grounding Scheme to Reduce the Electromagnetic Emission of Smart Power SoCs 188
A CMOS Opamp Immune to EMIwith no Penalty in Baseband Operation 188
Investigation on the effectiveness of the IC susceptibility TEM cell method 186
Weakness of the TEM cell method in evaluating IC radiated emissions 186
Smart power IC macromodeling for DPI analysis 185
Low Power single-ended I/O circuit for binary interchip communications 184
Assessment of Digital Integrated- Circuit Electromagnetic Emission Bases on Radiated Power Evaluation 183
A new Single-ended I/O with Reduced Electromagnetic Emissions 183
A critical assessment of the TEM cell IC susceptibility test method 182
A high immunity complementary differential pair 182
Nonlinear effects of RF interference in SC circuits 182
On the Use of the IC Stripline to Evaluate the Susceptibility to EMI of Small Integrated Circuits 181
Identification of integrated circuits conducted emission limits for automotive applications 180
Riferimento di tensione e di corrente 179
Behavioural Model of Integrated Circuits for EMC Prediction 179
Correlation between building block power supply currents and conducted emission of digital ICs 179
A Sensor Signal Amplifier Resilient to EMI 179
Susceptibility to EMI of high side current sensors based on chopper OpAmps 178
A New Approach to Characterize Complex ICs in Terms of Scattering Parameters 178
Analysis of EME produced by a microcontroller operation 176
A new nonlinear model of EMI-induced distortion phenomena in feedback CMOS operational amplifier 176
Investigation on the Susceptibility to EMI of sigma-delta converters 175
MODIFIED GUMMEL POON MODEL FOR ELECTROMAGNETIC SUSCEPTIBILITY PREDICTION 173
Investigation on the susceptibility of microcontrollers to EFT interference 173
Susceptibility of analog cells to substrate interference 173
EMI susceptibility: The achilles' heel of smart power ICs 173
Investigations on the correlations between IC conducted emission and chip-level power supply current 173
Investigations on the effectiveness of the IC susceptibility TEM cell method 173
Totale 22.326
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Categoria #
all - tutte 98.879
article - articoli 35.556
book - libri 634
conference - conferenze 58.865
curatela - curatele 0
other - altro 567
patent - brevetti 1.894
selected - selezionate 0
volume - volumi 1.363
Totale 197.758
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Totale Lug Ago Sett Ott Nov Dic Gen Feb Mar Apr Mag Giu
2019/20203.022 0 0 86 456 386 351 317 477 415 286 161 87
2020/20212.669 386 377 79 316 127 263 105 200 171 295 215 135
2021/20222.732 107 190 108 103 246 204 151 99 213 239 522 550
2022/20233.422 306 587 155 235 307 464 293 188 282 32 179 394
2023/20241.576 65 174 88 100 154 153 90 118 78 75 228 253
2024/2025633 97 533 3 0 0 0 0 0 0 0 0 0
Totale 35.050