FIORI, FRANCO
 Distribuzione geografica
Continente #
EU - Europa 16.545
NA - Nord America 14.908
AS - Asia 2.465
AF - Africa 210
SA - Sud America 56
OC - Oceania 16
Continente sconosciuto - Info sul continente non disponibili 6
Totale 34.206
Nazione #
US - Stati Uniti d'America 14.830
IT - Italia 3.914
GB - Regno Unito 3.345
DE - Germania 3.063
FR - Francia 2.519
UA - Ucraina 1.207
CN - Cina 1.137
SE - Svezia 415
IE - Irlanda 388
CH - Svizzera 382
TR - Turchia 376
RU - Federazione Russa 256
SG - Singapore 252
NL - Olanda 238
KR - Corea 233
FI - Finlandia 197
BE - Belgio 181
JP - Giappone 123
AT - Austria 105
HK - Hong Kong 70
CI - Costa d'Avorio 69
IN - India 69
AP - ???statistics.table.value.countryCode.AP??? 67
CA - Canada 66
SN - Senegal 66
EU - Europa 50
MY - Malesia 50
BG - Bulgaria 47
EG - Egitto 47
RO - Romania 36
TW - Taiwan 31
IR - Iran 29
CZ - Repubblica Ceca 28
NO - Norvegia 28
VN - Vietnam 28
AE - Emirati Arabi Uniti 18
IL - Israele 17
BR - Brasile 16
JO - Giordania 15
AR - Argentina 12
AU - Australia 12
CL - Cile 12
PL - Polonia 12
ES - Italia 11
MX - Messico 11
ZA - Sudafrica 10
EC - Ecuador 8
LU - Lussemburgo 8
NG - Nigeria 8
TH - Thailandia 8
CO - Colombia 7
GR - Grecia 7
AL - Albania 6
HR - Croazia 6
EE - Estonia 5
ID - Indonesia 4
KZ - Kazakistan 4
NZ - Nuova Zelanda 4
SK - Slovacchia (Repubblica Slovacca) 4
GH - Ghana 3
HU - Ungheria 3
IQ - Iraq 3
LT - Lituania 3
A2 - ???statistics.table.value.countryCode.A2??? 2
AZ - Azerbaigian 2
BY - Bielorussia 2
DK - Danimarca 2
DZ - Algeria 2
GE - Georgia 2
KE - Kenya 2
MD - Moldavia 2
TN - Tunisia 2
BD - Bangladesh 1
BZ - Belize 1
LV - Lettonia 1
MA - Marocco 1
PH - Filippine 1
PK - Pakistan 1
PT - Portogallo 1
UZ - Uzbekistan 1
VE - Venezuela 1
Totale 34.206
Città #
Ashburn 4.185
Southend 3.082
Seattle 1.932
Fairfield 942
Turin 788
Chandler 714
Princeton 666
Jacksonville 634
Ann Arbor 528
Woodbridge 506
Torino 458
San Ramon 439
Houston 423
Cambridge 414
Berlin 395
Dublin 378
Beijing 370
Wilmington 363
Bern 346
Izmir 285
Milan 245
Frankfurt 219
San Donato Milanese 207
Helsinki 179
Katy 172
Shanghai 169
Brussels 160
Fujian 153
Zaporozhye 149
Bologna 147
Pennsylvania Furnace 145
Overberg 138
Zhengzhou 135
Singapore 134
Baltimore 129
Council Bluffs 122
Monopoli 111
Boardman 104
Padua 101
Chicago 97
Saint Petersburg 91
Abidjan 69
Mountain View 69
Seoul 68
Redwood City 63
Des Moines 62
Vienna 62
Duncan 60
Hangzhou 52
Malatya 52
Guangzhou 49
Fremont 48
Cairo 47
San Diego 46
Neubiberg 45
Washington 45
Sofia 41
Norwalk 39
Atlanta 38
Shenzhen 37
Melun 34
Rome 34
Toronto 31
Amsterdam 30
Hanover 28
Redmond 27
San Francisco 27
Brno 26
Falls Church 26
Tokyo 25
Buffalo 24
Stavanger 24
London 23
Galati 22
Verona 22
Andover 21
Ningbo 21
Modena 20
Piscataway 19
San Jose 19
Bremen 17
Graz 17
Las Vegas 17
Podenzano 17
San Mauro Torinese 17
Cadoneghe 16
Central District 16
Dong Ket 16
Lappeenranta 16
Salassa 16
Moscow 15
Taipei 15
Menlo Park 14
Indiana 13
San Mateo 13
Schneisingen 13
Frankfurt Am Main 12
Nanjing 12
Netro 12
Ottawa 12
Totale 22.746
Nome #
A New Mirroring Circuit for Power MOS Current Sensing Highly Immune to EMI 437
A critical assessment of the closed-loop bulk current injection immunity test performed in compliance with ISO 11452-4 336
EMI-inducted failures in MOS power transistors 317
DISPOSITIVO E SISTEMA PER LA TRASMISSIONE DI DATI DI INFORMAZIONE TRAMITE UN SEGNALE DI TIPO ULTRASONICO, E RELATIVO METODO 312
Modeling the IEC 61000-4-4 EFT Injection Clamp 302
On the Susceptibility of Embedded Thermal Shutdown Circuit to Radio Frequency Interference 302
A Wideband Ultrasound Connector Immune to EMI 301
A New Current Sensor Based on the Miller Effect Highly Immune to EMI 297
A New Filtering Technique for Increasing the Immunity of Power Transistors to RFI 284
Introduction to CMOS Analog Circuits 282
A New Current Sensor Based on MagFET Highly Immune to EMI 277
Ultrasound CAN Bus Transceiver Highly Immune to EMI 272
Investigation on the Susceptibility of Hall-Effect Current Sensors to EMI 269
A new MagFET-based integrated current sensor highly immune to EMI 268
A New Filtering Technique That Makes Power Transistors Immune to EMI 267
Reliability of Integrated Over-temperature Sensors in EM polluted environment 257
Chip-Level Design Constraints to Comply With Conducted Electromagnetic Emission Specifications 257
Electrical Model of Microcontrollers for the Prediction of Electromagnetic Emissions 257
MOS Power Transistor Model for Electromagnetic Susceptibility Analysis 257
Modified Gummel Poon Model for Susceptibility Prediction 254
Investigation on the Susceptibility of Integrated Current Sensors to EMI 253
Distributed Conversion of Common Mode into Differential Mode Interference 252
Reduction of the EMI in BLDC Motor Drives Based on Delay Compensation 249
Worst-Case Induced Disturbances in Digital and Analog Interchip Interconnects by an External Electromagnetic Plane Wave - Part I: Modeling and Algorithm 248
Susceptibility of Smart Power ICs to Radio Frequency Interference 248
A Linear Voltage Regulator Model for EMC Analysis 244
A New Integrated Current Sensor Immune to RFI 240
On the effectiveness of EMIRR to qualify OpAmps 238
A New Front-End for Binary Data Recovery in EM Polluted Environment 236
Worst Case-Induced Disturbances in Microstrip Interchip Interconnects by an External Electromagnetic Plane Wave - Part II: Analysis and Validation 236
A New Power MOS Current Sensor Highly Immune to EMI 236
Investigations on the susceptibility of ICs to power-switching transients 236
Electrical Model of a Microcontroller for EMC Analysis 236
Nonlinear effects of radio-frequency interference in operational amplifiers 236
A New Compact Temperature-Compensated CMOS Current Reference 235
A Simulation-based black-box microcontroller model for EME Prediction 234
Design of an Operational Amplifier Input Stage Immune to EMI 233
Current Sensing Circuit for DC-DC Converters Based on the Miller Effect 230
Prediction of high-power EMI effects in CMOS operational amplifiers 229
IC Digital Input Highly Immune to EMI 227
Operational amplifier input stage robust to EMI 224
Compact temperature-compensated CMOS current reference 224
A critical assessment of the closed-loop bulk current injection immunity test performed in compliance with ISO 11452-4 223
A new grounding scheme to reduce the electromagnetic emission of smart-power system-on-chips 221
Susceptibility to EMI of a Battery Management System IC for electric vehicles 218
Complementary differential pair with a high immunity to RFI 216
Design of a CMOS opamp input stage immune to EMI 215
Software based control of the EMI generated in BLDC motor drives 215
Linear voltage regulator susceptibility to conducted EMI 209
Susceptibility of CMOS Voltage Comparators to Radio Frequency Interference 209
Susceptibility of chopper OpAmps to EMI 208
A Binary Front-End Robust to EMI-Induced Errors 208
Comparison of IC conducted emission measurement methods 207
Prediction of RF interference in operational amplifier by a new analytical model 205
On the Susceptibility of Chopper Operational Amplifiers to EMI 205
Finite Common-Mode Rejection in Fully Differential Operational Amplifiers 204
Efficient Substrate Coupling Analysis in Smart Power Integrated Circuits 204
RFI-induced failures in switched capacitor circuits 202
Investigation on the Susceptibility of BLE Receivers to Power Switching Noise 202
An analog front end based on chopped signals highly immune to RFI 201
Compact, Very Low Voltage, Temperature-Independent Reference Circuit 201
Efficient BEM-based substrate network extraction in silicon SoCs 200
On the use of High-Impedance Power Supplies to Reduce the Substrate Switching Noise in System-on-Chips 200
Nonlinear effects of RF interference in MOS operational amplifiers 198
Investigation on VLSIs' input ports susceptibility to conducted RF interference 198
An Effective Way of Testing the Susceptibility to EMI of Custom ICs 196
Comparison of IC conducted measurement methods 194
RFI-Induced Distortion in Switched-Capacitor Circuits 192
Comparison of the susceptibility to EMI of MOS and BJT operational amplifiers 191
Investigation on RFI effects in bandgap voltage references 189
Analysis of Opamp Operation Under High Power EMI 188
Prediction of EMI effects in operational amplifiers by a two input Volterra series model 188
A New Grounding Scheme to Reduce the Electromagnetic Emission of Smart Power SoCs 187
A CMOS Opamp Immune to EMIwith no Penalty in Baseband Operation 187
Investigation on the effectiveness of the IC susceptibility TEM cell method 185
Weakness of the TEM cell method in evaluating IC radiated emissions 184
Smart power IC macromodeling for DPI analysis 184
A new Single-ended I/O with Reduced Electromagnetic Emissions 182
Low Power single-ended I/O circuit for binary interchip communications 182
A critical assessment of the TEM cell IC susceptibility test method 181
A high immunity complementary differential pair 180
Nonlinear effects of RF interference in SC circuits 180
Assessment of Digital Integrated- Circuit Electromagnetic Emission Bases on Radiated Power Evaluation 179
Identification of integrated circuits conducted emission limits for automotive applications 179
On the Use of the IC Stripline to Evaluate the Susceptibility to EMI of Small Integrated Circuits 179
Behavioural Model of Integrated Circuits for EMC Prediction 178
Riferimento di tensione e di corrente 177
A Sensor Signal Amplifier Resilient to EMI 176
A New Approach to Characterize Complex ICs in Terms of Scattering Parameters 176
Susceptibility to EMI of high side current sensors based on chopper OpAmps 175
A new nonlinear model of EMI-induced distortion phenomena in feedback CMOS operational amplifier 175
Analysis of EME produced by a microcontroller operation 174
Correlation between building block power supply currents and conducted emission of digital ICs 173
Investigation on the susceptibility of microcontrollers to EFT interference 172
Susceptibility of analog cells to substrate interference 172
EMI susceptibility: The achilles' heel of smart power ICs 172
Demodulation of Radio-Frequency Interference in CMOS Operational Amplifiers 171
Investigations on the correlations between IC conducted emission and chip-level power supply current 171
Investigation on the Susceptibility to EMI of sigma-delta converters 170
Investigations on the effectiveness of the IC susceptibility TEM cell method 170
Totale 22.107
Categoria #
all - tutte 96.174
article - articoli 34.501
book - libri 623
conference - conferenze 57.310
curatela - curatele 0
other - altro 558
patent - brevetti 1.845
selected - selezionate 0
volume - volumi 1.337
Totale 192.348


Totale Lug Ago Sett Ott Nov Dic Gen Feb Mar Apr Mag Giu
2019/20203.529 311 196 86 456 386 351 317 477 415 286 161 87
2020/20212.669 386 377 79 316 127 263 105 200 171 295 215 135
2021/20222.732 107 190 108 103 246 204 151 99 213 239 522 550
2022/20233.422 306 587 155 235 307 464 293 188 282 32 179 394
2023/20241.576 65 174 88 100 154 153 90 118 78 75 228 253
2024/202538 38 0 0 0 0 0 0 0 0 0 0 0
Totale 34.455