Archivio Istituzionale della RicercaThe paper analyzes the test setup required by International Electrotecnical Commission (IEC) 61000-4-4 to evaluate the immunity of electronic equipment to electrical fast transients (EFTs) and proposes an electrical model of the capacitive coupling clamp, which is employed to add disturbances to nominal signals. The study points out limits on accuracy of this model and shows how it can be fruitfully employed to predict the interference waveform affecting nominal system signals through computer simulations.
Modeling the IEC 61000-4-4 EFT Injection Clamp / Musolino, Francesco; Fiori, Franco. - In: IEEE TRANSACTIONS ON ELECTROMAGNETIC COMPATIBILITY. - ISSN 0018-9375. - STAMPA. - 50:4(2008), pp. 869-875. [10.1109/TEMC.2008.2004603]
Modeling the IEC 61000-4-4 EFT Injection Clamp
MUSOLINO, FRANCESCO;FIORI, Franco
2008
Abstract
The paper analyzes the test setup required by International Electrotecnical Commission (IEC) 61000-4-4 to evaluate the immunity of electronic equipment to electrical fast transients (EFTs) and proposes an electrical model of the capacitive coupling clamp, which is employed to add disturbances to nominal signals. The study points out limits on accuracy of this model and shows how it can be fruitfully employed to predict the interference waveform affecting nominal system signals through computer simulations.
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https://hdl.handle.net/11583/1673727
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