The authors prescnt a new analytical model that describes the nonlinear behaviour of common CMOS operational amplifiers excited by radio-frequency interference (RFI) added to the input nominal signals. The new model is a valid support to analogue integrated circuit designers since it expresses a relationship between circuit parameters, parasitic elements and the amplitude of the RFI induced output offset voltage of a feedback CMOS operational amplifier. The validity'of model prediction has been verified through a comparison with experimental and computer simulation results.
Prediction of EMI effects in operational amplifiers by a two input Volterra series model / FIORI F.; CROVETTI P.S.. - In: IEE PROCEEDINGS. CIRCUITS, DEVICES AND SYSTEMS. - ISSN 1350-2409. - STAMPA. - 150:3(2003), pp. 185-193. [10.1049/ip-cds:20030342]
|Titolo:||Prediction of EMI effects in operational amplifiers by a two input Volterra series model|
|Data di pubblicazione:||2003|
|Digital Object Identifier (DOI):||http://dx.doi.org/10.1049/ip-cds:20030342|
|Appare nelle tipologie:||1.1 Articolo in rivista|