Archivio Istituzionale della RicercaFOSCALE, TOMMASO
FOSCALE, TOMMASO
Dipartimento di Automatica e Informatica
055629
A Flexible FPGA-based Test Equipment for Enabling Out-of-Production Manufacturing Test Flow of Digital Systems
2024 Di Gruttola Giardino, Nicola; Angione, Francesco; Bernardi, Paolo; Foscale, Tommaso; Bertani And Vincenzo Tancorre, Claudia
Exploring trade-offs in multi-site wafer testing
2024 Bernardi, Paolo; Cardone, Lorenzo; Foscale, Tommaso
Low cost external serial interface watchdog for SoCs and FPGAs automatic characterization tests
2023 Bernardi, Paolo; Filipponi, Gabriele; Foscale, Tommaso; Insinga, Giorgio
A novel SEU injection setup for Automotive SoC
2022 Iaria, G.; Foscale, T.; Bernardi, P.; Presicce, L.; Sonza Reorda, M.; Appello, D.; Tancorre, V.; Ugioli, R.
Test, Reliability and Functional Safety trends for Automotive System-on-Chip
2022 Angione, F.; Appello, D.; Aribido, J.; Bellarmino, N.; Bernardi, P.; Cantoro, R.; De Sio, C.; Foscale, T.; Gavarini, G.; Huch, M.; Kilian, T; Mariani, R.; Martone, R.; Ruospo, A.; Sanchez, E.; Schlichtmann, U.; Squillero, G.; Sonza Reorda, M.; Sterpone, L.; Tancorre, V.; Ugioli, R.
Test, Reliability and Functional Safety Trends for Automotive System-on-Chip
2022 Angione, F.; Appello, D.; Aribido, J.; Athavale, J.; Bellarmino, N.; Bernardi, P.; Cantoro, R.; De Sio, C.; Foscale, T.; Gavarini, G.; Guerrero, J.; Huch, M.; Iaria, G.; Kilian, T.; Mariani, R.; Martone, R.; Ruospo, A.; Sanchez, E.; Schlichtmann, U.; Squillero, G.; Sonza Reorda, M.; Sterpone, L.; Tancorre, V.; Ugioli, R.
| Citazione | Data di pubblicazione | Autori | File |
|---|---|---|---|
| A Flexible FPGA-based Test Equipment for Enabling Out-of-Production Manufacturing Test Flow of Digital Systems / Di Gruttola Giardino, N., Angione, F., Bernardi, P., Foscale, T., Bertani And Vincenzo Tancorre, C.. - (2024). (International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFTS) Didcot (UK) 08-10 October 2024) [10.1109/DFT63277.2024.10753536]. | 1-gen-2024 | Nicola di Gruttola GiardinoFrancesco AngionePaolo BernardiTommaso Foscale + | A_Flexible_FPGA-Based_Test_Equipment_for_Enabling_Out-of-Production_Manufacturing_Test_Flow_of_Digital_Systems.pdf |
| Exploring trade-offs in multi-site wafer testing / Bernardi, Paolo; Cardone, Lorenzo; Foscale, Tommaso. - (2024). ( 25th IEEE Latin American Test Symposium 2024 Maceio (BRA) 09-12 April 2024) [10.1109/lats62223.2024.10534596]. | 1-gen-2024 | Bernardi, PaoloCardone, LorenzoFoscale, Tommaso | Exploring_trade-offs_in_multi-site_wafer_testing.pdf |
| Low cost external serial interface watchdog for SoCs and FPGAs automatic characterization tests / Bernardi, P., Filipponi, G., Foscale, T., Insinga, G.. - (2023). (IEEE Latin-American Test Symposium Veracruz (Mexico) 21-24 March 2023) [10.1109/LATS58125.2023.10154486]. | 1-gen-2023 | Bernardi, PaoloFilipponi, GabrieleFoscale, TommasoInsinga, Giorgio | LATS_2023.pdf; Low_cost_external_serial_interface_watchdog_for_SoCs_and_FPGAs_automatic_characterization_tests.pdf |
| A novel SEU injection setup for Automotive SoC / Iaria, G., Foscale, T., Bernardi, P., Presicce, L., Sonza Reorda, M., Appello, D., Tancorre, V., Ugioli, R.. - (2022), pp. 623-626. (2022 IEEE International Symposium on Industrial Electronics Anchorage, AK (USA) 01-03 June 2022) [10.1109/ISIE51582.2022.9831533]. | 1-gen-2022 | G. IariaT. FoscaleP. BernardiL. PresicceM. Sonza Reorda + | A_novel_SEU_injection_setup_for_Automotive_SoC.pdf |
| Test, Reliability and Functional Safety trends for Automotive System-on-Chip / Angione, F.; Appello, D.; Aribido, J.; Bellarmino, N.; Bernardi, P.; Cantoro, R.; De Sio, C.; Foscale, T.; Gavarini, G.; Huch, M.; Kilian, T; Mariani, R.; Martone, R.; Ruospo, A.; Sanchez, E.; Schlichtmann, U.; Squillero, G.; Sonza Reorda, M.; Sterpone, L.; Tancorre, V.; Ugioli, R.. - ELETTRONICO. - (2022). (Intervento presentato al convegno 2022 IEEE European Test Symposium (ETS) tenutosi a Barcelona (ESP) nel 23-27 May 2022) [10.1109/ETS54262.2022.9810388]. | 1-gen-2022 | F. AngioneN. BellarminoP. BernardiR. CantoroC. de SioT. FoscaleG. GavariniA. RuospoE. SanchezG. SquilleroM. Sonza ReordaL. Sterpone + | 01_ETS_special_session_ABSTRACT.pdf; Test_Reliability_and_Functional_Safety_Trends_for_Automotive_System-on-Chip.pdf |
| Test, Reliability and Functional Safety Trends for Automotive System-on-Chip / Angione, F., Appello, D., Aribido, J., Athavale, J., Bellarmino, N., Bernardi, P., Cantoro, R., De Sio, C., Foscale, T., Gavarini, G., Guerrero, J., Huch, M., Iaria, G., Kilian, T., Mariani, R., Martone, R., Ruospo, A., Sanchez, E., Schlichtmann, U., Squillero, G., et al.. - (2022), pp. 1-10. (2022 IEEE European Test Symposium (ETS) Barcelona (Spain) 23-27 May 2022) [10.1109/ETS54262.2022.9810388]. | 1-gen-2022 | F. AngioneN. BellarminoP. BernardiR. CantoroC. De SioT. FoscaleG. GavariniJ. GuerreroG. IariaR. MarianiA. RuospoG. SquilleroM. Sonza ReordaL. Sterpone + | 2022_ETS_SpecialSession.pdf; Test_Reliability_and_Functional_Safety_Trends_for_Automotive_System-on-Chip.pdf |